Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
12/2004
12/23/2004US20040258202 Imaging method based on attenuation, refraction and ultra-small-angle scattering of x-rays
12/23/2004US20040258201 Radiography apparatus and radiography method
12/23/2004US20040258199 System and method for resolving threats in automated explosives detection in baggage and other parcels
12/23/2004US20040258198 Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
12/23/2004US20040258189 Detecting special nuclear materials in containers using high-energy gamma rays emitted by fission products
12/23/2004US20040256567 Radiographic apparatus and radiographic method
12/23/2004US20040256566 Gamma ray detectors having improved signal-to-noise ratio and related systems and methods for analyzing bulk materials
12/23/2004US20040256565 X-ray backscatter mobile inspection van
12/23/2004US20040256553 Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam
12/23/2004US20040256548 Gamma ray detectors having improved signal-to-noise ratio and related systems and methods for analyzing materials in an oil well
12/23/2004DE10324698A1 Computer und Verfahren zum Bearbeiten und/oder Auswerten eines digitalen Bildes Computers and method for processing and / or evaluation of a digital image
12/23/2004DE10322281A1 Manipulator für eine Röntgenvorrichtung Manipulator for an X-ray device
12/23/2004CA2528867A1 Methods and apparatus for sterilization of air and objects
12/23/2004CA2528028A1 Screening checkpoint for passengers and baggage
12/22/2004EP1489530A1 Inspection method using a database to manage inspection parameters of techniques
12/22/2004EP1489435A1 Radiographic apparatus and radiographic method
12/22/2004CN1556921A X-ray backscatter mobile inspection van
12/22/2004CN1181336C Movable on-vehicle container checking system
12/22/2004CN1181314C 谐波测角仪 Harmonic goniometer
12/21/2004US6834117 X-ray defect detection in integrated circuit metallization
12/16/2004WO2004109628A1 Array substrate testing method
12/16/2004WO2004109375A1 Substrate inspection method
12/16/2004WO2004109374A1 Method for testing array substrate and apparatus for testing array substrate
12/16/2004WO2004109331A2 Neutron and gamma ray monitor
12/16/2004WO2004109242A1 A method and apparatus for assessing/measuring grammage variation in sheet material
12/16/2004US20040252874 Radiation imaging method, radiation imaging apparatus, computer program and computer-readable recording medium
12/16/2004US20040252807 Explosives detection system using computed tomography (CT) and quadrupole resonance (QR) sensors
12/16/2004US20040251433 Sensor with alignment self compensation
12/16/2004US20040251415 Density detection using real time discrete photon counting for fast moving targets
12/16/2004DE19629250B4 Verfahren zur Herstellung von Proben zur Analyse von Defekten von Halbleitereinrichtungen Process for the preparation of samples for analysis of defects of semiconductor devices
12/16/2004DE10322271A1 Solid body material defect investigation unit uses mobile infrared laser heating to modulate X ray diffraction pattern for measurement by area detector
12/16/2004CA2528177A1 Neutron and gamma ray monitor
12/15/2004EP1487193A1 Method and apparatus for correcting defect pixels in radiation imaging, computer program and computer-readable recording medium
12/15/2004EP1486784A2 Sensor with alignment self-compensation
12/15/2004EP1486773A1 Method and system to inspect a component
12/15/2004EP1485923A1 System and method of irradiating products being conveyed past an electron beam delivery device
12/15/2004EP1485697A2 Computer tomograph with a detector following the movement of a pivotable x-ray source
12/15/2004EP1485515A2 Evaluation of chamber components having textured coatings chamber components
12/15/2004EP1194736A4 Non-destructive testing of hidden flaws
12/15/2004CN1555486A Method of examining a wafer of semiconductor material by means of x-rays
12/15/2004CN1180246C Metal surface coating test system
12/15/2004CN1180245C Ion masspectrometry contraband object detecting device, method and use
12/15/2004CN1180244C Method for measuring and caculating dendrite typical area content of casting alloy and application thereof
12/15/2004CN1180243C Method for determining ore grade and ash content of coal and portable measuring instrument
12/15/2004CN1180242C Quick detection method for punching steel plate polar diagram data
12/14/2004US6831962 Automatic adjusting method for a goniometer and associated device
12/14/2004US6830376 Radioactive image apparatus and focus control method thereof
12/09/2004WO2004107353A1 Method for controlling uranium-235 mass fraction in gaseous uranium hexafluoride and control system
12/09/2004WO2004107265A2 Computer and method for processing and/or evaluating a digital image
12/09/2004WO2004106906A1 Tomographic energy dispersive x-ray diffraction apparatus comprising an array of detectors and associated collimators
12/09/2004WO2004106897A1 Method and apparatus for determining particle parameter and processor performance in a coal and mineral processing system
12/09/2004WO2004105610A1 Fan-beam coherent-scatter computer tomography
12/09/2004WO2004105592A1 Medical image recording system
12/09/2004WO2004068529A3 Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample
12/09/2004WO2004036251A3 Ray tracing kernel
12/09/2004WO2003058202A3 System and method of detecting, neutralizing, and containing suspected contaminated articles
12/09/2004US20040248311 Using absorption spectrochemical analysis to determine extent of copper contamination of silicon semiconductor
12/09/2004US20040247167 Method, system and apparatus for processing radiographic images of scanned objects
12/09/2004US20040247080 Systems and methods for controlling an X-ray source
12/09/2004US20040247075 Vehicle mounted inspection systems and methods
12/09/2004US20040247069 X-ray CT apparatus and X-ray CT method
12/09/2004US20040246465 Micro-sample pick-up apparatus and micro-sample pick-up method
12/09/2004US20040245475 Determining a physical mass changing event in the material of interest (such as the onset of crystallization) by measuring the temporal response of a sensor to which the material of interest is exposed.
12/09/2004US20040245466 Transmission electron microscope sample preparation
12/09/2004DE10322040A1 Koppel- und Justiervorrichtung für ein Röntgendiffraktometer Coupling and adjusting for a X-ray diffractometer
12/09/2004DE10320972A1 Signal playback time lag difference correction method for use in X-ray detector, involves subtracting output X-ray intensity reduction at different time periods, from output X-ray intensity at particular time period
12/09/2004DE10320882A1 Verfahren zur Erzeugung von Bildern in der Spiral-Computertomographie und Spiral-CT-Gerät A process for generating images in spiral computer tomography and spiral CT apparatus
12/09/2004DE10304661A1 Kühlsystem und Verfahren zur Kühlung einer Gantry Cooling system and method for cooling a gantry
12/09/2004DE10225899B4 Portable Vorrichtung zur Visualisierung temperaturabhängiger Prozesse Portable device for the visualization of temperature-dependent processes
12/09/2004CA2523819A1 Method and apparatus for determining particle parameter and processor performance in a coal and mineral processing system
12/08/2004EP1484717A2 Enhancement of radiographic images
12/08/2004EP1484602A2 Sample chamber with coupling and adjusting means for reproducibly coupling the sample chamber to a X-ray diffractometer
12/08/2004EP1483566A1 Apparatus for presenting a sample of material for analysis
12/08/2004CN2662239Y Detecting apparatus frame
12/08/2004CN1179207C Method and system for in-situ testing grade of big ore block by electron-air shielding radiation effect
12/07/2004US6829328 Method for making quantitative analysis of nickel
12/07/2004US6829327 Total-reflection x-ray fluorescence apparatus and method using a doubly-curved optic
12/07/2004US6829324 X-ray CT scanner capable of performing improved log conversion
12/07/2004US6828572 Ion beam incident angle detector for ion implant systems
12/07/2004US6828571 Apparatus and methods of controlling surface charge and focus
12/07/2004US6828555 Three-dimensional structure verification supporting apparatus, three-dimensional structure verification method, recording medium, and program therefor
12/07/2004US6826971 Fabrication method for sample to be analyzed
12/02/2004WO2004105077A1 High-density recording scanning microscope
12/02/2004WO2004103512A2 Method and system for electrokinetic, preparative sample separation in high-surface-area separation channels with non-convex cross sections
12/02/2004WO2004011898A3 Flow method and apparatus for screening chemicals using micro x-ray fluorescence
12/02/2004US20040243448 Medical image recording system
12/02/2004US20040240719 Method for producing images in spiral computed tomography, and a spiral CT unit
12/02/2004US20040240623 Device for the examination of samples by means of x-rays
12/02/2004US20040240611 Method of setting measuring range of reciprocal-space mapping
12/02/2004US20040240609 Method and system for generating an x-ray exposure
12/02/2004US20040240608 Apparatus and method for non-destructive inspection of material in containers
12/02/2004US20040240607 Method and system to inspect a component
12/02/2004US20040240606 X-ray fluorescence measuring system and metods for trace elements
12/02/2004US20040240604 Methods and devices for CT reconstruction using a grangeat approach
12/02/2004US20040239347 Semiconductor device tester
12/02/2004US20040238753 Particle processing apparatus and methods
12/02/2004US20040238750 X-ray and CT image detector
12/02/2004US20040238735 System and method for depth profiling and characterization of thin films
12/02/2004DE10354017A1 Chemische Vorfilterung für die Phasenunterscheidung mittels simultaner Energiedispersionsspektrometrie und Elektronenrückstreuungsbeugung Chemical pre-filtering for the phase discrimination means of simultaneous Energiedispersionsspektrometrie and electron backscatter diffraction
12/02/2004DE10322053A1 Calibration method for a gamma camera, in which a screen with a multiplicity of windows is placed between a multiple source and a scintillation crystal such that a pattern of maxima at half-value multiples is generated