Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827) |
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06/22/1999 | US5913718 Head for a chemical mechanical polishing apparatus |
06/17/1999 | WO1999029469A1 Method and device for electro-erosive dressing of a grinding wheel |
06/17/1999 | DE19753426A1 Vorrichtung und Verfahren zum Korrigieren von Rundlauffehlern Apparatus and method for correcting eccentricities |
06/15/1999 | US5911619 Apparatus for electrochemical mechanical planarization |
06/10/1999 | WO1999028081A1 Improved grinding machine |
06/10/1999 | WO1999028080A1 Device and method for correcting radial run-outs |
06/09/1999 | EP0920956A2 Polishing apparatus and method |
06/09/1999 | EP0920955A2 Method and apparatus for endpoint detection in polishing of components, especially semiconductor components |
06/08/1999 | US5910846 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers |
06/08/1999 | US5910040 Method of controlling shape and NC processing apparatus utilizing the method |
06/03/1999 | WO1999026763A2 Polishing apparatus |
06/03/1999 | WO1999026760A1 Wafer polishing machine |
06/03/1999 | WO1999026758A1 Electrochemical-control of abrasive polishing and machining rates |
06/03/1999 | WO1999026755A2 Active centering apparatus with imbedded shear load sensor and actuator |
06/02/1999 | EP0918589A1 Machine for machining workpieces with cutting teeth, in particular saw blades |
06/02/1999 | DE19855455A1 Finishing processing, e.g. final polishing of workpiece |
05/27/1999 | WO1999025520A1 Method and apparatus for modeling a chemical mechanical polishing process |
05/25/1999 | US5906533 Infrared heater to soften a bonding agent for semiconductor wafer |
05/19/1999 | EP0916450A1 Method and apparatus for polishing semiconductor wafers |
05/18/1999 | US5904608 For polishing a surface of a workpiece |
05/14/1999 | WO1999023486A1 Method and apparatus for ultrasonically detecting flaw on surface of circular cylinder, and method of grinding roll utilizing the same |
05/14/1999 | WO1999023449A1 Method and apparatus for modeling substrate reflectivity during chemical mechanical polishing |
05/14/1999 | WO1999022907A1 Device for grinding multiple-cornered billets |
05/14/1999 | WO1999022906A1 Device for measuring a former |
05/12/1999 | EP0914908A2 Polishing apparatus and method |
05/12/1999 | EP0914907A2 Polishing member support and polishing method |
05/12/1999 | DE19748160A1 Vorrichtung zum Vermessen einer Formscheibe Device for measuring a mold plate |
05/11/1999 | US5901619 Method for manufacturing rotary cutting tool and rotary cutting tool |
05/11/1999 | US5901400 Brushing apparatus |
05/06/1999 | WO1999021682A1 A polishing apparatus for forming aspheric surfaces |
05/05/1999 | CN2317046Y Polishing head feed automatic regulator |
05/04/1999 | US5899800 Chemical mechanical polishing apparatus with orbital polishing |
05/04/1999 | US5899792 Of a wafer |
05/04/1999 | CA2037106C Lens edging system with programmable feed and speed control |
04/27/1999 | US5897426 Chemical mechanical polishing with multiple polishing pads |
04/22/1999 | WO1999019114A1 Apparatus for machining workpieces |
04/21/1999 | EP0909611A1 Method for grinding the surfaces of workpieces and apparatus for carrying out the method |
04/20/1999 | US5895314 Lens shape measuring apparatus |
04/20/1999 | US5895311 Abrasive device that maintains normal line of contact with curved abrasive surface and method of using same |
04/15/1999 | DE19743529C1 Maschine zum Bearbeiten von Werkstücken mit Schneidzähnen, insbesondere von Sägeblättern Machine for machining workpieces with cutting teeth, especially saw blades |
04/14/1999 | EP0907461A1 Grinding machine spindle flexibly attached to platform |
04/14/1999 | EP0907460A1 Method for chemical-mechanical planarization of stop-on-feature semiconductor wafers |
04/13/1999 | US5893796 Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
04/13/1999 | US5893754 Method for chemical-mechanical planarization of stop-on-feature semiconductor wafers |
04/13/1999 | CA2168472C A brushless spindle motor for a grinding machine including hydrostatic bearings |
04/08/1999 | WO1999016581A1 Measuring device on a machine for machining workpieces with cutting teeth, especially saw blades |
04/08/1999 | WO1999016579A1 Sharpening of fittings |
04/08/1999 | WO1999016569A1 Machine for machining workpieces with cutting teeth, especially saw blades |
04/08/1999 | DE19845284A1 Conical-ness correction device for grinding machine |
04/07/1999 | EP0906174A1 Workpiece inspection and handling |
04/06/1999 | US5891352 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
03/31/1999 | EP0904895A2 Substrate polishing method and apparatus |
03/31/1999 | EP0904894A2 Eyeglass lens grinding apparatus, and a method of grinding an eyeglass |
03/31/1999 | EP0904893A2 Inspection of wafer edge after grinding |
03/31/1999 | CN1212645A Method of polishing hard disc and polishing apparatus therefor |
03/30/1999 | US5888120 Method and apparatus for chemical mechanical polishing |
03/24/1999 | EP0903199A2 Improvements in and relating to workpiece gauging |
03/24/1999 | CN1211488A Method and device for detecting surface defect on continuously mechanical cutting to continuous casting products |
03/23/1999 | US5885142 Device for cleaning a liquid crystal panel |
03/23/1999 | US5885134 Polishing apparatus |
03/23/1999 | US5885132 Method and apparatus for machining an annular layer of boron nitride or diamonds of grinding discs |
03/23/1999 | US5885131 Interactive device for lapping transducers |
03/18/1999 | DE19740044A1 Machining or grinding workpieces for production of jewelry or designer goods |
03/18/1999 | DE19738818A1 Pattern-controlled precision-machining system |
03/16/1999 | US5882244 Polishing apparatus |
03/16/1999 | US5882243 Method for polishing a semiconductor wafer using dynamic control |
03/11/1999 | WO1999011432A1 Device and method for heating a liquid or semiliquid polishing agent, and device for polishing wafers |
03/11/1999 | DE19737849A1 Vorrichtung und Verfahren zum Beheizen eines flüssigen oder zähflüssigen Poliermittels sowie Vorrichtung zum Polieren von Wafern Device and method for heating a liquid or viscous as well as polishing agent for polishing wafers device |
03/02/1999 | US5877088 Flattening method and apparatus for semiconductor device |
02/25/1999 | WO1999009371A1 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers |
02/23/1999 | US5873769 Temperature compensated chemical mechanical polishing to achieve uniform removal rates |
02/18/1999 | WO1999007518A1 Continuously variable planarization and polishing pad system |
02/18/1999 | WO1999007516A1 A carrier head with local pressure control for a chemical mechanical polishing apparatus |
02/17/1999 | EP0896859A2 Wafer polishing apparatus |
02/17/1999 | EP0896858A1 Wafer polishing apparatus |
02/16/1999 | US5872633 Methods and apparatus for detecting removal of thin film layers during planarization |
02/16/1999 | US5871392 Under-pad for chemical-mechanical planarization of semiconductor wafers |
02/16/1999 | US5871389 Grinding machine |
02/10/1999 | EP0895614A1 Method and apparatus for grinding composite workpieces |
02/09/1999 | US5868896 Chemical-mechanical planarization machine and method for uniformly planarizing semiconductor wafers |
02/04/1999 | WO1999004930A1 Wafer carrier for semiconductor wafer polishing machine |
02/03/1999 | EP0894570A2 Method and apparatus for polishing |
02/03/1999 | EP0894569A1 Method of polishing hard disc and polishing apparatus therefor |
02/03/1999 | EP0894568A2 Method and apparatus for grinding eyeglass lenses |
02/03/1999 | EP0894567A2 Method and apparatus for measuring an eyeglass frame and eyeglass lens grinding apparatus using the same |
02/02/1999 | US5865666 Apparatus and method for polish removing a precise amount of material from a wafer |
02/02/1999 | US5865665 In-situ endpoint control apparatus for semiconductor wafer polishing process |
01/27/1999 | EP0893203A2 Method and apparatus for in-situ end-point detection and optimization of a chemical-mechanical polishing process using a linear polisher |
01/21/1999 | WO1999002304A1 A carrier head with a flexible membrane for a chemical mechanical polishing system |
01/19/1999 | US5860847 Polishing apparatus |
01/13/1999 | EP0890416A2 Wafer polishing apparatus |
01/12/1999 | US5857895 Checking device for a microfinishing machine tool |
01/12/1999 | US5857893 Methods and apparatus for measuring and dispensing processing solutions to a CMP machine |
01/12/1999 | CA2035763C Adaptable tool-holder assembly for robitized adjustment |
01/05/1999 | CA2147952C Apparatus for grinding spectacle lenses |
12/30/1998 | WO1998058767A2 Machining apparatus and method |
12/29/1998 | US5853316 Method of and apparatus for grinding control edges of a control bush |
12/24/1998 | DE19726665A1 In situ end point determination during chemical-mechanical polishing |
12/22/1998 | US5851846 Polishing method for SOI |
12/22/1998 | US5851135 System for real-time control of semiconductor wafer polishing |