| Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827) |
|---|
| 09/23/1997 | US5670410 End-point detection |
| 09/18/1997 | DE19630057C1 Machine tool for machining saw blades |
| 09/16/1997 | US5668930 Off-line teaching method for a robot |
| 09/16/1997 | US5667629 Method and apparatus for determination of the end point in chemical mechanical polishing |
| 09/16/1997 | US5667424 New chemical mechanical planarization (CMP) end point detection apparatus |
| 09/12/1997 | WO1997032691A1 Method of polishing hard disc and polishing apparatus therefor |
| 09/12/1997 | WO1997032690A1 Resin disk polishing method and apparatus |
| 09/09/1997 | US5664987 Methods and apparatus for control of polishing pad conditioning for wafer planarization |
| 09/09/1997 | US5664986 Apparatus for polishing a dielectric layer formed on a substrate |
| 09/04/1997 | WO1997031756A1 Machine tool for combined working |
| 09/04/1997 | WO1997031755A1 Apparatus for grinding surfaces |
| 09/04/1997 | CA2250214A1 Apparatus for grinding surfaces |
| 09/03/1997 | EP0705156B1 Process for avoiding overstressing a workpiece during grinding |
| 09/03/1997 | CN1158289A Method of producing semiconductor wafers |
| 09/02/1997 | US5663797 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers |
| 09/02/1997 | US5663637 Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool |
| 08/27/1997 | EP0791444A1 Wafer manufacturing process |
| 08/20/1997 | EP0790101A1 Shape control method and nc machine using the method |
| 08/20/1997 | EP0789787A1 Device for machining the edge of spectacle lenses |
| 08/19/1997 | US5659492 For removing a film from a wafer |
| 08/19/1997 | US5658183 System for real-time control of semiconductor wafer polishing including optical monitoring |
| 08/12/1997 | US5655951 Method for selectively reconditioning a polishing pad used in chemical-mechanical planarization of semiconductor wafers |
| 08/12/1997 | US5655475 Method of grinding thin-film magnetic heads using optical grinding markers |
| 08/05/1997 | US5653622 Chemical mechanical polishing system and method for optimization and control of film removal uniformity |
| 07/31/1997 | DE19626388C1 Machine for cutting tooth flanks in saw blade |
| 07/31/1997 | DE19602937A1 Paint sanding machine for wooden frame profiles |
| 07/31/1997 | DE19602934A1 Paint layer abrasive machining mechanism |
| 07/30/1997 | EP0785839A1 Lateral evening process and device |
| 07/30/1997 | EP0757609A4 Microfinishing tool with axially variable machining effect |
| 07/29/1997 | US5651720 Bore size correcting apparatus |
| 07/29/1997 | US5651719 Tooling for abrasive belt machining of cylindrical bearing surfaces with provision for monitoring bearing surface diameter |
| 07/22/1997 | US5649849 Method and apparatus for realtime monitoring and feedback control of the shape of a continuous planetary polishing surface |
| 07/17/1997 | WO1997025660A1 In situ technique for monitoring and controlling a process of chemical-mechanical-polishing via a radiative communication link |
| 07/17/1997 | DE4345408A1 Semiconductor wafer polishing appts. |
| 07/15/1997 | US5647952 Chemical/mechanical polish (CMP) endpoint method |
| 07/09/1997 | EP0782491A1 Grinding machine |
| 07/08/1997 | US5645466 For removing weld flash from the tip of a gas turbine blade |
| 07/01/1997 | US5644221 Endpoint detection for chemical mechanical polishing using frequency or amplitude mode |
| 07/01/1997 | US5643060 System for real-time control of semiconductor wafer polishing including heater |
| 07/01/1997 | US5643053 Chemical mechanical polishing apparatus with improved polishing control |
| 07/01/1997 | US5643051 Centerless grinding process and apparatus therefor |
| 07/01/1997 | US5643050 Chemical/mechanical polish (CMP) thickness monitor |
| 07/01/1997 | US5643049 Floating contact gage for measuring cylindrical workpieces exiting a grinder |
| 07/01/1997 | US5643048 Endpoint regulator and method for regulating a change in wafer thickness in chemical-mechanical planarization of semiconductor wafers |
| 07/01/1997 | US5643047 Mobile floor grinding vehicle |
| 07/01/1997 | US5643046 Polishing method and apparatus for detecting a polishing end point of a semiconductor wafer |
| 07/01/1997 | US5643044 Automatic chemical and mechanical polishing system for semiconductor wafers |
| 07/01/1997 | US5642646 Method for manufacturing rotary cutting tool and rotary cutting tool |
| 06/26/1997 | WO1997022442A1 Determining the coefficient of friction of a polishing pad |
| 06/17/1997 | US5639388 Polishing endpoint detection method |
| 06/11/1997 | EP0721391A4 A brushless spindle motor for a grinding machine including hydrostatic bearings |
| 06/10/1997 | US5637185 Chemical mechanical polishing slurry, electrochemical potential measuring means for measuring potential of slurry during polishing |
| 06/10/1997 | US5637031 Electrochemical simulator for chemical-mechanical polishing (CMP) |
| 06/05/1997 | WO1997020343A1 Semiconductor device manufacturing method, chemical-mechanical polishing method, and device used for the polishing method |
| 06/05/1997 | DE19544620A1 Burning detection method state of disk for grinding disks |
| 06/03/1997 | US5635083 Method and apparatus for chemical-mechanical polishing using pneumatic pressure applied to the backside of a substrate |
| 05/27/1997 | US5632669 Interactive method for lapping transducers |
| 05/21/1997 | CN1150401A Control device for robot |
| 05/14/1997 | EP0453500B1 Method for measuring and maintaining the profile of a railroad track rail |
| 05/07/1997 | EP0771611A1 Method and apparatus for determining endpoint in polishing process |
| 05/07/1997 | EP0771249A1 Grinding method and apparatus |
| 05/07/1997 | EP0610181B1 Apparatus for use in the manufacture of valves for hydraulic power steering gears |
| 04/29/1997 | US5625446 Optical measurement system for articles with varying surface reflectivity |
| 04/29/1997 | US5624300 Apparatus and method for uniformly polishing a wafer |
| 04/29/1997 | US5624299 Chemical mechanical polishing apparatus with improved carrier and method of use |
| 04/17/1997 | WO1997013614A1 Device for measuring or checking an orbitally mobile cylindrical part during machining thereof |
| 04/15/1997 | US5620358 Method of dressing grindstone for NC grinder |
| 04/10/1997 | WO1997012724A1 Apparatus for checking the diameter of crankpins rotating with an orbital motion |
| 04/08/1997 | US5618993 Ultrasonic detection apparatus and method for detecting acoustic emission |
| 04/08/1997 | US5618447 Polishing pad counter meter and method for real-time control of the polishing rate in chemical-mechanical polishing of semiconductor wafers |
| 04/08/1997 | US5618221 Method of dressing grindstone for NC grinder |
| 03/25/1997 | US5613894 Method to hone curved and shaped profiles and honing machine to carry out such method |
| 03/20/1997 | DE19533847A1 Measurement head for measuring thickness or diameter |
| 03/18/1997 | US5611723 Apparatus for modifying attitude of golf ball having burrs formed thereon and deburring machine employing the same |
| 03/11/1997 | US5609718 Method and apparatus for measuring a change in the thickness of polishing pads used in chemical-mechanical planarization of semiconductor wafers |
| 03/11/1997 | US5609518 Grinding wheel for forming convex shapes, applicable in particular to manual grinders |
| 03/11/1997 | US5609511 Polishing method |
| 03/06/1997 | DE19532222A1 Workpiece cylindrical contour forming method for grinding equipment |
| 03/04/1997 | US5607718 Polishing method and polishing apparatus |
| 02/27/1997 | WO1997006922A1 Shape control method and nc machine using the method |
| 02/25/1997 | US5605488 Polishing apparatus of semiconductor wafer |
| 02/20/1997 | WO1997005989A1 Method and apparatus for shaping an orifice with an abrasive slurry |
| 02/18/1997 | US5604583 Computer vision inspection station |
| 02/12/1997 | EP0757609A1 Microfinishing tool with axially variable machining effect |
| 02/04/1997 | US5599423 Computer process control; for integrated circuits |
| 01/28/1997 | US5597442 Determining endpoint for polishing semiconductor wafer surface |
| 01/28/1997 | US5597341 Semiconductor planarizing apparatus |
| 01/21/1997 | US5595529 Dual column abrading machine |
| 01/21/1997 | US5595528 Grinding wheel dresser |
| 01/21/1997 | US5595525 Numerically controlled grinding machine |
| 01/15/1997 | CN1140124A Method and apparatus for processing reference plane of Si 111 crystal ingot with one-step process |
| 12/31/1996 | US5588899 Apparatus for grinding spectacle lenses |
| 12/17/1996 | US5585718 Device for detecting the bending magnitude of a shaft |
| 12/10/1996 | US5582534 Orbital chemical mechanical polishing apparatus and method |
| 12/03/1996 | US5579717 Method of grinding thin-film magnetic heads using optical grinding markers |
| 11/28/1996 | WO1996037340A1 Interactive system for lapping transducers |
| 11/28/1996 | DE19612195A1 Wafer polishing appts. for esp. semiconductor wafer |
| 11/28/1996 | DE19518365A1 Stabilising tool temperature in wood-working machine |
| 11/27/1996 | EP0743891A1 Method and apparatus for correcting diametrical taper on a workpiece |
| 11/13/1996 | EP0742078A1 Drive and control device and related process for a grinding machine |