Patents for G01J 4 - Measuring polarisation of light (3,335)
11/2013
11/21/2013US20130308132 System and method for polarimetric wavelet fractal detection and imaging
11/20/2013EP2663853A1 Mueller matrix spectroscopy using chiroptic
11/20/2013CN103403528A Optical characteristics measuring apparatus, and optical characteristics measuring method
11/19/2013US8589120 Methods, systems, and apparatus for determining optical properties of elements of lighting components having similar color points
11/19/2013US8587781 View-finder in ellipsometer or the like systems
11/19/2013US8587780 Device for measuring the twist of a rotating shaft
11/12/2013US8582101 High throughput birefringence measurement
11/12/2013US8582094 Systems and methods for inspecting specimens including specimens that have a substantially rough uppermost layer
11/07/2013US20130293871 Sensor for spectral-polarization imaging
11/06/2013CN102589703B Method and device for measuring linearly-polarized and light-polarized vector orientation
10/2013
10/30/2013CN102359865B Testing method of magnetic-optic effect of linear polarized light and device thereof
10/29/2013US8570515 Periodic patterns and technique to control misalignment between two layers
10/29/2013US8570514 Optical system polarizer calibration
10/29/2013US8570513 Ellipsometric investigation and analysis of textured samples
10/23/2013EP2652469A1 Image mapped spectropolarimetry
10/23/2013CN103364927A Optical system for lithography machine illuminating system polarization measurement
10/23/2013CN103364348A Optical device, particularly a polarimeter, for detecting inhomogeneities in a sample
10/22/2013US8564777 System and method for compensating detector non-idealities
10/17/2013US20130271763 Inspection device and method thereof
10/17/2013DE102012205311B4 Optische Vorrichtung, insbesondere Polarimeter, zur Detektion von Inhomogenitäten in einer Probe Optical device, in particular polarimeter, for detecting inhomogeneities in a sample
10/16/2013EP2650661A1 Vectorial polarimetry apparatus with phase and polarization spatial control
10/15/2013US8559009 Image calculation method
10/15/2013US8559008 Ellipsometer focusing system
10/10/2013US20130265576 Device and method for polarimetric measurement with microscopic resolution, polarimetry accessory for a microscope, ellipsomicroscope and ellipsometric contrast microscope
10/08/2013US8553227 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
10/03/2013US20130255054 Method of manufacturing particle-based image display
10/02/2013DE102012205311A1 Optische Vorrichtung, insbesondere Polarimeter, zur Detektion von Inhomogenitäten in einer Probe Optical device, in particular polarimeter, for detecting inhomogeneities in a sample
10/02/2013CN103335714A Real-time synchronous acquisition device for image type sky polarized light distribution modes
10/01/2013US8547551 Lithographic apparatus and contamination detection method
09/2013
09/24/2013US8542357 Method and device for measuring circular dichroism spectra
09/24/2013US8542356 Measurement method and measurement system for measuring birefringence
09/19/2013US20130242303 Dual angles of incidence and azimuth angles optical metrology
09/18/2013CN203203710U Automatic detection device for polarization of light
09/18/2013CN103308175A Linear double refraction measuring device and measuring method
09/17/2013US8537342 Polariscope stress measurement tool and method of use
09/10/2013US8531665 Small volume cell
09/03/2013US8526005 System and method for calibrating optical measurement systems that utilize polarization diversity
09/03/2013US8525993 Scatterometry measurement of asymmetric structures
09/03/2013US8525992 Method and apparatus of measuring relative phase of bio-cells
08/2013
08/28/2013EP2631230A1 Semiconducting Polymers
08/28/2013CN103267576A Device and method for light wave polarization state high-speed static measurement
08/27/2013US8520214 Fiber optical gyroscope
08/27/2013US8520208 Segmented polarizer for optimizing performance of a surface inspection system
08/27/2013US8520207 Detection system for birefringence measurement
08/22/2013WO2013121423A1 Method and system for use in optical measurements in deep three-dimensional structures
08/22/2013US20130216247 Optical sensor and image forming apparatus
08/21/2013CN103256984A Device and method for accurately measuring temperature-varying elliptical polarization in wide temperature range
08/21/2013CN101903759B Method and device for one-shot measurement of the transient birefringence induced by a perturbation lying within the terahertz frequency range
08/21/2013CN101634676B Method and device for detecting electromagnetic wave signals
08/20/2013US8514380 Polarization imaging apparatus with auto-calibration
08/14/2013CN102538971B Full-optical-field full-stokes parameter detection device and detection method
08/14/2013CN101532851B Near infrared sensor system with nano-imprinted wire-grid polarizers and method using the same
08/07/2013CN103238048A Image mapped spectropolarimetry
08/07/2013CN103234638A Automatic light polarization detecting device
08/07/2013CN103234637A Atmospheric radiation spectrum polarization information measuring system
08/01/2013US20130194572 Optical measurement device and optical measurement method
07/2013
07/31/2013CN101881659B Electromagnetic wave detector
07/30/2013US8497985 Inspection method based on captured image and inspection device
07/25/2013US20130188144 Control apparatus and control method
07/24/2013CN203083705U Device for accurately measuring temperature-change elliptic polarization in wide-temperature range
07/23/2013US8493562 Optical device with superimposed photonic circuits for coupling to one or more optical waveguides
07/17/2013CN103210294A Optical characteristic measuring device and method
07/16/2013US8488120 Polarization based interferometric detector
07/16/2013US8488119 Terahertz-infrared ellipsometer system, and method of use
07/16/2013US8486735 Method and device for incremental wavelength variation to analyze tissue
07/11/2013US20130176567 Composite Laminate Enabling Structural Monitoring Using Electromagnetic Radiation
07/10/2013EP2612158A1 Device and method for characterizing a laser beam
07/10/2013CN103196561A Device of measuring polarization characteristic of object at multiple angles and method of achieving measurement of polarization characteristic of object at multiple angles thereof
07/04/2013WO2013101252A1 Terahertz ellipsometer system, and method of use
07/04/2013US20130169964 System and Method for Error Correction in a Polarimeter
07/02/2013US8477309 Method and system for inspecting beveled objects
07/02/2013US8477308 Polarized, specular reflectometer apparatus
06/2013
06/27/2013US20130162995 Layer Thickness Measurement
06/27/2013US20130162980 Apparatus for non-invasively inspecting defects and method for inspecting defects using the same
06/26/2013CN103175612A On-orbit polarization measuring system of satellite-borne imaging spectrometer
06/25/2013US8472017 Kit comprising a supporting device for use with a polarimeter
06/20/2013WO2013090115A1 Method and apparatus for observing subsurfaces of a target material
06/20/2013WO2013087456A1 Device for measuring the state of polarization of an incident wave of frequency 10 ghz to 30 thz
06/19/2013CN1739007B Method and apparatus for measuring out-of-plane birefringence of transparent samples
06/19/2013CN103162836A Device and method for detecting optical interference of light polarization tiny corner
06/19/2013CN102099661B High throughput birefringence measurement
06/18/2013US8467057 Ellipsometers and polarimeters comprising polarization state compensating beam directing sample wobble compensating system, and method of use
06/18/2013US8467056 Variable angle, fiber optic coupled, light scattering apparatus
06/12/2013CN102435318B Polarized simulation method of remote sensing data by considering influences of skylights on ground surface reflection
06/11/2013US8462341 Mounting for deviation angle self compensating substantially achromatic retarder
06/05/2013CN202974441U Miniature automatic optical filter rotating wheel multiband polarization imaging system
06/04/2013US8456632 Vectorial polarimetry method and apparatus for analyzing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating field and a sample to be observed
05/2013
05/29/2013EP2597517A2 Apparatus, methods, and systems for multi-primary display or projection
05/29/2013EP2596325A1 Device and method for polarimetric measurement with microscopic resolution, polarimetry accessory for a microscope, ellipsomicroscope and ellipsometric contrast microscope
05/29/2013CN202956189U Spontaneous and multifunctional experiment system on characteristics of polarized light
05/28/2013US8452135 Method and apparatus for measuring fiber twist by polarization tracking
05/28/2013US8451446 Differential polarization measuring extension unit for a laser-scanning microscope
05/28/2013US8451445 Apparatus and method for detecting array substrate
05/23/2013US20130128269 Device for Measuring the Rotating Angle of Two Objects Rotating on a Rotating Axis Relative to Each Other
05/22/2013CN1826512B Measurements of optical inhomogeneity and other properties in substances using propagation modes of light
05/22/2013CN103115683A Method of measuring monochromatic light polarization state
05/21/2013US8446584 Reconfigurable spectroscopic ellipsometer
05/21/2013US8446583 Light focusing unit and spectrum measuring apparatus having the same
05/16/2013US20130120750 Optical phase device, method and system
05/14/2013US8441639 Metrology systems and methods
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