Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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11/10/2004 | EP0920672B1 Position-sensing unit and multidimensional pointer comprising one or several such units |
11/10/2004 | CN2655175Y High-precise angle displacement measurer based on F-P plate sine phase modulation |
11/10/2004 | CN2655174Y On-line thick detector for float glass |
11/10/2004 | CN2655173Y Remote-point relative position measuring ruler |
11/10/2004 | CN1544880A Array aiming adjusting device of fiber-optic collimating apparatus |
11/10/2004 | CN1175368C Three-dimensional moulding device and method |
11/10/2004 | CN1175263C Nozzle detecting device for synthetic fibre-optical substrate |
11/09/2004 | US6816638 Strain sensing |
11/09/2004 | US6816631 Calculations of coordinates of target image displayed on monitor screen |
11/09/2004 | US6816609 Vision measuring machine, method, and medium |
11/09/2004 | US6816535 Co-alignment of time-multiplexed pulsed laser beams to a single reference point |
11/09/2004 | US6816263 Interferometric measurement apparatus for wavelength calibration |
11/09/2004 | US6816253 Substrate holder, and use of the substrate holder in a highly accurate measuring instrument |
11/09/2004 | US6816246 Method for measuring light transmittance and apparatus therefor |
11/09/2004 | US6816239 Exposure apparatus, method of controlling same, and method of manufacturing devices |
11/09/2004 | US6815838 Laser alignment target and method |
11/09/2004 | US6815702 Method and apparatus for detection of an edge of a printing plate mounted on a drum imaging system |
11/09/2004 | US6815701 Method and device for measuring wear on internal barrel surfaces |
11/09/2004 | US6815651 Optical position measurement system employing one or more linear detector arrays |
11/09/2004 | US6815228 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method |
11/09/2004 | US6815128 Box-in-box field-to-field alignment structure |
11/09/2004 | US6814121 Bonding apparatus |
11/04/2004 | WO2004094945A1 Device and method of extracting landmarks |
11/04/2004 | WO2004094943A1 Motion capturing method, motion capturing device, and motion capturing marker |
11/04/2004 | WO2004086015A3 Optical inspection system, illumination apparatus and method for imaging specular objects based on illumination gradients |
11/04/2004 | WO2004081492A3 Determining the geometry and dimensions of a three-dimensional object |
11/04/2004 | WO2004074769A3 Method for the contactless measurement of an object |
11/04/2004 | WO2004063663A3 Opto-electronic transmissive edge location sensor |
11/04/2004 | US20040220767 Image processing method and apparatus therefor |
11/04/2004 | US20040220760 Method and system of dynamic learning through a regression-based library generation process |
11/04/2004 | US20040219865 Substrate polishing apparatus |
11/04/2004 | US20040218786 Stroke information measuring apparatus and stroke information measuring method |
11/04/2004 | US20040218479 Optical position detecting device and recording medium |
11/04/2004 | US20040218192 Edge roughness measurement in optical metrology |
11/04/2004 | US20040218191 Microscope with fixed-element autocollimator for tilt adjustment |
11/04/2004 | US20040218189 Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements |
11/04/2004 | US20040218187 Multiple wavelength spectrometer |
11/04/2004 | US20040218185 Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment |
11/04/2004 | US20040218181 Systems and methods for absolute positioning using repeated quasi-random pattern |
11/04/2004 | US20040218180 Thin film optical measurement system and method with calibrating ellipsometer |
11/04/2004 | US20040218040 Appearance inspection apparatus and method of image capturing using the same |
11/04/2004 | US20040217288 Microstructured pattern inspection method |
11/04/2004 | US20040217269 Optoelectronic angle-of-rotation sensor |
11/04/2004 | US20040217267 Optoelectronic device for detecting position and movement and method associated therewith |
11/04/2004 | US20040217264 Tunable sensor |
11/04/2004 | US20040216313 Line generating device |
11/04/2004 | DE4115841B4 Vorrichtung zur optischen Kontrolle von Gegenständen Apparatus for optical control of Objects |
11/04/2004 | DE10316807A1 Three-dimensional measurement method for measuring the shape of an object, especially for vehicle applications, whereby dispersed light from a polychromatic source is used with a camera orientated at the same object area |
11/04/2004 | DE10140041B4 Verfahren zur Ermittlung der Fläche eines gravierten Näpfchens Method for determining the surface of an engraved cup is |
11/03/2004 | EP1473549A1 Systems and methods for absolute positioning using repeated quasi-random pattern |
11/03/2004 | EP1473541A2 Line generating device |
11/03/2004 | EP1473540A1 Method and device for determining the level of a plurality of measuring points |
11/03/2004 | EP1473539A1 Method and apparatus for measuring the form and/or deformation of an object, in particular by interferometry |
11/03/2004 | EP1472643A1 Arrangement and method for measurement on a resonant oscillator, control thereof and setting of a pixel width |
11/03/2004 | EP1472531A2 Use of electronic speckle interferometry for defect detection in fabricated devices |
11/03/2004 | EP1472505A2 Reentry vehicle interceptor with ir and variable fov laser radar |
11/03/2004 | EP1472052A2 Method and apparatus for single camera 3d vision guided robotics |
11/03/2004 | EP1203199B1 Thermal resonance imaging method |
11/03/2004 | EP1086352B1 Measuring probe with diaphragms ( modules) |
11/03/2004 | CN2653440Y T-shape rail side work surface laser indicator |
11/03/2004 | CN2653439Y Corrector for belt wheel and chain wheel mounting |
11/03/2004 | CN2653438Y Detector for centre and inclined angle |
11/03/2004 | CN2653437Y Laser centring device |
11/03/2004 | CN2653436Y Optic scanning outer diameter measuring system without scanning objective lens |
11/03/2004 | CN2653435Y Folding laser triangle method measurer |
11/03/2004 | CN1542543A Image-taking apparatus |
11/03/2004 | CN1542532A Hollow shaft absolute type matrix encoder possessing 13 bits code output |
11/03/2004 | CN1542426A Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object |
11/03/2004 | CN1542409A Line generating device |
11/03/2004 | CN1542403A Non-contact measurement system and method |
11/03/2004 | CN1542401A Method for inspecting depth of parallelism for optic axis and mounting basal plane |
11/03/2004 | CN1174242C Detection system of sheet glass for making display |
11/03/2004 | CN1174220C Device and method for alignment |
11/03/2004 | CN1174219C Method for extracting image of amorphous sealing packing material |
11/03/2004 | CN1174218C Method and arrangement for determining geometry of objects using coordinate measuring device |
11/02/2004 | US6813035 Method for determining three-dimensional surface coordinates |
11/02/2004 | US6813034 Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements |
11/02/2004 | US6813033 Optical method of reading the shape of a profile and application thereof to reading the inside edge of a spectacle frame rim |
11/02/2004 | US6813031 Method of determining material using intensity of light |
11/02/2004 | US6813030 Optical interference tomographic image observing apparatus |
11/02/2004 | US6813029 Interferometric measuring device for form measurement |
11/02/2004 | US6813023 Automatic optical inter-alignment of two linear arrangements |
11/02/2004 | US6813022 Interferometer system |
11/02/2004 | US6813020 Device for determining the values of at least one parameter of particles, especially of water droplets |
11/02/2004 | US6813015 Adjusting device with an optical regulating device having a reflector |
11/02/2004 | US6813001 Exposure method and apparatus |
11/02/2004 | US6812964 Three-dimensional image capturing device |
11/02/2004 | US6812850 Measuring apparatus |
11/02/2004 | US6812479 Sample positioning method for surface optical diagnostics using video imaging |
11/02/2004 | US6812447 Image pickup apparatus having a wave synthesizer for incident and reference light |
11/02/2004 | US6810749 Fibre-optical strain gauge and method for the production of said strain gauge |
11/02/2004 | US6810721 Submerged sample observation apparatus and method |
11/02/2004 | US6810590 Steering angle detector |
10/28/2004 | WO2004092832A2 Determination of center of focus by parameter variability analysis |
10/28/2004 | WO2004092714A1 Method for measuring thin films |
10/28/2004 | WO2004046655A9 System and method for characterizing three-dimensional structures |
10/28/2004 | US20040215418 Wafer shape evaluating method, wafer, and wafer selecting method |
10/28/2004 | US20040215417 Method of inkless wafer blind assembly |
10/28/2004 | US20040213463 Multiplexed, spatially encoded illumination system for determining imaging and range estimation |
10/28/2004 | US20040212812 Optical metrology of single features |