| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 02/17/2005 | US20050036662 Measurement instrument |
| 02/17/2005 | US20050036187 Light detecting apparatus |
| 02/17/2005 | US20050036154 Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure |
| 02/17/2005 | US20050036152 Vibration-resistant interferometer apparatus |
| 02/17/2005 | US20050036144 Position detecting method |
| 02/17/2005 | US20050036143 Reference calibration of metrology instrument |
| 02/17/2005 | US20050036138 System for detecting anomalies and / or features of a surface |
| 02/17/2005 | US20050036122 Evaluation mask, focus measuring method and aberration measuring method |
| 02/17/2005 | US20050035314 Range finder and method |
| 02/17/2005 | DE20023610U1 Optical distance measuring apparatus uses a laser to generate invisible light beam which travels through the same path as a visible light beam |
| 02/17/2005 | DE10335472A1 Measurement and adjustment device has a positioning device for moving an exchangeable measurement head with a camera in three dimensions, said positioning device having a pivoting articulated arm |
| 02/17/2005 | DE10333762A1 Vehicle test bed, especially for commercial vehicles, has means for testing headlamp alignment, chassis alignment, tracking and a distance-regulated cruise control system |
| 02/17/2005 | DE10329538A1 Measurement of the geometrical dimensions of cylindrical or conical objects by scanning the object surface with a scanning unit that generates a sampling point on the object surface that is moved in a circular path |
| 02/17/2005 | DE10313038B4 Vorrichtung zur Erfassung der Lage eines Tastelements in einem Mehrkoordinatenmessgerät A device for detecting the position of a probe element in a multi-coordinate measuring machine |
| 02/17/2005 | DE10297560T5 Filmausbildungsvorrichtung und Herstellungsverfahren für ein optisches Element Film forming apparatus and manufacturing method for an optical element |
| 02/17/2005 | DE10260256B4 Interferometersystem und Meß-/Bearbeitungswerkzeug Interferometer and measuring / cutting tool |
| 02/17/2005 | DE102004032643A1 Contactless measurement of the spatial form of a measurement object, especially measurement of internal topologies, whereby an optical measurement system is used and overlapping measurement areas processed with appropriate algorithms |
| 02/16/2005 | EP1507141A1 Surface defect judging method |
| 02/16/2005 | EP1507131A2 Scanning unit for an optical position measuring device |
| 02/16/2005 | EP1506370A2 System and method for control of paint thickness by using an optoacoustic technique |
| 02/16/2005 | EP1506369A2 System and method for controlling tube thickness with ultrasound |
| 02/16/2005 | EP1506368A1 Appliance for digitising of curved and plane surfaces |
| 02/16/2005 | EP1506367A1 A device for measuring in three dimensions a topographical shape of an object |
| 02/16/2005 | EP1506340A1 System and method for online control of paper elasticity and thickness |
| 02/16/2005 | EP1446636B1 Dynamic artefact comparison |
| 02/16/2005 | EP1339570B1 Device and method for detecting an object in a vehicle |
| 02/16/2005 | EP0961915B1 Thickness measuring apparatus |
| 02/16/2005 | CN1582383A Tilt sensing apparatus |
| 02/16/2005 | CN1581457A Ball-grating array semiconductor device quality detecting system based on dual-eye machine vision |
| 02/16/2005 | CN1580749A Foreign matter checking method for transparent thin-film |
| 02/16/2005 | CN1580748A Methods and apparatus for inspection of lines embedded in highly textured material |
| 02/16/2005 | CN1580694A Measuring instrument |
| 02/16/2005 | CN1580693A Optical grating wedge plate and corner measuring device using same |
| 02/16/2005 | CN1580692A Portable curved surface measuring device and method |
| 02/16/2005 | CN1580689A Anti-shock interference instrument |
| 02/16/2005 | CN1189722C Optical reflective type sensor |
| 02/16/2005 | CN1189720C Servo caparative polarized light displacement sensor system |
| 02/15/2005 | US6856435 System and method for optical multiplexing and/or demultiplexing |
| 02/15/2005 | US6856408 Line profile asymmetry measurement using scatterometry |
| 02/15/2005 | US6856407 Method for depth detection in 3D imaging providing a depth measurement for each unitary group of pixels |
| 02/15/2005 | US6856405 Non linear phase shift calibration for interferometric measurement of multiple surfaces |
| 02/15/2005 | US6856397 System and method for automated fringe counting using image information |
| 02/15/2005 | US6856388 Optical sensor for measuring the distance and/or inclination of a surface |
| 02/15/2005 | US6856385 Spatial averaging technique for ellipsometry and reflectometry |
| 02/15/2005 | US6856384 Optical metrology system with combined interferometer and ellipsometer |
| 02/15/2005 | US6856381 Method for carrying out the non-contact measurement of geometries of objects |
| 02/15/2005 | US6856355 Method and apparatus for a color scannerless range image system |
| 02/15/2005 | US6856314 Method and system for 3D reconstruction of multiple views with altering search path and occlusion modeling |
| 02/15/2005 | US6856312 Method for generating three-dimensional form data and apparatus therefor |
| 02/15/2005 | US6854347 Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs |
| 02/15/2005 | US6854327 Apparatus and method for monitoring compaction |
| 02/15/2005 | US6854195 Adjustable probe |
| 02/15/2005 | US6854193 Rotating swivel unit for sensors of a coordinate measuring apparatus and method for determining corrective parameters of the rotating swivel unit |
| 02/15/2005 | CA2430300C Method and apparatus for measuring the outside dimensions of a package |
| 02/10/2005 | WO2005012831A1 Two-wheel alignment adjustment method |
| 02/10/2005 | US20050034036 Method for correcting data of several opto-electronic sensors |
| 02/10/2005 | US20050033538 Inspection method and its apparatus, inspection system |
| 02/10/2005 | US20050033184 Arrangement and method for measuring shape of basically two dimensional objects |
| 02/10/2005 | US20050031974 Ensuring uniform illumination of exposure tool; coating with resist film, generating patterns and comparing to reference image to detect abnormalities |
| 02/10/2005 | US20050031193 Method and system for detecting the three-dimensional shape of an object |
| 02/10/2005 | US20050031191 Methods and apparatus for inspection of lines embedded in highly textured material |
| 02/10/2005 | US20050030553 Displacement gauge and displacement measuring method |
| 02/10/2005 | US20050030552 Method for measuring large components, especially the body of rail cars |
| 02/10/2005 | US20050030537 Mark position measuring method and apparatus |
| 02/10/2005 | US20050030528 Confocal wafer-inspection system |
| 02/10/2005 | US20050030525 Method for determining an axle geometry and sensor for its execution |
| 02/10/2005 | US20050030523 Inclination angle detection device and inclination angle detection method |
| 02/10/2005 | US20050029764 Barrow for moving observation |
| 02/10/2005 | US20050029459 Radiometer, sighting device for a radiometer and method therefor |
| 02/10/2005 | US20050029228 Etch amount detection method, etching method, and etching system |
| 02/10/2005 | US20050028611 Mobile measurement system of three-dimensional structure |
| 02/10/2005 | US20050028393 Method for improving measurement accuracy of a portable coordinate measurement machine |
| 02/10/2005 | DE202004011508U1 Drehwinkelgeber Rotary encoder |
| 02/10/2005 | DE19747061B4 Verfahren und Einrichtung zur flächenhaften, dreidimensionalen, optischen Vermessung von Objekten Method and apparatus for spatial, three-dimensional optical measurement of objects |
| 02/10/2005 | DE10333493A1 3D object measurement system strip projector has light source modulated in synchronism with rotating mirror to suit camera exposure time |
| 02/10/2005 | DE10331012A1 Measurement of geometrical shapes, especially alignment markings, on a semiconductor wafer using an optical system, whereby an optimum contrast value is used for a detected shape if a reference threshold cannot be obtained |
| 02/10/2005 | DE10126753B4 Verfahren zur Genauigkeitssteigerung von Koordinatenmessgeräten und Werkzeugmaschinen A method for increasing the accuracy of coordinate measuring machines and machine tools |
| 02/09/2005 | EP1505544A2 Methods and apparatus for inspection of lines embedded in highly textured material |
| 02/09/2005 | EP1505542A2 Method and device for recognizing object position |
| 02/09/2005 | EP1505367A2 Method for evaluating axle geometry and sensor for implemention of said method |
| 02/09/2005 | EP1505366A2 Method for tuning a switching threshold of a switch sensor |
| 02/09/2005 | EP1505362A1 Measuring probe with modules |
| 02/09/2005 | EP1504379A1 Video microscopy system and multi-view virtual slide viewer capable of simultaneously acquiring and displaying various digital views of an area of interest located on a microscopic slide |
| 02/09/2005 | EP1504237A1 Device to determine the thickness of a conductive layer |
| 02/09/2005 | EP1277028B1 Co-ordinate measuring device or machine tool |
| 02/09/2005 | CN1578414A Position and orientation detection method and apparatus |
| 02/09/2005 | CN1577379A Face shape recognition from stereo images |
| 02/09/2005 | CN1577181A Apparatus and method for aligning holographic ROM system |
| 02/09/2005 | CN1577103A Lithographic apparatus and integrated circuit manufacturing method |
| 02/09/2005 | CN1576934A Focus detecting method, focus detecting mechanism and image measuring device having focus detecting mechanism |
| 02/09/2005 | CN1576878A Method and apparatus for detecting position of mobile robot |
| 02/09/2005 | CN1576831A Wiring pattern check up apparatus |
| 02/09/2005 | CN1576782A Pattern inspection method and apparatus, and pattern alignment method |
| 02/09/2005 | CN1576781A Method and apparatus for measuring a pitch of stranded cable |
| 02/09/2005 | CN1576778A Original and its producing method, exposure apparatus inspection system and method |
| 02/09/2005 | CN1576777A Inspection apparatus and inspection method |
| 02/09/2005 | CN1576776A Interferometer with interference fringe scanning function |
| 02/09/2005 | CN1576114A Method and apparatus for determining a head position of a vehicle driver |
| 02/09/2005 | CN1189072C Method for measuring device for plugging printed circuit board |
| 02/09/2005 | CN1188776C Apparatus for determining image, method and medium |