| Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827) |
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| 03/05/2009 | US20090061737 Lapping apparatus and lapping method |
| 03/05/2009 | US20090061734 Endpoint detection system for wafer polishing |
| 03/05/2009 | US20090061733 Method and device for forecasting/detecting polishing end point and method and device for monitoring real-time film thickness |
| 03/04/2009 | CN101376230A Lapping apparatus and lapping method |
| 03/04/2009 | CN100466191C Polishing device |
| 03/03/2009 | US7497763 Polishing pad, a polishing apparatus, and a process for using the polishing pad |
| 03/03/2009 | US7497762 Apparatus and method for correcting grinding amount of liquid crystal display panel |
| 02/26/2009 | WO2009023979A1 Method and device for machining workpieces |
| 02/26/2009 | US20090051939 Substrate film thickness measurement method, substrate film thickness measurement apparatus and substrate processing apparatus |
| 02/25/2009 | EP2028437A1 Apparatus and method for the dimensional checking of cylindrical parts |
| 02/25/2009 | CN101372090A Method for measuring thickness of substrate and equipment for processing substrate |
| 02/25/2009 | CN100464211C Manufacture device and method of liquid crystal display panel |
| 02/24/2009 | US7495759 Damage and wear detection for rotary cutting blades |
| 02/24/2009 | US7494399 Single-step fiber grinding process and apparatus |
| 02/19/2009 | US20090047869 Precision Machining Method |
| 02/18/2009 | EP2025470A1 Polishing apparatus, polishing method, substrate manufacturing method, and electronic apparatus manufacturing method |
| 02/18/2009 | EP2025469A1 Multi-layer polishing pad material for CMP |
| 02/18/2009 | EP2025450A2 Grinding apparatus and method of controlling grinding apparatus |
| 02/18/2009 | CN201195276Y On-line testing numerical control cam grinder |
| 02/18/2009 | CN101367199A Novel device and method for testing thermal stress at time of processing of camshaft of grinder |
| 02/18/2009 | CN100463136C Chemical mechanical polishing and method for manufacturing semiconductor device using the same |
| 02/17/2009 | US7491115 Indexing device for performing operational tasks on a tool element |
| 02/12/2009 | WO2009019537A1 Process and apparatus for grinding tyres |
| 02/12/2009 | US20090042487 Polishing apparatus, polishing method, substrate manufacturing method, and electronic apparatus manufacturing method |
| 02/12/2009 | US20090042483 Working System, Method for Detecting Contact, and Acoustic Emission Contact Detection Device |
| 02/12/2009 | US20090042482 Rough polishing method of semiconductor wafer and polishing apparatus of semiconductor wafer |
| 02/12/2009 | US20090042481 Method of calibrating or compensating sensor for measuring property of a target surface |
| 02/11/2009 | EP2021887A1 Numerically controlled grinding machine and process for controlling same |
| 02/11/2009 | CN101362309A Polishing apparatus, substrate manufacturing method, and electronic apparatus manufacturing method |
| 02/10/2009 | US7488235 Polishing apparatus and related polishing methods |
| 02/05/2009 | WO2009018012A1 Automated detection of characteristics of abrasive products during use |
| 02/05/2009 | WO2009018011A1 Abrasive products with splice marks and automated splice detection |
| 02/05/2009 | US20090036029 Advanced automatic deposition profile targeting and control by applying advanced polish endpoint system feedback |
| 02/05/2009 | US20090036028 Chemical mechanical polishing apparatus and chemical mechanical polishing method thereof |
| 02/05/2009 | US20090036027 Automated detection of characteristics of abrasive products during use |
| 02/05/2009 | US20090036026 Substrate thickness measuring during polishing |
| 02/05/2009 | US20090036024 Cmp apparatus and method of polishing wafer using cmp |
| 02/05/2009 | CA2694713A1 Abrasive products with splice marks and automated splice detection |
| 02/04/2009 | CN201189638Y Electric control device of energy-saving grinder |
| 02/03/2009 | US7486407 Polishing pad surface shape measuring instrument, method of using polishing pad surface shape measuring instrument, method of measuring apex angle of cone of polishing pad, method of measuring depth of groove of polishing pad, CMP polisher, and method of manufacturing semiconductor device |
| 02/03/2009 | US7485026 Sander |
| 01/29/2009 | WO2009013231A1 Apparatus and method for checking thickness dimensions of an element while it is being machined |
| 01/29/2009 | US20090028655 Device and method for machining bevel gears in the indexing method having complete indexing error compensation |
| 01/28/2009 | CN101352836A Method and device for controlling polishing temperature of freezing fixed abrasive |
| 01/28/2009 | CN100455410C Method and device for precisely controlling axial fiber polishing thickness |
| 01/27/2009 | US7481945 Polishing progress monitoring method and device thereof, polishing device, semiconductor device production method, and semiconductor device |
| 01/27/2009 | US7481697 Head slider and method of manufacturing same |
| 01/27/2009 | US7481695 Polishing apparatus and methods having high processing workload for controlling polishing pressure applied by polishing head |
| 01/22/2009 | US20090023361 Cmp apparatus and method of polishing wafer using cmp |
| 01/20/2009 | US7479206 Apparatus for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies |
| 01/20/2009 | US7479056 Automated drill bit re-sharpening and verification system |
| 01/15/2009 | WO2009007121A2 Method and arrangement for maintenance of gas-turbine blades |
| 01/15/2009 | US20090017726 Spectra based endpointing for chemical mechanical polishing |
| 01/14/2009 | EP2014413A1 Assembly, method and device for maintaining gas turbine blades |
| 01/14/2009 | CN101342696A Power tool |
| 01/13/2009 | US7476144 Sander |
| 01/13/2009 | US7476143 Eyeglass lens processing system |
| 01/08/2009 | WO2009006022A1 Tire for material treatment system |
| 01/08/2009 | US20090011680 Polishing state monitoring apparatus and polishing apparatus and method |
| 01/08/2009 | DE102007031299A1 Workpiece i.e. semiconductor wafer, machining tool i.e. double side machining tool, has wear sensor with sections running out from machining surfaces plane, where electrical resistances of sections exhibit different temperature dependencies |
| 01/07/2009 | EP1722950B1 Nozzle assembly for a saw for a semiconductor device |
| 01/07/2009 | CN201178090Y A method for measuring wafer liquid film middle variant in CMP process |
| 01/07/2009 | CN201175855Y System for measuring abrasion amount of panel |
| 01/07/2009 | CN101339893A Method for judging wafer thinning, device structure and device and its manufacture method |
| 01/07/2009 | CN100448616C Pneumatic loading equipment of accurate doublefaced polisher |
| 01/06/2009 | US7473162 Pad conditioner dresser with varying pressure |
| 01/06/2009 | US7473161 Lapping machine and head device manufacturing method |
| 01/06/2009 | US7473160 Method and apparatus for grinding a workpiece |
| 01/06/2009 | US7473159 Detection of diamond contamination in polishing pad and reconditioning system therefor |
| 01/01/2009 | US20090004951 Apparatus and method for removing material from microfeature workpieces |
| 12/31/2008 | WO2009003008A1 Methods of crystallographically reorienting single crystal bodies |
| 12/31/2008 | EP2009426A2 Method for processing a substrate |
| 12/31/2008 | CN100446927C Modeling an abrasive process to achieve controlled material removal |
| 12/25/2008 | US20080318503 Substrate holding mechanism, substrate polishing apparatus and substrate polishing method |
| 12/25/2008 | US20080318499 Substrate holding apparatus, polishing apparatus, and polishing method |
| 12/25/2008 | US20080318492 Substrate holding apparatus, polishing apparatus, and polishing method |
| 12/24/2008 | DE102004004556B4 Verfahren zur Herstellung einer Halbleiterscheibe A process for producing a semiconductor wafer |
| 12/23/2008 | US7467990 Back pressure control system for CMP and wafer polishing |
| 12/17/2008 | EP2002933A1 Sander |
| 12/17/2008 | EP2002932A1 Sander |
| 12/17/2008 | EP2002931A1 Sander |
| 12/17/2008 | EP2002930A1 Sander |
| 12/16/2008 | US7465215 Sponge blasting apparatus and sponge blasting method |
| 12/16/2008 | US7465214 Substrate holding apparatus and polishing apparatus |
| 12/16/2008 | US7464482 Apparatus for the dimensional checking of orbitally rotating pins |
| 12/16/2008 | CA2463209C Proportional pressure regulator having positive and negative pressure delivery capability |
| 12/11/2008 | WO2008148638A1 Grinding center and method for the simultaneous grinding of multiple crankshaft bearings |
| 12/11/2008 | US20080305717 Platen assembly and work piece carrier head employing flexible circuit sensor |
| 12/11/2008 | US20080305716 Honing method and honing control device |
| 12/11/2008 | US20080305715 Manufacturing method of semiconductor integrated circuit device |
| 12/10/2008 | EP2000259A2 Substrate holding apparatus, polishing apparatus, and polishing method |
| 12/10/2008 | EP2000258A2 Honing method and honing control device |
| 12/10/2008 | EP1771279B1 Polishing apparatus and substrate processing method |
| 12/10/2008 | CN101320708A Manufacturing method of semiconductor integrated circuit device |
| 12/10/2008 | CN101318280A Overlength bed way precision finishing process |
| 12/10/2008 | CN100442180C Numerical control apparatus |
| 12/09/2008 | US7462092 Method of finishing bevel gears to produce a diffuse surface structure |
| 12/04/2008 | US20080299872 Independent Measuring Apparatus for Grinding Machines |
| 12/04/2008 | US20080299871 Methods and apparatus for polishing a semiconductor wafer |
| 12/04/2008 | US20080297794 Apparatus for optical inspection of wafers during polishing |