| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 10/06/2004 | CN1170119C Photoelectric detection method and device based on orthogonal dual polarized light beams for rolled angle |
| 10/06/2004 | CN1170118C Method of real time detecting fiber aggregate planar product thickness and fiber orientation |
| 10/05/2004 | US6801875 Methods, systems, and software for performing measurements |
| 10/05/2004 | US6801727 Recording-material type determination apparatus and method and image forming apparatus |
| 10/05/2004 | US6801651 Visual inspection apparatus |
| 10/05/2004 | US6801650 Mechanism and method for controlling focal point position of UV light and apparatus and method for inspection |
| 10/05/2004 | US6801358 Broad band deep ultraviolet/vacuum ultraviolet catadioptric imaging system |
| 10/05/2004 | US6801323 Methods and apparatus for interferometric dimensional metrology |
| 10/05/2004 | US6801321 Method and apparatus for measuring lateral variations in thickness or refractive index of a transparent film on a substrate |
| 10/05/2004 | US6801315 Method and system for overlay measurement |
| 10/05/2004 | US6801313 Grooved pattern surrounding mark pattern formed by engraving protects against deformation by thermal expansion or contraction |
| 10/05/2004 | US6800843 Displacement and torque sensor |
| 10/05/2004 | US6800842 Optical encoder and sensor head of the same |
| 10/05/2004 | US6800839 Device for the optoelectronic detection of switching positions of a switching element |
| 10/05/2004 | US6799653 Device for side impact detection for a motor vehicle |
| 10/01/2004 | CA2481059A1 Bakeshop quality control process and installation |
| 09/30/2004 | WO2004084279A1 Wafer characteristics via reflectometry |
| 09/30/2004 | WO2004083901A2 Detection of macro-defects using micro-inspection inputs |
| 09/30/2004 | WO2004083834A1 A method and apparatus for determining one or more physical properties of a rolled smoking article or filter rod |
| 09/30/2004 | WO2004083778A1 Coded-light dual-view profile scanner |
| 09/30/2004 | WO2004083776A1 Film thickness acquiring method |
| 09/30/2004 | WO2004083774A1 Optical sensor |
| 09/30/2004 | WO2004083772A2 Method for measurement of three-dimensional objects by single-view backlit shadowgraphy |
| 09/30/2004 | WO2004082409A1 Improvements in or relating to machine vision equipmet |
| 09/30/2004 | WO2004017016A3 Device and method for measuring the dimensions of a body |
| 09/30/2004 | WO2002087825A8 Integrated endpoint detection system with optical and eddy current monitoring |
| 09/30/2004 | US20040190766 Image processing device |
| 09/30/2004 | US20040190764 Non-contact measurement system and method |
| 09/30/2004 | US20040190752 Moving object detection system |
| 09/30/2004 | US20040190009 Apparatus for determining wall thickness of microcapsule |
| 09/30/2004 | US20040190008 Method for process optimization and control by comparison between 2 or more measured scatterometry signals |
| 09/30/2004 | US20040190007 Lithography line width monitor reflecting chip-wide average feature size |
| 09/30/2004 | US20040190006 Optical system adjusting method for energy beam apparatus |
| 09/30/2004 | US20040190005 Position-sensing device for 3-D profilometers |
| 09/30/2004 | US20040190004 Apparatus for shifting reference distance of laser displacement sensor |
| 09/30/2004 | US20040190003 Interferometric method and system |
| 09/30/2004 | US20040190002 Interferometer system, method for recording an interferogram and method for providing and manufacturing an object having a target surface |
| 09/30/2004 | US20040190001 Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping |
| 09/30/2004 | US20040190000 Method and system for characterizing aspheric surfaces of optical elements |
| 09/30/2004 | US20040189999 Profiling complex surface structures using scanning interferometry |
| 09/30/2004 | US20040189995 Position detection apparatus |
| 09/30/2004 | US20040189983 Angle detection apparatus, optical signal switch system and information recording and reproduction system |
| 09/30/2004 | US20040189981 Inspection of ophthalmic lenses using absorption |
| 09/30/2004 | US20040189944 Method and system for visualizing surface errors |
| 09/30/2004 | US20040189512 Collision prediction device, method of predicting collision, and computer product |
| 09/30/2004 | US20040187327 Laser line generation device with attachment base |
| 09/30/2004 | DE19517029B9 Verfahren zur Bestimmung der Höhe eines Fahrzeuges mit Hilfe einer das Fahrzeug aufnehmenden Videokamera und Vorrichtung zur Durchführung des Verfahrens A method for determining the height of a vehicle by means of a video camera receiving the vehicle and a device for carrying out the method |
| 09/30/2004 | DE10312884A1 Tastsystem Probe |
| 09/30/2004 | DE10309284A1 Dilatometer uses optical measurement involving passing measurement beam to very close to specimen in vacuum to eliminate errors caused by atmosphere density changes and turbulence |
| 09/30/2004 | CA2518976A1 Coded-light dual-view profile scanner |
| 09/30/2004 | CA2518702A1 Method for measurement of three-dimensional objects by single-view backlit shadowgraphy |
| 09/29/2004 | EP1463185A2 Uniaxial drive unit and surface shape measuring apparatus using the same |
| 09/29/2004 | EP1462997A2 Image processing device |
| 09/29/2004 | EP1462995A2 Method and apparatus for classifying defects |
| 09/29/2004 | EP1462993A2 Automatic work apparatus and automatic work control program |
| 09/29/2004 | EP1462823A1 Collision prediction device, method of predicting collision, and computer product |
| 09/29/2004 | EP1462760A1 Apparatus for measuring the position of a probe in a coordinate measuring machine |
| 09/29/2004 | EP1461586A1 Device and procedure for aligning of components |
| 09/29/2004 | EP1461584A1 Method and apparatus for measuring stress in semiconductor wafers |
| 09/29/2004 | EP0892909B1 Diffraction management for grazing incidence interferometer |
| 09/29/2004 | CN2645098Y 便携式读数显微镜 Portable reading microscope |
| 09/29/2004 | CN2645033Y Reading measuring apparatus |
| 09/29/2004 | CN1533496A Self calibrating position determination system and user interface |
| 09/29/2004 | CN1533495A Shape measuring device |
| 09/29/2004 | CN1532802A 信息显示装置及信息显示方法 Information display device and information display method |
| 09/29/2004 | CN1532522A 探测系统 Detection system |
| 09/29/2004 | CN1532521A Device for detecting probe element position in multipe coodinate measurers |
| 09/29/2004 | CN1532518A Defect detector, defect detecting method and method for detecting hole figure |
| 09/29/2004 | CN1532517A Inclination regulating method for clamp device |
| 09/29/2004 | CN1532516A Method for producing optical element |
| 09/29/2004 | CN1532514A Optical fiber device and its producing method, optical shaft regulating method |
| 09/29/2004 | CN1168972C Pull-type loader for measuring laser speckle interference |
| 09/29/2004 | CN1168951C Apex cuvature radius measuring method and device foir aspherics |
| 09/28/2004 | US6799130 Inspection method and its apparatus, inspection system |
| 09/28/2004 | US6798925 Method and apparatus for calibrating an image acquisition system |
| 09/28/2004 | US6798528 System and method for measuring the dimensions of moving packages |
| 09/28/2004 | US6798527 Three-dimensional shape-measuring system |
| 09/28/2004 | US6798512 Multiple beam ellipsometer |
| 09/28/2004 | US6798505 Method and apparatus for article inspection including speckle reduction |
| 09/28/2004 | US6798503 Edge flaw inspection device |
| 09/28/2004 | US6798499 Method of forming optical thin films on substrate at high accuracy and apparatus therefor |
| 09/28/2004 | US6798402 Received-light pattern detection apparatus |
| 09/28/2004 | US6797958 Method of measuring sol-gel coating thickness using infrared absorbance |
| 09/28/2004 | US6797931 Light scanning probe apparatus using light of low coherence including a positioning mechanism |
| 09/28/2004 | US6797529 Processing apparatus with measuring unit and method |
| 09/28/2004 | US6797443 Light is directed onto a photomask by non- telecentric illumination obtained by controlling a shape of an opening of an illumination aperture |
| 09/28/2004 | US6796043 Target system for use with position determination system |
| 09/28/2004 | US6796035 Method and device for measuring wheel alignment of a suspended vehicle in a production line |
| 09/28/2004 | CA2129972C Method and apparatus for observing a gap |
| 09/23/2004 | WO2004082351A1 Electronic component mounting device |
| 09/23/2004 | WO2004081493A1 Method of measuring accurate parallelism |
| 09/23/2004 | WO2004081492A2 Determining the geometry and dimensions of a three-dimensional object |
| 09/23/2004 | WO2004081491A1 Method and device for determination of residual stresses |
| 09/23/2004 | WO2004081488A2 Scanning system with stereo camera set |
| 09/23/2004 | WO2004026539A3 Method for measuring the position of robot-guided workpieces and measuring device for the same |
| 09/23/2004 | US20040186619 Workpiece configuration detection system and method |
| 09/23/2004 | US20040185662 Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method |
| 09/23/2004 | US20040185582 System and method for in-situ monitor and control of film thickness and trench depth |
| 09/23/2004 | US20040184656 Method for measuring object based on image and photographing apparatus |
| 09/23/2004 | US20040184653 Optical inspection system, illumination apparatus and method for use in imaging specular objects based on illumination gradients |