| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/13/2005 | WO2005003689A1 Structure monitor system |
| 01/13/2005 | WO2005003679A2 Position-to-number electro-optical converter |
| 01/13/2005 | WO2004092832A3 Determination of center of focus by parameter variability analysis |
| 01/13/2005 | US20050008256 Position and orientation detection method and apparatus |
| 01/13/2005 | US20050008220 Method, apparatus, and program for processing stereo image |
| 01/13/2005 | US20050008218 Automated wafer defect inspection system and a process of performing such inspection |
| 01/13/2005 | US20050007919 Optical rotational position information detecting apparatus |
| 01/13/2005 | US20050007605 Analytical method and apparatus |
| 01/13/2005 | US20050007601 Optical characterization of surfaces and plates |
| 01/13/2005 | US20050007599 Stroboscopic interferometry with frequency domain analysis |
| 01/13/2005 | US20050007593 Method and apparatus for adjusting illumination angle |
| 01/13/2005 | US20050007592 Polarization analyzing method |
| 01/13/2005 | US20050007578 Real time ir optical sensor |
| 01/13/2005 | US20050007487 Image pickup apparatus, and image pickup method and control method of the image pickup apparatus |
| 01/13/2005 | US20050007225 Rotation and/or tilt angle detection means for a ball and socket joint |
| 01/13/2005 | US20050006585 System and method for correction for angular spread in determining optical properties of materials |
| 01/13/2005 | US20050006570 Method and system for measuring runout of a rotating tool |
| 01/13/2005 | US20050006560 Film forming apparatus and film forming method |
| 01/13/2005 | US20050005465 Dynamic artefact comparison |
| 01/13/2005 | US20050005463 Self-calibrating position determination system and user interface |
| 01/13/2005 | US20050005461 Truck alignment system |
| 01/13/2005 | DE20314026U1 Contactless measurement of surface e.g. for aviation, space flight or power station, has source of light with continuous spectrum with spectrograph detecting spectral distribution of intensity of light by lens towards surface |
| 01/13/2005 | DE10327939A1 Verfahren und Meßvorrichtung zur berührungslosen Messung von Winkeln oder Winkeländerungen an Gegenständen The method and measuring device for the contactless measurement of angles or angle changes on objects |
| 01/13/2005 | DE10326033A1 Verfahren zur adaptiven Fehlererkennung auf einer inhomogenen Oberfläche Method for adaptive failure detection on an inhomogeneous surface |
| 01/12/2005 | EP1496466A2 Face shape recognition from stereo images |
| 01/12/2005 | EP1496336A1 System and method for correction for angular spread in determining optical properties of materials |
| 01/12/2005 | EP1496335A2 Optoelectronic device |
| 01/12/2005 | EP1495357A2 Uv compatible programmable spatial filter |
| 01/12/2005 | EP1495286A1 Method for optically detecting the spatial form of inside spaces and a device for carrying out said method |
| 01/12/2005 | EP1495284A1 Contactless system for measuring centricity and diameter |
| 01/12/2005 | EP1495283A2 Methods and computer program products for characterizing a crystalline structure |
| 01/12/2005 | EP1494575A2 Measurement of optical properties |
| 01/12/2005 | EP1436570A4 Measurement of complex surface shapes using a spherical wavefront |
| 01/12/2005 | EP1129322B1 Method for determining the thickness of a multi-thin-layer structure |
| 01/12/2005 | EP0935735B1 Monitoring distortion of a spinning mirror |
| 01/12/2005 | CN1564930A Three-dimensional measuring apparatus |
| 01/12/2005 | CN1564929A Three-dimensional measuring apparatus, filter lattice moire plate and illuminating means |
| 01/12/2005 | CN1563901A Stress strain sensor based on temp insensitiveness of fiber glass raster |
| 01/12/2005 | CN1563887A Optical vernier protractor, its measuring range and precision design method |
| 01/12/2005 | CN1563886A Laser scanning measuring diameter, and its system |
| 01/12/2005 | CN1563885A Measuring method and measurer for thickness of metallic thin strip |
| 01/12/2005 | CN1563884A Non-contact measuring method and system for thickness and width |
| 01/12/2005 | CN1563883A Fiber glass motion transducer |
| 01/12/2005 | CN1563882A Co-optical circuit double-frequency heterodyne confocal micromeasurer |
| 01/12/2005 | CN1563881A Position phase-difference enlarger of combined interferometer |
| 01/12/2005 | CN1184505C Rack for mounting lens for obtaining spectacle optical center, and method and apparatus for producing lens |
| 01/12/2005 | CN1184504C Glasses lens working method, checking apparatus and glasses lens working device with checking apparatus |
| 01/12/2005 | CN1184455C Optical senser |
| 01/12/2005 | CN1184452C In-situ substrate thickness measuring system and method |
| 01/12/2005 | CN1184451C Apparatus and method for measuring film thickness of unsintered ceramic wafer |
| 01/11/2005 | US6842531 Vehicle area detecting apparatus and vehicle area determining method |
| 01/11/2005 | US6842261 Integrated circuit profile value determination |
| 01/11/2005 | US6842260 Imaging system and method for positioning a measuring tip onto a contact region of a microchip |
| 01/11/2005 | US6842259 Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements |
| 01/11/2005 | US6842258 Method of measuring the geometry of grooves in an elongated element |
| 01/11/2005 | US6842256 Compensating for effects of variations in gas refractivity in interferometers |
| 01/11/2005 | US6842255 Interferometer and interferance measurement method |
| 01/11/2005 | US6842248 System and method for calibrating mirrors of a stage assembly |
| 01/11/2005 | US6842247 Reticle independent reticle stage calibration |
| 01/11/2005 | US6842246 Six degree of freedom position ranging |
| 01/11/2005 | US6842245 Pattern test device |
| 01/11/2005 | US6842238 Device for measuring the parameters of a vehicle characteristic attitude |
| 01/11/2005 | US6842189 Road monitoring method for a vehicle and a system thereof |
| 01/11/2005 | US6842119 Detecting damage to a structural member |
| 01/11/2005 | US6841780 Method and apparatus for detecting objects |
| 01/11/2005 | US6840097 Inspection apparatus for tires |
| 01/11/2005 | US6839975 Accuracy measuring apparatus for machine tool |
| 01/11/2005 | US6839972 Self-calibrating position determination system |
| 01/06/2005 | WO2005001774A2 Methods and apparatus for reducing error in interferometric imaging measurements |
| 01/06/2005 | WO2005001577A1 System and method for optical mertology of semiconductor wafers |
| 01/06/2005 | WO2005001452A1 Method of measuring coating using two-wavelength infrared reflectance |
| 01/06/2005 | WO2005001375A1 Three-dimensional shape measuring method and measuring apparatus thereof |
| 01/06/2005 | WO2005000558A1 Container manufacturing inspection and control system |
| 01/06/2005 | WO2004074582A3 Road marking evaluation and measurement system |
| 01/06/2005 | WO2004068064A3 A method and an apparatus for determining the distance between a collimator lens and an object |
| 01/06/2005 | WO2004029540A3 Determination of the angular position of a laser beam |
| 01/06/2005 | US20050004778 Method for producing library |
| 01/06/2005 | US20050003642 Method for determining the depth of a buried structure |
| 01/06/2005 | US20050002674 Light receiving apparatus, mark detecting apparatus using light receiving apparatus, exposing apparatus, maintenance method of exposing apparatus, manufacturing method of semiconductor device using exposing apparatus and semiconductor manufacturing plant |
| 01/06/2005 | US20050002624 Method and system for measuring thin films |
| 01/06/2005 | US20050002559 Depth measuring method and depth measuring apparatus |
| 01/06/2005 | US20050002555 Image processing apparatus |
| 01/06/2005 | US20050002044 Method for determination of the level of two or more measurement points, and an arrangement for this purpose |
| 01/06/2005 | US20050002042 Sensor device for performing rapid optical measurement of distances according to the confocal optical imaging principle |
| 01/06/2005 | US20050002040 Lithographic apparatus, device manufacturing method, and computer program |
| 01/06/2005 | US20050002036 Method and apparatus for measuring a pitch of stranded cable |
| 01/06/2005 | US20050002035 Exposure apparatus |
| 01/06/2005 | US20050002034 Overlay key with a plurality of crossings and method of measuring overlay accuracy using the same |
| 01/06/2005 | US20050002033 Multiple beam ellipsometer |
| 01/06/2005 | US20050000102 Coordinate measuring instrument with feeler element and optical system for measuring the position of the feeler element |
| 01/06/2005 | US20050000051 Machine and method for inspecting input shaft of power steering system |
| 01/06/2005 | CA2527707A1 Container manufacturing inspection and control system |
| 01/05/2005 | EP1494275A1 Method to inspect directionally solidified castings |
| 01/05/2005 | EP1494224A2 Apparatus and method for aligning holographic ROM system |
| 01/05/2005 | EP1493502A1 Container inspection machine with easy access to its optical and electronical components for maintenance |
| 01/05/2005 | EP1492999A1 Improvements relating to cameras |
| 01/05/2005 | EP1492997A1 An apparatus and method for inspecting a tubular |
| 01/05/2005 | EP1492996A1 Arrangement in a measuring system |
| 01/05/2005 | EP1492995A1 Mark provided in an environment to be measured and measuring system comprising same |
| 01/05/2005 | EP1492994A2 Method and apparatus for stage mirror mapping |