Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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07/22/2004 | WO2004061389A1 Laser digitizer system for dental applications |
07/22/2004 | WO2004061388A2 Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum |
07/22/2004 | WO2004046642A3 Device and method for measuring surfaces on the internal walls of cylinders, using confocal microscopes |
07/22/2004 | WO2004021915A3 Sanitary sleeve or tip for intra-oral three-dimensional camera |
07/22/2004 | US20040142772 Ball trajectory measuring apparatus |
07/22/2004 | US20040141188 Apparatus and method for precision testing of fiber length using electrostatic collection and control of fibers |
07/22/2004 | US20040141187 Calibration for 3D measurement system |
07/22/2004 | US20040141186 System and method for calibrating a hard disc drive magnetic head flying height tester by optical interference techniques |
07/22/2004 | US20040141177 System for measuring periodic structures |
07/22/2004 | US20040141063 Method and apparatus for calibration of camera system, and method of manufacturing camera system |
07/22/2004 | US20040140820 Probing method and prober |
07/22/2004 | US20040140780 High-speed precision positioning apparatus |
07/22/2004 | US20040140425 Light scanning probe apparatus using light of low coherence |
07/22/2004 | US20040140422 Optoelectronic angle measuring instrument and method for its production |
07/22/2004 | US20040139620 Method of and apparatus for the inspection of vehicle wheel alignment |
07/22/2004 | DE4430813B4 Vorrichtung und Verfahren zur Fahrzeug-Fahrhöhenmessung Apparatus and method for vehicle ride height measurement |
07/22/2004 | DE202004006799U1 Optisches Meßgerät An optical measuring apparatus |
07/22/2004 | DE10360389A1 Durchbiegungssensor Deflection sensor |
07/22/2004 | DE10306417B4 Verfahren und Vorrichtung zur optischen Abtastung Method and device for optically scanning |
07/22/2004 | DE10301094A1 Video camera based device for 2D distance measurement, e.g. for industrial control, comprises first and second light sources that can generate any of a number of combinations of divergent, convergent and parallel light beams |
07/22/2004 | DE10258283A1 Tasteinrichtung zur Werkstückvermessung Sensing device for workpiece measurement |
07/22/2004 | DE10233372B4 Messsystem und Verfahren zur Erfassung geometrischer Größen Measurement system and method for detection of geometrical parameters |
07/21/2004 | EP1439649A1 Data communication system, data transmitter and data receiver |
07/21/2004 | EP1439427A2 Shearing interferometer for euv wavefront measurement |
07/21/2004 | EP1439284A1 Method to detect the wear of a surface of a turbine blade |
07/21/2004 | EP1438608A2 Characterization of optical preforms |
07/21/2004 | EP1438568A2 Method of monitoring extent of cure of a coating |
07/21/2004 | EP1438548A1 Device for optically measuring surface properties |
07/21/2004 | EP1185382A4 System and method for inspecting the structural integrity of visibly clear objects |
07/21/2004 | CN2627498Y Laser linear measuring instrument of cotton |
07/21/2004 | CN2627493Y Young's modulus determinator with Hall position sensor |
07/21/2004 | CN2627460Y Packaging strain gauge of optical fiber grating gum base |
07/21/2004 | CN2627459Y Three-dimensional continuous high-precision measuring device for revolution body component |
07/21/2004 | CN1514231A Integrated vision imaging and electronic detecting and checking system |
07/21/2004 | CN1514207A Magnetic photoelectric encoder used for servo system |
07/21/2004 | CN1514203A Flatness detecting method and detecting instrument thereby |
07/20/2004 | US6766229 Method and apparatus for measuring the running gears on a motor vehicle |
07/20/2004 | US6766217 Method of manufacturing dental prosthesis, method of placing object for measurement and measuring device |
07/20/2004 | US6766047 Defect inspection method for three-dimensional object |
07/20/2004 | US6765684 Surface shape measurement apparatus |
07/20/2004 | US6765683 Interferometer system and method of manufacturing projection optical system using same |
07/20/2004 | US6765677 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
07/20/2004 | US6765673 Pattern forming method and light exposure apparatus |
07/20/2004 | US6765667 Method for inspection of circuit boards and apparatus for inspection of circuit boards |
07/20/2004 | US6765664 Laser scanner with parabolic collector |
07/20/2004 | US6765663 Efficient multiple emitter boresight reference source |
07/20/2004 | US6765606 Three dimension imaging by dual wavelength triangulation |
07/20/2004 | US6765223 Sub-micron accuracy edge detector |
07/20/2004 | US6765204 Microstructured pattern inspection method |
07/20/2004 | US6764412 Method and apparatus to determine golf ball trajectory and flight |
07/20/2004 | US6764380 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing |
07/20/2004 | US6763597 Arrangement and process for determining the relative alignment of two bodies |
07/20/2004 | CA2289598C Grating based phase control optical delay line |
07/15/2004 | WO2004059258A2 Apparatus and method for displaying numeric values corresponding to the volume of segments of an irregularly shaped item |
07/15/2004 | WO2004059247A1 Assessment and optimization for metrology instrument |
07/15/2004 | WO2004059246A2 Optical method of examining reliefs on a structure |
07/15/2004 | WO2004059244A1 High-powered microscope observation device |
07/15/2004 | WO2004058617A1 Position referencing system |
07/15/2004 | WO2004027686A3 Non-destructive optical imaging system for enhanced lateral resolution |
07/15/2004 | WO2003062739A3 Method and apparatus for compensation of time-varying optical properties of gas in interferometry |
07/15/2004 | US20040138859 Tunable filter device for spatial positioning systems |
07/15/2004 | US20040138590 Method and apparatus for obtaining geometrical data relating to a canal |
07/15/2004 | US20040136706 Finder, marker presentation member, and presentation method of positioning marker for calibration photography |
07/15/2004 | US20040136190 Illumination device and method for illuminating an object |
07/15/2004 | US20040136100 Optical sensor |
07/15/2004 | US20040136012 Method and device for calibrating a measuring system |
07/15/2004 | US20040136011 Reflective position measuring device and method |
07/15/2004 | US20040136009 Method of detecting a distortion on a surface |
07/15/2004 | US20040136008 Optical characteristic measurement device and optical type displacement meter |
07/15/2004 | US20040135069 Optical position measurement system employing one or more linear detector arrays |
07/15/2004 | US20040134275 Method for measuring and/or machining a workpiece |
07/15/2004 | US20040134264 Apparatus and method for isolating and measuring movement in a metrology apparatus |
07/15/2004 | DE19700665C5 Sensor zum Detektieren von Fremdmaterial und Scheibenwischsystem mit Sensor zum Detektieren von Fremdmaterial, insbesondere Regentropfen Sensor for detecting foreign material and windshield wiper system with sensor for detecting foreign material, in particular raindrops |
07/15/2004 | DE10357470A1 Target identification method for frequency modulated continuous wave radar apparatus, involves identifying motor vehicle based on judgment data generated by converting reflected wave intensity to radar reflective cross section |
07/15/2004 | DE10260670A1 Apparatus for optically scanning work pieces using a line sensor which can be rotatable about an axis on a robot |
07/15/2004 | DE10260256A1 Interferometersystem und Meß-/Bearbeitungswerkzeug Interferometer and measuring / cutting tool |
07/15/2004 | DE10260232A1 Method for determining the shape of a surface for optical applications based on the distribution of illumination intensity |
07/15/2004 | DE10258248A1 Interferometric quality checking system for a mirror used in EUV-lithography, whereby a limited surface area is checked for non-rotationally symmetric errors so that rotationally symmetric parent body errors can be located |
07/15/2004 | DE10257494A1 Determination of the attributes of rotational movements of a black and white object or other two-color object for monitoring objects with rotating assemblies, e.g. semiconductor wafers, fans, turbines, wind power plant |
07/14/2004 | EP1437645A2 Position/orientation measurement method, and position/orientation measurement apparatus |
07/14/2004 | EP1437568A2 Laser measuring device and device for determining the coordinates of a laser beam |
07/14/2004 | EP1436571A1 Alignment apparatus |
07/14/2004 | EP1436570A1 Measurement of complex surface shapes using a spherical wavefront |
07/14/2004 | EP1224434B1 Interferometric measuring device for form measurement |
07/14/2004 | EP1147376A4 Position sensor and circuit for optical encoder |
07/14/2004 | CN1512555A Detector for substrate defect |
07/14/2004 | CN1512137A Working position measurer |
07/14/2004 | CN1512135A Robot straight line track characteristeric measuring method and measurer used thereof |
07/14/2004 | CN1157589C Absolute encoding measurment method using circular grating |
07/14/2004 | CN1157588C Device and method for measuring sidewall thickness of glass containers |
07/14/2004 | CN1157587C Device for determining wheel and/or axle geometry in motor vehicles |
07/13/2004 | US6763319 Profilometer and method for measuring, and method for manufacturing object of surface profiling |
07/13/2004 | US6763133 Moire image capturing apparatus and method therefor |
07/13/2004 | US6763132 Repetitive inspection system with intelligent tools |
07/13/2004 | US6762849 Method for in-situ film thickness measurement and its use for in-situ control of deposited film thickness |
07/13/2004 | US6762848 Offset measurement method, tool position detection method and bonding apparatus |
07/13/2004 | US6762847 Laser align sensor with sequencing light sources |
07/13/2004 | US6762846 Substrate surface profile and stress measurement |
07/13/2004 | US6762839 System and method for performing selected optical measurements utilizing a position changeable aperture |
07/13/2004 | US6762824 Correction apparatus that corrects optical shift in two optical units, and exposure apparatus having the same |