| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 06/24/2004 | WO2004008188A3 System and method for examination of microarrays using scanning electron microscope |
| 06/24/2004 | US20040121497 Voltage contrast test structure |
| 06/24/2004 | US20040120566 Compact storage of projection matrix for tomography using separable operators |
| 06/24/2004 | US20040120564 Systems and methods for tomographic reconstruction of images in compressed format |
| 06/24/2004 | US20040120459 Industrial machine vision system having a direct conversion X-ray detector |
| 06/24/2004 | US20040120455 Method and apparatus for detecting radiation |
| 06/24/2004 | US20040120454 Folded array CT baggage scanner |
| 06/24/2004 | US20040120449 Method and apparatus for generating temporally interpolated projections |
| 06/24/2004 | US20040119023 Electron beam apparatus and a device manufacturing method by using said electron beam apparatus |
| 06/24/2004 | DE10121998B4 Anordnung zur tomographischen Bildrekonstruktion Arrangement for tomographic image reconstruction |
| 06/24/2004 | CA2507056A1 Humidified imaging with an environmental scanning electron microscope |
| 06/23/2004 | EP1430514A2 Method of examining a wafer of semiconductor material by means of x-rays |
| 06/23/2004 | CN2621292Y Special specimen stage for prepared spore-pollen specimen used in scanning electron microscopic |
| 06/23/2004 | CN1506802A System and method for classification of cost efficiency to detected objects |
| 06/22/2004 | US6754586 Apparatus and methods for monitoring output from pulsed neutron sources |
| 06/22/2004 | US6754306 Portable medical digital radiography assembly |
| 06/22/2004 | US6754305 Measurement of thin films and barrier layers on patterned wafers with X-ray reflectometry |
| 06/22/2004 | US6754304 Method for obtaining a picture of the internal structure of an object using x-ray radiation and device for the implementation thereof |
| 06/22/2004 | US6753873 Shared memory control between detector framing node and processor |
| 06/22/2004 | US6753524 Inspection system and inspection process for wafer with circuit using charged-particle beam |
| 06/22/2004 | US6753416 Modifications of the VEGF receptor-2 protein and methods of use |
| 06/20/2004 | CA2452733A1 Apparatus and method for treating substances with electromagnetic wave energy |
| 06/17/2004 | WO2004052059A2 Methods for identification and verification using vacuum xrf system |
| 06/17/2004 | WO2004051696A2 One dimensional beam blanker array |
| 06/17/2004 | WO2004051565A2 Optical tomography of small objects using parallel ray illumination and post-specimen optical magnification |
| 06/17/2004 | WO2004051564A2 Method and apparatus for three-dimensional imaging in the fourier domain |
| 06/17/2004 | WO2004051311A2 Radiation scanning units including a movable platform |
| 06/17/2004 | WO2004051222A2 Methods for the identification of agents for the treatment of seizures, neurological diseases, endocrinopathies and hormonal diseases |
| 06/17/2004 | US20040114788 Sample observation method and transmission electron microscope |
| 06/17/2004 | US20040114726 Method for Calibrating bone mineral density index variation and recording medium for storing program for executing the same |
| 06/17/2004 | US20040114716 Remote sensing device to detect materials of varying atomic numbers |
| 06/17/2004 | US20040114715 Substance hardness measuring instrument, biological tissue hardness measuring instrument, and recording medium for outputting hardness data on substance when data is inputted to it |
| 06/17/2004 | US20040114713 X-ray laminography system having a pitch, roll and Z-motion positioning system |
| 06/17/2004 | US20040114712 Nonplanar x-ray target anode for use in a laminography imaging system |
| 06/17/2004 | US20040114710 X-ray CT apparatus |
| 06/17/2004 | US20040114709 Ray tracing kernel |
| 06/17/2004 | US20040114708 Method for imaging in the computer tomography of a periodically moved object to be examined and CT device for carrying out the method |
| 06/17/2004 | US20040114707 Method of creating images in computed tomography (CT), and CT device |
| 06/17/2004 | US20040113107 Image data collecting device for analysis of material structure |
| 06/17/2004 | US20040113091 Measuring the moisture content of plutonium oxide canisters |
| 06/17/2004 | DE10338742A1 Verfahren und Vorrichtung zum Kalibrieren eines Röntgenstrahl- Laminographiebilderzeugungssystems Method and device for calibrating an X-ray Laminographiebilderzeugungssystems |
| 06/17/2004 | DE10217513B4 Verfahren und Vorrichtung zur Analyse von verdeckten, oberflächennahen Schichten mittels Photoelektronen-Spektrometrie Method and apparatus for analyzing hidden, near-surface layers by means of photoelectron spectrometry |
| 06/17/2004 | CA2507734A1 One dimensional beam blanker array |
| 06/17/2004 | CA2504620A1 Method and apparatus for three-dimensional imaging in the fourier domain |
| 06/16/2004 | EP1429181A1 Image recording and read-out device for analyzing diffraction patterns using a plurality of recording sheets positioned on an endless belt |
| 06/16/2004 | EP1429158A2 Device and method for inspection of baggage and other objects |
| 06/16/2004 | EP1429138A1 NONDESTRUCTIVE ANALYSIS METHOD AND NONDESTRUCTIVE ANALYSIS DEVICE AND SPECIFIC OBJECT BY THE METHOD/DEVICE |
| 06/16/2004 | EP1428048A2 Nautical x-ray inspection system |
| 06/16/2004 | EP1428006A2 Method and apparatus for scanned instrument calibration |
| 06/16/2004 | EP1102980B1 Sample changer for transferring radioactive samples between a hot cell and a measuring apparatus |
| 06/16/2004 | CN1504744A Method and apparatus for measuring and analyzing structure and component of combined sample |
| 06/16/2004 | CN1504169A Beam hardening post-processing method and x-ray ct apparatus |
| 06/16/2004 | CN1153951C Method and apparatus for determining the position of elongated object relative the surface of obstructing body by means of electromagnetic radiation |
| 06/15/2004 | US6751294 Prevention of parametic or functional changes to silicon semiconductor device properties during x-ray inspection |
| 06/15/2004 | US6751288 Small angle x-ray scattering detector |
| 06/15/2004 | US6751287 Method and apparatus for x-ray analysis of particle size (XAPS) |
| 06/15/2004 | US6751286 Computed-tomography system with filtering |
| 06/15/2004 | US6750451 Observation apparatus and observation method using an electron beam |
| 06/15/2004 | US6750447 Calibration standard for high resolution electron microscopy |
| 06/15/2004 | US6750064 Detecting sampling in capillary tube; solidification; analyzing, classification |
| 06/15/2004 | US6748806 Dynamic balancing system for computed tomography gantry |
| 06/10/2004 | WO2004049456A1 Small area pixel electrode direct planar x-ray detector |
| 06/10/2004 | WO2004049256A2 Ray tracing kernel calibration |
| 06/10/2004 | WO2004048950A1 Optical inspection system and radiation source for use therein |
| 06/10/2004 | WO2004036174A3 Double crystal analyzer linkage |
| 06/10/2004 | WO2003067770A3 Method and apparatus for transmitting information about a target object between a prescanner and a ct scanner |
| 06/10/2004 | US20040109534 Fluorescent X-ray analysis apparatus |
| 06/10/2004 | US20040109533 High quantum efficiency x-ray detector for portal imaging |
| 06/10/2004 | US20040109532 Radiation scanning units including a movable platform |
| 06/10/2004 | US20040109531 Beam centering and angle calibration for X-ray reflectometry |
| 06/10/2004 | US20040109528 Beam hardening post-processing method and X-ray CT apparatus |
| 06/10/2004 | US20040108459 Electron microscope, method for operating the same, and computer-readable medium |
| 06/10/2004 | US20040108458 Focused ion beam system with coaxial scanning electron microscope |
| 06/10/2004 | US20040108059 System and method for removal of materials from an article |
| 06/09/2004 | DE10353197A1 Verfahren und Einrichtung zum Korrigieren eines Artefakt durch ein gehaltenes Bild Method and apparatus for correcting an artifact by a held image |
| 06/09/2004 | CN2620273Y Marking device for nondestructive tester |
| 06/09/2004 | CN1503004A Small area pixel electrode direct plane plate x-ray detector |
| 06/09/2004 | CN1153059C 微波共振器外壳 Microwave resonator case |
| 06/08/2004 | US6748345 Method of analyzing crystalline texture |
| 06/08/2004 | US6748048 Attachment of x-ray apparatus, high temperature attachment and x-ray apparatus |
| 06/08/2004 | US6748047 Scatter correction method for non-stationary X-ray acquisitions |
| 06/08/2004 | US6748046 Off-center tomosynthesis |
| 06/08/2004 | US6748043 Method and apparatus for stabilizing the measurement of CT numbers |
| 06/08/2004 | US6747739 Observing techniques and its evaluation equipments of filler packing-structure for resin polymer composite filled with ceramic filler-powder |
| 06/08/2004 | US6747697 Method and apparatus for digital image defect correction and noise filtering |
| 06/03/2004 | WO2004046703A1 An x-ray technique-based nonintrusive inspection apparatus |
| 06/03/2004 | WO2004012208A3 Soller slit using low density materials |
| 06/03/2004 | WO2003073481A3 Feedforward and feedback control of semiconductor fabrication process using secondary electron microscopy and a focused ion beam system |
| 06/03/2004 | US20040106862 Electron beam apparatus, and inspection instrument and inspection process thereof |
| 06/03/2004 | US20040105578 Pattern inspection apparatus |
| 06/03/2004 | US20040105160 Particle-optical apparatus, electron microscopy system and electron lithography system |
| 06/03/2004 | US20040104362 Image recording medium having suppression layer for suppressing interfacial crystallization |
| 06/03/2004 | US20040104357 Electron beam exposure apparatus, electron beam exposing method, semiconductor element manufacturing method, and pattern error detection method |
| 06/03/2004 | US20040104354 Device and method for adapting the size of an ion beam spot in the domain of tumor irradiation |
| 06/03/2004 | US20040104353 One dimensional beam blanker array |
| 06/03/2004 | DE19954662B4 Vorrichtung und Verfahren zum Detektieren von unzulässigen Reisegepäckgegenständen Apparatus and method for detecting improper luggage articles |
| 06/03/2004 | DE10253724A1 Electronic semiconductor component material sample condition monitoring procedure for use in grinding uses continuous X-ray monitoring of the working zone |
| 06/03/2004 | DE10250893A1 Verfahren und Vorrichtung zum Bestimmen der Abmessung eines Strukturelements durch Variieren eines die Auflösung bestimmenden Parameters Method and apparatus for determining the dimension of a structural element by varying a parameter determining the resolution |
| 06/02/2004 | EP1424721A2 Sample observation method and transmission electron microscope |
| 06/02/2004 | EP1424552A1 A container inspection system using cobalt 60 gamma ray source and cesium iodide or cadmium tungstate array detector |