G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons

Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258)
11/2004
11/10/2004	EP1475750A2 Method and apparatus for image reconstruction and X-Ray CT imaging apparatus
11/10/2004	EP1475649A2 X-ray imaging apparatus and method using a flat amorphous silicon imaging panel
11/10/2004	EP1474033A2 Optical projection imaging system and method for automatically detecting cells having nuclear and cytoplasmic densitometric features associated with disease
11/10/2004	CN2655233Y Portable constant frequency gas insulation X ray industrial flaw detector
11/10/2004	CN2655232Y Sandwich structure pipe for on-line measurement of cigarette density
11/10/2004	CN1175430C High resolution X-ray imaging of extra fine objects
11/10/2004	CN1175265C Recorder of X-ray photoelectronic hologram
11/10/2004	CN1175264C Container inspection adopting single area array type detector and alternative-gating light source
11/10/2004	CN1174903C Device for monitoring lateral broke of steel wire enhanced conveying belt
11/09/2004	US6816791 Assay methods for hydratable cementitious compositions
11/09/2004	US6816573 X-ray generating apparatus, X-ray imaging apparatus, and X-ray inspection system
11/09/2004	US6816571 Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner
11/09/2004	US6816570 Multi-technique thin film analysis tool
11/09/2004	US6816564 Techniques for deriving tissue structure from multiple projection dual-energy x-ray absorptiometry
11/09/2004	US6815688 Devices for guiding and manipulating electron beams
11/09/2004	US6815684 Analytical X-ray apparatus provided with a solid state position sensitive X-ray detector
11/09/2004	US6815676 Material defect evaluation apparatus using positron and its evaluation method
11/09/2004	US6815675 Method and system for e-beam scanning
11/09/2004	US6815127 Scanning through gap in sample capacitor with pulsed, focused beam of radation; measuring photoelectron response; recording signals from radio frequency photoconductor
11/09/2004	US6814848 Method for determining alloy phase in plating layer and method for evaluating sliding property of alloy galvanized steel plate
11/04/2004	WO2004095060A2 X-ray imaging technique
11/04/2004	WO2004094993A2 Sample mounts for microcrystal crystallography
11/04/2004	WO2004068915A3 Snapshot backscatter radiography system and method
11/04/2004	WO2004049256A3 Ray tracing kernel calibration
11/04/2004	US20040219607 Ligand screening and design by X-ray crystallography
11/04/2004	US20040218729 Methods and apparatus for processing a fluoroscopic image
11/04/2004	US20040218728 Calibration of the transformation of spectral X-ray attenuation values in density and atomic number information
11/04/2004	US20040218725 Method and device for cooling and electrically insulating a high-voltage, heat-generating component such as an x-ray tube for analyzing fluid streams
11/04/2004	US20040218717 Calibration and alignment of X-ray reflectometric systems
11/04/2004	US20040218716 Portable imaging system method and apparatus
11/04/2004	US20040218715 Method and apparatus for detecting defects using digital radiography
11/04/2004	US20040218713 Collimator assembly having multi-piece components
11/04/2004	US20040218712 CT detector array having non-pixilated scintillator array
11/04/2004	US20040217297 Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
11/04/2004	US20040217288 Microstructured pattern inspection method
11/04/2004	DE10339404A1 Analysis arrangement for determining the direction of electron spin polarization in an imaging electron microscope has a polarization-sensitive scatter target
11/04/2004	DE10297101T5 Kontrollanlage für Luftfracht oder Fahrzeuge Control system for air cargo or vehicles
11/04/2004	CA2519830A1 Sample mounts for microcrystal crystallography
11/03/2004	EP1472525A1 System and method for adapting a software control in an operating environment
11/03/2004	EP1472524A2 Method and apparatus for transmitting information about a target object between a prescanner and a ct scanner
11/03/2004	EP1472523A1 Method and apparatus for examining absorbent articles
11/03/2004	EP1472522A1 X-ray inspection system and method
11/03/2004	CN1543653A Wavelength dispersive XRF system using focusing optic for excitation and a focusing monochromator for collection
11/03/2004	CN1541621A CT detector array having non-pixilated scintillator array
11/03/2004	CN1541620A Collimator assembly having multi-piece components
11/03/2004	CN1174463C Photomultiplier unit and radiation detection device
11/03/2004	CN1174243C Gamma ray test instrument
11/02/2004	US6813338 Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector
11/02/2004	US6812461 Photocathode source for e-beam inspection or review
11/02/2004	US6812050 System and method of evaluating gate oxide integrity for semiconductor microchips
11/02/2004	US6810718 Apparatus and method for fluid analysis
10/2004
10/28/2004	WO2004092727A2 Compound libraries and methods for drug discovery
10/28/2004	WO2004092719A2 Gamma ray detectors woth coincidence circuit and their use for analyzing bulk materials
10/28/2004	WO2004092718A2 Gamma ray detectors with coincidence circuit for a logging tool and their use in analyzing materials in an oil well
10/28/2004	WO2004073655A9 Radiation phantom
10/28/2004	WO2004072631A3 A method for measuring and reducing angular deviations of a charged particle beam
10/28/2004	US20040213376 Method for locating an alignment feature of a crystalline body
10/28/2004	US20040213374 Inspection system for air cargoes or vehicles
10/28/2004	US20040213373 Dual x-ray fluorescence spectrometer and method for fluid analysis
10/28/2004	US20040213371 Imaging tomography device with at least two beam detector systems, and method to operate such a tomography device
10/28/2004	US20040212373 Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer
10/28/2004	US20040211899 Sample electrification measurement method and charged particle beam apparatus
10/28/2004	DE19727219B4 Meßsystem für einen Computertomographen Measuring system for a computer tomograph
10/28/2004	CA2521766A1 Compound libraries and methods for drug discovery
10/28/2004	CA2426953A1 Position sensitive neutron detector
10/27/2004	EP1470783A1 Radiation computed tomography apparatus and tomographic image producing method
10/27/2004	EP1470782A2 Radiation computed tomography apparatus
10/27/2004	EP1470413A1 Diffractometer and method for diffraction analysis
10/27/2004	EP1158842B1 X-ray generator, x-ray imaging apparatus and x-ray inspection system
10/27/2004	CN1540327A Method for detecting metal pollution and corpuscle in processing device
10/27/2004	CN1540326A Method for quick quantitative mesuring content of rutile type and anatase type in T10*
10/27/2004	CN1540325A Method for analyzing abd managing negatives of ray detection
10/27/2004	CN1540324A Determining saturation of residual oil through 113 mIN Gamma leak measurement
10/27/2004	CN1540323A Plasma Monitoring method, plasma monitor and plasma treatment appts.
10/27/2004	CN1540322A Method for quick testing data of pole figure for deep drawn sheet plate made from aluminium alloy
10/27/2004	CN1539378A Radiation computer fault scanner
10/27/2004	CN1539377A Radiation computer fault scanner and method of generating fault images
10/27/2004	CN1173192C Two dimension array type radiographic detector
10/27/2004	CN1173188C Battery testing system
10/27/2004	CN1173170C Gamma-ray radiation source device for container inspecting system
10/27/2004	CN1173169C Method for correcting data nonuniformity in radiation imaging system
10/26/2004	US6810278 Method and system for creating three-dimensional images using tomosynthetic computed tomography
10/26/2004	US6810106 X-ray fluorescence thickness measurement device
10/26/2004	US6810105 Methods and apparatus for dishing and erosion characterization
10/26/2004	US6809534 Semiconductor device test method and semiconductor device tester
10/26/2004	US6809331 X-ray image reader
10/26/2004	US6809317 Method and apparatus for local surface analysis
10/21/2004	WO2004090947A2 Ion beam incident angle detector for ion implant systems
10/21/2004	WO2004090576A2 System and method for detection of explosives in baggage
10/21/2004	WO2004090522A1 Method and apparatus for x-ray topography of single crystal ingot
10/21/2004	WO2004089056A2 Exempt source for an x-ray fluorescence device
10/21/2004	US20040209304 Using multicompartment apparatus to screen variable forms of biological materials
10/21/2004	US20040208290 X-ray CT system and beam-hardening post-processing method
10/21/2004	US20040208284 X-ray optical system for combinatorial screening of a sample library
10/21/2004	US20040208283 X-ray optical system with wobble device
10/21/2004	US20040208280 X-ray microscopic inspection apparatus
10/21/2004	US20040208279 Apparatus and methods for multiple view angle stereoscopic radiography
10/21/2004	US20040208278 Radiation computed tomography apparatus
10/21/2004	US20040208277 Radiation computed tomography apparatus and tomographic image producing method
10/21/2004	US20040208276 Method and device for improving time resolution of an imaging device

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