Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
09/2004
09/29/2004EP1462054A2 Radiographic apparatus
09/29/2004EP1044457B1 X-ray irradiation apparatus including an x-ray source provided with a capillary optical system
09/29/2004CN2645079Y Backscattering X-ray scanner
09/29/2004CN1532628A Radioative ray camera
09/29/2004CN1532536A Composite analyzer
09/29/2004CN1169000C Multiple angle pre-screening tomographic x-ray systems and methods
09/29/2004CN1168981C High-resolution eectroacoustic imaging detecting system
09/29/2004CN1168975C Non-destructive X-ray inspection apparatus for food industry
09/29/2004CN1168959C Dished liquid and soft matter shear wave resonant absorption instrument
09/28/2004US6798863 Combined x-ray analysis apparatus
09/28/2004US6798861 Computer tomography apparatus and method
09/28/2004US6797965 Charged particle beam apparatus, pattern measuring method, and pattern drawing method
09/28/2004US6797960 Self triggered imaging device for imaging radiation
09/28/2004US6797954 Patterned wafer inspection method and apparatus therefor
09/28/2004CA2349956C System for assessing metal deterioration on maritime vessels
09/23/2004WO2004081877A1 Motion-corrected three-dimensional volume imaging method
09/23/2004WO2004081551A1 A method and an apparatus for detecting water on a ship’s deck
09/23/2004US20040184956 alanine is uniformly dispersed in a solvent-soluble binder to form a coating solution on a flexible plastic support bearing an electrically conducting layer
09/23/2004US20040184955 Moisture resistant dosimeter
09/23/2004US20040184652 Pattern inspecting method and pattern inspecting apparatus
09/23/2004US20040184580 X-ray diffraction system and method
09/23/2004US20040184576 Precise x-ray inspection system utilizing multiple linear sensors
09/23/2004US20040184575 Method and device for the determination of the thickness of the insulation of a flat ribbon cable in the region of the conductor paths
09/23/2004US20040184574 Method and apparatus for generating a density map using dual-energy CT
09/23/2004US20040183016 Scanning electron microscope and sample observation method using the same
09/23/2004US20040183015 Methods for measuring dimensions of minute structures and apparatus for performing the same
09/23/2004US20040183014 Scanning electron microscope
09/23/2004US20040183013 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
09/23/2004US20040183012 Material characterization system
09/23/2004US20040183005 Method of mass spectrometry, to enhance separation of ions with different charges
09/23/2004DE19833524B4 Röntgen-Analysegerät mit Gradienten-Vielfachschicht-Spiegel X-ray analyzer with gradient multilayer mirror
09/23/2004DE102004009990A1 CT-Detektor mit integriertem Luftspalt CT detector with integrated air gap
09/23/2004CA2519077A1 A method and an apparatus for detecting water on a ship's deck
09/22/2004EP1459056A1 A method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum
09/22/2004EP0746869B1 Method and apparatus for electron beam focusing adjustment in a scanning electron beam computed tomography scanner
09/22/2004CN1530645A X-ray diagnostic apparatus for operating directional filter by image computer
09/22/2004CN1530644A Radiographic detector
09/22/2004CN1530075A CT apparatus with radiating system
09/22/2004CN1167604C Scanning movement device for tower fault detection
09/21/2004US6795571 System and method for generating an image dataset
09/21/2004US6794663 Method and apparatus for specimen fabrication
09/21/2004US6794648 Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method
09/21/2004US6794146 Modifications of the VEGF receptor-2 protein and methods of use
09/16/2004WO2004080130A2 Scanning-based detection of ionizing radiation
09/16/2004WO2004079771A2 Three-dimensional imaging of the chemical surface compositions of objects
09/16/2004WO2004079752A2 Systems and methods for controlling an x-ray source
09/16/2004WO2004079394A2 Method and apparatus for evaluating materials using prompt gamma ray analysis
09/16/2004WO2004079361A1 Quantitative nondestructive evaluation method for cracking
09/16/2004WO2004079344A1 Information acquisition method and apparatus for information acquisition
09/16/2004WO2004078043A1 Method and imaging system for imaging the spatial distribution of an x-ray fluorescence marker
09/16/2004US20040179647 Contain inspection system using cobalt-60 gamma-ray source and cesium iodide or cadmium tungstate array detector
09/16/2004US20040177700 Stress measurement method using X-ray diffraction
09/16/2004DE19820861B4 Simultanes Röntgenfluoreszenz-Spektrometer Simultaneous X-ray fluorescence spectrometer
09/16/2004DE19820321B4 Kompaktes Röntgenspektrometer Compact X-ray spectrometer
09/16/2004DE10309166A1 X-ray diagnostic device, filters individual x-ray images along edges detected by interpolator, variance measuring device, and minimum variance determining device
09/16/2004DE10308641A1 Verfahren zur Aufbereitung vorhandener zeit-/phasenabhängiger Primärdatensätze eines Computertomographen von einem sich bewegenden Objekt zu einer dreidimensionalen Bildserie A method for processing available time / phase-dependent primary data sets of a computer tomograph of a moving object in a three-dimensional image series
09/16/2004DE10307356A1 Verfahren und Vorrichtung zur Bestimmung der Dicke der Isolation eines Flachkabels in Bereichen der metallischen Leiterbahnen Method and apparatus for determining the thickness of the insulation of a flat cable in areas of the metallic conductor paths
09/16/2004CA2517786A1 Quantitative nondestructive evaluation method for cracking
09/16/2004CA2511097A1 Scanning-based detection of ionizing radiation
09/15/2004EP1282425A4 Crystal structures of p-selectin, p- and e-selectin complexes, and uses thereof
09/15/2004EP1057203B1 Particle-optical apparatus involving detection of auger electrons
09/15/2004EP0861446B1 X-ray imaging apparatus and method using a flat amorphous silicon imaging panel
09/15/2004CN1529827A Generation of library of periodic grating diffraction signals
09/15/2004CN1529647A Device and method for determining orintation of crystallographic plane in relation to crystal surface and device for cutting single crystal in cutting machine
09/15/2004CN1166935C Sample preparing apparatus for glancing emitted X-ray fluorescent sanalysis
09/14/2004US6792075 Method and apparatus for thin film thickness mapping
09/14/2004US6792071 Method of performing geometric measurements on digital radiological images
09/14/2004US6792070 Radiation image recording method and apparatus
09/14/2004US6792069 Apparatus for inspecting a heat exchanger tube and group of heat exchanger tubes
09/14/2004US6792068 Computed tomography device with a multi-line detector system
09/14/2004US6792066 Method and control device for controlling a tomogram acquisition device
09/14/2004US6791089 PINS chemical identification software
09/14/2004US6791075 Method of spectrum analysis in two-dimensional representation
09/14/2004US6789428 Method and apparatus for evaluating damage of metal material
09/10/2004WO2004077361A1 Method for processing available time/phase-dependent primary data sets of a computer tomograph of a displaced object to form a three-dimensional image sequence
09/10/2004WO2004077096A2 Handheld isotope identification system
09/10/2004WO2004077023A2 High-throughput structure and electron density determination
09/10/2004WO2004052059A3 Methods for identification and verification using vacuum xrf system
09/09/2004US20040175839 kit includes at least two compounds of different molecular mass, one above, one below and both close to the expected molecular mass of the material whose exact mass is to be measured; calibration curve is not linear
09/09/2004US20040175018 Information barrier for protection of personal information
09/09/2004US20040174959 X-ray diffraction-based scanning system
09/09/2004US20040174955 Apparatus and method for generating high-order harmonic X-ray, and point-diffraction interferometer using high-order harmonic X-ray
09/09/2004US20040174952 Scintillator array having a reflector with integrated air gaps
09/09/2004US20040174951 Ct detector with integrated air gap
09/09/2004US20040174950 Imaging system including scintillation conversion screen
09/09/2004US20040174947 Scanning-based detection of ionizing radiation
09/09/2004US20040174182 Apparatus and method for testing pixels arranged in a matrix array
09/09/2004US20040173757 Halation-prevention filter, image analysis device equipped with said halation-prevention filter, and diffraction pattern intensity analysis method and diffraction pattern intensity correction program that use said halation-prevention filter
09/09/2004US20040173756 Halation-prevention filter, image analysis device equipped with said halation-prevention filter, and diffraction pattern intensity analysis method and diffraction pattern intensity correction program that use said halation-prevention filter
09/09/2004US20040173749 Method and device for observing a specimen in a field of view of an electron microscope
09/09/2004US20040173748 Method of measuring the performance of a scanning electron microscope
09/09/2004US20040173746 Method and system for use in the monitoring of samples with a charged particles beam
09/09/2004US20040173745 Defect evaluation apparatus utilizing positrons
09/09/2004US20040173016 Tool holder for measurement means
09/09/2004DE10327036A1 Method for correcting sensitivity of X-ray store florescent layer, involves sequential radiation of incident surface with specified homogenous light intensity
09/09/2004DE10307423A1 Quality control of strongly ionized crystals, whereby high energy radiation is used to generated electron-hole pairs in the crystal and the corresponding absorption spectrum measured
09/08/2004EP1455378A1 Sample imaging method and charged particle beam system
09/08/2004EP1454513A2 X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
09/08/2004EP1454335A1 Measurement device for electron microscope
09/08/2004EP1454165A2 System and method for irradiating a sample