| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 09/08/2004 | EP1287341B1 X-ray inspection method for food containers |
| 09/08/2004 | CN1527048A X-ray induced photoelectronic phase contrast imaging device |
| 09/08/2004 | CN1527047A 原子束相衬成像装置 Atomic beam phase contrast imaging device |
| 09/08/2004 | CN1526361A CT detector with integral air gap |
| 09/08/2004 | CN1526360A X-ray diagnostic apparatus and X-ray photographic method |
| 09/07/2004 | US6788761 Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner |
| 09/07/2004 | US6788760 Methods and apparatus for characterizing thin films |
| 09/07/2004 | US6787773 Film thickness measurement using electron-beam induced x-ray microanalysis |
| 09/07/2004 | US6787770 Method of inspecting holes using charged-particle beam |
| 09/02/2004 | WO2004074824A2 A method to determine the three-dimensional atomic structure of molecules having an unknown structure by x-ray diffraction at a two dimensional array of the molecules on the surface of known molecular crystal |
| 09/02/2004 | WO2004073655A2 Radiation phantom |
| 09/02/2004 | US20040171074 Structures of substrate binding pockets of SCF complexes |
| 09/02/2004 | US20040170249 Method and apparatus for thin film thickness mapping |
| 09/02/2004 | US20040170248 Method and system for reconstructing an image from projection data acquired by a cone beam computed tomography system |
| 09/02/2004 | US20040169143 Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method |
| 09/02/2004 | US20040169142 Method for analyzing organic material per microscopic area, and device for analysis per microscopic area |
| 09/02/2004 | US20040168682 Device and method for determining the orientation of a crystallographic plane in relation to a crystal surface and device for cutting a single crystal in a cutting machine |
| 09/01/2004 | EP1452890A2 Device and method for inspection of baggage and other objects |
| 09/01/2004 | EP1451564A1 X-ray topographic system |
| 09/01/2004 | EP1451563A1 Phase-contrast enhanced computed tomography |
| 09/01/2004 | EP1450690A1 Motion correction for perfusion measurements |
| 09/01/2004 | CN2638066Y Hydraulic pump under well storage type water ratio tester |
| 09/01/2004 | CN2638060Y Garma ray radiation source device used for vehicle load container-detection system |
| 09/01/2004 | CN1525161A Design method for molecular beam mass spectrum diagnosis apparatus |
| 09/01/2004 | CN1165206C Three-dimensional image construction method using X-ray device |
| 09/01/2004 | CN1165051C Electroacoustic signal detector with complex structure |
| 09/01/2004 | CN1164928C Non-destructive detecting method and equipment for X-or gamma-radiation imaging |
| 09/01/2004 | CN1164923C Neutron microscope |
| 09/01/2004 | CN1164450C High-safety Co-60 radiating interlock method and system for inspecting radiation of goods train |
| 08/31/2004 | US6785615 Method and structure for detection of electromechanical problems using variance statistics in an E-beam lithography device |
| 08/31/2004 | US6785357 High energy X-ray mobile cargo inspection system with penumbra collimator |
| 08/31/2004 | US6785356 Fluoroscopic computed tomography method |
| 08/31/2004 | US6784426 Electron beam irradiation apparatus, electron beam exposure apparatus, and defect detection method |
| 08/31/2004 | US6784425 Energy filter multiplexing |
| 08/31/2004 | US6784285 Kinases; for making angiogenisis inhibitors; drug screening |
| 08/31/2004 | CA2244040C Method for diagnosis of components inside turbine generator |
| 08/26/2004 | WO2004072631A2 A method for measuring and reducing angular deviations of a charged particle beam |
| 08/26/2004 | WO2004071299A1 X-ray detector |
| 08/26/2004 | WO2004071298A1 Apparatus and method to obtain phase contrast x-ray images |
| 08/26/2004 | WO2004053920A8 Humidified imaging with an environmental scanning electron microscope |
| 08/26/2004 | WO2004038365A9 Imaging apparatus and method with event sensitive photon detection |
| 08/26/2004 | US20040167744 Measuring method for pattern-dots of light guide plate |
| 08/26/2004 | US20040165760 Non-destructive inspection of downhole equipment |
| 08/26/2004 | US20040165698 Method to determine the three-dimensional atomic structure of molecules |
| 08/26/2004 | US20040165697 X-ray diffraction apparatus and method |
| 08/26/2004 | US20040165695 Helical interpolation for an asymmetric multi-slice scanner |
| 08/26/2004 | US20040164742 Method and device for testing the quality of printed circuits |
| 08/26/2004 | US20040164250 Handheld isotope identification system |
| 08/26/2004 | US20040164245 Scanning electron microscope with measurement function |
| 08/26/2004 | US20040164243 Shape measurement method and apparatus |
| 08/26/2004 | DE10307752A1 Digital X-ray detector, e.g. for use in mammography or angiography, has an array of pixels and sub-pixels with each sub-pixel corresponding to an element of detector material with signals processed together to form pixel signals |
| 08/26/2004 | DE10306665A1 Determination of osmium compounds in product mixture, especially from catalytic reaction, involves dissolution in neutral or alkaline solution, extraction with organic polymer and x-ray fluorescence analysis of charged polymer |
| 08/26/2004 | DE10305105A1 Calibration of a transformation of X-ray absorption values obtained using at least two different X-ray spectra into thickness and atomic number values using calibration samples of known thickness and atomic number |
| 08/25/2004 | EP1450154A2 Non destructive x-ray inspection apparatus for food industry |
| 08/25/2004 | EP1450127A2 Method and device to measure the thickness of the isolation in flat cables |
| 08/25/2004 | EP1449630A1 Coated resin sorting method and apparatus |
| 08/25/2004 | EP1448980A2 Method and apparatus for neutron microscopy with stoichiometric imaging |
| 08/25/2004 | EP1448979A1 Bulk material analyser and method of assembly |
| 08/25/2004 | EP0852718B1 Container fill level and pressurization inspection using multi-dimensional images |
| 08/25/2004 | CN2636385Y X-ray beryllium glass window device |
| 08/25/2004 | CN1523322A Method and device for the determination of the thickness of the insulation of a flat ribbon cable in the region of the conductor paths |
| 08/25/2004 | CN1163740C Contact macroradiography characterization of doped optical fibers |
| 08/25/2004 | CN1163739C Method for detecting single microparticle of sulfate and nitrate |
| 08/25/2004 | CA2458549A1 Non-destructive inspection of downhole equipment |
| 08/24/2004 | US6782342 Spectroscopy instrument using broadband modulation and statistical estimation techniques to account for component artifacts |
| 08/24/2004 | US6782076 X-ray topographic system |
| 08/24/2004 | US6782075 Method of making <200 nm wavelength fluoride crystal lithography/laser optical elements |
| 08/24/2004 | US6782074 Optical member for photolithography and method for evaluating the same |
| 08/24/2004 | US6782072 Method of analyzing composition depth profile of solid surface layer |
| 08/24/2004 | US6781126 Auger-based thin film metrology |
| 08/24/2004 | US6781125 Method and apparatus for processing a micro sample |
| 08/24/2004 | US6781120 Fabrication of chopper for particle beam instrument |
| 08/24/2004 | US6781060 Electrical connector, a cable sleeve, and a method for fabricating an electrical connection |
| 08/19/2004 | WO2004070828A1 Method for inspection, process for making analytic piece, method for analysis, analyzer, process for producing soi wafer, and soi wafer |
| 08/19/2004 | WO2004069758A1 Flux for producing beads for x-fluorescent analysis and method for producing said flux |
| 08/19/2004 | WO2004069053A1 Dual function ct scan |
| 08/19/2004 | WO2004031809A3 Optical tomography of small moving objects using time delay and integration imaging |
| 08/19/2004 | US20040159786 Method of fabricating probe for scanning probe microscope |
| 08/18/2004 | EP1447659A2 A nuclear gauge for measuring a characteristic of a sheet material with sheet position and alignment compensation |
| 08/18/2004 | EP1447046A1 Apparatus and method to obtain phase contrast x-ray images |
| 08/18/2004 | EP1446659A2 Systems and methods for the generation of crystalline polymorphs |
| 08/18/2004 | EP1446658A2 X-ray grading apparatus and process |
| 08/18/2004 | EP1446657A2 Spot grid array imaging system |
| 08/18/2004 | CN1520781A X-ray diagnosis apparatus and method for getting x-ray image |
| 08/17/2004 | US6778944 Method and system for managing data |
| 08/17/2004 | US6778681 Analysis and presentation of internal features of logs |
| 08/17/2004 | US6777679 Method of observing a sample by a transmission electron microscope |
| 08/17/2004 | US6777677 Method of inspecting pattern and inspecting instrument |
| 08/17/2004 | US6777676 X-ray scanning |
| 08/17/2004 | US6777674 Method for manipulating microscopic particles and analyzing |
| 08/17/2004 | US6777238 Dual use corrosion inhibitor and penetrant for anomaly detection in neutron/X radiography |
| 08/17/2004 | US6776526 Method for navigation-calibrating x-ray image data and a height-reduced calibration instrument |
| 08/12/2004 | WO2004068915A2 Snapshot backscatter radiography system and method |
| 08/12/2004 | WO2004068529A2 Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample |
| 08/12/2004 | WO2004067724A2 Methods of identifying and designing cell surface receptor inhibitors |
| 08/12/2004 | WO2003043498A8 Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector |
| 08/12/2004 | US20040156474 X-ray reflectometry with small-angle scattering measurement |
| 08/12/2004 | US20040156471 Apparatus and method for X-ray analysis |
| 08/12/2004 | US20040156470 Arrangement for the determination by measurement of a projection of the radiation absorption capacity of a periodically-variable measured object |
| 08/12/2004 | US20040155208 Method of selecting pattern to be measured, pattern inspection method, manufacturing method of semiconductor device, program, and pattern inspection apparatus |