| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 11/21/2013 | US20130308132 System and method for polarimetric wavelet fractal detection and imaging |
| 11/20/2013 | EP2663853A1 Mueller matrix spectroscopy using chiroptic |
| 11/20/2013 | CN103403528A Optical characteristics measuring apparatus, and optical characteristics measuring method |
| 11/19/2013 | US8589120 Methods, systems, and apparatus for determining optical properties of elements of lighting components having similar color points |
| 11/19/2013 | US8587781 View-finder in ellipsometer or the like systems |
| 11/19/2013 | US8587780 Device for measuring the twist of a rotating shaft |
| 11/12/2013 | US8582101 High throughput birefringence measurement |
| 11/12/2013 | US8582094 Systems and methods for inspecting specimens including specimens that have a substantially rough uppermost layer |
| 11/07/2013 | US20130293871 Sensor for spectral-polarization imaging |
| 11/06/2013 | CN102589703B Method and device for measuring linearly-polarized and light-polarized vector orientation |
| 10/30/2013 | CN102359865B Testing method of magnetic-optic effect of linear polarized light and device thereof |
| 10/29/2013 | US8570515 Periodic patterns and technique to control misalignment between two layers |
| 10/29/2013 | US8570514 Optical system polarizer calibration |
| 10/29/2013 | US8570513 Ellipsometric investigation and analysis of textured samples |
| 10/23/2013 | EP2652469A1 Image mapped spectropolarimetry |
| 10/23/2013 | CN103364927A Optical system for lithography machine illuminating system polarization measurement |
| 10/23/2013 | CN103364348A Optical device, particularly a polarimeter, for detecting inhomogeneities in a sample |
| 10/22/2013 | US8564777 System and method for compensating detector non-idealities |
| 10/17/2013 | US20130271763 Inspection device and method thereof |
| 10/17/2013 | DE102012205311B4 Optische Vorrichtung, insbesondere Polarimeter, zur Detektion von Inhomogenitäten in einer Probe Optical device, in particular polarimeter, for detecting inhomogeneities in a sample |
| 10/16/2013 | EP2650661A1 Vectorial polarimetry apparatus with phase and polarization spatial control |
| 10/15/2013 | US8559009 Image calculation method |
| 10/15/2013 | US8559008 Ellipsometer focusing system |
| 10/10/2013 | US20130265576 Device and method for polarimetric measurement with microscopic resolution, polarimetry accessory for a microscope, ellipsomicroscope and ellipsometric contrast microscope |
| 10/08/2013 | US8553227 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method |
| 10/03/2013 | US20130255054 Method of manufacturing particle-based image display |
| 10/02/2013 | DE102012205311A1 Optische Vorrichtung, insbesondere Polarimeter, zur Detektion von Inhomogenitäten in einer Probe Optical device, in particular polarimeter, for detecting inhomogeneities in a sample |
| 10/02/2013 | CN103335714A Real-time synchronous acquisition device for image type sky polarized light distribution modes |
| 10/01/2013 | US8547551 Lithographic apparatus and contamination detection method |
| 09/24/2013 | US8542357 Method and device for measuring circular dichroism spectra |
| 09/24/2013 | US8542356 Measurement method and measurement system for measuring birefringence |
| 09/19/2013 | US20130242303 Dual angles of incidence and azimuth angles optical metrology |
| 09/18/2013 | CN203203710U Automatic detection device for polarization of light |
| 09/18/2013 | CN103308175A Linear double refraction measuring device and measuring method |
| 09/17/2013 | US8537342 Polariscope stress measurement tool and method of use |
| 09/10/2013 | US8531665 Small volume cell |
| 09/03/2013 | US8526005 System and method for calibrating optical measurement systems that utilize polarization diversity |
| 09/03/2013 | US8525993 Scatterometry measurement of asymmetric structures |
| 09/03/2013 | US8525992 Method and apparatus of measuring relative phase of bio-cells |
| 08/28/2013 | EP2631230A1 Semiconducting Polymers |
| 08/28/2013 | CN103267576A Device and method for light wave polarization state high-speed static measurement |
| 08/27/2013 | US8520214 Fiber optical gyroscope |
| 08/27/2013 | US8520208 Segmented polarizer for optimizing performance of a surface inspection system |
| 08/27/2013 | US8520207 Detection system for birefringence measurement |
| 08/22/2013 | WO2013121423A1 Method and system for use in optical measurements in deep three-dimensional structures |
| 08/22/2013 | US20130216247 Optical sensor and image forming apparatus |
| 08/21/2013 | CN103256984A Device and method for accurately measuring temperature-varying elliptical polarization in wide temperature range |
| 08/21/2013 | CN101903759B Method and device for one-shot measurement of the transient birefringence induced by a perturbation lying within the terahertz frequency range |
| 08/21/2013 | CN101634676B Method and device for detecting electromagnetic wave signals |
| 08/20/2013 | US8514380 Polarization imaging apparatus with auto-calibration |
| 08/14/2013 | CN102538971B Full-optical-field full-stokes parameter detection device and detection method |
| 08/14/2013 | CN101532851B Near infrared sensor system with nano-imprinted wire-grid polarizers and method using the same |
| 08/07/2013 | CN103238048A Image mapped spectropolarimetry |
| 08/07/2013 | CN103234638A Automatic light polarization detecting device |
| 08/07/2013 | CN103234637A Atmospheric radiation spectrum polarization information measuring system |
| 08/01/2013 | US20130194572 Optical measurement device and optical measurement method |
| 07/31/2013 | CN101881659B Electromagnetic wave detector |
| 07/30/2013 | US8497985 Inspection method based on captured image and inspection device |
| 07/25/2013 | US20130188144 Control apparatus and control method |
| 07/24/2013 | CN203083705U Device for accurately measuring temperature-change elliptic polarization in wide-temperature range |
| 07/23/2013 | US8493562 Optical device with superimposed photonic circuits for coupling to one or more optical waveguides |
| 07/17/2013 | CN103210294A Optical characteristic measuring device and method |
| 07/16/2013 | US8488120 Polarization based interferometric detector |
| 07/16/2013 | US8488119 Terahertz-infrared ellipsometer system, and method of use |
| 07/16/2013 | US8486735 Method and device for incremental wavelength variation to analyze tissue |
| 07/11/2013 | US20130176567 Composite Laminate Enabling Structural Monitoring Using Electromagnetic Radiation |
| 07/10/2013 | EP2612158A1 Device and method for characterizing a laser beam |
| 07/10/2013 | CN103196561A Device of measuring polarization characteristic of object at multiple angles and method of achieving measurement of polarization characteristic of object at multiple angles thereof |
| 07/04/2013 | WO2013101252A1 Terahertz ellipsometer system, and method of use |
| 07/04/2013 | US20130169964 System and Method for Error Correction in a Polarimeter |
| 07/02/2013 | US8477309 Method and system for inspecting beveled objects |
| 07/02/2013 | US8477308 Polarized, specular reflectometer apparatus |
| 06/27/2013 | US20130162995 Layer Thickness Measurement |
| 06/27/2013 | US20130162980 Apparatus for non-invasively inspecting defects and method for inspecting defects using the same |
| 06/26/2013 | CN103175612A On-orbit polarization measuring system of satellite-borne imaging spectrometer |
| 06/25/2013 | US8472017 Kit comprising a supporting device for use with a polarimeter |
| 06/20/2013 | WO2013090115A1 Method and apparatus for observing subsurfaces of a target material |
| 06/20/2013 | WO2013087456A1 Device for measuring the state of polarization of an incident wave of frequency 10 ghz to 30 thz |
| 06/19/2013 | CN1739007B Method and apparatus for measuring out-of-plane birefringence of transparent samples |
| 06/19/2013 | CN103162836A Device and method for detecting optical interference of light polarization tiny corner |
| 06/19/2013 | CN102099661B High throughput birefringence measurement |
| 06/18/2013 | US8467057 Ellipsometers and polarimeters comprising polarization state compensating beam directing sample wobble compensating system, and method of use |
| 06/18/2013 | US8467056 Variable angle, fiber optic coupled, light scattering apparatus |
| 06/12/2013 | CN102435318B Polarized simulation method of remote sensing data by considering influences of skylights on ground surface reflection |
| 06/11/2013 | US8462341 Mounting for deviation angle self compensating substantially achromatic retarder |
| 06/05/2013 | CN202974441U Miniature automatic optical filter rotating wheel multiband polarization imaging system |
| 06/04/2013 | US8456632 Vectorial polarimetry method and apparatus for analyzing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating field and a sample to be observed |
| 05/29/2013 | EP2597517A2 Apparatus, methods, and systems for multi-primary display or projection |
| 05/29/2013 | EP2596325A1 Device and method for polarimetric measurement with microscopic resolution, polarimetry accessory for a microscope, ellipsomicroscope and ellipsometric contrast microscope |
| 05/29/2013 | CN202956189U Spontaneous and multifunctional experiment system on characteristics of polarized light |
| 05/28/2013 | US8452135 Method and apparatus for measuring fiber twist by polarization tracking |
| 05/28/2013 | US8451446 Differential polarization measuring extension unit for a laser-scanning microscope |
| 05/28/2013 | US8451445 Apparatus and method for detecting array substrate |
| 05/23/2013 | US20130128269 Device for Measuring the Rotating Angle of Two Objects Rotating on a Rotating Axis Relative to Each Other |
| 05/22/2013 | CN1826512B Measurements of optical inhomogeneity and other properties in substances using propagation modes of light |
| 05/22/2013 | CN103115683A Method of measuring monochromatic light polarization state |
| 05/21/2013 | US8446584 Reconfigurable spectroscopic ellipsometer |
| 05/21/2013 | US8446583 Light focusing unit and spectrum measuring apparatus having the same |
| 05/16/2013 | US20130120750 Optical phase device, method and system |
| 05/14/2013 | US8441639 Metrology systems and methods |