Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/2004
08/17/2004US6778285 Automatic in situ pellicle height measurement system
08/17/2004US6778283 Method and apparatus for locating a football on a field of play
08/17/2004US6778282 Measuring positions of coplanarity of contract elements of an electronic component with a flat illumination and two cameras
08/17/2004US6778281 Phase shift fringe analysis method and apparatus using the same
08/17/2004US6778279 Inline sagnac fiber optic sensor with modulation adjustment
08/17/2004US6778275 Interior and exterior polygon pattern; photolithography
08/17/2004US6778266 Semiconductor wafer tilt monitoring on semiconductor fabrication equipment plate
08/17/2004US6778260 Coordinate measuring stage and coordinate measuring instrument
08/17/2004US6778236 Reflective liquid crystal strain gauge with aspected particles and polarization-sensitive devices
08/17/2004US6778219 Three-dimensional image capturing device
08/17/2004US6777666 Position sensor utilizing light emissions from a lateral surface of a light-emitting structure and two light collectors
08/17/2004US6776031 Submerged sample observation apparatus and method
08/17/2004CA2205937C Electro-optical measuring device for absolute distances
08/12/2004WO2004068492A1 Method and device for measuring angle of torsion of suspension for magnetic disk
08/12/2004WO2004068400A2 Methods and apparatus for making images including depth information
08/12/2004WO2004068088A2 Optical characterization of surfaces and plates
08/12/2004WO2004068072A1 Calibration certification for wheel alignment equipment
08/12/2004WO2004068071A1 Apparatus for determining the vertical profile of an object
08/12/2004WO2004068070A1 Method for determining structural parameters of a surface
08/12/2004WO2004068066A2 Full-filled optical measurements of surface properties of panels, substrates and wafers
08/12/2004WO2004068064A2 A method and an apparatus for determining the distance between a collimator lens and an object
08/12/2004WO2004048888A3 Method of measuring thickness of an opaque coating using infrared absorbance
08/12/2004WO2004040234A3 Arrangement for measuring the geometry or structure of an object
08/12/2004US20040156533 Land appearance inspecting device, and land appearance inspecting method
08/12/2004US20040156054 Method for measuring an object by means of a co-ordinate measuring device with image processing sensor
08/12/2004US20040156053 Method and arrangement for the depth-resolved detection of specimens
08/12/2004US20040156043 Method and apparatus for simultaneous 2-D and topographical inspection
08/12/2004US20040156042 System for detecting anomalies and/or features of a surface
08/12/2004US20040156027 Lithographic projection mask, device manufacturing method, and device manufactured thereby
08/12/2004US20040155190 Portable coating weight reader
08/12/2004US20040154402 Remote laser beam delivery system and method for use with a robotic positioning system for ultrasonic testing purposes
08/12/2004US20040154179 Adjustable probe
08/12/2004US20040154178 Length sensor
08/12/2004US20040154177 Adjustable probe
08/12/2004US20040154174 Method and device for determining the rectilinearity of guide rails
08/12/2004DE202004009224U1 Sensor zur Vermessung der Oberfläche eines Objekts Sensor for measuring the surface of an object
08/12/2004DE19927025B4 Anordnung zur Erfassung der Oberflächenstrukturen von Fingern und/oder Handinnenflächen Arrangement for detection of the surface structures of the fingers and / or palms
08/12/2004DE10304317A1 Speckle shear interferometry device for measurement of strain or deformation of objects, including in-plane and out-of-plane measurements uses a commercial digital camera with a screen and special shear objective
08/12/2004DE10254942B3 Verfahren zur automatischen Ermittlung der Koordinaten von Abbildern von Marken in einem Volumendatensatz und medizinische Vorrichtung A method for automatically determining the coordinates of images of marks in a volume dataset and medical device
08/12/2004DE10242628B4 Verfahren und System zur Größenkalibrierung Method and system for size calibration
08/12/2004DE10242535B4 Vorrichtung zum fluchtenden Ausrichten eines Riemens oder einer Kette Apparatus for aligning a belt or chain
08/12/2004DE10225193B4 Verfahren zur Kalibrierung der Vergrößerung eines Mikroskops sowie kalibrierbares Mikroskop Method of calibrating the magnification of a microscope and can be calibrated microscope
08/11/2004EP1445964A2 Multi-layered real-time stereo matching method and system
08/11/2004EP1445577A1 A method and an apparatus for determining the distance between a collimator lens and an object
08/11/2004EP1445576A1 Method and device for measuring the diameter of a rodlike object, in particular of the tobacco industry
08/11/2004EP1445097A1 Verifying correct mounting of a printing plate on an external drum imaging machine
08/11/2004EP1445005A1 Stroke information meausring instrument and stroke information meausring method
08/11/2004EP1444643A1 Video surveillance system employing video primitives
08/11/2004EP1444482A1 Scanning interferometer for aspheric surfaces and wavefronts
08/11/2004EP1444481A1 Rapid in situ mastering of an aspheric fizeau
08/11/2004EP1443853A1 Illumination unit for the generation of optical sectional images in transparent media in particular in the eye
08/11/2004CN1520510A Method and appts. for defining position of edge surface of piled, e.g. boardlike objects
08/11/2004CN1519538A Appts. and method for measuring rod-like, matter diameter esp. rod-like matter of tobacco processing industry
08/10/2004US6775817 Inspection system and semiconductor device manufacturing method
08/10/2004US6775606 Device and method for sensing an object and use of the device and method for adjusting an element
08/10/2004US6775403 Device for and method of processing 3-D shape data
08/10/2004US6775395 Object recognition system
08/10/2004US6775051 Systems and methods for scanning a beam of light across a specimen
08/10/2004US6775015 Optical metrology of single features
08/10/2004US6775014 System and method for determining the location of a target in a room or small area
08/10/2004US6775013 Method and apparatus for measuring displacement or motion error
08/10/2004US6775012 System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface
08/10/2004US6775011 Apparatus for determining measurements of an object utilizing negative imaging
08/10/2004US6775010 Measuring system with improved method of reading image data of an object
08/10/2004US6775006 Height scanning interferometry method and apparatus including phase gap analysis
08/10/2004US6775004 Measuring surface roughness to calculate filler dispersion in a polymer sample
08/10/2004US6774997 Apparatus for analyzing multi-layer thin film stacks on semiconductors
08/10/2004US6772630 Micro-distance toss-up type absolute gravimeter
08/10/2004US6772527 Modular measurement device
08/10/2004US6772524 Chassis alignment system
08/05/2004WO2004066028A2 Method for process optimization and control by comparison between 2 or more measured scatterometry signals
08/05/2004WO2004065904A1 Optical measuring process and precision measuring machine for determining the deviations from ideal shape of technically polished surfaces
08/05/2004WO2004065903A1 Inspection device for mouth of container
08/05/2004WO2004065902A1 Method and apparatus for the contactless measurement of the thickness of a coating on a substrate
08/05/2004WO2004065901A1 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques
08/05/2004WO2004065900A1 Optical sensing device
08/05/2004WO2004065899A1 Optical sensing device
08/05/2004WO2004065897A2 Interferometric measuring device
08/05/2004WO2004055564A3 Efficient coupling of light into light guides
08/05/2004WO2004019382A9 Tft sensor having improved imaging surface
08/05/2004US20040153283 Apparatus and method for displaying numeric values corresponding to the volume of segments of an irregularly shaped item
08/05/2004US20040151380 Multi-layered real-time stereo matching method and system
08/05/2004US20040151369 Method and system for imaging an object
08/05/2004US20040151363 Choice of reference markings for enabling fast estimating of the position of an imaging device
08/05/2004US20040151362 Method and apparatus for determining defect detection sensitivity data, control method of defect detection apparatus, and method and apparatus for detecting defect of semiconductor devices
08/05/2004US20040151345 Image analysis apparatus
08/05/2004US20040151068 Dimensioning system and method of dimensioning
08/05/2004US20040150839 Method for measuring the spatial position and/or opening of a work piece
08/05/2004US20040150838 Model optimization for structures with additional materials
08/05/2004US20040150837 Three-dimensional measurement apparatus and three-dimensional measurement method
08/05/2004US20040150836 Method and device for determining the absolute coordinates of an object
08/05/2004US20040150834 Application of the phase shifting diffraction interferometer for measuring convex mirrors and negative lenses
08/05/2004US20040150832 Method and apparatus for measuring motion
08/05/2004US20040150823 Exposure apparatus and aligning method
08/05/2004US20040150816 Target for photogrammetric analystical measurement system
08/05/2004US20040150707 Apparatus for measuring the physical properties of a surface and a pattern generating apparatus for writing a pattern on a surface
08/05/2004US20040149897 Structure analysis and defect detection system
08/05/2004US20040149883 Automatic focusing method
08/05/2004US20040148792 Adjustable probe
08/05/2004DE10303659A1 Optisches Messverfahren zur Ermittlung von Idealformabweichungen technisch polierter Oberflächen und Präzisionsmessmaschine zur Durchführung des Messverfahrens The optical measuring method for the determination of ideal shape deviations technically polished surfaces and precision measuring apparatus for performing the method of measurement