Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/2004
09/14/2004US6792368 System and method for heterodyne interferometer high velocity type non-linearity compensation
09/14/2004US6792359 Method for inspecting defect and system therefor
09/14/2004US6792147 Object recognition system
09/14/2004US6791700 Coordinate inputting/detecting apparatus, method and computer program product designed to precisely recognize a designating state of a designating device designating a position
09/14/2004US6791699 Optical displacement-measuring apparatus
09/14/2004US6791698 Confocal imaging system having a divided retroreflector
09/14/2004US6791696 Automated optical measurement apparatus and method
09/14/2004US6791695 Shearographic imaging machine with archive memory for animation data and air handling system
09/14/2004US6791686 Apparatus for integrated monitoring of wafers and for process control in the semiconductor manufacturing and a method for use thereof
09/14/2004US6791680 System and method for inspecting semiconductor wafers
09/14/2004US6791461 Object detection sensor
09/14/2004US6791071 Apparatus for measuring aperture size of near-field optical probe and method thereof
09/14/2004US6790175 Endoscope system
09/14/2004US6789416 Hand held probe for measuring tire tread wear
09/14/2004US6789327 Touch probe with deflection measurement and inspection optics
09/10/2004WO2004077354A1 Image processing device, method, and program
09/10/2004WO2004077353A1 Image processing device, method, and program
09/10/2004WO2004077033A1 A scatterometer and a method for inspecting a surface
09/10/2004WO2004077032A1 A scatterometer and a method for observing a surface
09/10/2004WO2004076970A1 Method and optical system for measuring the topography of a test object
09/10/2004WO2004076969A1 Single wavelength ellipsometry for measuring the thickness of thin films on multilayer substrates
09/10/2004WO2004076968A1 Quality control method for two-dimensional matrix codes on metallic workpieces, using an image processing device
09/10/2004WO2004075677A1 Foot pattern measuring instrument
09/09/2004US20040176928 CD metrology method
09/09/2004US20040176925 Position/orientation measurement method, and position/orientation measurement apparatus
09/09/2004US20040175030 Systems and methods for detecting defects in printed solder paste
09/09/2004US20040174543 optoelectronic measuring method and distance measuring device for carrying out the method
09/09/2004US20040174542 Optical measurement device and method
09/09/2004US20040174541 Three dimensional scanning camera
09/09/2004US20040174540 Method of and apparatus for inspecting a curved shape
09/09/2004US20040174539 Moire deflectometer including non-mechanical transparent, spatial light modulators for demonstrating two-axis rulings
09/09/2004US20040174538 Systems and methods for evaluating semiconductor layers
09/09/2004US20040174537 Method for measuring surface properties and co-ordinate measuring device
09/09/2004US20040174531 System for interferometric fit testing
09/09/2004US20040174529 Opto-acoustic apparatus with optical heterodyning for measuring solid surfaces and thin films
09/09/2004US20040174526 Non linear phase shift calibration for interferometric measurement of multiple surfaces
09/09/2004US20040174516 Distance measuring method and image input device with distance measuring function
09/09/2004US20040174510 Alignment method and exposure apparatus using the method
09/09/2004US20040173734 Rapid high resolution position sensor for auto steering
09/09/2004US20040173225 Method of and apparatus for ascertaining the transverse dimensions of rod-shaped articles
09/09/2004DE10322907A9 Vorrichtung zur Messung von Außen-, Innenabmessungen und Abständen von Messobjekten Device for measuring outside, inside dimensions and distances of measurement objects
09/09/2004DE10309033A1 Optische Messanordnung Optical device
09/09/2004DE10308684A1 Verfahren zur Qualitätskontrolle von zweidimensionalen Matrix-Codes an metallischen Werkstücken mit einem Bildverarbeitungsgerät Method for quality control of two-dimensional matrix code on metal workpieces with an image processing apparatus
09/09/2004DE10307209A1 Dental method for creating dimensional data for dental prostheses, whereby two or more pattern projection data sets relating to an object are combined using data set linking means for implying a movement between projection points
09/09/2004DE10306669A1 Interferometric shape checking device, used during shaping of a lens surface, couples light into lens through surface not being shaped and measures light rays reflected from inside of surface being shaped
09/09/2004DE102004007452A1 Vorrichtung zur Prüfung und/oder Vermessung von Prüflingen Device for testing and / or measurement of specimens
09/08/2004EP1455253A2 Absolute positioning system
09/08/2004EP1454113A1 System and method for inspection using white light interferometry
09/08/2004EP1454112A2 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance
09/08/2004EP1102963B1 Imaging a three dimensional structure by confocal focussing an array of light beams
09/08/2004CN1527243A 图像读取装置 Image reading means
09/08/2004CN1527026A Differential confocal scanning detection method with high spatial resolution
09/08/2004CN1527025A Electrooptical angle measurer
09/08/2004CN1165779C Adaptive photoheterodyne method for detecting light refraction
09/07/2004US6789240 Method of controlling bond process quality by measuring wire bond features
09/07/2004US6788835 Multiplexable fiber-optic strain sensor system with temperature compensation capability
09/07/2004US6788817 Object recognition system
09/07/2004US6788807 Three dimensional information measurement method and apparatus
09/07/2004US6788422 Method and apparatus for using quasi-stable light sources in interferometry applications
09/07/2004US6788411 Method and apparatus for adjusting illumination angle
09/07/2004US6788390 Light receiving apparatus, mark detecting apparatus using light receiving apparatus, exposing apparatus, maintenance method of exposing apparatus, manufacturing method of semiconductor device using exposing apparatus and semiconductor manufacturing plant
09/07/2004US6787378 Method for measuring height of sphere or hemisphere
09/07/2004US6786899 Eye tracking employing a retro-reflective disk
09/07/2004US6786650 Method and apparatus for analyzing the end face of a multifiber ferrule
09/07/2004US6786099 Surface photo-acoustic film measurement device and technique
09/02/2004WO2004074770A1 Method for optical measurement of the shape of a three-dimensional object
09/02/2004WO2004074769A2 Method for the contactless measurement of an object
09/02/2004WO2004074768A1 Imaging device
09/02/2004WO2004074582A2 Road marking evaluation and measurement system
09/02/2004WO2004046655A3 System and method for characterizing three-dimensional structures
09/02/2004WO2004046645A3 Fast 3d height measurement method and system
09/02/2004US20040172170 Portable wheel alignment device
09/02/2004US20040172164 Method and apparatus for single image 3D vision guided robotics
09/02/2004US20040171929 Method and device for determining the contour of a recess in a piece of material
09/02/2004US20040170315 Calibration apparatus, calibration method, program for calibration, and calibration jig
09/02/2004US20040169868 Optical measurement arrangement
09/02/2004US20040169866 Transmission shear grating in checkerboard configuration for EUV wavefront sensor
09/02/2004US20040169860 Optical alignment apparatus and method using visual optical source and image
09/02/2004US20040169853 Surface inspection apparatus
09/02/2004US20040169850 System and method for double sided optical inspection of thin film disks or wafers
09/02/2004US20040169843 Detection apparatus for the optical detection of an object, method for operating a detection apparatus of this type and scanning apparatus and confocal microscope
09/02/2004US20040169837 Enhanced lithographic displacement measurement system
09/02/2004DE20320498U1 Light barrier for defining edge of security area has two posts with arrangement of lamps, mirror and photocells producing light beams crossing intervening space
09/02/2004DE202004007476U1 Alignment device for formation of linear optical markings, e.g. a laser-level instrument, whereby markings are formed with grooved shaped lenses that cause light to reflect in different directions dependent on its incident position
09/02/2004DE19913139C5 Vorrichtung zum Erzeugen eines Ursprungssignales einer optischen Linearskala An apparatus for generating an origin signal of an optical linear scale
09/02/2004DE10309544A1 Linear triangulation object optical profile measurement method, in which an object being profiled is illuminated with a linear beam and imaged in the same location using different imaging parameters
09/02/2004DE102004008364A1 Vorrichtung zum Messen der Größe von Artikeln Apparatus for measuring the size of articles
09/01/2004EP1451526A2 Method and device for detecting the shape of a three-dimensional object
09/01/2004EP1451524A2 Phase-shifting interferometry method and system
09/01/2004EP1451523A1 System and method for wavefront measurement
09/01/2004EP1236035B1 Method for quality control of material layers
09/01/2004CN2638027Y Measuring value display device on polarimeter
09/01/2004CN2638026Y Wire width measuring equipment having light ray pointer function
09/01/2004CN1526065A 位置测量装置 Position measuring means
09/01/2004CN1525142A Mark position detection equipment
09/01/2004CN1525141A Quantifier used for position measuring system
09/01/2004CN1524699A Image recognition method for nozzle bore and relevant method and apparatus
09/01/2004CN1165077C Method and apparatus for verifying quality of semiconductor substrate
09/01/2004CN1164886C Oil gas pipeline leak intelligent on line monitoring method based on distribution type optical fibre sensor
08/2004
08/31/2004US6785638 Method and system of dynamic learning through a regression-based library generation process