Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/2002
09/25/2002EP1243894A1 A range-image-based method and system for automatic sensor planning
09/25/2002EP1243893A1 A crystal based fringe generator system
09/25/2002EP1243892A2 Apparatus for automatically detecting size and automatic analyzer using the same
09/25/2002EP1242787A1 Method and system for optical distance and angle measurement
09/25/2002EP1242786A1 Method for determining three-dimensional surface coordinates
09/25/2002EP1242785A1 Optical method for the characterization of integrated circuits
09/25/2002EP1053449B1 Navigation link for measuring objects and method of its use
09/25/2002CN2513078Y Amber strain measurer by optic fibre method
09/25/2002CN2513077Y Interference type optic fibre length measurer
09/25/2002CN1371466A Analysing method and device for automatically sorting products such as fruits
09/25/2002CN1371028A Exposure equipment with interferometer system
09/24/2002US6456958 Method for allowing a user access to an electronic device having improved security
09/24/2002US6456384 Moiré interferometer with overlapping illumination and imaging systems
09/24/2002US6456383 Method and apparatus for making absolute range measurements
09/24/2002US6456382 Interferometer that measures aspherical surfaces
09/24/2002US6456373 Method and apparatus for monitoring the light emitted from an illumination apparatus for an optical measuring instrument
09/24/2002US6456372 Steering aligning apparatus and method
09/24/2002US6456368 Three-dimensional image capturing device
09/24/2002US6456318 Defect inspection apparatus and method by comparing two pairs of areas adjacent to one another
09/24/2002US6455835 System, method, and program product for acquiring accurate object silhouettes for shape recovery
09/24/2002US6453760 Automated detection of unacceptable warpage of trays for holding integrated circuit packages
09/19/2002WO2002073127A1 Land appearance inspecting device, and land appearance inspecting method
09/19/2002WO2002073126A1 Apparatus and method for isolating and measuring movement in metrology apparatus
09/19/2002WO2002073125A1 Apparatus and method for isolating and measuring movement in a metrology apparatus
09/19/2002WO2002073122A2 Cyclic error reduction in average interferometric position measurements
09/19/2002WO2002055958A8 Topological and motion measuring tool
09/19/2002WO2002052242A3 Method and apparatus for crack and fracture detection utilizing bragg gratings
09/19/2002WO2002025206A9 Assembly and method for the optical-tactile measurement of a structure
09/19/2002US20020133078 Transesophageal ultrasound probe with imaging element position sensor in scanhead
09/19/2002US20020132409 Substrate processing apparatus
09/19/2002US20020131622 Apparatus and method for adjusting focus position in iris recognition system
09/19/2002US20020131621 Target recognition apparatus
09/19/2002US20020131467 Gas laser and optical system
09/19/2002US20020131058 Procedure and device for measuring the thickness of a liquid layer
09/19/2002US20020131056 Measuring system with improved method of reading image data of an object
09/19/2002US20020131055 Method and apparatus for the determination of mask rules using scatterometry
09/19/2002US20020131051 Interferometric alignment device
09/19/2002US20020131039 Method and apparatus for mapping system calibration
09/19/2002US20020131038 Method for measuring light transmittance and apparatus therefor
09/19/2002US20020131036 Devices and methods for measuring residual stress in a membrane region of a segmented reticle blank
09/19/2002US20020131033 Distance measuring apparatus
09/19/2002US20020130961 Display device of focal angle and focal distance in iris recognition system
09/19/2002US20020130951 Stride length measurement device
09/19/2002US20020130651 Eddy-optic sensor for object inspection
09/19/2002US20020129658 Pressure distribution image analysis process
09/19/2002US20020129508 Arrangement for determining the relative position of two bodies that are movable in relation to each other, and process for producing such an arrangement
09/19/2002US20020129504 Process and device for determining the axial position of two machine spindles
09/19/2002US20020129476 Device for manufacturing semiconductor device and method of manufacturing the same
09/19/2002DE19821059C2 Verfahren und Vorrichtung zur Erfassung von Formabweichungen an Objekten Method and apparatus for detection of deviations in shape of objects
09/19/2002DE10200264A1 Lichtsondenmikroskop Light probe microscope
09/19/2002DE10161060A1 Fehlerprüfverfahren für einen dreidimensionalen Gegenstand Error checking for a three-dimensional object
09/19/2002DE10149750A1 Imaging, measuring at least part of surface of at least one three-dimensional object involves computing 3D information continuously using multiple acquisition units and self-calibration data
09/19/2002DE10137241A1 Arrangement, for detecting and measuring objects, optically projects markers onto object, records partial views of object in global coordinate system using information re-detected markers
09/19/2002DE10113211A1 Marking photogrammetrically body part and given code designations by covering body part with tight covering on which are drawn contrasting patterns in which are single repeated designations for photogrammetrical evaluation of suitable marks
09/19/2002DE10112024A1 Anordnung und Verfahren zum Erzeugen mehrerer zueinander definiert ausgerichteter optischer Achsen Arrangement and method for generating a plurality of mutually aligned optical axes defined
09/19/2002DE10111301A1 Prüfeinrichtung und -verfahren für verformbare Prüflinge Test device and method for deformable samples
09/19/2002DE10111130A1 Koordinatenmeßgerät mit einem Videotastkopf Co-ordinate with a video probe
09/19/2002DE10110969A1 Detecting surface deformations with coherent light involves assessing functions computed from associated reference and object sub-images to determine local inclination angle per sub-image
09/18/2002EP1241634A2 Display device of operation limit angle and distance in iris recognition system
09/18/2002EP1241614A2 Apparatus and method for adjusting focus position in iris recognition system
09/18/2002EP1241465A1 Method and apparatus for classifying defects occuring at or near a surface of a smooth substrate
09/18/2002EP1241461A2 Method for measuring light transmittance of lenses and apparatus therefor
09/18/2002EP1241455A1 Method and system for measuring
09/18/2002EP1241442A2 Method of determining the position of measured images of an object relative to the object
09/18/2002EP1241440A1 Alignment device of pulleys with laser and ground glass screen or angle scale
09/18/2002EP1241439A2 Procedure and device to measure profiled elongated objects
09/18/2002EP1241312A2 Sensor for automatic doors
09/18/2002EP1240869A2 Transesophageal ultrasound probe with imaging element position sensor in scanhead
09/18/2002EP1240704A1 Optical measuring device in a pressed-in conducting bar of an electrical machine
09/18/2002EP1240580A1 Radio based proximity token with multiple antennas
09/18/2002EP1240572A2 Method of determining distance between two or more electronic devices
09/18/2002EP1240496A1 Device for measuring, by diffraction, the size of substantially spherical particles, in particular opaque drops
09/18/2002EP1240476A1 Optical mapping apparatus with adjustable depth resolution
09/18/2002EP1240258A1 Coating with optical taggent
09/18/2002EP1053447B1 Device for continuously monitoring the junction of a conveyor belt
09/18/2002EP1029220B1 Device for referencing a system of co-ordinates
09/18/2002EP0968637B1 Method for gauging a device for producing electrical components
09/18/2002CN1369941A Mfg. method of spark plug and its mfg. appts.
09/18/2002CN1369697A Lens detector for measuring performance of lens or contact lens
09/18/2002CN1369688A Automatic in-line leangth measuring method and instrument for shaped steel
09/18/2002CN1091270C Parts testing method
09/18/2002CN1091246C Device for determining point of impact of darts on target
09/17/2002US6453263 Surface analysis using ellipsometry
09/17/2002US6452686 Method and system for high speed measuring of microscopic targets
09/17/2002US6452685 Apparatus for evaluating metalized layers on semiconductors
09/17/2002US6452678 Reflectance method for evaluating the surface characteristics of opaque materials
09/17/2002US6452671 Illuminator for macro inspection, macro inspecting apparatus and macro inspecting method
09/17/2002US6452670 Process and instrument for checking the bonding of the cellular core of a honeycomb to a skin
09/17/2002US6452208 Semiconductor chip including a reference element having reference coordinates
09/17/2002US6452159 Position measuring system
09/17/2002US6452145 Method and apparatus for wavefront sensing
09/17/2002US6451700 Method and apparatus for measuring planarity of a polished layer
09/17/2002US6451492 Optical system
09/17/2002US6450641 Method of corneal analysis using a checkered placido apparatus
09/12/2002WO2002071363A1 Device for detecting a running surface and vehicle using same
09/12/2002WO2002071330A1 Image processing device and method therefor and program codes, storing medium
09/12/2002WO2002071117A2 Optical delay line
09/12/2002WO2002071035A1 Light scattering measuring probe
09/12/2002WO2002070987A1 System and method of aligning two optical axis towards each other
09/12/2002WO2002070986A1 A local track pitch measuring apparatus and method