| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
|---|
| 01/05/2005 | EP1244895B1 Method and device for determining measuring positions for measuring an object or a part thereof |
| 01/05/2005 | DE4016796B4 Vorrichtung zur Bestimmung dreidimensionaler Koordinaten aus einem Stereobildpaar Apparatus for determining three-dimensional coordinates of a stereo image pair |
| 01/05/2005 | DE19934925B4 Fahrzeugbereich-Erkennungsvorrichtung und Fahrzeugbereich-Bestimmungsverfahren Vehicle area detecting apparatus and vehicle range determination method |
| 01/05/2005 | DE10325942A1 Contactless method for measuring the thickness of a transparent body, e.g. a lens, using a spectrograph, whereby the evaluation unit also considers the dispersion characteristics of the material of the object being measured |
| 01/05/2005 | DE10325108A1 Optoelektronischer Drehwinkelsensor Optoelectronic rotation angle sensor |
| 01/05/2005 | DE10297565T5 Mapping-Sensor für Halbleiterwaferträger Mapping sensor for semiconductor wafer carrier |
| 01/05/2005 | CN2669136Y Hole shaft angle deviation measuring device |
| 01/05/2005 | CN2669135Y Truck frame fixed spring steel plate support hole axiality detecting device |
| 01/05/2005 | CN2669134Y Truck frame straightness laser detecting device |
| 01/05/2005 | CN1561502A Strapdown system for three-dimensional reconstruction |
| 01/05/2005 | CN1561181A Anterior chamber diameter measurement system from limbal ring measurement |
| 01/05/2005 | CN1560563A Laser colimation system and method of automatic measuring light drift angle |
| 01/05/2005 | CN1560562A Fibre-optical beam displacement transducer |
| 01/05/2005 | CN1560561A Adjustable optical phase shifter and phase-shift process |
| 01/05/2005 | CN1183820C Method and device for calibrating displacement path and/or angular position and califrating substrate |
| 01/05/2005 | CN1183819C Method for regulating lighting in device for identifying position of and/or controlling quality of components and/or substrates |
| 01/05/2005 | CN1183473C Fingerprint reading device and method |
| 01/05/2005 | CN1183372C Device for determining geometry of wheel and/or axle in motor vehicles |
| 01/04/2005 | US6839462 Image segmentation method |
| 01/04/2005 | US6839144 Optical displacement sensor |
| 01/04/2005 | US6839143 Method for the interferometric measurement of non-rotationally symmetric wavefront errors |
| 01/04/2005 | US6839141 Method and apparatus for compensation of time-varying optical properties of gas in interferometry |
| 01/04/2005 | US6838688 Light spot position sensor and displacement measuring device |
| 01/04/2005 | US6838686 Alignment method and exposure apparatus using the method |
| 01/04/2005 | US6838657 Optical position detecting device and recording medium |
| 01/04/2005 | US6837595 Surface inspecting illumination device and surface inspecting apparatus |
| 01/04/2005 | US6837074 Method of measuring the twist imparted to an optical fibre and procedure for processing an optical fibre using this method |
| 01/04/2005 | US6836970 Wheel alignment measuring method and apparatus |
| 01/04/2005 | CA2252308C Glass inspection system |
| 01/04/2005 | CA2140461C Light scanner with interlaced camera fields and parallel light beams |
| 12/30/2004 | US20040267496 Thickness gauge for meat products |
| 12/30/2004 | US20040267397 Optical metrology of structures formed on semiconductor wafer using machine learning systems |
| 12/30/2004 | US20040265477 Method for analyzing thin-film layer structure using spectroscopic ellipsometer |
| 12/30/2004 | US20040264839 Optical detection device and optical device |
| 12/30/2004 | US20040264764 Apparatus and method for three-dimensional coordinate measurement |
| 12/30/2004 | US20040264760 Defect inspecting method, defect inspecting apparatus and inspection machine |
| 12/30/2004 | US20040264759 Pattern inspection method and apparatus, and pattern alignment method |
| 12/30/2004 | US20040264758 Method for measuring the geometry of an object by means of a co-ordination measuring device |
| 12/30/2004 | US20040264745 Stereo-coupled face shape registration |
| 12/30/2004 | US20040264398 Method and system for load balancing switch modules in a server system and a computer system utilizing the same |
| 12/30/2004 | US20040264314 Displacement measurement |
| 12/30/2004 | US20040263868 Method for measuring thickness of thin film-like material during surface polishing, and surface polishing method and surface polishing apparatus |
| 12/30/2004 | US20040263866 Apparatus for optical proximity correction, method for optical proximity correction, and computer program product for optical proximity correction |
| 12/30/2004 | US20040263865 Non-circular-orbit detection method and apparatus |
| 12/30/2004 | US20040263864 Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces |
| 12/30/2004 | US20040263863 System and method for design and manufacture of custom face masks |
| 12/30/2004 | US20040263862 Detecting peripheral points of reflected radiation beam spots for topographically mapping a surface |
| 12/30/2004 | US20040263850 Method and apparatus for examining features on semi-transparent and transparent substrates |
| 12/30/2004 | US20040263840 Calibration of reconfigurable inspection machine |
| 12/30/2004 | US20040263839 Container inspection machine |
| 12/30/2004 | US20040263832 Method to grain inspect directionally solidified castings |
| 12/30/2004 | US20040263829 Method and device for inspecting an object using a time delay integration sensor |
| 12/30/2004 | US20040263824 Range finder |
| 12/30/2004 | US20040263815 Apparatus and method for aligning holographic ROM system |
| 12/30/2004 | US20040263672 Focus detecting method, focus detecting mechanism and image measuring device having focus detecting mechanism |
| 12/30/2004 | US20040262529 Pattern defect inspection method and its apparatus |
| 12/30/2004 | US20040262522 Infrared confocal scanning type microscope and measuring method |
| 12/30/2004 | US20040261278 Device and procedure for aligning of components |
| 12/30/2004 | DE202004014281U1 Equipment simplifying location of vehicle bodywork damage, especially bulges, employs transparent film with stripes and light source |
| 12/30/2004 | DE19818972B4 Entfernungsmeßgerät A distance |
| 12/30/2004 | DE10347513A1 Optische Kohärenztomographievorrichtung Optical coherence tomography device |
| 12/30/2004 | DE10326590A1 Car crash test sheet component mechanical surface stress visualization procedure, observes colors in thin chiral layer painted or bonded to surface |
| 12/30/2004 | DE102004022955A1 Position detector of sheet sent to printer, has planar shape light source that illuminates sheet and adjacent area with retrogression reflection angle |
| 12/29/2004 | WO2004114369A2 Three-dimensional and color sensing |
| 12/29/2004 | WO2004114243A1 Method and apparatus for detecting objects using structured light patterns |
| 12/29/2004 | WO2004113985A2 Laser line generating device with swivel base and laser level |
| 12/29/2004 | WO2004113932A2 Method and system for automatic target finding |
| 12/29/2004 | WO2004113834A2 Method of determining a dimension of a sample of a construction material and associated appartus |
| 12/29/2004 | WO2004113833A1 3-d shape measuring unit, processing unit, and production method for semiconductor device |
| 12/29/2004 | WO2004113832A1 Method and measuring device for the contactless measurement of angles or angle modifications in objects |
| 12/29/2004 | WO2004113831A1 Method and measuring device for contactlessly measuring a contour of a surface, and method for automatically correcting coordinates of pixels |
| 12/29/2004 | WO2004113830A1 Strain and ae measurement device using optical fiber sensor |
| 12/29/2004 | WO2004113828A1 Interferometric method for the measurement of plane separations with sub-nanometre accuracy |
| 12/29/2004 | WO2004113825A1 Method and device for measuring unroundness of an object |
| 12/29/2004 | WO2004113706A1 Device and method for inspecting piston ring |
| 12/29/2004 | EP1491967A1 Method and apparatus for positioning a substrate on a substrate table |
| 12/29/2004 | EP1491961A1 Lithographic apparatus and device manufacturing method |
| 12/29/2004 | EP1491936A2 Focus detecting method of an image pickup device and focus detection mechanism |
| 12/29/2004 | EP1490898A2 System and method of broad band optical end point detection for film change indication |
| 12/29/2004 | EP1490670A1 Dark field detection apparatus with traveling lens multi-beam scanner and a method thereof |
| 12/29/2004 | EP1490669A1 Wafer defect detection system with traveling lens multi-beam scanner |
| 12/29/2004 | EP1490651A1 Compact optical contour digitizer |
| 12/29/2004 | EP1073876B1 Measuring a diffracting structure, broadband, polarized, ellipsometric, and an underlying structure |
| 12/29/2004 | CN2667457Y Micro-angle displacement measuring instrument |
| 12/29/2004 | CN2667456Y Length measuring instrument |
| 12/29/2004 | CN1558182A Measuring system for faceplate deflection, internal horizontal and vertical deformation of dam body |
| 12/29/2004 | CN1558181A Monitoring method and device for faceplate deflection of large dam or internal deformation of dam body |
| 12/29/2004 | CN1182369C Measure for wall thickness of hot container |
| 12/29/2004 | CN1182368C Automatic on-line length measuring system |
| 12/29/2004 | CN1182366C Confocal imaging system having divided retroreflector |
| 12/29/2004 | CN1182022C Anti-collision device with non-contact measuring and monitoring device for pulley |
| 12/29/2004 | CN1181952C Three-dimensional reverse evaluating measurer with digitally controlled miller as machine tool |
| 12/28/2004 | US6836577 Variable coupler fiberoptic sensor and sensing apparatus using the sensor |
| 12/28/2004 | US6836562 Method for determining the shape of objects directly from range images |
| 12/28/2004 | US6836561 Method and system for detecting a defect in projected portions of an object having the projected portions formed in the same shape with a predetermined pitch along an arc |
| 12/28/2004 | US6836338 Apparatus for evaluating metalized layers on semiconductors |
| 12/28/2004 | US6836336 Inspection system calibration methods |
| 12/28/2004 | US6836329 Real time IR optical sensor |
| 12/28/2004 | US6836324 Method and apparatus for measurements of patterned structures |
| 12/28/2004 | US6836323 Spatial reference system |