Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/2004
11/10/2004EP0920672B1 Position-sensing unit and multidimensional pointer comprising one or several such units
11/10/2004CN2655175Y High-precise angle displacement measurer based on F-P plate sine phase modulation
11/10/2004CN2655174Y On-line thick detector for float glass
11/10/2004CN2655173Y Remote-point relative position measuring ruler
11/10/2004CN1544880A Array aiming adjusting device of fiber-optic collimating apparatus
11/10/2004CN1175368C Three-dimensional moulding device and method
11/10/2004CN1175263C Nozzle detecting device for synthetic fibre-optical substrate
11/09/2004US6816638 Strain sensing
11/09/2004US6816631 Calculations of coordinates of target image displayed on monitor screen
11/09/2004US6816609 Vision measuring machine, method, and medium
11/09/2004US6816535 Co-alignment of time-multiplexed pulsed laser beams to a single reference point
11/09/2004US6816263 Interferometric measurement apparatus for wavelength calibration
11/09/2004US6816253 Substrate holder, and use of the substrate holder in a highly accurate measuring instrument
11/09/2004US6816246 Method for measuring light transmittance and apparatus therefor
11/09/2004US6816239 Exposure apparatus, method of controlling same, and method of manufacturing devices
11/09/2004US6815838 Laser alignment target and method
11/09/2004US6815702 Method and apparatus for detection of an edge of a printing plate mounted on a drum imaging system
11/09/2004US6815701 Method and device for measuring wear on internal barrel surfaces
11/09/2004US6815651 Optical position measurement system employing one or more linear detector arrays
11/09/2004US6815228 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method
11/09/2004US6815128 Box-in-box field-to-field alignment structure
11/09/2004US6814121 Bonding apparatus
11/04/2004WO2004094945A1 Device and method of extracting landmarks
11/04/2004WO2004094943A1 Motion capturing method, motion capturing device, and motion capturing marker
11/04/2004WO2004086015A3 Optical inspection system, illumination apparatus and method for imaging specular objects based on illumination gradients
11/04/2004WO2004081492A3 Determining the geometry and dimensions of a three-dimensional object
11/04/2004WO2004074769A3 Method for the contactless measurement of an object
11/04/2004WO2004063663A3 Opto-electronic transmissive edge location sensor
11/04/2004US20040220767 Image processing method and apparatus therefor
11/04/2004US20040220760 Method and system of dynamic learning through a regression-based library generation process
11/04/2004US20040219865 Substrate polishing apparatus
11/04/2004US20040218786 Stroke information measuring apparatus and stroke information measuring method
11/04/2004US20040218479 Optical position detecting device and recording medium
11/04/2004US20040218192 Edge roughness measurement in optical metrology
11/04/2004US20040218191 Microscope with fixed-element autocollimator for tilt adjustment
11/04/2004US20040218189 Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements
11/04/2004US20040218187 Multiple wavelength spectrometer
11/04/2004US20040218185 Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment
11/04/2004US20040218181 Systems and methods for absolute positioning using repeated quasi-random pattern
11/04/2004US20040218180 Thin film optical measurement system and method with calibrating ellipsometer
11/04/2004US20040218040 Appearance inspection apparatus and method of image capturing using the same
11/04/2004US20040217288 Microstructured pattern inspection method
11/04/2004US20040217269 Optoelectronic angle-of-rotation sensor
11/04/2004US20040217267 Optoelectronic device for detecting position and movement and method associated therewith
11/04/2004US20040217264 Tunable sensor
11/04/2004US20040216313 Line generating device
11/04/2004DE4115841B4 Vorrichtung zur optischen Kontrolle von Gegenständen Apparatus for optical control of Objects
11/04/2004DE10316807A1 Three-dimensional measurement method for measuring the shape of an object, especially for vehicle applications, whereby dispersed light from a polychromatic source is used with a camera orientated at the same object area
11/04/2004DE10140041B4 Verfahren zur Ermittlung der Fläche eines gravierten Näpfchens Method for determining the surface of an engraved cup is
11/03/2004EP1473549A1 Systems and methods for absolute positioning using repeated quasi-random pattern
11/03/2004EP1473541A2 Line generating device
11/03/2004EP1473540A1 Method and device for determining the level of a plurality of measuring points
11/03/2004EP1473539A1 Method and apparatus for measuring the form and/or deformation of an object, in particular by interferometry
11/03/2004EP1472643A1 Arrangement and method for measurement on a resonant oscillator, control thereof and setting of a pixel width
11/03/2004EP1472531A2 Use of electronic speckle interferometry for defect detection in fabricated devices
11/03/2004EP1472505A2 Reentry vehicle interceptor with ir and variable fov laser radar
11/03/2004EP1472052A2 Method and apparatus for single camera 3d vision guided robotics
11/03/2004EP1203199B1 Thermal resonance imaging method
11/03/2004EP1086352B1 Measuring probe with diaphragms ( modules)
11/03/2004CN2653440Y T-shape rail side work surface laser indicator
11/03/2004CN2653439Y Corrector for belt wheel and chain wheel mounting
11/03/2004CN2653438Y Detector for centre and inclined angle
11/03/2004CN2653437Y Laser centring device
11/03/2004CN2653436Y Optic scanning outer diameter measuring system without scanning objective lens
11/03/2004CN2653435Y Folding laser triangle method measurer
11/03/2004CN1542543A Image-taking apparatus
11/03/2004CN1542532A Hollow shaft absolute type matrix encoder possessing 13 bits code output
11/03/2004CN1542426A Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object
11/03/2004CN1542409A Line generating device
11/03/2004CN1542403A Non-contact measurement system and method
11/03/2004CN1542401A Method for inspecting depth of parallelism for optic axis and mounting basal plane
11/03/2004CN1174242C Detection system of sheet glass for making display
11/03/2004CN1174220C Device and method for alignment
11/03/2004CN1174219C Method for extracting image of amorphous sealing packing material
11/03/2004CN1174218C Method and arrangement for determining geometry of objects using coordinate measuring device
11/02/2004US6813035 Method for determining three-dimensional surface coordinates
11/02/2004US6813034 Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements
11/02/2004US6813033 Optical method of reading the shape of a profile and application thereof to reading the inside edge of a spectacle frame rim
11/02/2004US6813031 Method of determining material using intensity of light
11/02/2004US6813030 Optical interference tomographic image observing apparatus
11/02/2004US6813029 Interferometric measuring device for form measurement
11/02/2004US6813023 Automatic optical inter-alignment of two linear arrangements
11/02/2004US6813022 Interferometer system
11/02/2004US6813020 Device for determining the values of at least one parameter of particles, especially of water droplets
11/02/2004US6813015 Adjusting device with an optical regulating device having a reflector
11/02/2004US6813001 Exposure method and apparatus
11/02/2004US6812964 Three-dimensional image capturing device
11/02/2004US6812850 Measuring apparatus
11/02/2004US6812479 Sample positioning method for surface optical diagnostics using video imaging
11/02/2004US6812447 Image pickup apparatus having a wave synthesizer for incident and reference light
11/02/2004US6810749 Fibre-optical strain gauge and method for the production of said strain gauge
11/02/2004US6810721 Submerged sample observation apparatus and method
11/02/2004US6810590 Steering angle detector
10/2004
10/28/2004WO2004092832A2 Determination of center of focus by parameter variability analysis
10/28/2004WO2004092714A1 Method for measuring thin films
10/28/2004WO2004046655A9 System and method for characterizing three-dimensional structures
10/28/2004US20040215418 Wafer shape evaluating method, wafer, and wafer selecting method
10/28/2004US20040215417 Method of inkless wafer blind assembly
10/28/2004US20040213463 Multiplexed, spatially encoded illumination system for determining imaging and range estimation
10/28/2004US20040212812 Optical metrology of single features