Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/2004
09/23/2004US20040184650 Method and device to control the straightness and torsions of long products
09/23/2004US20040184042 Apparatus for measuring sizes of articles
09/23/2004US20040184041 Method for operating optical sensors
09/23/2004US20040184040 Shape measuring device
09/23/2004US20040184039 Co-ordinate measuring device with additional heat source
09/23/2004US20040184038 Method and apparatus for measuring the shape and thickness variation of polished opaque plates
09/23/2004US20040184036 Substrate alignment apparatus and method, and exposure apparatus
09/23/2004US20040184035 Generic interface for an optical metrology system
09/23/2004US20040184027 Image reading system
09/23/2004US20040184021 Photolithography processing system and method thereof
09/23/2004US20040184018 Abbe arm calibration system for use in lithographic apparatus
09/23/2004US20040183909 Method of determining the imaging equation for self calibration with regard to performing stereo-PIV methods
09/23/2004US20040183789 Touch measurement system
09/23/2004DE202004008586U1 Measurement of surface deformation with a handheld shearograph device e.g. for objects, has shearograph measuring instrument combined with endoscope to determine deformation and differences of surfaces
09/23/2004DE19713521B4 Vorrichtung zur Erkennung falsch orientierter und/oder von einem vorgegebenen Muster abweichender Teile Apparatus for detecting false-oriented and / or of a predetermined pattern differing parts
09/23/2004DE10311247A1 Portable Einrichtung zum Erfassen einer Lage und von Abmessungen eines Objekts A portable device for detecting a position and dimensions of an object
09/23/2004DE10308042A1 Stereo imaging method for determining the spatial position of a freely shaped line in space, whereby the position of a given point is determined in a first imaging system and then positions determined in a second imaging system
09/23/2004DE102004007446A1 Verfahren zur detailgetreuen Umsetzung der Abmessungen eines dreidimensionalen Körpers in ein massstäbliches Modell Method for accurate implementation of the dimensions of a three-dimensional body in a scale model
09/23/2004DE10000491B4 Verfahren und Messeinrichtung zum Vermessen eines Rotationswerkzeuges Methods and measuring means for measuring a rotary tool
09/22/2004EP1460839A1 Imaging device
09/22/2004EP1460433A2 Method for the determination of the imaging transformation for the autocalibration of Stereo-PIV methods
09/22/2004EP1460376A1 Depth measuring apparatus
09/22/2004EP1460375A2 Method and apparatus for measuring the geometry of a material strip
09/22/2004EP1460374A2 Method and apparatus for measuring the shape and thickness variation of polished opaque plates
09/22/2004EP1459036A1 Machine and method of inspecting input shaft of power steering system
09/22/2004EP1459035A1 Method for determining corresponding points in three-dimensional measurement
09/22/2004EP1459034A1 Method and device for measuring lengths of a workpiece deformed by bending
09/22/2004EP1459033A2 Method for the three-dimensional measurement of a surface
09/22/2004EP1459032A1 Quality factor
09/22/2004EP1459031A1 Method and system for the calibration of a computer vision system
09/22/2004EP1218688A4 Method and apparatus for three dimensional inspection of electronic components
09/22/2004CN2643282Y Out led optical fiber strain measuring transducer
09/22/2004CN2643281Y Light amplification measuring unit for tiny length change
09/22/2004CN1530629A Measuring method for precision parallelism
09/22/2004CN1167947C Method and device for imaging liquid-filled container
09/22/2004CN1167937C Polarized-light linear displacement sensor
09/21/2004US6795612 Device and method for measuring angle of slant surface of an optical component
09/21/2004US6795574 Method of correcting physically-conditioned errors in measurement of microscopic objects
09/21/2004US6795200 Method and system for dimensioning boxes or other cuboid objects
09/21/2004US6795198 Method and device for measuring thin films and semiconductor substrates using reflection mode geometry
09/21/2004US6795185 Film thickness measuring apparatus
09/21/2004US6794651 Method of measuring chromated conversion coating amount using infrared absorbance
09/21/2004US6794637 Optical device for measuring position
09/21/2004US6794626 Method and system for verifying correct mounting of a printing plate on an external drum imaging machine
09/21/2004US6793356 Omnidirectional vision sensor
09/21/2004US6792684 Method for determination of stand attributes and a computer program to perform the method
09/21/2004CA2305057C Optical 3d digitizer, system and method for digitizing an object
09/16/2004WO2004079427A1 Optical device and inspection module
09/16/2004WO2004079295A2 Profiling complex surface structures using scanning interferometry
09/16/2004WO2004079294A2 Characterizing and profiling complex surface structures using scanning interferometry
09/16/2004WO2004041381A3 Control systems for use with flying craft and other remote elements
09/16/2004US20040181361 Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
09/16/2004US20040181128 Determining the geometry and dimensions of a three-dimensional object
09/16/2004US20040179765 Sensing device having a large diameter D-shaped optical waveguide
09/16/2004US20040179729 Measurement system
09/16/2004US20040179727 Pattern inspection method and apparatus
09/16/2004US20040179210 Substrate holder, and use of the substrate holder in a highly accurate measuring instrument
09/16/2004US20040179209 Opical sensor device
09/16/2004US20040179208 Structure for sophisticated surveying instrument with coordinate board for position identification
09/16/2004US20040179207 Method and system for high speed measuring of microscopic targets
09/16/2004US20040179206 Portable device for measuring a position, a shape, and a size of an object
09/16/2004US20040179205 Method and device for the verification and identification of a measuring device
09/16/2004US20040179204 Speckle interferometer apparatus
09/16/2004US20040179184 Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby
09/16/2004US20040179095 3-Dimension scanning metohod and 3-dimension scanning system using the same
09/16/2004US20040177806 Apparatus for simultaneously coating and measuring parts
09/16/2004DE19937035B4 Vorrichtung und Verfahren zur dreidimensionalen zeitaufgelösten photogrammetrischen Erfassung eines Objekts Apparatus and method for three-dimensional time-resolved photogrammetric detection of an object
09/16/2004DE10317828B3 Interferometric investigation of measurement object involves forming measurement and reference beams in first interferometer unit, scanning object and passing reflected beams to second unit with reference beams
09/16/2004DE10308383A1 Verfahren und optisches System zur Vermessung der Topographie eines Meßobjekts The method and optical system for measuring the topography of a test object
09/16/2004DE10125885B4 Sensorvorrichtung zur schnellen optischen Abstandsmessung nach dem konfokalen optischen Abbildungsprinzip Sensor device for fast optical distance measurement using the confocal optical imaging principle
09/15/2004EP1456629A2 Method for mobile on- and off-line monitoring of coloured and high-gloss automobile component surfaces
09/15/2004EP1456605A1 Method and system for detecting the three-dimensional shape of an object
09/15/2004EP1456604A2 Method and system for determining symmetry and ackermann geometry status of the steering system of a vehicle
09/15/2004EP1456603A1 Device for optically measuring boreholes
09/15/2004EP1456602A1 Sensor for the visual position detection (component, substrate) comprising a modular lighting device
09/15/2004EP1456600A1 System and method for measuring optical distance
09/15/2004EP1325283A4 Level and/or verticality indicator using laser beams
09/15/2004EP1234193B1 Measurement of the wear of the fireproof lining of a metallurgical vessel
09/15/2004EP1121567B1 Luminescent brittle coating in strain analysis
09/15/2004EP0899542B1 Route guiding device for vehicle
09/15/2004CN2641641Y Reflection difference device for in-situ real time detection film growth status
09/15/2004CN2640701Y Siemens digital control system applied in roller grinder work piece measuring device
09/15/2004CN1529997A 光学传感器设备 The optical sensor device
09/15/2004CN1529827A Generation of library of periodic grating diffraction signals
09/15/2004CN1529806A Method for measuring surface propevties and co-ordinate measuring device
09/15/2004CN1529351A Method for evaluatin quality of semiconductor substrate
09/15/2004CN1529125A Magnetic suspension motion platfrom height measuring and calibrating method and apparatus thereof
09/15/2004CN1529123A Shaping ring light-beam differiential confocal sensor with high space resolution capability
09/15/2004CN1529122A Method for realizing Fourier transfrom contour by generating pi phase shift by two-colour grating template
09/15/2004CN1529121A Optical scanning outside diameter measuring system without scanning objective lens and its measuring method
09/15/2004CN1529120A Small-sized on-line radical shear interferometer and its aspheric surface measuring method
09/15/2004CN1529119A Surface light source device for image identification
09/15/2004CN1166973C Device and method for te directly-vision inspection of concealed soldered connections
09/15/2004CN1166921C Monitoring method of long-period working state of optical fibre grating anchor wire and its equipment
09/15/2004CN1166918C Tumble angle measuring method and measurer
09/15/2004CN1166917C Method for correcting angle-metering error of encode disk
09/15/2004CN1166916C Wall surface observing device
09/15/2004CN1166915C Method for measuring limb part and method for matching artificial limb or corrector to same
09/15/2004CN1166914C Frequency-dividing self-mixing feedback-type non-contact He-Ne laser micrometer
09/14/2004US6792369 System and method for automatically calibrating an alignment reference source