| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
|---|
| 02/27/1996 | US5494206 Wire bonding method and apparatus |
| 02/27/1996 | US5494169 IC carrier |
| 02/27/1996 | US5493987 Chemical vapor deposition reactor and method |
| 02/27/1996 | US5493986 Method of providing VLSI-quality crystalline semiconductor substrates |
| 02/27/1996 | US5493926 Method of identifying a weakest interface where delamination is most likely to occur in a multi-layer dielectric film stack |
| 02/27/1996 | CA2056781C Multichip module |
| 02/22/1996 | WO1996005620A1 Process for producing a silicon capacitor |
| 02/22/1996 | WO1996005619A1 Varactor diode having a stepped capacitance-voltage profile |
| 02/22/1996 | WO1996005618A1 High-voltage ldd-mosfet with increased breakdown voltage and method of fabrication |
| 02/22/1996 | WO1996005616A1 Electrostatic discharge protection circuit |
| 02/22/1996 | WO1996005614A1 Flip chip bonding with non-conductive adhesive |
| 02/22/1996 | WO1996005612A1 A fine pitch lead frame and method for manufacturing same |
| 02/22/1996 | WO1996005611A1 Support for substrates |
| 02/22/1996 | WO1996005334A1 Metal polyoxyalkylated precursor solutions in an octane solvent and method of making the same |
| 02/22/1996 | WO1996005019A1 Wafer carrier and method for making same |
| 02/22/1996 | WO1996005017A1 Method of marking works |
| 02/22/1996 | WO1996004999A2 Wafer rinsing system and filter bank |
| 02/22/1996 | WO1996004998A1 Method for forming particle layer on substrate, method for flattening irregular substrate surface, and particle-layered substrate |
| 02/22/1996 | DE4440072C1 Forming trenched monocrystalline silicon carbide layer in substrate |
| 02/22/1996 | DE19527314A1 Fabrication of silicon membrane with predefined parameters |
| 02/22/1996 | CA2197775A1 Metal polyoxyalkylated precursor solutions in an octane solvent and method of making the same |
| 02/21/1996 | EP0697766A1 Buffer circuit with wide dynamic range |
| 02/21/1996 | EP0697741A1 Resonant tunneling devices |
| 02/21/1996 | EP0697740A2 Low threshold voltage, high performance junction transistor |
| 02/21/1996 | EP0697738A1 Semiconductor diamond device having improved metal-diamond contact |
| 02/21/1996 | EP0697735A1 Single twist layout and method for paired line conductors of integrated circuits |
| 02/21/1996 | EP0697733A2 Electrostatic discharge protection device and method of forming |
| 02/21/1996 | EP0697730A2 High aspect ratio low resistivity lines/vias by surface diffusion |
| 02/21/1996 | EP0697729A2 Contact structure using barrier metal and method of manufacturing the same |
| 02/21/1996 | EP0697728A1 MOS-technology power device chip and package assembly |
| 02/21/1996 | EP0697727A2 Method of bumping substrates |
| 02/21/1996 | EP0697725A2 Ceramic composition for circuit substrat and its fabrication |
| 02/21/1996 | EP0697723A2 A process for metallization of an insulator layer |
| 02/21/1996 | EP0697722A2 Method for planarizing the dielectrics a semiconductor devices |
| 02/21/1996 | EP0697721A2 Selective addition of a solder ball to an array of solder balls |
| 02/21/1996 | EP0697720A1 A conductive amorphous-nitride barrier layer for high dielectric-constant material electrodes |
| 02/21/1996 | EP0697719A2 Microelectronic structure including a conductive exotic-nitride barrier layer for high-dielectric-constant material electrodes and method of fabricating the same |
| 02/21/1996 | EP0697718A1 Method of making electrical connections to materials with high dielectric constant |
| 02/21/1996 | EP0697717A1 Method of making electrical connections to materials with high-dielectric-constant |
| 02/21/1996 | EP0697716A2 Method for forming concurrent top oxides using reoxidized silicon |
| 02/21/1996 | EP0697715A1 UV-enhanced dry stripping of silicon nitride films |
| 02/21/1996 | EP0697714A1 Method for forming gate electrode of semiconductor device |
| 02/21/1996 | EP0697713A1 Silicon on insulator substrate and method of manufacturing the same |
| 02/21/1996 | EP0697708A1 Semiconductor fuse devices |
| 02/21/1996 | EP0697701A2 An improved electronic memory and methods for making and using the same |
| 02/21/1996 | EP0697668A1 Apparatus and method for identifying false timing paths in digital circuits |
| 02/21/1996 | EP0697632A2 Chemically amplified radiation-sensitive composition |
| 02/21/1996 | EP0697467A1 Method and apparatus for cleaning a deposition chamber |
| 02/21/1996 | EP0697376A1 Single body injector and method for delivering gases to a surface |
| 02/21/1996 | EP0697113A1 Sensor for articles on an end effector |
| 02/21/1996 | CN1117211A Structure and process for electro/mechanical joint formation |
| 02/21/1996 | CN1117206A Silicon on insulating substance and manufacturing method for same |
| 02/21/1996 | CN1117205A Wiring structure of semiconductor device and method and method for manufacturing the same |
| 02/21/1996 | CN1117204A Glassivation method for large mesa power semiconductor device |
| 02/21/1996 | CN1117203A Method of rough polishing semiconductor wafers to reduce surface roughness |
| 02/21/1996 | CN1117202A Contact structure of a semiconductor device and method for forming the same |
| 02/21/1996 | CN1117148A Method of providing sacrificial spacer for micro-mechanical devices |
| 02/20/1996 | US5493509 Method of and apparatus for generating mask layouts |
| 02/20/1996 | US5493506 Integrated circuit device and method of designing same |
| 02/20/1996 | US5493501 Production control system selecting optimum dispatching rule |
| 02/20/1996 | US5493445 Laser textured surface absorber and emitter |
| 02/20/1996 | US5493403 Method and apparatus for the alignment of a substrate |
| 02/20/1996 | US5493402 EGA alignment method using a plurality of weighting coefficients |
| 02/20/1996 | US5493251 CMOS process and circuit including zero threshold transistors |
| 02/20/1996 | US5493236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis |
| 02/20/1996 | US5493233 MOSFET circuit apparatus with avalanche breakdown prevention means |
| 02/20/1996 | US5493151 Semiconductor device, lead frame and method for manufacturing semiconductor devices |
| 02/20/1996 | US5493150 For use in mounting an ic in an ic socket |
| 02/20/1996 | US5493149 Transistor device with increased breakdown voltage |
| 02/20/1996 | US5493148 Semiconductor device whose output characteristic can be adjusted by functional trimming |
| 02/20/1996 | US5493147 Antifuse circuit structure for use in a field programmable gate array and method of manufacture thereof |
| 02/20/1996 | US5493144 Field progammable device with contact openings |
| 02/20/1996 | US5493142 Input/output transistors with optimized ESD protection |
| 02/20/1996 | US5493140 Nonvolatile memory cell and method of producing the same |
| 02/20/1996 | US5493139 Electrically erasable PROM (E2 PROM) with thin film peripheral transistor |
| 02/20/1996 | US5493138 Improved tunneling dual layer of inner oxynitride and outer silica |
| 02/20/1996 | US5493137 Semiconductor device |
| 02/20/1996 | US5493136 Field effect transistor and method of manufacturing the same |
| 02/20/1996 | US5493135 Symmetrical multi-layer metal logic array with continuous substrate taps and extension portions for increased gate density |
| 02/20/1996 | US5493132 Integrated circuit contact barrier formation with ion implant |
| 02/20/1996 | US5493131 Diamond rectifying element |
| 02/20/1996 | US5493130 Integrated circuitry having an electrically conductive sidewall link positioned over and electrically interconnecting respective outer sidewalls of two conductive layers |
| 02/20/1996 | US5493125 Charged beam apparatus |
| 02/20/1996 | US5493116 Detection system for precision measurements and high resolution inspection of high aspect ratio structures using particle beam devices |
| 02/20/1996 | US5493096 Thin substrate micro-via interconnect |
| 02/20/1996 | US5493076 Structure for repairing semiconductor substrates |
| 02/20/1996 | US5492868 Capped reflow process to avoid contact autodoping and supress tungsten silicide peeling |
| 02/20/1996 | US5492866 Process for correcting warped surface of plastic encapsulated semiconductor device |
| 02/20/1996 | US5492865 Method of making structure for suppression of field inversion caused by charge build-up in the dielectric |
| 02/20/1996 | US5492864 Method and equipment for manufacturing a semiconductor device |
| 02/20/1996 | US5492863 Method for forming conductive bumps on a semiconductor device |
| 02/20/1996 | US5492862 Vacuum change neutralization method |
| 02/20/1996 | US5492861 Process for applying structured layers using laser transfer |
| 02/20/1996 | US5492860 Vapor deposition at low variated temperature |
| 02/20/1996 | US5492859 Method for producing semiconductor device substrate by bonding a porous layer and an amorphous layer |
| 02/20/1996 | US5492858 Shallow trench isolation process for high aspect ratio trenches |
| 02/20/1996 | US5492857 High-frequency wireless communication system on a single ultrathin silicon on sapphire chip |
| 02/20/1996 | US5492855 Method of dry etching platinum using sulfur containing gas |
| 02/20/1996 | US5492854 Method of manufacturing semiconductor device |
| 02/20/1996 | US5492853 Method of forming a contact using a trench and an insulation layer during the formation of a semiconductor device |