Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2005
05/11/2005CN1201405C Complementing biopolar transistor and its manufacturing method
05/11/2005CN1201404C Substrate-triggering type electrostatic discharge protective semiconductor
05/11/2005CN1201403C Field effect transistor structure with partially isolated source/drain junctions and methods of making same
05/11/2005CN1201402C Nonvolatile semiconductor memory
05/11/2005CN1201401C Semiconductor device
05/11/2005CN1201400C Nonvolatile semiconductor device and its making method
05/11/2005CN1201399C Semiconductor integrated circuit device contg. nonvolatile semiconductor storage
05/11/2005CN1201398C Semiconductor chip with fuse element and semiconductor module
05/11/2005CN1201397C Semiconductor storage having ruthenium pole and its mfg. method
05/11/2005CN1201396C Fabrication method of organic thin-film semiconductor devices
05/11/2005CN1201395C Semiconductor integrated circuit and its design method
05/11/2005CN1201394C Electrostatic discharge protection of integrated circuits
05/11/2005CN1201393C Semiconductor device and mfg. method thereof
05/11/2005CN1201392C Semiconductor device and mfg. method thereof
05/11/2005CN1201389C Making process of charging-preventing nitride ROM
05/11/2005CN1201388C Manufacture of flash memory
05/11/2005CN1201387C Method of fabricating power rectifier device to vary operating parameters and resulting device
05/11/2005CN1201386C Embedding process of making metal capacitor and its product
05/11/2005CN1201385C Presinteirng test circuit and method for wafer stage memory
05/11/2005CN1201384C Wafer class probe card and its mfg. method
05/11/2005CN1201383C Electronic parts mounting method and device therefor, and electronic parts device
05/11/2005CN1201382C IC card making appts.
05/11/2005CN1201381C Semiconductor device manufacturing method, press die, and guide rail
05/11/2005CN1201380C Semiconductor manufacturing technology and semiconductor device manufacturing technology
05/11/2005CN1201379C Throttle making method
05/11/2005CN1201378C Hydrogenimplant for buffer of punch-through non EPI IGBT
05/11/2005CN1201377C Intra-metal dielectric layer structure and its forming method
05/11/2005CN1201376C Manufacturing method of semiconductor device
05/11/2005CN1201375C Liquid state film drying method and device
05/11/2005CN1201370C Apparatus for improving plasma distribution and performance in inductively coupled plasma
05/11/2005CN1201348C Electronic device and manufacture thereof
05/11/2005CN1201347C Film capacitor for temperature compensation
05/11/2005CN1201337C Conducting paste and semiconductor prepared by using said paste
05/11/2005CN1201335C Code addressing storage cell for flash memory device
05/11/2005CN1201333C Integrated storage with storage unit having magnetic-resistance storage effect and its operation method
05/11/2005CN1201275C Manufacture of electro-optical device
05/11/2005CN1201206C Exposure device
05/11/2005CN1201183C Electro-optical device and mfg. method and electronic apparatus
05/11/2005CN1201161C Probe card for probing wafers with raised contact elements
05/11/2005CN1201160C Testing method and device of semiconductor integrated circuit of liquid crastal driver
05/11/2005CN1201158C Method and apparatus for minimizing semiconductor wafer arcing in semiconductor wafer processing
05/11/2005CN1201137C Semiconductor mechanical quantity sensor
05/11/2005CN1200793C Method for machining work by laser beam
05/11/2005CN1200773C Double-fluid jet nozzle for cleaning, cleaner and method for making semiconductor using same
05/10/2005US6892373 Integrated circuit cell library
05/10/2005US6892372 Wiring layout method of integrated circuit
05/10/2005US6892365 Method for performing monte-carlo simulations to predict overlay failures in integrated circuit designs
05/10/2005US6892364 Method of analyzing an integrated electric circuit, computer program utilizing the method, data carrier including the method, and method for downloading the program
05/10/2005US6892156 Method and apparatus for monitoring integrated circuit fabrication
05/10/2005US6892108 Method for adjusting processing parameters of at least one plate-shaped object in a processing tool
05/10/2005US6892106 Balancing work release based on both demand and supply variables
05/10/2005US6891927 Light generation apparatus, exposure apparatus, and device manufacturing method
05/10/2005US6891761 Semiconductor device and manufacturing method
05/10/2005US6891760 Method of erasing information in non-volatile semiconductor memory device
05/10/2005US6891751 Charge trapping memory cell, method for fabricating it, and semiconductor memory device
05/10/2005US6891746 Magneto-resistive device having soft reference layer
05/10/2005US6891743 Semiconductor memory device having a capacitive plate to reduce soft errors
05/10/2005US6891741 Ferroelectric memory device
05/10/2005US6891715 Capacitor and method for fabricating the same
05/10/2005US6891713 Element storage layer in integrated circuits
05/10/2005US6891627 Methods and systems for determining a critical dimension and overlay of a specimen
05/10/2005US6891624 Cyclic error reduction in average interferometric position measurements
05/10/2005US6891611 Sample inspection system
05/10/2005US6891610 Methods and systems for determining an implant characteristic and a presence of defects on a specimen
05/10/2005US6891609 Measurement box that can be integrated into existing wafer processing equipment for quality control in manufacture of semiconductor chips
05/10/2005US6891603 Manufacturing method in manufacturing line, manufacturing method for exposure apparatus, and exposure apparatus
05/10/2005US6891600 Lithographic apparatus and device manufacturing method
05/10/2005US6891599 Stage apparatus and exposure apparatus
05/10/2005US6891598 Lithographic device and method for wafer alignment with reduced tilt sensitivity
05/10/2005US6891597 Driving apparatus, exposure apparatus, and device manufacturing method
05/10/2005US6891596 Refractive projection objective for immersion lithography
05/10/2005US6891593 Exposure apparatus, maintenance method therefor, semiconductor device manufacturing method using the apparatus, and semiconductor manufacturing factory
05/10/2005US6891588 Liquid crystal display device
05/10/2005US6891578 Method of manufacturing a thin-film semiconductor device used for a display region and peripheral circuit region
05/10/2005US6891523 Active-matrix substrate, electro-optical device, method for manufacturing active-matrix substrate, and electronic equipment
05/10/2005US6891461 Integrated transformer
05/10/2005US6891409 Semiconductor device
05/10/2005US6891395 Application-specific testing methods for programmable logic devices
05/10/2005US6891391 Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate
05/10/2005US6891387 System for probing, testing, burn-in, repairing and programming of integrated circuits
05/10/2005US6891366 Magneto-resistive device with a magnetic multilayer structure
05/10/2005US6891360 Plated probe structure
05/10/2005US6891341 Aligning apparatus in semiconductor device test handler
05/10/2005US6891327 Organic electroluminescent device and a method of manufacturing thereof
05/10/2005US6891314 Lattice array-structured piezoelectric actuator and method for producing the same
05/10/2005US6891277 Alignment mark including insulating film with metal in groove, first film on insulating film covering metal for preventing oxidation during heat treatment in oxygen atmosphere, second insulating film between insulating film and first film
05/10/2005US6891276 Having terminals that protrude downwardly from bottom surface of insulative housing and leads that protrude laterally from side surfaces; terminals and leads are connected together and to chip pads in one-to-one relation; simplified testing
05/10/2005US6891274 Under-ball-metallurgy layer including adhesion layer, barrier layer fabricated using nickel-vanadium alloy, and wettable layer fabricated using copper and having specified thickness; improved bonding strength
05/10/2005US6891273 Semiconductor package and fabrication method thereof
05/10/2005US6891271 Non-volatile memory device
05/10/2005US6891270 Semiconductor device and method of manufacturing the same
05/10/2005US6891269 Having barrier layer and metal growth promoting layer of titanium nitride containing oxygen at lower concentration than barrier layer jointly as ground layer; reduces incubation time for forming embedded copper interconnection layer
05/10/2005US6891267 Semiconductor switching circuit device
05/10/2005US6891263 Ceramic substrate for a semiconductor production/inspection device
05/10/2005US6891262 Semiconductor device and method of producing the same
05/10/2005US6891261 Semiconductor device and method of manufacturing the same
05/10/2005US6891257 Packaging system for die-up connection of a die-down oriented integrated circuit
05/10/2005US6891255 Microelectronic packages having an array of resilient leads
05/10/2005US6891254 Semiconductor device with protrusions
05/10/2005US6891253 Semiconductor integrated circuit device and method of manufacturing the same
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