| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 10/09/2002 | EP0914600B1 Broadband spectroscopic rotating compensator ellipsometer |
| 10/09/2002 | CN2515652Y Measurer for measuring thickness of optical wave plate |
| 10/09/2002 | CN2515651Y Automatic detecter for measuring axle sleeve parallelism and length |
| 10/08/2002 | US6463402 Infeed log scanning for lumber optimization |
| 10/08/2002 | US6463187 Variable coupler fiberoptic sensor and sensing apparatus using the sensor |
| 10/08/2002 | US6463184 Method and apparatus for overlay measurement |
| 10/08/2002 | US6462818 Overlay alignment mark design |
| 10/08/2002 | US6462811 Automatic circular saw tooth inspection system and method |
| 10/08/2002 | US6462808 Small optical microphone/sensor |
| 10/08/2002 | US6462349 Measuring spacing between two surfaces via evanescent coupling |
| 10/08/2002 | US6460765 Label sensor for sensing edges of light conductive labels |
| 10/08/2002 | US6460418 Method of and apparatus for measuring elongation of a test specimen |
| 10/08/2002 | US6460417 Formability testing of small-size coatings and materials |
| 10/03/2002 | WO2002077574A1 An improved displacement and torque sensor |
| 10/03/2002 | WO2002077570A1 Method to measure features with asymmetrical profile |
| 10/03/2002 | WO2002077569A1 Contact wire inspection with separate position determination |
| 10/03/2002 | WO2002077568A1 Method and apparatus for decreasing thermal loading and roughness sensitivity in a photoacoustic film thickness measurement system |
| 10/03/2002 | WO2002077567A1 Height measuring instrument, and method of measuring height using the same |
| 10/03/2002 | WO2002061368A3 Method and apparatus for determining a three dimensional image of a moving object by means of light |
| 10/03/2002 | WO2002035177A3 Dynamic angle measuring interferometer |
| 10/03/2002 | WO2002008685A3 Apparatus and method for determining the range of remote objects |
| 10/03/2002 | WO2000026609A3 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing |
| 10/03/2002 | US20020143506 Device for the three-dimensional recording of a scene using laser emission |
| 10/03/2002 | US20020142613 Method for controlling etching depth |
| 10/03/2002 | US20020142493 In-situ thickness measurement for use in semiconductor processing |
| 10/03/2002 | US20020141634 Pattern defect inspection apparatus and method |
| 10/03/2002 | US20020140949 Method of inspecting semiconductor integrated circuit which can quickly measure a cubic body |
| 10/03/2002 | US20020140948 Tomographic reconstruction of electronic components from shadow image sensor data |
| 10/03/2002 | US20020140928 Automatic lens meter |
| 10/03/2002 | US20020140670 Method and apparatus for accurate alignment of images in digital imaging systems by matching points in the images corresponding to scene elements |
| 10/03/2002 | US20020140580 Encoder reading device |
| 10/03/2002 | US20020139178 Submerged sample observation apparatus and method |
| 10/02/2002 | EP1245923A2 Procedure and device to determine and to verify the contour of a rim |
| 10/02/2002 | EP1245922A1 System for measuring a phase difference between light signals reflected from both sides of an object |
| 10/02/2002 | EP1245344A2 Reintegration of a digital camera in an image processing system which is deplaced from a calibrated position in a non-calibrated position |
| 10/02/2002 | EP1244950A2 High rate optical correlator implemented on a substrate |
| 10/02/2002 | EP1244907A1 In-situ metalization monitoring using eddy current measurements and optical measurements |
| 10/02/2002 | EP1244896A4 Method of measuring and sizing objects from an image of a human face using iris size |
| 10/02/2002 | EP1244896A2 Method of measuring and sizing objects from an image of a human face using iris size |
| 10/02/2002 | EP1244895A1 Method for determining measuring positions and method for planning measuring tracks for measuring an object or a part thereof and device for measuring an object or a part thereof |
| 10/02/2002 | EP1244394A2 Reflector system for determining position |
| 10/02/2002 | EP1244367A1 Procede et systeme pour l'identification et la classification anthropomorphique a usage militaire et civil |
| 10/02/2002 | EP1092145A4 A system and method for analyzing topological features on a surface |
| 10/02/2002 | EP1066497B1 Method for determining the spatial and rotational positions of an object |
| 10/02/2002 | EP0995076B1 Method and device for determining the thickness of paper or cardboard by measuring on a continuous material web |
| 10/02/2002 | EP0769158B1 Device for optically scanning objects on a scanning surface and process for operating it |
| 10/02/2002 | EP0746745B1 Method of the rapid data acquisition in coherence scanning interferometry |
| 10/02/2002 | DE10145025A1 Verfahren und Einrichtung zum Messen der Dicke einer Flüssigkeitsschicht Method and device for measuring the thickness of a liquid layer |
| 10/02/2002 | DE10145024A1 Verfahren und Einrichtung zum Messen der Dicke einer Flüssigkeitsschicht Method and device for measuring the thickness of a liquid layer |
| 10/02/2002 | DE10116278A1 Adjustment and alignment method of separation or distance sensors on any motor vehicle using an array of reference markers arranged around the vehicle at varying angular positions |
| 10/02/2002 | DE10113518A1 Safety glass fouling measurement for laser processing head involves comparing scattered radiation with reference value to produce error signal if reference value is exceeded |
| 10/02/2002 | DE10113216A1 Monitoring of creep and tensioning of critical or thick walled components used at high temperatures and pressures by optical monitoring of surface markings so that changes in creep rate etc. are immediately detected |
| 10/02/2002 | DE10112732A1 Verfahren zur Bestimmung der Lage von Meßbildern eines Objektes relativ zum Objekt A method for determining the position of an object relative to the object Meßbildern |
| 10/02/2002 | CN1091875C Direction detector |
| 10/02/2002 | CN1091874C Fiber coupled interferometric displacement sensor |
| 10/01/2002 | US6460004 Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system |
| 10/01/2002 | US6459494 Width measuring apparatus |
| 10/01/2002 | US6459493 Apparatus for measuring surface form |
| 10/01/2002 | US6459491 Non-intrusive pellicle height measurement system |
| 10/01/2002 | US6459488 Diffuse reflectance method and apparatus for determining thickness of an infrared translucent layer |
| 10/01/2002 | US6459483 Level with angle and distance measurement apparatus |
| 10/01/2002 | US6459446 Eye tracking apparatus |
| 10/01/2002 | US6459389 Adaptive absolute steering angle sensor |
| 10/01/2002 | US6459092 6 degree-of-freedom (DOF) motion measuring apparatus |
| 10/01/2002 | US6458035 Method of measuring rotational motion of a golf ball |
| 09/26/2002 | WO2002075807A1 Probing method and device |
| 09/26/2002 | WO2002075295A1 An electronic imaging and quality control method for a fast moving web |
| 09/26/2002 | WO2002075245A1 Apparatus and method for measuring three dimensional shape with multi-stripe patterns |
| 09/26/2002 | WO2002075244A1 Method for noncontact inspection of dimensions of three-dimensional objects |
| 09/26/2002 | WO2002075243A1 Method for noncontact inspection of dimensions of three-dimensional objects |
| 09/26/2002 | WO2002074038A2 Method and arrangement for photographically detecting the spatial form of an object |
| 09/26/2002 | WO2001020252A9 Method and apparatus for performing optical measurements of layers and surface properties |
| 09/26/2002 | WO1999062313A3 Method and device for checking the oblique position or coplanarity of a contact bank of smd components |
| 09/26/2002 | US20020136444 Photogrammetric image correlation and measurement system and method |
| 09/26/2002 | US20020136443 Method and apparatus for detecting position of lead of electric component, and electric-component mounting method |
| 09/26/2002 | US20020136009 Surface inspecting illumination device and surface inspecting apparatus |
| 09/26/2002 | US20020135849 Optical barrier device |
| 09/26/2002 | US20020135785 Device for manufacturing semiconductor device and method of manufacturing the same |
| 09/26/2002 | US20020135784 Method and apparatus for decreasing thermal loading and roughness sensitivity in a photoacoustic film thickness measurement system |
| 09/26/2002 | US20020135783 Critical dimension analysis with simultaneous multiple angle of incidence measurements |
| 09/26/2002 | US20020135782 Scanning using position transmission for triggering the recording of measured values |
| 09/26/2002 | US20020135781 Scatterometry techniques to ascertain asymmetry profile of features and generate feedback or feedforward process control data associated therewith |
| 09/26/2002 | US20020135777 Phase shift fringe analysis method and apparatus using the same |
| 09/26/2002 | US20020135775 Height scanning interferometry method and apparatus including phase gap analysis |
| 09/26/2002 | US20020135774 Optical surface profiling systems |
| 09/26/2002 | US20020135773 Crystal based fringe generator system |
| 09/26/2002 | US20020135767 Optical alignment element method |
| 09/26/2002 | US20020135756 Inspection apparatus for surfaces of spheres |
| 09/26/2002 | US20020135751 Process and apparatus for recording the deformation of objects |
| 09/26/2002 | US20020135747 Distance measuring device |
| 09/26/2002 | US20020135361 Sensor device for burr examination |
| 09/26/2002 | US20020134952 Apparatus for detecting light-transmissive sheet-like body |
| 09/26/2002 | US20020134926 Optoelectronic angle of rotation sensor |
| 09/26/2002 | US20020134924 Light sensor |
| 09/26/2002 | US20020134923 Apparatus for automatically detecting size to be detected and automatic analyzer using the same |
| 09/26/2002 | US20020134839 Distance information acquisition apparatus or system, pattern projector, and distance information acquisition method |
| 09/26/2002 | US20020134631 Device for determining the pressure between a contact wire and a pantograph |
| 09/26/2002 | DE10202738A1 Phase or fringe scanning using a phase scanning device such as a piezo-electric device for determining the surface properties of objects, such as detection of wave front aberrations of less than one tenth of a wavelength |
| 09/25/2002 | EP1243945A2 Object detection sensor |
| 09/25/2002 | EP1243944A2 Distance measuring apparatus |