Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
04/2004
04/08/2004US20040066893 Density-nonuniform multilayer film analyzing method, and apparatus and system thereof
04/08/2004US20040066891 Method and apparatus and computer program product for determining an abort criterion during acquisition of 2D images of a 3D subject
04/08/2004US20040066890 Method and apparatus for analysing and sorting a flow of material
04/08/2004US20040066889 Collimator aperture scheduling for enhanced pencil-beam resolution
04/08/2004US20040066888 X-ray examining device, and its control method and its adjusting method
04/08/2004US20040066887 Cargo security method and apparatus
04/08/2004US20040066886 Scatter spectra method for x-ray fluorescent analysis with optical components
04/08/2004US20040066884 Continuous scan tomosynthesis system and method
04/08/2004US20040066882 Continuous scan RAD tomosynthesis system and method
04/08/2004US20040066878 Imaging apparatus and method with event sensitive photon detection
04/08/2004US20040065827 Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor
04/08/2004US20040065826 System for imaging a cross-section of a substrate
04/08/2004DE10245840B3 Anordnung zur Bestimmung der spektralen Reflektivität eines Messobjektes Arrangement for determining the spectral reflectivity of an object to be measured
04/08/2004DE10245578A1 Computer tomography instrument has a detector system with detector rows in which the detector elements have alternating wide and narrow apertures
04/08/2004DE10244180A1 CT imaging method for periodically moving organs, especially the heart, using 3D filtered back projection, wherein spatial and temporal weighting functions are used to improve image quality
04/07/2004EP1406084A1 Analyzing apparatus and analyzing method
04/07/2004EP1405598A1 X-ray ct apparatus
04/07/2004EP1405061A2 Determination of material parameters using x-ray scattering
04/07/2004EP1405060A2 Device for and method of material analysis using a shutter comprising a calibration sample
04/07/2004EP1052937B1 X-ray examination apparatus and method for generating distortion-free x-ray images
04/07/2004CN1487285A X-ray diffraction stress determinating method
04/06/2004US6718008 X-ray diffraction screening system with retractable x-ray shield
04/06/2004US6718007 Using hair to screen for breast cancer
04/06/2004US6718006 Fiber-optic encoding for dual transmission measurements in positron emission tomography
04/06/2004US6718003 Gantry of an X-ray computer tomography apparatus
04/06/2004US6717156 Beam as well as method and equipment for specimen fabrication
04/06/2004US6717146 Tandem microchannel plate and solid state electron detector
04/06/2004US6717145 Mapping electron microscopes exhibiting improved imaging of specimen having chargeable bodies
04/06/2004US6715918 Calibration phantom for projection X-ray systems
04/06/2004US6715533 Method for making a collimator for an x-ray technique-based nonintrusive inspection apparatus
04/01/2004WO2004027810A2 System and method for removal of materials from an article
04/01/2004WO2004027809A2 Charged particle beam system
04/01/2004WO2004027808A2 Particle-optical device and detection means
04/01/2004WO2004027373A2 Inspection system for limited access spaces
04/01/2004WO2004027111A1 Electrode, solid element and device using the same
04/01/2004WO2003085416B1 Machinery for automatic x-ray inspection of wheels
04/01/2004WO2003081220A3 Computer tomograph with a detector following the movement of a pivotable x-ray source
04/01/2004WO2002091023A3 Nautical x-ray inspection system
04/01/2004US20040064265 Assay methods for hydratable cementitious compositions
04/01/2004US20040062452 Method, apparatus and program for restoring phase information
04/01/2004US20040062350 Arrangement for determining the spectral reflectivity of a measurement object
04/01/2004US20040062349 Phase contrast X-ray device for creating a phase contrast image of an object and method for creating the phase contrast image
04/01/2004US20040062347 X-ray microscope
04/01/2004US20040062346 Article screening system
04/01/2004US20040062342 Method and system for reconstructing an image from projection data acquired by a cone beam computed tomography system
04/01/2004US20040061081 Radiation image read-out method and apparatus
04/01/2004US20040061066 Magnetic field applying sample observing system
04/01/2004US20040061053 Method and apparatus for measuring physical properties of micro region
04/01/2004US20040061051 Devices for guiding and manipulating electron beams
04/01/2004US20040061042 Spot grid array imaging system
04/01/2004DE10244181A1 Image forming method in computer tomography, by filtering data output from detector array and back-projecting, with rays weighted based on position in beam
04/01/2004DE10241184A1 Verfahren zur Erzeugung eines Volumendatensatzes A method for generating a volume data set
03/2004
03/31/2004EP1403882A2 Method and apparatus for obtaining parallel x-ray beam and x-ray diffraction apparatus related thereto
03/31/2004EP1403824A2 Method and system for reconstructing an image from projection data acquired by a cone beam computed tomography system
03/31/2004EP1403634A1 Arrangement for the determination of the spectral reflectivity of an object
03/31/2004EP1402541A2 Wavelength dispersive xrf system using focusing optic for excitation and a focusing monochromator for collection
03/31/2004EP1402248A1 X-ray device for medical examination and method of improving the image quality thereof
03/31/2004EP1401768A1 Disaggregation of asphaltenes in incompatible petroleum oil mixtures
03/31/2004EP1401479A2 Detection and therapy of vulnerable plaque with photodynamic compounds
03/31/2004CN2608979Y Constant-voltage X-ray defects detector
03/31/2004CN2608978Y Remote measuring remote reading surface type nucleo moisture density gage
03/31/2004CN1485611A Backscattering type X-ray scanner
03/31/2004CN1485610A Electronic apparatus and method of switching connection destination of the same
03/31/2004CN1144237C Integral lens for high energy particle flow, method for producing such lenses and use thereof
03/31/2004CN1144039C Radiation imaging method and device with single radiation source and dual scans
03/30/2004US6714289 Semiconductor device inspecting apparatus
03/30/2004US6713761 Scanning electron microscope
03/30/2004US6713760 Analysis of semiconductor surfaces by secondary ion mass spectrometry and methods
03/30/2004US6713759 Apparatus and method for secondary electron emission microscope
03/30/2004CA2130899C Analysis of drilling fluids
03/26/2004CA2442171A1 Arrangement for determining the spectral reflectivity of a measurment object
03/25/2004WO2004025285A1 Comparison of a rutherford back scattering signal with a particle induce x-ray emission signal
03/25/2004WO2003063233A3 Systems and methods for closed loop defect reduction
03/25/2004WO2003055338A3 Device and system for measuring the properties of multi-segmented filters and corresponding method
03/25/2004US20040058513 Method of implanting a substrate and an ion implanter for performing the method
03/25/2004US20040057554 Radiation sources and compact radiation scanning systems
03/25/2004US20040057551 Multi-view x-ray imaging of logs
03/25/2004US20040057042 Inspection system for limited access spaces
03/25/2004US20040056194 Method for manipulating microscopic particles and analyzing
03/25/2004US20040056193 Applications operating with beams of charged particles
03/25/2004DE19926056B4 Einrichtung zur Analyse atomarer und/oder molekularer Elemente mittels wellenlängendispersiver, röntgenspektrometrischer Einrichtungen Means for analyzing atomic and / or molecular elements by wavelength, röntgenspektrometrischer facilities
03/25/2004DE19738409B4 Vorrichtung zur wellenlängen-dispersiven Analyse von Fluoreszenzstrahlung An apparatus for wavelength-dispersive analysis of fluorescence radiation
03/25/2004DE10243074A1 Verfahren und Vorrichtung zur Polarisationsanalyse bei Streuexperimenten mit Neutronen Method and apparatus for polarization analysis with neutron scattering experiments with
03/24/2004EP1400157A2 Device for the examination of samples by means of x-rays
03/24/2004EP1399306A1 Device and method for determining the orientation of a crystallographic plane in relation to a crystal surface and device for cutting a single crystal in a cutting machine
03/24/2004EP0975953B1 Device for inspecting test objects and the use thereof
03/24/2004EP0894264B1 X-ray spectrometer with an analyzer crystal having a partly variable and a partly constant radius of curvature
03/24/2004CN1484018A Long distance ray board for transmitting Qigong
03/23/2004US6711282 Method for automatically segmenting a target bone from a digital image
03/23/2004US6711236 Aperture position adjusting mechanism, gantry apparatus and method of controlling it in X-ray CT system
03/23/2004US6711235 X-ray inspection apparatus and method
03/23/2004US6711234 X-ray fluorescence apparatus
03/23/2004US6711232 X-ray reflectivity measurement
03/23/2004US6710342 Method and apparatus for scanning semiconductor wafers using a scanning electron microscope
03/23/2004US6710341 Electron microscope equipped with X-ray spectrometer
03/23/2004US6710339 Scanning probe microscope
03/18/2004WO2004023495A1 Method and apparatus for detecting boron in x-ray fluorescence spectroscopy
03/18/2004WO2004023123A1 Anti-scattering x-ray shielding for ct scanners
03/18/2004WO2004008969A3 Methods and apparatus for motion compensation in image reconstruction
03/18/2004WO2004008127A3 Device and method for generation of a defined environment for particulate samples