| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 10/28/2004 | US20040212811 Three-dimensional shape and color detecting apparatus |
| 10/28/2004 | US20040212810 Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements |
| 10/28/2004 | US20040212803 Measuring device for movements on a weaving machine |
| 10/28/2004 | US20040212801 Wafer Alignment System Using Parallel Imaging Detection |
| 10/28/2004 | US20040212797 Appearance inspection apparatus and the method of inspecting the same |
| 10/28/2004 | US20040212795 Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object |
| 10/28/2004 | US20040211921 Position measuring device, position measuring system, lithographic apparatus, and device manufacturing method |
| 10/28/2004 | DE19804051B4 Entfernungsmeßgerät A distance |
| 10/28/2004 | DE10313888A1 Continuous online measurement and regulation of the thickness of a coating to be applied to a technical workpiece uses a triangulation method with an optical sensor arrangement |
| 10/28/2004 | DE10304111A1 Aufnahmeverfahren für ein Bild eines Aufnahmeobjekts und Aufnahmevorrichtung Recording method for recording an image of an object and recording device |
| 10/28/2004 | DE102004016322A1 Vorrichtung und Verfahren zur Bestimmung und/ oder Justage eines Kippwinkels einer Probe Apparatus and method for determining and / or adjustment of a tilt angle of a sample |
| 10/28/2004 | DE10161226B4 Einrichtung zur optischen Messung einer Dimension eines Werkstücks Means for optically measuring a dimension of a workpiece |
| 10/27/2004 | EP1471356A1 Device for measurement of movement in a weaving machine |
| 10/27/2004 | EP1471327A2 Method and apparatus for non-contact three-dimensional surface measurement |
| 10/27/2004 | EP1470621A1 Method and device for measuring distance |
| 10/27/2004 | EP1470434A2 Imaging device for recording depth |
| 10/27/2004 | EP1470412A2 Multi-measurement / sensor coating consolidation detection method and system |
| 10/27/2004 | EP1470388A2 Laser scanner with parabolic collector |
| 10/27/2004 | EP1470026A2 Head position sensor |
| 10/27/2004 | EP1470007A1 Method and systems for measuring wear in relation to tyre casing |
| 10/27/2004 | EP1110054B1 Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate |
| 10/27/2004 | EP1008831B1 Outdoor range finder |
| 10/27/2004 | CN2651704Y Fibre-optic raster strain sensor |
| 10/27/2004 | CN1541451A Optoelectronic device for detecting position and movement and method associated therewith |
| 10/27/2004 | CN1540283A Method and device for measuring roughness on working surface |
| 10/27/2004 | CN1540282A Method for measuring position of zero optical path difference in dual beam interference of wideband light source |
| 10/27/2004 | CN1173166C Dual-surface metal waveguide measuring method and its device |
| 10/27/2004 | CN1173153C Method for measuring the surface height of material bed conduced on conveyor belt to thermal treatment |
| 10/27/2004 | CN1173151C Grid type displacement transducer |
| 10/26/2004 | US6810138 Process and device for generating test patterns when applying solder paste by a screen printing process on printed circuit boards |
| 10/26/2004 | US6809827 Self referencing mark independent alignment sensor |
| 10/26/2004 | US6809824 Alignment process for integrated circuit structures on semiconductor substrate using scatterometry measurements of latent images in spaced apart test fields on substrate |
| 10/26/2004 | US6809823 Method for the calibration and alignment of multiple multi-axis motion stages for optical alignment to a planar waveguide device and system |
| 10/26/2004 | US6809808 Wafer defect detection system with traveling lens multi-beam scanner |
| 10/26/2004 | US6809806 Apparatus and method for verifying the beam axis of front-looking land vehicle transceiver antenna |
| 10/26/2004 | US6809803 Surface topology inspection |
| 10/26/2004 | US6809771 Data input apparatus having multiple lens unit |
| 10/26/2004 | US6809728 Three dimensional modeling apparatus |
| 10/26/2004 | US6807870 Rotary shaft axial elongation measuring method and device |
| 10/26/2004 | CA2313396C Device for continuously monitoring the junction of a conveyor belt |
| 10/26/2004 | CA2061865C Methods and apparatus for optically determining the acceptability of products |
| 10/21/2004 | WO2004090994A1 Light receiving device with controllable sensitivity and spatial information detecting apparatus using the same |
| 10/21/2004 | WO2004090467A1 Probe for sensing the position of an object |
| 10/21/2004 | WO2003067246A9 Use of electronic speckle interferometry for defect detection in fabricated devices |
| 10/21/2004 | US20040210343 Mobile robot using image sensor and method for measuring moving distance thereof |
| 10/21/2004 | US20040208394 Image display device and method for preventing image Blurring |
| 10/21/2004 | US20040208340 Method and device for suppressing electromagnetic background radiation in an image |
| 10/21/2004 | US20040207858 Optical position detecting device and recording medium |
| 10/21/2004 | US20040207857 Optical sharpness meter |
| 10/21/2004 | US20040207848 Device for the generation and projection of light marks |
| 10/21/2004 | US20040207847 Apparatus and methods for alignment of optical barrier apparatus |
| 10/21/2004 | US20040207845 Thin film optical measurement system and method with calibrating ellipsometer |
| 10/21/2004 | US20040207844 Thin-flim characteristic measuring method using spectroellipsometer |
| 10/21/2004 | US20040207835 Auto-collimator |
| 10/21/2004 | US20040207652 Methods and apparatus for visualizing volumetric data using deformable physical object |
| 10/21/2004 | US20040206895 Rapid high resolution position sensor for auto steering |
| 10/21/2004 | US20040206889 Optical position detecting device and recording medium |
| 10/21/2004 | US20040206606 Device for sensing the wear state of wheels or rollers |
| 10/21/2004 | US20040206264 Labeling methods and apparatus |
| 10/21/2004 | DE4114343B4 Verfahren und Vorrichtung zum Erkennen der Lage eines fotografischen Filmes Method and apparatus for detecting the position of a photographic film, |
| 10/21/2004 | DE202004007653U1 Length measuring device e.g. for measuring lengths in one, two or three dimensions, has optically and tactile touchable measuring surfaces |
| 10/21/2004 | DE10315608A1 Optical sensor with elongate light conducting element such as for deformation elements of a vehicle the sensor being made up of several film layers |
| 10/21/2004 | DE10313038A1 Vorrichtung zur Erfassung der Lage eines Tastelements in einem Mehrkoordinatenmessgerät A device for detecting the position of a probe element in a multi-coordinate measuring machine |
| 10/21/2004 | DE102004014471A1 Vorrichtung zum Bestimmen der Wanddicke einer Mikrokapsel Apparatus for determining the wall thickness of a microcapsular |
| 10/21/2004 | DE10116981B4 Verfahren und Vorrichtung zum Kontrollieren eines Gefäßverschlusses Method and apparatus for controlling a vessel closure |
| 10/20/2004 | EP1469351A1 Lithographic apparatus and device manufacturing method |
| 10/20/2004 | EP1469282A2 Device for producing and projecting light marks |
| 10/20/2004 | EP1469281A2 Electronic surveying apparatus |
| 10/20/2004 | EP1469278A1 Apparatus for measuring the wear of wheels or rollers |
| 10/20/2004 | EP1468395A1 A coiled tubing inspection system using image pattern recognition |
| 10/20/2004 | EP1468247A1 Aligning optical components of an optical measuring system |
| 10/20/2004 | EP1468246A2 Method for the reconstruction of the geometry of the inner surface of a cavity |
| 10/20/2004 | EP1446698A4 An interferometer system for a semiconductor exposure system |
| 10/20/2004 | EP1194642B1 Method for measuring and regulating curl in a paper or board web and a paper or board machine line |
| 10/20/2004 | EP1147368B1 Shadow moire surface topology inspection with calibration samples |
| 10/20/2004 | EP1093567B1 Device and method for determining a relative position of two objects with regard to one another |
| 10/20/2004 | EP1015873B1 Device for optical capture of a parameter of a longitudinally moving thread-shaped body |
| 10/20/2004 | CN2650157Y High signal-to-noise-ratio asymmetrical pieced seam reference null line grating |
| 10/20/2004 | CN2650156Y High signal-to-noise-ratio asymmetrical multi-seam reference null line grating |
| 10/20/2004 | CN2650155Y High signal-to-noise-ratio symmetrical pieced seam reference null line grating |
| 10/20/2004 | CN2650154Y High signal-noise-ratio symmetrical multi-seam reference null line grating |
| 10/20/2004 | CN2650153Y Equipotential paraphase index grating |
| 10/20/2004 | CN1539084A Method and device for suppressing electromagnetic background radiation in image |
| 10/20/2004 | CN1539074A Displacement detecting method, displacement detecting device and calibrating method thereof, and recording device of information recording medium original disk |
| 10/20/2004 | CN1538251A 图像信息检测传感器 Image information detecting sensor |
| 10/20/2004 | CN1538245A Lithographic apparats, apparatus manufacturing method and computer program |
| 10/20/2004 | CN1538157A Auto-collimation instrument |
| 10/20/2004 | CN1538147A Electronic measuring device |
| 10/19/2004 | US6807511 Aircraft identification and docking guidance systems |
| 10/19/2004 | US6807497 Laser measurement system with digital delay compensation |
| 10/19/2004 | US6806971 Method and apparatus for process control in semiconductor manufacture |
| 10/19/2004 | US6806970 Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the same |
| 10/19/2004 | US6806969 Optical measurement for measuring a small space through a transparent surface |
| 10/19/2004 | US6806968 Apparatus and method for measuring a workpiece |
| 10/19/2004 | US6806966 Copper CMP flatness monitor using grazing incidence interferometry |
| 10/19/2004 | US6806963 Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object |
| 10/19/2004 | US6806961 Interferometric cyclic error compensation |
| 10/19/2004 | US6806959 Measurement of surface defects on a movable surface |
| 10/19/2004 | US6806958 Microforce measurement method and apparatus |
| 10/19/2004 | US6806948 System and method of broad band optical end point detection for film change indication |