| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 12/15/2004 | CN1554926A Method for realizing high speed moving article 3D profile measurement using stroboscopic structure lighting |
| 12/15/2004 | CN1554925A High precision combined optical grating device for optical 3D measurement |
| 12/15/2004 | CN1180488C Semiconductor position detector and range finder using the same |
| 12/15/2004 | CN1180308C Range-finding apparatus and method and camera using the same thereof |
| 12/15/2004 | CN1180222C Double-frequency confocal step height microscope measuring device |
| 12/15/2004 | CN1180221C Reflected light shield eliminating method for surface measurement of laser displacement sensor |
| 12/14/2004 | US6831750 Method and apparatus for using spatial patterns for measuring mirror tilt angles in digital mirror devices |
| 12/14/2004 | US6831743 Broadband spectroscopic rotating compensator ellipsometer |
| 12/14/2004 | US6831277 Method for measuring dimensions and alignment of thin film magnetic head and apparatus therefor |
| 12/14/2004 | US6830943 Thin film CMOS calibration standard having protective cover layer |
| 12/14/2004 | US6830334 Anterior chamber diameter measurement system from limbal ring measurement |
| 12/09/2004 | WO2004106856A1 Device and method of supporting stereo camera, device and method of detecting calibration, and stereo camera system |
| 12/09/2004 | WO2004106853A1 Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics |
| 12/09/2004 | WO2004106852A1 Method for measuring the sagging of a glass panel to be bent on a ring mould |
| 12/09/2004 | WO2004106851A1 Pickup image processing device of electronic part mounting device and pickup image processing method |
| 12/09/2004 | WO2004068400A3 Methods and apparatus for making images including depth information |
| 12/09/2004 | WO2004005052A3 Tyre wear indicator |
| 12/09/2004 | US20040249504 Robot self-position identification system and self-position identification method |
| 12/09/2004 | US20040248662 Method and apparatus to determine golf ball trajectory and flight |
| 12/09/2004 | US20040247172 Pattern measuring apparatus, pattern measuring method, and manufacturing method of semiconductor device |
| 12/09/2004 | US20040247170 Use of patterned, structured light to detect and measure surface defects on a golf ball |
| 12/09/2004 | US20040246497 Method and device for measuring at least a geometric quantity of an optically reflecting surface |
| 12/09/2004 | US20040246496 Method and apparatus for non-contact three-dimensional surface measurement |
| 12/09/2004 | US20040246494 Scanning apparatus |
| 12/09/2004 | US20040246493 Apparatus for measuring thickness profile and refractive index distribution of multiple layers of thin films by means of two-dimensional refrectometry and method of measuring the same |
| 12/09/2004 | US20040246481 Differential numerical aperture methods |
| 12/09/2004 | US20040246473 Coded-light dual-view profile scanning apparatus |
| 12/09/2004 | US20040246471 Method of adjusting axial direction of monitoring apparatus |
| 12/09/2004 | US20040246470 Image sensing wheel alignment system |
| 12/09/2004 | US20040246468 Electronic surveying apparatus |
| 12/09/2004 | US20040246367 Image measuring method and image measuring device |
| 12/09/2004 | US20040246167 Method and apparatus for discriminating a target objective, and related program |
| 12/09/2004 | US20040245444 Optical sensor using a long period grating suitable for dynamic interrogation |
| 12/09/2004 | US20040245442 Position measuring device |
| 12/09/2004 | US20040244463 Calibration certification for wheel alignment equipment |
| 12/09/2004 | DE10354087A1 Car steering adjustment jig has laser pointer alignment aid on marker unit with wheel mounting clearance holes in base adapter |
| 12/09/2004 | DE10321896A1 Triangulation sensor for object depth scanning, e.g. for optical measurement of the 3D structure of surfaces in the micro- and macroscopic ranges, wherein lenses an illumination beam path are designed to generate tele-centering |
| 12/09/2004 | DE10321883A1 Triangulation measurement device for determining object 3D structure has illumination and observation arrays with a projected pattern being evaluated using cross correlation or phase shift analysis |
| 12/09/2004 | DE10321748A1 Destructive method for measurement of the 3D shape of objects involves the successive removal of material layers and imaging and recording of the resultant sectional images |
| 12/09/2004 | DE10297317T5 Schnelle Blitzlampen-Entladeschaltung Fast flashlamp discharge circuit |
| 12/09/2004 | CA2527565A1 Method for measuring the sagging of a glass panel to be bent on a ring mould |
| 12/08/2004 | EP1484582A1 Optoelectronic rotation angle detector |
| 12/08/2004 | EP1483627A2 Position detecting method, surface shape estimating method, and exposure apparatus and device manufacturing method using the same |
| 12/08/2004 | EP1483570A1 Mutli-detector defect detection system and a method for detecting defects |
| 12/08/2004 | EP1483559A2 Moir method and measuring system for measuring the distortion of an optical imaging system |
| 12/08/2004 | EP1483548A1 Multiple emitter boresight reference source |
| 12/08/2004 | EP1483355A2 Profile refinement for integrated circuit metrology |
| 12/08/2004 | EP1482888A1 Process for detection of marked components of a composite article using infrared blockers |
| 12/08/2004 | EP1482887A1 Apparatus and method for making and inspecting pre-fastened articles |
| 12/08/2004 | EP1482886A1 Infrared detection of composite article components |
| 12/08/2004 | EP1299691B1 Method for carrying out the non-contact measurement of geometries of objects |
| 12/08/2004 | EP1153263B1 Combining interference fringe patterns to a moire fringe pattern |
| 12/08/2004 | EP1071922B1 Method and arrangement for determining the geometry of objects using a coordinate measuring device |
| 12/08/2004 | EP1057081B1 Linear conoscopic holography |
| 12/08/2004 | CN2662198Y X ray photograph posture angle survey meter |
| 12/08/2004 | CN1553246A Combining method for projector and apparatus |
| 12/08/2004 | CN1553141A Microscope focus height-finding method |
| 12/08/2004 | CN1553140A Phase differential nonsensitive counting method and device for node tracking mohr interference fringe signals |
| 12/08/2004 | CN1553139A Quick determining method for micro-lens structural parameters and surface deformation |
| 12/08/2004 | CN1179406C Method for optically measuring dielectric thickness in semiconductor device |
| 12/08/2004 | CN1179206C Chip testing device |
| 12/08/2004 | CN1179205C Apparatus and method for monitoring structure using counter-propagating signal method for loacating events |
| 12/08/2004 | CN1179194C Optical sensor and its signal processor and branch connector |
| 12/08/2004 | CN1179193C Recording material type discriminating device and method and image forming device |
| 12/08/2004 | CN1179192C Method and device for inspecting objects |
| 12/07/2004 | US6829388 System of detecting road white line, method for detecting road white line and storage medium storing program for detecting road white line |
| 12/07/2004 | US6829118 Optical rotational position information detecting apparatus |
| 12/07/2004 | US6829057 Critical dimension analysis with simultaneous multiple angle of incidence measurements |
| 12/07/2004 | US6829054 Integrated surface metrology |
| 12/07/2004 | US6829047 Defect detection system |
| 12/07/2004 | US6827721 Method and device for the determination of reduction parameters for the subsequent reduction of a fractured bone |
| 12/07/2004 | CA2191329C Apparatus for detecting relative movement |
| 12/02/2004 | WO2004104517A1 Surface profiling apparatus |
| 12/02/2004 | WO2004103169A2 Method and arrangement for measuring the front section of the eye |
| 12/02/2004 | US20040242123 Method for monitoring a substrate during chemical mechanical polishing |
| 12/02/2004 | US20040240754 Overhead dimensioning system and method |
| 12/02/2004 | US20040240710 Method for determining a model roadway |
| 12/02/2004 | US20040240513 Stage with thermal expansion compensation |
| 12/02/2004 | US20040240049 Method and a device for the combination of a first and second beam of rays |
| 12/02/2004 | US20040239954 Resolution enhanced optical metrology |
| 12/02/2004 | US20040239953 Optical method measuring thin film growth |
| 12/02/2004 | US20040239952 Sensor for visual position detection with a modular lighting unit |
| 12/02/2004 | US20040239951 Depth measuring apparatus |
| 12/02/2004 | US20040239950 Machine vision system |
| 12/02/2004 | US20040239949 Method for elementary depth detection in 3D imaging |
| 12/02/2004 | US20040239948 Methods and apparatus for measuring flow opening areas |
| 12/02/2004 | US20040239947 Measurement of complex surface shapes using a spherical wavefront |
| 12/02/2004 | US20040239945 Apparatus and method for determining the active dopant profile in a semiconductor wafer |
| 12/02/2004 | US20040239942 Optical coherence tomography device |
| 12/02/2004 | US20040239934 Aberration mark and method for estimating overlay error and optical aberrations |
| 12/02/2004 | US20040239918 Defect inspection apparatus, defect inspection method and method of inspecting hole pattern |
| 12/02/2004 | US20040239917 Method to accurately measure small angular differences between surfaces |
| 12/02/2004 | US20040239549 Inverse synthetic aperture radar-based covert system for human identification |
| 12/02/2004 | US20040238764 Optical moving amount detecting device, electronic equipment, and conveyance processing system |
| 12/02/2004 | US20040238727 Tilt sensing apparatus |
| 12/02/2004 | US20040238636 Semiconductor device identification apparatus |
| 12/02/2004 | US20040237973 Apparatus for ascertaining the transverse dimensions of rod-shaped articles |
| 12/02/2004 | DE10322130A1 Phasenabgleich für Winkel- und Wegmessgeber Phase adjustment for angle and position encoder |
| 12/02/2004 | DE10321894A1 Device for detecting the welding depth in a keyhole during laser welding comprises a beam bundle distributor producing a lateral shear arranged on the light path facing a camera chip |
| 12/02/2004 | DE10321888A1 3D optical metrology method in which a structured pattern is generated on an object surface and resultant virtual pixels measured with a white-light interferogram |