Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/1996
03/21/1996DE4432774A1 Verfahren zur Belotung von Anschlußflächen, sowie Verfahren zur Herstellung einer Lotlegierung A process for Belotung of pads, and to methods for producing a solder alloy
03/21/1996DE19534735A1 Clock pulse edge forming circuit for semiconductor integrated circuit testing system
03/21/1996DE19534082A1 Uniform thin film of dielectric prodn. on semiconductor substrate
03/20/1996EP0702455A2 Overheat protection apparatus for self-turn-off device
03/20/1996EP0702435A1 Method for making a reflective digitally tunable laser
03/20/1996EP0702413A2 MES field effect transistor formed in a diamond layer
03/20/1996EP0702410A2 A transistor protection circuit
03/20/1996EP0702407A2 Wiring pattern of semiconductor integrated circuit device
03/20/1996EP0702406A2 Press-contact type semiconductor devices
03/20/1996EP0702404A2 Semiconductor device
03/20/1996EP0702403A2 Element-isolated hydrogen-terminated diamond semiconductor device and its manufacturing method
03/20/1996EP0702402A1 Manufacturing method for integrated circuits and semiconductor wafer so obtained
03/20/1996EP0702401A2 Method for producing a semiconductor substrate suitable for IGBTs
03/20/1996EP0702400A2 Removal of metal contamination
03/20/1996EP0702399A1 Process for wet chemical removal of contaminants from semiconductor crystal surfaces
03/20/1996EP0702398A2 Method of fabricating a semiconductor device using epitaxy
03/20/1996EP0702397A2 Centrifugal wafer carrier cleaning apparatus
03/20/1996EP0702392A2 Plasma reactor
03/20/1996EP0702391A2 Etch processing and plasma reactor for performing same
03/20/1996EP0702303A1 Prescaler IC test method capable of executing alternate current test by the use of IC tester for direct current test
03/20/1996EP0702272A1 Exposure apparatus and exposure method
03/20/1996EP0702204A2 A method of evaluating silicon wafers
03/20/1996EP0702101A2 MBE System and semiconductor device fabricated using same
03/20/1996EP0702100A1 Apparatus and method for manufacturing single-crystal material
03/20/1996EP0702098A1 Corrosion-resistant aluminum article for semiconductor processing equipment
03/20/1996EP0701975A2 Process for sintering hollow tubes of silica soot and support device therefor
03/20/1996EP0701684A1 Apparatus and method of film thickness measurement
03/20/1996EP0701499A1 Improved polishing pads and methods for their use
03/20/1996EP0701487A1 Device for lacquering or coating plates or panels
03/20/1996EP0540519B1 Method for making a thermal compression bond
03/20/1996EP0504431B1 Method of removing organic coating
03/20/1996CN1119040A Environmental control system
03/20/1996CN1118937A Buried bit line cell and the manufacturing method thereof
03/20/1996CN1118936A Method for forming submicroscopic patterns
03/20/1996CN1118935A Method for fabricating stack capacitor of semiconductor device
03/20/1996CN1118934A Method and apparatus for processing wafers and substrates, and apparatus for transferring the wafers and substrates
03/20/1996CN1118886A Waterborne photoresists having associate thickeners
03/20/1996CA2155776A1 Method for a reflective digitally tunable laser
03/19/1996US5500822 Address decoder for repair of memory device
03/19/1996US5500816 Non-volatile semiconductor memory device and manufacturing method thereof
03/19/1996US5500815 Semiconductor memory
03/19/1996US5500787 Electrodes on a mounting substrate and a liquid crystal display apparatus including same
03/19/1996US5500785 Circuit board having improved thermal radiation
03/19/1996US5500736 Method of detecting positions
03/19/1996US5500607 Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer
03/19/1996US5500603 Methodology to quickly isolate functional failures associated with integrated circuit manufacturing defects
03/19/1996US5500587 E-O probe
03/19/1996US5500560 Semiconductor device having low resistance values at connection points of conductor layers
03/19/1996US5500559 Semiconductor device and method for manufacturing the same
03/19/1996US5500558 Semiconductor device having a planarized surface
03/19/1996US5500554 Bipolar transistor having reduced base-collector capacitance while maintaining improved cut-off frequency
03/19/1996US5500553 Semiconductor device having polysilicon resistors with a specific resistance ratio resistant to manufacturing processes
03/19/1996US5500551 Integrated emitter switching configuration using bipolar transistors
03/19/1996US5500550 Photoelectric converting device
03/19/1996US5500548 Integrated circuit device formed on a semiconductor substrate
03/19/1996US5500547 Integrated semiconductor device with temperature sensing circuit and method for operating same
03/19/1996US5500544 Dynamic random access memory cell and method for fabricating the same
03/19/1996US5500542 Semiconductor integrated circuit with protection circuit against electrostatic breakdown and layout design method therefor
03/19/1996US5500541 Semiconductor device having voltage sensing element
03/19/1996US5500522 Gallium arsenide MESFET imager
03/19/1996US5500502 Bonding method and apparatus
03/19/1996US5500393 Method for fabricating a schottky junction
03/19/1996US5500392 Planar process using common alignment marks for well implants
03/19/1996US5500391 Method for making a semiconductor device including diffusion control
03/19/1996US5500390 Method for control of Si concentration in gallium phosphide single crystal layer by liquid phase epitaxial growth technique
03/19/1996US5500389 Process for formation for hetero junction structured film utilizing V grooves
03/19/1996US5500388 Heat treatment process for wafers
03/19/1996US5500387 Method of making high performance capacitors and/or resistors for integrated circuits
03/19/1996US5500386 Manufacturing method of semiconductor devices
03/19/1996US5500385 Method for manufacturing a silicon capacitor by thinning
03/19/1996US5500384 Method for manufacturing a bit line via hole in a memory cell
03/19/1996US5500383 Method for fabricating a CCD image sensor with active transistor pixel
03/19/1996US5500382 Self-aligned contact process
03/19/1996US5500381 Fabrication method of field-effect transistor
03/19/1996US5500380 Method for fabricating thin film transistor
03/19/1996US5500379 Method of manufacturing semiconductor device
03/19/1996US5500378 Process for forming a bipolar type semiconductor device
03/19/1996US5500315 An article comprising an image pattern on a substrate
03/19/1996US5500312 Alternating layers with compressive and tensile stress, patterning semiconductor wafers
03/19/1996US5500294 Modified acrylonitrile-butadiene copolymer
03/19/1996US5500278 Used for hybrid integrated circuit
03/19/1996US5500256 Dry process apparatus using plural kinds of gas
03/19/1996US5500102 Method of forming deposited semiconductor film
03/19/1996US5500081 Dynamic semiconductor wafer processing using homogeneous chemical vapors
03/19/1996US5500080 Self-alignment, semiconductors, integrated circuits with conduction wiring
03/19/1996US5500079 Evacuation; applying ultraviolet radiation to semiconductor
03/19/1996US5500078 8-beam bridge-type silicon acceleration sensor and the fabricating method thereof
03/19/1996US5500073 Semiconductor wafers, electrodes in etch bath but not contacting wafers, monitoring impedance, capacitance, resistance, etc
03/19/1996US5500047 Apparatus for adsorbing atomic hydrogen on surface
03/19/1996US5499733 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
03/19/1996US5499668 Process for making electronic device
03/19/1996US5499602 Apparatus for manfuacturing a semiconductor layer using rapid thermal processing
03/19/1996US5499598 Method for producing a silicon rod
03/19/1996US5499450 Method of manufacturing a multiple pin heatsink device
03/14/1996WO1996008127A1 Method of fabricating electronic circuit
03/14/1996WO1996008070A1 Booster
03/14/1996WO1996008056A1 Ball grid array socket
03/14/1996WO1996008040A1 Field effect transistors and method of fabricating same
03/14/1996WO1996008039A1 Structure and fabrication of bipolar transistors with improved output current-voltage characteristics
03/14/1996WO1996008038A1 Fault-protected overvoltage switch with expanded signal range