H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/1994
11/22/1994	US5366794 Tape carrier for semiconductor apparatus
11/22/1994	US5366766 Method of manufacturing thin film and thin film device
11/22/1994	US5366757 In situ resist control during spray and spin in vapor
11/22/1994	US5366713 Vapor deposition using silane, hydrogen, trimethylborane, and either diborane/6/ or boron trifluoride gases; carbiding
11/22/1994	US5366692 Alloy connecting materials for semiconductors
11/22/1994	US5366688 Heat sink and method of fabricating
11/22/1994	US5366590 Dry etching method
11/22/1994	US5366589 Integrated circuits, covering of passivation layer on insulation
11/22/1994	US5366585 Method and apparatus for protection of conductive surfaces in a plasma processing reactor
11/22/1994	US5366573 Backside bonded to temporary carrier and positioned before curing, removing adhesive by solvent
11/22/1994	US5366557 Method and apparatus for forming integrated circuit layers
11/22/1994	US5366552 Apparatus for liquid-phase epitaxial growth
11/22/1994	US5366368 Multi-plunger manual transfer mold die
11/22/1994	US5366364 Plastic molding apparatus
11/22/1994	US5366156 Nozzle apparatus for producing aerosol
11/22/1994	US5366140 Patterned array of uniform metal microbeads
11/22/1994	US5366079 Integrated circuit wafer and retainer element combination
11/22/1994	US5366002 Apparatus and method to ensure heat transfer to and from an entire substrate during semiconductor processing
11/22/1994	US5365960 Megasonic transducer assembly
11/22/1994	US5365877 Method of growing semiconductor in vapor phase
11/22/1994	US5365875 Semiconductor element manufacturing method
11/22/1994	US5365772 Leak detection in a reduced pressure processing apparatus
11/22/1994	US5365672 Positioning apparatus for a semiconductor wafer
11/22/1994	US5365657 Method and apparatus for cutting wire
11/22/1994	CA1333146C Method of forming silicon dioxide glass films
11/17/1994	EP0624952A2 Integrated circuit with a low-power mode and clock amplifier circuit for same
11/17/1994	EP0624943A1 Serial current limiting device
11/17/1994	EP0624909A2 Lateral MOSFET with contact structure
11/17/1994	EP0624907A2 Semiconductor device, heterojunction bipolar transistor, and high electron mobility transistor
11/17/1994	EP0624906A1 Integrated structure circuit for the protection of power devices against overvoltages
11/17/1994	EP0624904A2 A multi-layer wiring board and a manufacturing method thereof
11/17/1994	EP0624903A1 A modular integrated circuit structure
11/17/1994	EP0624902A1 Thixotropic conductive paste
11/17/1994	EP0624901A1 Semiconductor device with a passivation layer
11/17/1994	EP0624900A2 Method of micro-machining an integrated sensor on the surface of a silicon wafer
11/17/1994	EP0624899A2 Oxidation of silicon nitride in semiconductor devices
11/17/1994	EP0624897A1 Electrode for use in a plasma assisted chemical etching process
11/17/1994	EP0624896A1 Contamination control in plasma contouring the plasma sheath using materials of differing rf impedances
11/17/1994	EP0624826A1 Method of forming relief patterns by i-line light irradiation
11/17/1994	EP0624824A1 Resist ink composition and cured article prepared therefrom
11/17/1994	EP0624801A1 Inspection apparatus, inspection method and semiconductor device
11/17/1994	EP0624775A1 Apparatus and method for performing high spatial resolution thin film layer thickness metrology
11/17/1994	EP0624660A1 Plasma Enhanced Chemical Vapour Deposition (PECVD) Process for forming Borophosphosilicate Glass (BPSG) with low flow temperature
11/17/1994	EP0624405A1 Megasonic cleaning system using compressed, condensed gases
11/17/1994	EP0624282A1 Fermi threshold field effect transistor with reduced gate and diffusion capacitance
11/17/1994	EP0624262A1 Method of applying a lacquer film sensitive to uv and/or electron-beam radiation
11/17/1994	EP0608335A4 Structure for suppression of field inversion caused by charge build-up in the dielectric.
11/17/1994	EP0606350A4 Gallium arsenide mesfet imager.
11/17/1994	EP0471003B1 Method of grounding an ultra high density pad array chip carrier
11/17/1994	DE4416735A1 Method for producing a gate electrode with a Polycide (Polycid) structure
11/17/1994	DE4416696A1 Halbleitervorrichtung und Herstellungsverfahren A semiconductor device and manufacturing method
11/17/1994	DE4416543A1 Improved susceptor for a floating zone melting device
11/17/1994	DE4409220A1 Pattern forming material and pattern forming process
11/17/1994	DE4344439A1 Method for guiding air in a receiving chamber and apparatus for working small parts
11/17/1994	DE4316175A1 Soldered connection and soldering method
11/16/1994	CN1095188A 半导体存储器件 A semiconductor memory device
11/16/1994	CN1095187A Process for the wet-chemical treatment of workpieces
11/16/1994	CN1095060A A source of photochemically generated acid for microelectronic photoresists
11/15/1994	US5365474 Semiconductor memory device
11/15/1994	US5365454 Layout designing method for a semiconductor integrated circuit device
11/15/1994	US5365406 Master-slice type semiconductor integrated circuit device
11/15/1994	US5365405 Multi-chip module
11/15/1994	US5365404 Jack-type semiconductor integrated circuit packages
11/15/1994	US5365371 Projection exposure apparatus
11/15/1994	US5365342 Alignment and exposure apparatus and method for manufacture of integrated circuits
11/15/1994	US5365341 Bonding wire inspection apparatus
11/15/1994	US5365334 Micro photoreflectance semiconductor wafer analyzer
11/15/1994	US5365250 Semiconductor device for driving liquid crystal panel
11/15/1994	US5365140 Piezoelectric actuator having strain gage
11/15/1994	US5365124 BiCMOS logic circuit
11/15/1994	US5365123 Semiconductor logic circuits with diodes and amplitude limiter
11/15/1994	US5365112 Semiconductor integrated circuit device having an improved bonding pad structure
11/15/1994	US5365111 Stable local interconnect/active area silicide structure for VLSI applications
11/15/1994	US5365109 MIS semiconductor device with polysilicon gate electrode
11/15/1994	US5365107 Semiconductor device having tab tape
11/15/1994	US5365104 Oxynitride fuse protective/passivation film for integrated circuit having resistors
11/15/1994	US5365103 Punchthru ESD device along centerline of power pad
11/15/1994	US5365099 Semiconductor device having high energy sustaining capability and a temperature compensated sustaining voltage
11/15/1994	US5365098 Non-volatile semiconductor memory having improved erasure characteristics
11/15/1994	US5365096 Yttrium lower electrode, yttrium oxide dielectric film, upper electrode
11/15/1994	US5365095 Semiconductor memory device and process
11/15/1994	US5365094 Semiconductor device including ferroelectric nonvolatile memory
11/15/1994	US5365091 Semiconductor integrated circuit device
11/15/1994	US5365090 Hetero bipolar transistor and method of manufacturing the same
11/15/1994	US5365089 Double heterojunction bipolar transistor and the method of manufacture therefor
11/15/1994	US5365082 MOSFET cell array
11/15/1994	US5365081 Semiconductor device incorporating thermally contracted film
11/15/1994	US5365080 Field effect transistor with crystallized channel region
11/15/1994	US5365078 Semiconductor device and method of making it
11/15/1994	US5365073 Nanofabricated structures
11/15/1994	US5365051 Projection exposure apparatus
11/15/1994	US5365031 Apparatus and method for shielding a workpiece holding mechanism from depreciative effects during workpiece processing
11/15/1994	US5364818 Sog with moisture resistant protective capping layer
11/15/1994	US5364817 Improved coverage, reduced electromigration problems
11/15/1994	US5364816 Epitaxially growing sample with heterojunction, forming semiconductor layers, forming source and drain metallizations, growing dielectric layer, applying photoresist, masking, forming recesses
11/15/1994	US5364815 Crystal growth to form monocrystalline silicon having high light sensitivity and polycrystalline silicon having low light sensitivty to light on same substrate
11/15/1994	US5364813 Forming insulating layer, forming sacrificial layer and patterning, depositing conducting layer, forming second and third insulating and second conducting layers, masking, oxidizing, forming apertures and contactors
11/15/1994	US5364812 High density dynamic RAM cell
11/15/1994	US5364811 Method of manufacturing a semiconductor memory device with multiple device forming regions
11/15/1994	US5364810 Methods of forming a vertical field-effect transistor and a semiconductor memory cell

1 ... 6068 6069 6070 6071 6072 6073 6074 6075 6076 6077 6078 6079 6080 6081 6082 6083 6084 6085 6086 6087 6088 ... 6590