Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
01/2005
01/27/2005DE10330363A1 Fabry-Perot fiber interferometer for precise measurements of small displacements comprises an emitting and detecting optical fiber and a deformable reflecting element that follows a displacement that is to be measured
01/27/2005DE10328523A1 Verfahren und Meßvorrichtung zur berührungslosen Vermessung einer Kontur einer Oberfläche sowie Verfahren zur automatischen Entzerrung von Koordinaten von Bildpunkten Procedures and measuring device for non-contact measurement of a contour of a surface and method for automatic correction of coordinates of pixels
01/26/2005EP1501051A2 Position and orientation detection method and apparatus
01/26/2005EP1500997A2 Mobile robot using image sensor and method for measuring moving distance thereof
01/26/2005EP1500917A2 Procedure and device for testing tyres
01/26/2005EP1500904A1 Method and instrument for measuring bead cutting shape of electric welded tube
01/26/2005EP1499861A1 Method and device for automatically regulating a quantity of product deposited
01/26/2005EP1401609B1 Method for the calibration of the optical system on a laser machine for machining electrical circuit substrates
01/26/2005EP0803062B2 Process and device for determining the layer thickness, the conductivity and/or the layer contact quality of layers deposited on substrates
01/26/2005CN2674480Y Raster disc for circular raster rotary coder
01/26/2005CN2674402Y Angle adjustable laser line alignment device
01/26/2005CN2674401Y Target drilling, distance measuring and classifying device
01/26/2005CN1571920A Optical tactile sensor
01/26/2005CN1570555A Micro mirror detecting method and device
01/26/2005CN1570554A Auto-collimation interference measurement system for three dimensional angular distortion of object
01/26/2005CN1570553A Composite calibration method of mold surface optical measurement system
01/26/2005CN1570552A Method for measuring three dimensional size using laser
01/26/2005CN1570551A Three wire image testing method and system for screw thread
01/26/2005CN1570550A Three dimensional high precision multifunctional thermal deformation experimental apparatus
01/26/2005CN1570549A Peak wavelength tuning unit for fiber grating
01/26/2005CN1570548A Micro-drill diameter measuring method and device using CCD gap diffraction method
01/26/2005CN1570547A Light pen type portable three dimensional coordinates measuring system
01/26/2005CN1570546A Flexible testing tool detection method for dimensional error of mechanical products
01/26/2005CN1570545A Workpiece measuring method and device
01/26/2005CN1186591C Corner sensor for rotor, especially for motor vehicle wheel ready to balance
01/26/2005CN1186590C 高倍全息位相差放大装置 High power amplification device holographic phase difference
01/26/2005CN1186589C Method of measuring two dimensional displacement quantity using conjugated optical channels
01/25/2005US6847910 Method and apparatus to measure amount of movement using granular speck pattern generated by reflecting laser beam
01/25/2005US6847859 Method for locating articles on a support plane
01/25/2005US6847464 Measurement of photolithographic features
01/25/2005US6847463 Method and apparatus for detecting the presence and thickness of carbon and oxide layers on EUV reflective surfaces
01/25/2005US6847462 Integrated system for quickly and accurately imaging and modeling three-dimensional objects
01/25/2005US6847458 Method and apparatus for measuring the shape and thickness variation of polished opaque plates
01/25/2005US6847453 All fiber autocorrelator
01/25/2005US6847450 System and method for optical multiplexing and/or demultiplexing
01/25/2005US6847444 Surface inspecting apparatus and method
01/25/2005US6847438 Apparatus for inspecting surface strain of magnetic tape
01/25/2005US6847435 Laser distance measuring apparatus
01/25/2005US6847360 Three-dimensional measuring method and system
01/25/2005US6847031 Intermittent operating type pointing device
01/25/2005US6847029 Multiple-source arrays with optical transmission enhanced by resonant cavities
01/25/2005US6847025 Semiconductor image position sensitive device
01/25/2005US6846597 Photomask inspecting method
01/20/2005WO2005006073A2 Image projector, inclination angle detection method, and projection image correction method
01/20/2005WO2005005924A1 Information presentation device and information presentation system using the same
01/20/2005WO2004099818A3 A modular non-contact measurement device for quickly and accurately obtaining dimensional measurement data
01/20/2005WO2004068066A3 Full-filled optical measurements of surface properties of panels, substrates and wafers
01/20/2005WO2004057266A8 Interferometer system and measuring device
01/20/2005US20050015099 Position measuring apparatus
01/20/2005US20050013510 Quality factor
01/20/2005US20050013477 Three dimensional tangible interface for interacting with spatial-temporal data using infrared light sources and infrared detectors
01/20/2005US20050012938 Apparatus and method for detecting wafer position
01/20/2005US20050012936 Scanning probe microscope and measurement method using the same
01/20/2005US20050012935 Characterizing unsteady pressures in pipes using optical measurement devices
01/20/2005US20050012928 Apparatus and method for measuring overlay by diffraction gratings
01/20/2005US20050012920 High resolution, dynamic positioning mechanism for specimen inspection and processing
01/20/2005US20050012907 Projector apparatus, inclination angle obtaining method, and projection image correction method
01/20/2005US20050012844 Three-dimensional field for calibration and method of photographing the same
01/20/2005US20050012056 Method for determining corresponding points in three-dimensional measurement
01/20/2005US20050011722 Apparatus for processing a sheet
01/20/2005DE10328412A1 Interferometer zur Messung von Ebenenabständen mit Subnanometer-Genauigkeit Interferometer for measuring plane distances with accuracy Subnanometer
01/19/2005EP1499130A1 Object monitoring apparatus
01/19/2005EP1498690A1 Thickness measuring device
01/19/2005EP1498689A1 Camera corrector
01/19/2005EP1498688A1 Probe and optical measuring system
01/19/2005EP1498081A1 Position measuring apparatus
01/19/2005EP1497614A1 Method and apparatus for alignment of components
01/19/2005EP1497613A1 Method and device for determining the spatial co-ordinates of an object
01/19/2005EP1497611A2 Scatterometric measurement of undercut multi-layer diffracting structures
01/19/2005EP1497160A1 Safety device for a vehicle
01/19/2005EP1496991A1 Methods and systems for laser calibration and eye tracker camera alignment
01/19/2005EP1226415B1 Method of measuring the twist imparted to an optical fibre and procedure for processing an optical fibre using this method
01/19/2005EP1194803B1 Broad band ultraviolet catadioptric imaging system
01/19/2005EP1032916B1 Method for automatic triggering of pattern recognition tasks
01/19/2005CN1568419A Method and device for analysing the surface of a substrate
01/19/2005CN1567384A Method of image acquisition, digitized measure and reconstruction of three-dimensional object
01/19/2005CN1567192A Surveying calculation system assembly for floor area of building
01/19/2005CN1566901A Method for forming dynamic grating stripes
01/19/2005CN1566900A Vision measuring method for spaced round geometrical parameters
01/19/2005CN1566899A Phase difference adjusting device and method, sensing apparatus employing the same
01/19/2005CN1566898A Cutter angle measuring microscope
01/19/2005CN1566897A Multiple free degree positioning cutter angle measuring microscope
01/19/2005CN1185464C System for simultaneous projections of multiple phase-shifted patterns for the multiple phase-shifted patterns for the three-dimensional inspection of an object
01/19/2005CN1185463C Fabricating optical waveguide gratings and/or characterizing optical waveguides
01/19/2005CN1185462C Non linear deviation compensation device used for interference measuring element
01/19/2005CN1185461C Frequency shift without chromatic aberration of wideband light source and device generation interferential heterodyne signal
01/18/2005US6845296 Object taking out apparatus
01/18/2005US6844935 Multi-function opto-electronic detection apparatus
01/18/2005US6844932 System and method for optical multiplexing and/or demultiplexing
01/18/2005US6844923 Method and apparatus for surveying the geometry of tunnels
01/18/2005US6844918 Alignment system and methods for lithographic systems using at least two wavelengths
01/18/2005US6844542 Marked plate for a rotational angle sensor element, an angular sensor element for rotating structural parts, and a process for determining a reference value
01/18/2005US6844541 Rapid high resolution position sensor for auto steering
01/18/2005US6844539 Touch location by retroflected scanned optical beams
01/18/2005CA2275670C Apparatus and method for determining axial stability
01/13/2005WO2005004052A2 Method and apparatus for automatic registration and visualization of occluded targets using ladar data
01/13/2005WO2005003911A2 Optical metrology of structures formed on semiconductor wafers using machine learning systems
01/13/2005WO2005003739A1 Method and apparatus for examining features on semi-transparent and transparent substrates
01/13/2005WO2005003727A2 Optical sensor for measuring characteristics and properties of strands
01/13/2005WO2005003695A1 Characterizing unsteady pressures in pipes using optical measurement devices