| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 03/27/2002 | CN1341908A Automatic analysis and identification device of internal defect in cast and its analysis and identification method |
| 03/26/2002 | US6362481 X-ray detector apparatus with reduced thermal expansivity |
| 03/26/2002 | US6362477 Bulk material analyser for on-conveyor belt analysis |
| 03/21/2002 | WO2002023581A1 Apparatus for inspecting mask |
| 03/21/2002 | WO2002023231A2 Generation of a library of periodic grating diffraction signals |
| 03/21/2002 | WO2001081905A3 Sealed detector for a medical imaging device and a method of manufacturing the same |
| 03/21/2002 | WO2001068861A3 THREE-DIMENSIONAL MODEL OF A Fc REGION OF AN IgE ANTIBODY AND USES THEREOF |
| 03/21/2002 | WO2001044793A3 Optical scheme for high flux low-background two-dimensional small angle x-ray scattering |
| 03/21/2002 | WO2001044792A3 Apparatus for fast detection of x-rays |
| 03/21/2002 | US20020035455 Generation of a library of periodic grating diffraction signals |
| 03/21/2002 | US20020034279 X-ray generating apparatus, X-ray imaging apparatus, and X-ray inspection system |
| 03/21/2002 | US20020034278 Linear prediction of structure factors in x-ray crystallography |
| 03/21/2002 | US20020034276 Volumetric computed tomography system for cardiac imaging |
| 03/21/2002 | US20020033451 Electron microscope |
| 03/21/2002 | US20020033449 Inspection system by charged particle beam and method of manufacturing devices using the system |
| 03/21/2002 | DE10142159A1 Testing device for electric circuit board connections, uses X-ray source and detector system for providing laminographic images compared with CAD data |
| 03/21/2002 | DE10044357A1 Detektoranordnung zur Detektion von Röntgenstrahlen Detector array for the detection of X-rays |
| 03/21/2002 | DE10044169A1 Verfahren zur zerstörungsfreien Wandstärkenprüfung A method of nondestructive testing wall thickness |
| 03/21/2002 | DE10043664A1 Surface structure analysis method for workpiece sample uses correlation between surface structure data and microscopic image of surface or between different surface images |
| 03/20/2002 | EP1188165A1 Parallel x-ray nanotomography |
| 03/20/2002 | EP1188045A1 Method of diagnosing colorectal adenomas and cancer using proton magnetic resonance spectroscopy |
| 03/20/2002 | EP1188044A2 On-line system for quantitative analysis of multi-component additives and coatings in sheet material |
| 03/20/2002 | CN2482693Y Crude oil gathering and transportation metering on-line automatic sampling apparatus |
| 03/19/2002 | US6359964 X-ray analysis apparatus including a parabolic X-ray mirror and a crystal monochromator |
| 03/19/2002 | US6359962 Flourescent X-ray analyzer |
| 03/19/2002 | US6359961 Apparatus and methods for stereo radiography including remote control via a network |
| 03/19/2002 | US6359285 Stimulable phosphor sheet |
| 03/14/2002 | WO2002021112A2 Method to measure hydrogen-bearing constituent in a material using neutron spectroscopy |
| 03/14/2002 | WO2001063236A3 Method for automatically detecting casting defects in a test piece |
| 03/14/2002 | WO2001059476A3 Sample preparation method |
| 03/14/2002 | WO2001057515A3 Analytical devices based on diffusion boundary layer calibration and quantitative sorption |
| 03/14/2002 | WO2001051919A9 High-throughput formation, identification, and analysis of diverse solid-forms |
| 03/14/2002 | WO2001036966A3 An apparatus for machine fluid analysis |
| 03/14/2002 | US20020031773 Quantitative MALDI-time of filght mass spectrometry of peptides and proteins |
| 03/14/2002 | US20020031203 Design and manufacturing approach to the implementation of a microlens-array based scintillation conversion screen |
| 03/14/2002 | US20020031202 X-ray scatter and transmission system with coded beams |
| 03/14/2002 | US20020030801 Electron beam aligner, outgassing collection method and gas analysis method |
| 03/14/2002 | US20020030187 Method of evaluating critical locations on a semiconductor apparatus pattern |
| 03/14/2002 | US20020030166 Pattern inspection method and apparatus using electron beam |
| 03/14/2002 | US20020030160 Positron trap beam source for positron microbeam production |
| 03/14/2002 | DE10043629A1 Vorrichtung zur Bestimmung und/oder Überwachung der Dichte und/oder des Füllstands eines Füllguts in einem Behälter Device for determining and / or monitoring the density and / or the filling level of a filling material in a container |
| 03/14/2002 | DE10042856A1 Operation unit for x-ray test apparatus has identification device that is provided to operator, and recognition device that is provided to control panel |
| 03/13/2002 | EP1186909A2 X ray detection system |
| 03/13/2002 | EP1186855A2 Method for nondestructive wall thickness inspection |
| 03/13/2002 | EP1185857A2 Method and apparatus for enhancing yield of secondary ions |
| 03/12/2002 | US6355217 Holding device for particulate samples |
| 03/12/2002 | US6354737 Digital image orientation marker |
| 03/12/2002 | CA2356060A1 Radiographic system and method for inspecting aircraft fuselages |
| 03/07/2002 | WO2002018921A2 Method and system for real-time fluorescent determination of trace elements |
| 03/07/2002 | WO2002018883A2 Device for determining the density and the level of a filling material in a container |
| 03/07/2002 | US20020028399 Detecting defects using scanning radiation |
| 03/07/2002 | US20020027973 Method for operating a radiation examination device |
| 03/07/2002 | US20020027970 Diffraction enhanced x-ray imaging of articular cartilage |
| 03/07/2002 | US20020027653 Method for inspecting defects and an apparatus of the same |
| 03/07/2002 | US20020027199 Method and device for observing a specimen in a field of view of an electron microscope |
| 03/07/2002 | CA2420665A1 Method and system for real-time fluorescent determination of trace elements |
| 03/06/2002 | EP1183527A1 Electrically-charged particle energy analysers |
| 03/06/2002 | EP1183526A2 Device and method for analyzing atomic and/or molecular elements by means of wavelength dispersive x-ray spectrometric devices |
| 03/06/2002 | CN2480838Y Oil-containing ratio measurer for inner produced liquid from oil conveying pipe |
| 03/06/2002 | CN2480837Y Overhead rail vehicle type check equipment |
| 03/06/2002 | CN2480836Y Layer thickness loading block set for x-ray photographic test |
| 03/06/2002 | CN1339136A Apparatus and method for processing objects in computed tomography data using object projection |
| 03/05/2002 | US6353657 Image redirection and optical path folding |
| 03/05/2002 | US6353656 Radioisotope based x-ray residual stress analysis apparatus |
| 03/05/2002 | US6353654 Method and apparatus for compensating for image retention in an amorphous silicon imaging detector |
| 02/28/2002 | WO2002016615A2 Crystal structure of dimethylarginine dimethylaminohydrolase and arginine deiminase |
| 02/28/2002 | US20020026628 Pattern defect checking method and device |
| 02/28/2002 | US20020025021 System and method for reducing phase ambiguity of crystal structure factors |
| 02/28/2002 | US20020025020 X-ray fluorescence thickness tester |
| 02/28/2002 | US20020024022 Charged particle beam irradiation apparatus and irradiation method using the apparatus |
| 02/28/2002 | US20020024021 Method and apparatus for inspecting patterns of a semiconductor device with an electron beam |
| 02/28/2002 | US20020024019 Mask defect checking method and device for electron beam exposure |
| 02/28/2002 | US20020024014 Scanning electron microscope |
| 02/28/2002 | US20020024012 Electron microscope |
| 02/28/2002 | US20020024011 Method for correcting opaque defects in reticles for charged-particle-beam microlithography, and reticles produced using same |
| 02/27/2002 | EP0789888B1 X-ray computer tomography (ct) system and method for detecting thin objects |
| 02/27/2002 | CN2479502Y On-line cut tobacco filling value measuring instrument |
| 02/27/2002 | CN1338048A Apparatus and method for calibration of nuclear gauges |
| 02/27/2002 | CN1338047A Methods and apparatus using attenuation of radiation to determine concentration of material in object |
| 02/27/2002 | CN1337577A Plane ray-detector unit and X-ray pic-up device |
| 02/26/2002 | US6351516 Detection of voids in semiconductor wafer processing |
| 02/21/2002 | WO2002014856A2 Mass spectrometry |
| 02/21/2002 | US20020022250 Process for pan-genomic determination of macromolecular atomic structures |
| 02/21/2002 | US20020021785 Methods and apparatus for calibrating CT x-ray beam tracking loop |
| 02/21/2002 | US20020021442 Observing techniques and its evaluation equiptments of filler packing-structure for resin polymer composite filled with ceramic filler-powder |
| 02/21/2002 | US20020020814 Electron spectroscopy employing controlled surface charging |
| 02/21/2002 | DE10135873A1 Verfahren und Vorrichtung für submillimeter-CT-Schnitte mit vergrößertem erfassten Gebiet Method and apparatus for submillimeter-CT slices with increased coverage area |
| 02/21/2002 | DE10129489A1 Bewertungsmethode für polykristallines Silizium Evaluation method for polycrystalline silicon |
| 02/21/2002 | CA2418735A1 Mass spectrometry |
| 02/20/2002 | CN1336810A Progressive correction for calbulatijng X-ray computed tomography ring artifacts |
| 02/20/2002 | CN1336542A Mechanism for fixing scattering target, and electron self-rotating analyzer |
| 02/20/2002 | CN1079584C Method for producing defect inspection test sheet for semiconductor device |
| 02/20/2002 | CN1079583C Method for analyzing defects of semiconductor device with three-D |
| 02/19/2002 | US6349273 Atomic coordinates generating method |
| 02/19/2002 | US6349128 Method and device using x-rays to measure thickness and composition of thin films |
| 02/19/2002 | US6348690 Method and an apparatus of an inspection system using an electron beam |
| 02/14/2002 | WO2002013232A2 Measurement of critical dimensions using x-rays |
| 02/14/2002 | WO2002013227A1 Sheet beam test apparatus |
| 02/14/2002 | WO2002012871A1 X-ray measuring and testing system |
| 02/14/2002 | US20020018588 System and method for generating an image dataset |