Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
10/2004
10/21/2004US20040208275 X-ray computed tomography apparatus
10/21/2004US20040207415 Semiconductor device tester
10/21/2004US20040206908 Primary beam stop
10/21/2004US20040206803 Combinatiorial production of material compositions from a single sample
10/21/2004DE10313116A1 Verfahren und Vorrichtung zur Bestimmung des Feststoffgehalts einer Suspension Method and apparatus for determining the solids content of a suspension
10/21/2004CA2521138A1 System and method for detection of explosives in baggage
10/20/2004EP1469308A1 Method of screening drug
10/20/2004EP1469306A1 Inspection device using scanning electron microscope
10/20/2004EP1469305A1 X-ray diffractometer for screening of a combinatiorial library
10/20/2004EP1469304A2 X-ray optical system with wobble-device
10/20/2004EP1469303A1 Beam stop for x-rays or neutron rays, which is translatable along the optical axis
10/20/2004EP1469302A1 Method of fast simulation and fitting of x-ray specta from superlattices
10/20/2004EP1469090A2 Combinatorial production by diffusion of material compositions from a single sample
10/20/2004EP1468650A1 X-ray CT system and method with beam-hardening correction
10/20/2004EP1468428A1 Optical unit and associated method
10/20/2004EP1468276A2 X-ray diffraction method
10/20/2004CN1538461A X-ray equipment and method for generating surface image
10/20/2004CN1538166A Comprehensive detecting method for quality of well cementation
10/20/2004CN1537513A X射线计算层析成像设备 X-ray computed tomography apparatus
10/20/2004CN1172178C Method for testing flavone of acanthopanax leaf
10/19/2004US6807251 X-ray diffraction apparatus
10/19/2004US6806486 Radiation image read-out method and apparatus
10/19/2004US6806093 Process of parallel sample preparation
10/14/2004WO2004088296K1 X-ray fluorescence analyzer
10/14/2004WO2004088296A1 Fluorescent x-ray analyzer
10/14/2004WO2004088288A1 Method for analyzing impurities (color centers) of fluoride and process for producing material for growing single crystal
10/14/2004WO2004051696A3 One dimensional beam blanker array
10/14/2004US20040205036 Optimization on lie manifolds
10/14/2004US20040204388 incubating SV2 protein or fragment with levetiracetam or an analog or derivative thereof and a potential binding partner and determining if the potential binding partner modulates the binding of levetiracetam to the SV2 protein
10/14/2004US20040202277 X-ray computed tomographic apparatus
10/14/2004US20040201839 Sample positioning system to improve edge measurements
10/14/2004US20040200971 Method for creating a contiguous image using multiple X-ray imagers
10/14/2004US20040200960 High contrast inspection and review of magnetic media and heads
10/14/2004DE19629251B4 Verfahren zum Herstellen von Proben zur Analyse von Defekten von Halbleitereinrichtungen A method of producing samples for the analysis of defects of semiconductor devices
10/14/2004DE10351741A1 Präzises Röntgenüberprüfungssystem, das mehrere lineare Sensoren benutzt Precise X-ray inspection system using multiple linear sensors
10/14/2004DE10310518A1 Dreidimensionale Abbildung der chemischen Oberflächenzusammensetzung von Objekten Three-dimensional imaging of the surface chemical composition of objects
10/13/2004EP1467226A1 Method for creating a contiguous image using multiple x-ray imagers
10/13/2004EP1466166A1 Method for performing powder diffraction analysis
10/13/2004EP1144988B1 Device for the precision rotation of samples
10/13/2004EP0818131B1 Simplified conditions and configurations for phase-contrast imaging with hard x-rays
10/13/2004CN1536533A Metod and equipment for image reconstrction and x-ray calculation tomography imaging device
10/13/2004CN1536345A Scanning electronic microscope standard substance and its making method
10/13/2004CN1535658A X ray calculating fault photographic equipment
10/12/2004US6803595 Solid sensor
10/12/2004US6803583 Scintillator for electron microscope and method of making
10/12/2004US6803582 One dimensional beam blanker array
10/12/2004US6803573 Scanning electron microscope
10/12/2004US6803572 Apparatus and methods for secondary electron emission microscope with dual beam
10/12/2004US6803571 Method and apparatus for dual-energy e-beam inspector
10/12/2004US6802991 Method for preparing a CsX photostimulable phosphor and phosphor screens therefrom
10/12/2004CA2138503C Method and apparatus for the classification of particulate matter
10/07/2004WO2004086018A1 X-ray fluorescence analyzer
10/07/2004WO2004086017A1 X-ray imaging device
10/07/2004WO2004086006A1 Method and device for determining the solid content in a suspension
10/07/2004WO2004038395A3 Method and apparatus for in situ depositing of neutral cs under ultra-high vacuum to analytical ends
10/07/2004WO2004018959A3 Method and apparatus for thin film thickness mapping
10/07/2004US20040196957 Nondestructive analysis method and nondestructive analysis device and specific object by the method/device
10/07/2004US20040196956 Golf ball inspection using metal markers
10/07/2004US20040196955 X-ray computed tomography apparatus with heat emission system
10/07/2004US20040195528 Ion beam incident angle detector for ion implant systems
10/07/2004US20040195512 Method and apparatus for anatomical and functional medical imaging
10/07/2004US20040195498 Non-uniform density sample analyzing method, device and system
10/07/2004DE10312450A1 Image distortion compensation device for a radiation, especially X-ray, electronic imaging system, whereby pixel image signals are amplified based on the actual position of the scattered radiation grid relative to the focus
10/06/2004EP1464950A2 Optical device for determining the situation of a diffractometer beam and the situation of a sample in a diffractometer
10/06/2004EP1463971A2 INTEGRATED CRYSTAL MOUNTING AND ALIGNMENT SYSTEM FOR HIGH−THROUGHPUT BIOLOGICAL CRYSTALLOGRAPHY
10/06/2004EP1463932A2 Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector
10/06/2004EP1463930A1 Method and means for correcting measuring instruments
10/06/2004EP1463421A2 Device and system for measuring the properties of multi-segmented filters and corresponding method
10/06/2004EP1198705B1 Method and device for x-raying items, especially items of luggage during conveyance on a conveyor belt
10/06/2004EP1014856A4 X-ray image processing
10/06/2004EP0848885B1 X-ray examination apparatus with a semiconductor x-ray detector
10/06/2004CN2646703Y Microwave cotton humidity measuring transducer
10/06/2004CN2646702Y Off-line type water content analyzing equipment for crude oil
10/06/2004CN2645989Y Trailer equipment used in radiation imaging
10/06/2004CN2645988Y Sloping table for trailer used in radiation imaging system
10/06/2004CN1535099A Cooling system and colling method used for cooling supporter
10/06/2004CN1534289A X射线衍射装置 X-ray diffraction apparatus
10/06/2004CN1170150C Apparatus and method for calibration of nuclear gauges
10/06/2004CN1170135C Method for enriching and detecting aminomercury chloride in cosmetics
10/05/2004USH2110 Automated security scanning process
10/05/2004US6801597 Method and system for creating task-dependent three-dimensional images
10/05/2004US6801596 Methods and apparatus for void characterization
10/05/2004US6801595 X-ray fluorescence combined with laser induced photon spectroscopy
10/05/2004US6800853 Electron microscope and method of photographing TEM images
10/05/2004US6800852 Nondestructive characterization of thin films using measured basis spectra
10/05/2004US6800403 Techniques to characterize iso-dense effects for microdevice manufacture
09/2004
09/30/2004WO2004083895A1 Method and apparatus for fixing location of x-ray incidence to be detected on ccd
09/30/2004WO2004083815A2 X-ray diffraction system and method
09/30/2004WO2004074824A3 A method to determine the three-dimensional atomic structure of molecules having an unknown structure by x-ray diffraction at a two dimensional array of the molecules on the surface of known molecular crystal
09/30/2004US20040191931 Method of implanting a substrate and an ion implanter for performing the method
09/30/2004US20040190681 X-ray diffraction apparatus
09/30/2004US20040190676 Radiological imaging apparatus
09/30/2004US20040190675 X-ray inspection system and method of operating
09/30/2004US20040188626 Radiographic apparatus
09/30/2004US20040188610 Crystal analyzing apparatus capable of three-dimensional crystal analysis
09/30/2004US20040188609 Inspection method and apparatus using an electron beam
09/30/2004CA2519657A1 X-ray diffraction system and method
09/29/2004EP1463088A2 Material characterization system using an electron beam
09/29/2004EP1463085A2 X-ray inspection system and method of operating
09/29/2004EP1462795A2 X-Ray diffractometer for grazing incidence switchable between in-plane and out-of-plane measurements