Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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12/28/2004 | US6836320 Method and apparatus for active boresight correction |
12/28/2004 | US6836319 Optical system adjusting method for energy beam apparatus |
12/28/2004 | US6834537 Optical microcantilever |
12/28/2004 | CA2198022C Method for the correlation of three dimensional measurements obtained by image capturing units and system for carrying out said method |
12/23/2004 | WO2004112387A1 Projector with tilt-angle detecting capability |
12/23/2004 | WO2004111571A1 Apparatus for determining shape and size of three-dimensional objects |
12/23/2004 | WO2004111569A1 Wheel alignment with surface-oriented runout determination |
12/23/2004 | WO2004088285A3 Optical determination of changes in the shape of an object and of the fluid flow around an object |
12/23/2004 | WO2004034079A3 Inspection system calibration methods |
12/23/2004 | US20040260496 Method for inspecting defect and system therefor |
12/23/2004 | US20040260420 Processing method and processing system |
12/23/2004 | US20040259653 Launch monitor system with a calibration fixture and a method for use thereof |
12/23/2004 | US20040258437 Image information detection sensor |
12/23/2004 | US20040258297 3D color information acquisition method and 3D color information acquisition device |
12/23/2004 | US20040258293 Automated optical inspection of wire-wrapped well screens |
12/23/2004 | US20040258126 Laser line generating device with swivel base |
12/23/2004 | US20040257675 Optical measuring system, and a projection objective |
12/23/2004 | US20040257587 Full-field optical measurements of surface properties of panels, substrates and wafers |
12/23/2004 | US20040257586 Common element confocal interferometer |
12/23/2004 | US20040257583 Method for measuring thickness of an optical disc |
12/23/2004 | US20040257582 Dual-beam interferometer for ultra-smooth surface topographical measurements |
12/23/2004 | US20040257573 Position detecting method |
12/23/2004 | US20040257570 Alignment routine for optically based tools |
12/23/2004 | US20040257569 System, apparatus and method for alignment of propeller shaft supports and engine of a water vessel |
12/23/2004 | US20040257568 Dimension measuring method, system and program |
12/23/2004 | US20040257565 Polarization bearing detection type two-dimensional light reception timing detecting device and surface shape measuring device using it |
12/23/2004 | US20040257555 Distance measuring sensor and electronics equipped therewith |
12/23/2004 | US20040256564 Method of measuring coating using two-wavelength infrared reflectance |
12/23/2004 | US20040256552 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
12/23/2004 | US20040256541 Method and apparatus for detecting objects using structured light patterns |
12/23/2004 | DE202004013326U1 3D micro-machining space projector for position determination, measurement and evaluation of micro-workpieces in a machining space of a micro-fabrication system, has an optical system appropriate for such a task |
12/23/2004 | DE10341585A1 Container support load test procedure has fibre optic deformation sensors combined with temperature sensors for statistical modelling to monitor corrosion weakening |
12/23/2004 | DE10335690A1 Deformation sensor used for e.g. force, pressure, torque and acceleration measurements in vehicle, is mounted with signal processor circuit on flexible insulation film substrate |
12/23/2004 | DE10325443A1 Interferometrische Messvorrichtung Interferometric measurement device |
12/23/2004 | DE10324934A1 Anordnung und ein Verfahren zur Erkennung von Schichten, die auf Oberflächen von Bauteilen angeordnet sind, und Bestimmung deren Eigenschaften Arrangement and a method for the detection of layers which are disposed on surfaces of components, and determination of their properties |
12/23/2004 | DE10312696B3 Verfahren zur Bestimmung der Abbildungsgleichung für die Selbstkalibrierung in Bezug auf die Durchführung von Stereo-PIV-Verfahren Method for determining the mapping equation for the self-calibration in relation to the implementation of stereo PIV method |
12/23/2004 | DE10214817B4 Anordnung zur Höhenmessung des Lotpastenauftrages Arrangement for measuring the height Lotpastenauftrages |
12/22/2004 | EP1488194A1 Measuring shape of a flexible electromagnetic radiation structure (mirror, adaptive optics) |
12/22/2004 | EP1488191A2 Method for determining and correcting guiding errors in a coordinate measuring device |
12/22/2004 | EP1287310B1 Method and device for determining the thickness of transparent organic layers |
12/22/2004 | EP1261840B1 Method for quantitatively and/or qualitatively detecting layer thicknesses, a mircroreaction vessel and a titre plate |
12/22/2004 | EP1119742B1 Fibre optic sensor |
12/22/2004 | CN2665667Y Laser tridimensional true colour scanner |
12/22/2004 | CN1556914A Apparatus for measuring thickness profile and refractive index distribution of multiple layers of thin films by means of two-dimensional reflectometry and method of measuring the same |
12/22/2004 | CN1556371A Multifunction tridimension displacement laser interference measuring system |
12/22/2004 | CN1181313C Method and system for measuring relief of object |
12/22/2004 | CN1181312C Transparent liquid testing apparatus, transparent liquid testing method, and transparent liquid coating method |
12/21/2004 | US6834254 Monitor system of vehicle outside and the method thereof |
12/21/2004 | US6834250 Position and orientation determining method and apparatus and storage medium |
12/21/2004 | US6834129 Method of measuring rotation of sphere |
12/21/2004 | US6833913 Apparatus and methods for optically inspecting a sample for anomalies |
12/21/2004 | US6833541 Dual-parameter optical waveguide grating sensing device and sensor |
12/21/2004 | US6833309 Method of manufacturing a semiconductor device |
12/21/2004 | US6832849 Light radiation device, light source device, light radiation unit, and light connection mechanism |
12/21/2004 | US6832577 Apparatus and method for simultaneously coating and measuring parts |
12/21/2004 | US6832550 Ink and dampening solution determination in offset printing |
12/21/2004 | US6832517 Optical level detector |
12/20/2004 | WO2004113829A1 Method for measuring thickness of an optical disc |
12/16/2004 | WO2004109229A2 3d and 2d measurement system and method with increased sensitivity and dynamic range |
12/16/2004 | WO2004109228A1 Three-dimensional shape-measuring device |
12/16/2004 | WO2004109227A1 Condition-analyzing device |
12/16/2004 | WO2004109226A2 Interferometric measuring device |
12/16/2004 | WO2004086573A3 Laser system for measurements of the profile of objects |
12/16/2004 | WO2004083776B1 Film thickness acquiring method |
12/16/2004 | WO2004033985A3 Spatial reference system |
12/16/2004 | US20040254476 Laser digitizer system for dental applications |
12/16/2004 | US20040253824 Arrangement for monitoring a thickness of a layer depositing on a sidewall of a processing chamber |
12/16/2004 | US20040253748 Method and apparatus for detecting topographical features of microelectronic substrates |
12/16/2004 | US20040252878 Method and its apparatus for classifying defects |
12/16/2004 | US20040252877 Pin protrusion measurement probe |
12/16/2004 | US20040252393 Method and arrangement for removing noise and measurements of head-media spacing modulation for digital recording |
12/16/2004 | US20040252313 System for monitoring the movements of construction work parts |
12/16/2004 | US20040252310 Scanning interferometry |
12/16/2004 | US20040252302 Method and apparatus for alignment of components |
12/16/2004 | US20040252293 Alignment apparatus |
12/16/2004 | US20040252288 Advanced applications for 3-D autoscanning lidar system |
12/16/2004 | US20040252283 Projector with tilt-angle detecting capability |
12/16/2004 | US20040252190 Inspection system and method |
12/16/2004 | US20040251551 Phase changeable memory devices including carbon nano tubes and methods for forming the same |
12/16/2004 | US20040250438 Rigger-spread measuring instruments |
12/16/2004 | DE10324104A1 Surface property measurement procedure uses imaging array to detect reflected radiation and calculates statistical parameters to provide summary description |
12/16/2004 | DE10323920A1 Verfahren und Anordnung zum Vermessen des vorderen Augenabschnitts Method and apparatus for measuring anterior segment |
12/16/2004 | DE10323438B3 Verfahren und Vorrichtung zum Ausrichten von plattenförmigen Werkstücken Process and apparatus for alignment of plate-shaped workpieces |
12/16/2004 | DE10323152A1 Vorrichtung zum Messen des Durchmessers eines stabförmigen Gegenstandes insbesondere der Tabak verarbeitenden Industrie An apparatus for measuring the diameter of a rod-shaped article in particular of the tobacco-processing industry |
12/16/2004 | CA2528824A1 Three-dimensional shape-measuring device |
12/16/2004 | CA2528822A1 Condition-analyzing device |
12/15/2004 | EP1486918A2 Method for adaptive flawdetection on an inhomogeneous surface |
12/15/2004 | EP1486758A2 Image measuring method and image measuring device |
12/15/2004 | EP1486377A2 Movable body surrounding monitoring apparatus |
12/15/2004 | EP1485872A1 A morphological inspection method based on skeletonization |
12/15/2004 | EP1485743A2 An improved process control method and apparatus |
12/15/2004 | EP1485678A2 Chromatic diffraction range finder |
12/15/2004 | EP1485676A1 Automated wheel slide detector |
12/15/2004 | EP1485675A2 Surface profiling apparatus |
12/15/2004 | EP1485674A1 Device and method for optoelectronically identifying the displacement and/or position of an object |
12/15/2004 | EP1485670A2 Method and device for determining the absolute coordinates of an object |
12/15/2004 | EP1448951A4 Three dimensional scanning camera |
12/15/2004 | CN2663923Y High-precision grating encoder |
12/15/2004 | CN1555480A Method and arrangement in a measuring system |
12/15/2004 | CN1555479A Method and apparatus for increasing signal to noise ratio in a photoacoustic film thickness measurement system |