| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 09/18/2001 | US6292532 Fluorescent X-ray analyzer useable as wavelength dispersive type and energy dispersive type |
| 09/18/2001 | US6292529 Two-dimensional X-ray detector array for CT applications |
| 09/18/2001 | US6292527 Method for operating a computed tomography (CT) device |
| 09/18/2001 | US6292526 Methods and apparatus for preprocessing volumetric computed tomography data |
| 09/18/2001 | US6292525 Use of Hilbert transforms to simplify image reconstruction in a spiral scan cone beam CT imaging system |
| 09/18/2001 | US6291823 Ion-induced electron emission microscopy |
| 09/18/2001 | US6291820 Highly charged ion secondary ion mass spectroscopy |
| 09/13/2001 | WO2001067076A2 Method of analysis using x-ray fluorescence |
| 09/13/2001 | WO1997013397A3 X-ray diffractometry method |
| 09/13/2001 | US20010021241 Mobile x-ray inspection system for large objects |
| 09/13/2001 | US20010021240 X-ray spectroscopic analyzer having sample surface observation mechanism |
| 09/13/2001 | US20010020682 Density detection using discrete photon counting |
| 09/13/2001 | DE10010793A1 Verfahren zum Aussortieren von Gegenständen sowie Vorrichtung zur Durchführung des Verfahrens A method for sorting of objects, and device for carrying out the method |
| 09/12/2001 | EP1132152A2 Method and device for sorting objects |
| 09/12/2001 | EP1131624A1 Interactive digital radiographic system |
| 09/12/2001 | CN2447777Y Beta ray dust gauge |
| 09/12/2001 | CN1312474A Two-dimension x-ray detector array for CT |
| 09/11/2001 | US6289235 Method and system for creating three-dimensional images using tomosynthetic computed tomography |
| 09/11/2001 | US6289073 X-ray CT apparatus |
| 09/11/2001 | US6288393 Automated method of circuit analysis |
| 09/11/2001 | CA2232381C X-ray imaging apparatus and method using a flat amorphous silicon imaging panel |
| 09/11/2001 | CA2100020C Methods and apparatus for detecting bacterial growth by spectrophotometric sampling of a fiber-optic array |
| 09/07/2001 | WO2001065245A1 Container inspection apparatus |
| 09/06/2001 | US20010019599 X-ray CT apparatus and method for operating same for reducing the radiation dose to an examiner having a body part exposed to the X-ray beam |
| 09/06/2001 | US20010019109 Scanning electron microscope |
| 09/06/2001 | US20010019108 Analysis of semiconductor surfaces by secondary ion mass spectrometry |
| 09/06/2001 | DE10063290A1 Method and device for detecting explosive in airport baggage, etc. using a computer tomography system that rotates around the baggage to provide a number of projections of an area of interest |
| 09/06/2001 | DE10056936A1 Radiation inspection system for non-destructive testing of objects or samples, has electronic shutter which automatically reveals spatially separated images, sequentially to camera |
| 09/05/2001 | EP1130385A2 High speed digital radiographic inspection of aircraft fuselages |
| 09/05/2001 | EP1129341A2 Methods and apparatus using attenuation of radiation to determine concentration of material in object |
| 09/05/2001 | EP1128818A1 Functionalized nanocrystals and their use in detection systems |
| 09/05/2001 | CN1311144A Rigid folding structure for container detection scanning arm |
| 09/04/2001 | US6285781 Radiographic apparatus and method |
| 09/04/2001 | US6285736 Method for X-ray micro-diffraction measurement and X-ray micro-diffraction apparatus |
| 09/04/2001 | US6285734 Method for determining element contents using wave dispersive and energy dispersive x-ray fluorescence analysis |
| 09/04/2001 | US6285733 Computed tomography method utilizing a conical radiation beam |
| 08/30/2001 | WO2001063266A2 System for imaging a cross-section of a substrate |
| 08/30/2001 | WO2001063236A2 Method for automatically detecting casting defects in a test piece |
| 08/30/2001 | WO2001062999A1 Titanium less susceptible to discoloration in the atmosphere and method for producing same |
| 08/30/2001 | WO2001007888A3 Pulsed gamma neutron activation analysis (pgnaa) method and apparatus for nondestructive assay of containerized contaminants |
| 08/30/2001 | US20010018037 Silicon oxide containing active silicon and its evaluation |
| 08/30/2001 | US20010017909 CT apparatus with reduced data transmission rate from the detector system to the image reconstruction computer |
| 08/30/2001 | US20010017878 Method of inspecting pattern and inspecting instrument |
| 08/30/2001 | US20010017054 Probe microscope |
| 08/30/2001 | DE10009285A1 Computertomograph zur Ermittlung des Impulsübertrags-Spektrums in einem Untersuchungsbereich A computed tomography for determination of the momentum transfer spectrum in an examination region |
| 08/30/2001 | CA2397921A1 Method for automatically detecting casting defects in a test piece |
| 08/29/2001 | EP1128413A1 Method of observing image and scanning electron microscope |
| 08/29/2001 | EP1127546A2 CT apparatus for detecting the spectrum of pulse transmission in an inspection field |
| 08/29/2001 | CN1309949A Operating method of CT machine and CT machine |
| 08/28/2001 | US6282261 Multi-mode x-ray image intensifier system |
| 08/28/2001 | US6282260 Unilateral hand-held x-ray inspection apparatus |
| 08/28/2001 | US6282256 Computed tomography method utilizing a conical radiation beam |
| 08/28/2001 | US6281496 Observing/forming method with focused ion beam and apparatus therefor |
| 08/28/2001 | US6281024 Semiconductor device inspection and analysis method and its apparatus and a method for manufacturing a semiconductor device |
| 08/23/2001 | WO2001061326A2 X-ray system |
| 08/23/2001 | US20010016938 Inspection method and inspection system using charged particle beam |
| 08/23/2001 | US20010016028 X-ray inspection using co-planar pencil and fan beams |
| 08/23/2001 | DE10107162A1 Primär-Abklingkorrektur hoher Ordnung für CT-Abbildungssystem-Erfassungseinrichtungen Primary Abklingkorrektur high-order for CT imaging system sensing devices |
| 08/23/2001 | DE10007306A1 Röntgensystem X-ray system |
| 08/22/2001 | EP1126477A2 Method for structure investigation in a semiconductor substrate |
| 08/22/2001 | EP0991937B1 Method for measuring the basic weight of constituents in a compound material |
| 08/22/2001 | CN2444235Y Multisource high precision mucleon weigh |
| 08/22/2001 | CN1309768A Method and apparatus for measuring multiphase flows |
| 08/22/2001 | CN1309548A Improved helical scan computed tomography detector geometry |
| 08/22/2001 | CN1309292A Radiation testing system and method |
| 08/21/2001 | US6278767 Methods for measuring curved distances on 3D and MIP images |
| 08/21/2001 | US6278112 Method of setting a base energy level for an Auger electron spectroscopy analysis of a titanium nitride film, and method of analyzing the titanium nitride film |
| 08/16/2001 | WO2001059485A1 Spectrally shaped x-ray inspection system |
| 08/16/2001 | WO2001059476A2 Sample preparation method |
| 08/16/2001 | WO2001059439A1 Method for obtaining a picture of the internal structure of an object using x-ray radiation and device for the implementation thereof |
| 08/16/2001 | US20010014140 Method of combining reconstruction images |
| 08/16/2001 | US20010014138 Detection of variable manufacturing tolerance packages utilizing x-rays |
| 08/16/2001 | US20010014137 Sheet detection system |
| 08/16/2001 | US20010014136 X-ray analysis apparatus with an X-ray detector in the form of a CCD array |
| 08/16/2001 | US20010013247 Apparatus and method for fluid analysis |
| 08/16/2001 | EP1123502A2 Multiple-head phosphor screen scanner |
| 08/16/2001 | DE19957127C1 Computertomograph mit Mitteln zur Darstellung von Schattenbildern A computed tomography with means for shadow images |
| 08/16/2001 | DE10006401A1 Verfahren zur Bestimmung von organischen und/oder anorganischen Molekülen im Prozess- oder Abgas A method for determination of organic and / or inorganic molecules in the process gas or offgas |
| 08/16/2001 | CA2399820A1 Sample preparation method |
| 08/16/2001 | CA2366547A1 Method for obtaining a picture of the internal structure of an object using x-ray radiation and device for the implementation thereof |
| 08/15/2001 | CN2443366Y Receiver for scanning electron microscope |
| 08/14/2001 | US6275563 Portable gamma apparatus for core analysis and method therefor |
| 08/14/2001 | US6275294 Analyzing device |
| 08/14/2001 | US6274876 Inspection apparatus and method using particle beam and the particle-beam-applied apparatus |
| 08/14/2001 | US6274505 Etching method, etching apparatus and analyzing method |
| 08/09/2001 | WO2001057878A1 Instrument and method for combined surface topography and spectroscopic analysis |
| 08/09/2001 | WO2001057515A2 Analytical devices based on diffusion boundary layer calibration and quantitative sorption |
| 08/09/2001 | WO2001057505A2 Apparatus and method for automated indexing of a nuclear gauge |
| 08/09/2001 | WO2000075646A3 Device and method for analyzing atomic and/or molecular elements by means of wavelength dispersive x-ray spectrometric devices |
| 08/09/2001 | US20010011709 Scintillator for a multi-slice computed tomograph system |
| 08/09/2001 | DE10003518A1 CT-Gerät CT device |
| 08/08/2001 | EP1121585A2 Scanning system with flexible drive assembly |
| 08/08/2001 | EP1121584A1 Application of x-ray optics to energy dispersive spectroscopy |
| 08/07/2001 | US6272437 Method and apparatus for improved inspection and classification of attributes of a workpiece |
| 08/07/2001 | US6272206 Rotatable cylinder dual beam modulator |
| 08/07/2001 | US6272204 Integrated X-ray and visual inspection systems |
| 08/07/2001 | US6272203 X-ray fluorescence inspection apparatus |
| 08/07/2001 | US6271534 Device for producing the image of an object using a flux of neutral or charged particles, and an integrated lens for converting such flux of neutral or charged particles |
| 08/07/2001 | US6271519 Analysis of semiconductor surfaces by secondary ion mass spectrometry |
| 08/02/2001 | WO2001055047A2 Assay methods for hydratable cementitious compositions |