Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
12/2004
12/01/2004EP1482520A1 X-ray microscope
12/01/2004EP1482305A1 Device for imaging the internal structure of an object
12/01/2004EP1482304A2 Method of setting measuring range of reciprocal-space mapping
12/01/2004EP1482303A2 Method of dynamically displaying a scattering vector of X-ray diffraction
12/01/2004CN1551745A Method for determining density distributions and atomic number distributions during radiographic examination methods
12/01/2004CN1550792A Method for correcting error of radioactive ray detector caused by delayed signal reproduction
12/01/2004CN1550214A X-ray CT system and method with beam-hardening correction
12/01/2004CN1178058C Ray source of nondestructive computerized tomography detecting system for large object
11/2004
11/30/2004US6826424 Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices
11/30/2004US6826255 X-ray inspection system and method of operating
11/30/2004US6826253 X-ray analysis apparatus
11/30/2004US6826252 Computed tomography scanner and method for controlling the computed tomography scanner
11/30/2004US6825467 Apparatus for scanning a crystalline sample and associated methods
11/25/2004WO2004102627A2 Method and apparatus for radiation image erasure
11/25/2004WO2004102186A1 Method for forming a database for determining biological agents and chemical substances
11/25/2004WO2004102172A1 Tomography of solid materials
11/25/2004WO2004102161A2 Method and apparatus for material identification using characteristic radiative emissions
11/25/2004WO2004102110A1 Manipulator for a device used for non-destructive material testing
11/25/2004US20040235059 Drug development and manufacturing
11/25/2004US20040234035 Limiting device for electromagnetic radiation, notably in an analysis device
11/25/2004US20040234030 Method and apparatus for x-ray diffraction analysis
11/25/2004US20040234029 Examination of material samples
11/25/2004US20040234025 Processes and a device for determining the actual position of a structure of an object to be examined
11/25/2004US20040234024 X-ray sensor signal processor and X-ray computed tomography system using the same
11/25/2004US20040234022 Method and apparatus for image reconstruction and X-ray CT imaging apparatus
11/25/2004US20040232360 Radiation shield for portable x-ray fluorescence instruments
11/25/2004US20040232332 Method of alignment for efficient defect review
11/25/2004US20040232331 Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer
11/25/2004US20040232330 Thin film analyzing method
11/25/2004DE19925395B4 Verfahren zum Betrieb eines Computertomographie(CT)-Gerätes Method for operating a computed tomography (CT) -device
11/24/2004EP1480034A1 High resolution defect inspection with positron annihilation by simultaneous irradiation of a positron beam and an electron beam
11/24/2004EP1479273A2 System and method for building and manipulating a centralized measurement value database
11/24/2004EP1478918A2 Methods and devices for quantitative analysis of x-ray images
11/24/2004CN1548949A Quantitative method for elements contained in sample with active metal
11/24/2004CN1548948A Three-dimensional tomoscanning material testing machine
11/23/2004US6823044 System for collecting multiple x-ray image exposures of a sample using a sparse configuration
11/23/2004US6823043 Determination of material parameters
11/23/2004US6823042 Apparatus for X-ray analysis and apparatus for supplying X-rays
11/23/2004US6823041 Grasping system for automated exchange of elongated samples in an X-ray analysis apparatus
11/23/2004US6823040 X-ray inspection method and apparatus used for the same
11/23/2004US6823039 Computed tomography apparatus also employable for x-ray diagnostic examinations
11/23/2004US6823038 X-ray detector array and method for manufacturing same
11/23/2004US6823037 Roller truck for CT scanner
11/23/2004US6822234 Method for measuring localized region lattice strain by means of convergent beam electron diffraction, and measurement device thereof
11/23/2004US6822232 Electronic microscope observation system and observation method
11/23/2004US6821784 Method of diagnosing colorectal adenomas and cancer using proton magnetic resonance spectroscopy
11/23/2004US6821361 Measuring the deposit amount of a metal phase contained in a galvanized layer by measuring diffracted x-rays over a predetermined range on a debye ring, and integrating the x-ray diffraction intensity data
11/18/2004WO2004100206A1 Electron beam device, electron beam inspection method, electron beam inspection device, pattern inspection method and exposure condition determination method
11/18/2004WO2004051565A3 Optical tomography of small objects using parallel ray illumination and post-specimen optical magnification
11/18/2004WO2003079903A9 Computer tomograph comprising energy discriminating detectors
11/18/2004WO2003074989A3 Methods for identification and verification
11/18/2004US20040228453 Method and system for simulating X-ray images
11/18/2004US20040228450 Cooling system and method to cool a gantry
11/18/2004US20040228444 X-ray diagnostic apparatus with image computer for direction filtering
11/18/2004US20040228442 X-ray diagnosis apparatus and method for obtaining an X-ray image
11/18/2004US20040228441 X-ray diffractometer
11/18/2004US20040228440 X-ray diffractometer for high flux grazing incidence diffraction
11/18/2004US20040228438 Radiation therapy planning device
11/18/2004US20040228437 In-situ monitoring system for bonding process and method therefor
11/18/2004US20040228434 Radiographic device and control method therefor
11/18/2004US20040227531 Semiconductor device test method and semiconductor device tester
11/18/2004US20040227113 Radiation image storage panel
11/18/2004US20040227081 Electron beam apparatus
11/18/2004US20040227079 Inspection apparatus for circuit pattern
11/18/2004US20040227078 Defect inspection instrument and positron beam apparatus
11/18/2004US20040227077 Electron microscopes exhibiting improved imaging of specimen having chargeable bodies
11/18/2004DE10317679A1 Röntgen-optisches System mit Wobbel-Einrichtung X-ray optical system with wobble device
11/18/2004DE10317678A1 Röntgen-optisches System zum kombinatorischen Screening einer Probenbibliothek X-ray optical system for combinatorial screening a sample library
11/18/2004DE10317677A1 Primärstrahlfänger Primary beam stop
11/18/2004DE10317137A1 X-ray apparatus with scanning support taking series of two-dimensional projections from object under investigation and includes three-dimensional sensor on carrier
11/18/2004DE102004020468A1 CT-Detektorarray mit einem nicht in Pixel unterteiltem Szintillatorarray CT detector array with a non-subdivided in pixels scintillator
11/18/2004DE10195715T5 Digitales Erfassungsverfahren für Dualenergieabbildung Digital detection method for dual-energy imaging
11/17/2004EP1477796A2 Small angle x-ray scattering system with vertical beam for simplified analysis of liquid samples
11/17/2004EP1477795A1 X-ray diffractometer for grazing incidence diffraction of horizontally oriented samples
11/17/2004CN2656998Y Regulating and controlling input pump used for discriminating and detecting sugar containing radiation food
11/17/2004CN2656033Y Ultraviolet sterilizing device with automatic cleaning apparatus
11/17/2004CN1547665A Device for manipulating a product and for processing radioscopy images of the product to obtain tomographic sections and uses
11/17/2004CN1546999A Analysis method for aluminium electrolysis raw material industrial cryolite
11/17/2004CN1546998A Standard sample for aluminium electrolyte analysis
11/17/2004CN1176370C X-ray fluorescent holographic tomographic equipment
11/17/2004CN1176369C Charge testing method for insulating material
11/16/2004US6819739 Method and apparatus for calibrating an x-ray laminography imaging system
11/16/2004US6818898 X-ray image sensing device
11/11/2004WO2004097938A1 Conductive adhesive bonded semiconductor substrates for radiation imaging devices
11/11/2004WO2004097386A1 Control means for heat load in x-ray scanning apparatus
11/11/2004WO2004080130A3 Scanning-based detection of ionizing radiation
11/11/2004WO2004057649A3 Voltage contrast test structure
11/11/2004US20040223975 Methods for treating cardiovascular diseases with botulinum toxin
11/11/2004US20040223590 Method for the compensation of image disturbances in the course of radiation image recordings and radiation image recording apparatus
11/11/2004US20040223586 Vertical small angle x-ray scattering system
11/11/2004US20040223585 Method for determining density distributions and atomic number distributions during radiographic examination methods
11/11/2004US20040223582 X-ray sensor signal processor and X-ray computed tomography system using the same
11/11/2004US20040223140 TFT array inspection apparatus
11/11/2004US20040222806 Semiconductor device test method and semiconductor device tester
11/11/2004US20040222541 Resin material remolding method and resin material pulverized piece selecting apparatus
11/11/2004US20040222377 Patterned wafer inspection method and apparatus therefor
11/11/2004US20040222376 Charged particle beam apparatus
11/11/2004US20040222375 Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus
11/11/2004DE10318444A1 Image quality indicator (IQI) for radiographic material testing, especially non-destructive testing of industrial components, comprises a series of spheres of diameter less than 1mm mounted on a support film
11/11/2004CA2736631A1 Packaging system for detonation cords, which is used for x-ray examination and safe shipping