Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2006
04/26/2006CN1763144A Adhesive composition, process for producing the same, adhesive film using the same, substrate for mounting semiconductor and semiconductor device
04/26/2006CN1763140A Coating liquid for forming silicon dioxide serial illinition
04/26/2006CN1763051A Siliceous Feú¿óÄú®complex autogyration conversion composite material and preparation and uses
04/26/2006CN1763049A Trimethylgallium, a method for producing the same and a gallium nitride thin film grown from the trimethylgallium
04/26/2006CN1762788A Hermetically sealed microdevice with getter shield
04/26/2006CN1254026C Instrument for communication system
04/26/2006CN1254006C Voltage controlled oscillator circuit and its PLL circuit
04/26/2006CN1253948C Gallium nitride-based III-V group compound semiconductor device
04/26/2006CN1253946C Semiconductor device and its mfg. method
04/26/2006CN1253945C Semiconductor device and manufacturing method thereof
04/26/2006CN1253944C Semiconductor device and a method of producing the same
04/26/2006CN1253943C Transistor with multi-gate and strain channel layer and mfg. method thereof
04/26/2006CN1253941C Single electron memory having high integration level and method for making the same
04/26/2006CN1253939C Jointing washer structure on semiconductor substrate
04/26/2006CN1253938C Method for producing the chip card module
04/26/2006CN1253936C Interconnections including multi-layer metal film stack for improving corrosion and heat resistances
04/26/2006CN1253935C IC wafer electrical property testing equipment for prerenting electrostatic destruction and method of preventing electrostatic destruction
04/26/2006CN1253934C Method for evaluating shape of wafer, wafer and method for selecting wafer
04/26/2006CN1253933C Test equipment for packed semiconductor elements
04/26/2006CN1253932C Semiconductor device manufacturing method
04/26/2006CN1253931C Electronic part compression-bonding apparatus and its method
04/26/2006CN1253930C Producing method for image sensor
04/26/2006CN1253929C Semiconductor device and producing method thereof
04/26/2006CN1253928C Method and device for heat treatment
04/26/2006CN1253927C Substrate supporting structure
04/26/2006CN1253926C Structure of multiple gate dielectric layer and its making method
04/26/2006CN1253925C Indium pole pelletizing method of infrared focal plane detector
04/26/2006CN1253924C Method for preparing zinc oxide base magnetic semiconductor material using sub-nanometer composite method
04/26/2006CN1253923C Method of preparing one dimensional semiconductor nano rod and nano-wire in water solution
04/26/2006CN1253918C Plasma processing system and method therefor
04/26/2006CN1253895C Heat auxiliary switching of magnetic random access storage device
04/26/2006CN1253794C Logic cluster fault testing method for non-boundary scanning device
04/26/2006CN1253759C Photoresists, polymers and process for microlithography
04/26/2006CN1253718C Mechanism for fixing probe card
04/26/2006CN1253611C Process for preparing monocrystal membrane of Gallium nitride
04/26/2006CN1253610C Low defect density self-interstitial atom controlled silicon
04/26/2006CN1253608C Method and apparatus for disposing substrate with miniml edge isolation
04/26/2006CN1253606C Copper-plating solution, plating method and plating apparatus
04/26/2006CN1253527C Etching liquid composition
04/26/2006CN1253286C Electrostatic adsorption table and substrate processing apparatus
04/25/2006US7036101 Method and apparatus for scalable interconnect solution
04/25/2006US7036058 Semiconductor device having integrally sealed integrated circuit chips arranged for improved testing
04/25/2006US7035770 Fuzzy reasoning model for semiconductor process fault detection using wafer acceptance test data
04/25/2006US7035759 Position detecting method and apparatus
04/25/2006US7035752 Semiconductor test data analysis system
04/25/2006US7035705 System and method for process contamination prevention for semiconductor manufacturing
04/25/2006US7035447 Semiconductor wafer examination system
04/25/2006US7035375 X-ray scattering with a polychromatic source
04/25/2006US7035374 Optical device for directing x-rays having a plurality of optical crystals
04/25/2006US7035304 Semiconductor laser device and optical disk recording and reproducing apparatus
04/25/2006US7035143 NAND flash memory device and method of reading the same
04/25/2006US7035139 Magnetic storage cell and magnetic memory device using same
04/25/2006US7035138 Magnetic random access memory having perpendicular magnetic films switched by magnetic fields from a plurality of directions
04/25/2006US7035137 Semiconductor memory device having memory cells including ferromagnetic films and control method thereof
04/25/2006US7035136 Nonvolatile magnetic memory device and method of writing data into tunnel magnetoresistance device in nonvolatile magnetic memory device
04/25/2006US7035135 Semiconductor memory device
04/25/2006US7035128 Semiconductor memory device and semiconductor integrated circuit device
04/25/2006US7035069 Semiconductor integrated circuit device
04/25/2006US7035058 Magneto-resistive effect element, magnetic sensor using magneto-resistive effect, magnetic head using magneto-resistive effect and magnetic memory
04/25/2006US7035056 Piezoelectric actuator and a lithographic apparatus and a device manufacturing method
04/25/2006US7034998 Method of connecting a multiplicity of optical elements to a basic body
04/25/2006US7034986 Pattern generator mirror configurations
04/25/2006US7034984 Fabrication of a high fill ratio reflective spatial light modulator with hidden hinge
04/25/2006US7034976 Substrate for electrooptic device and method of manufacturing the same, electrooptic device, and electronic equipment
04/25/2006US7034931 Method to grain inspect directionally solidified castings
04/25/2006US7034923 Optical element, lithographic apparatus comprising such optical element and device manufacturing method
04/25/2006US7034921 Light receiving apparatus, mark detecting apparatus using light receiving apparatus, exposing apparatus, maintenance method of exposing apparatus, manufacturing method of semiconductor device using exposing apparatus and semiconductor manufacturing plant
04/25/2006US7034920 Balanced positioning system for use in lithographic apparatus
04/25/2006US7034919 Method and apparatus for providing lens aberration compensation by illumination source optimization
04/25/2006US7034918 Exposure apparatus, maintenance method therefor, semiconductor device manufacturing method using the apparatus, and semiconductor manufacturing factory
04/25/2006US7034917 Lithographic apparatus, device manufacturing method and device manufactured thereby
04/25/2006US7034653 Semiconductor resistor
04/25/2006US7034631 Symmetric microwave filter and microwave integrated circuit merging the same
04/25/2006US7034616 Operational amplification circuit, overheat detecting circuit and comparison circuit
04/25/2006US7034605 Internal step-down power supply circuit
04/25/2006US7034598 Switching point detection circuit and semiconductor device using the same
04/25/2006US7034580 Capacitor charging methods and apparatuses that use a secure parallel monitoring circuit
04/25/2006US7034560 Device and method for testing integrated circuit dice in an integrated circuit module
04/25/2006US7034557 Inspecting apparatus having a radiator to radiate heat from a semiconductor device
04/25/2006US7034514 Semiconductor integrated circuit using band-gap reference circuit
04/25/2006US7034409 Method of eliminating photoresist poisoning in damascene applications
04/25/2006US7034407 Semiconductor device and method for fabricating the same
04/25/2006US7034406 Semiconductor device with alignment mark
04/25/2006US7034403 Durable electronic assembly with conductive adhesive
04/25/2006US7034401 Packaging substrates for integrated circuits and soldering methods
04/25/2006US7034400 Dual damascene interconnect structure using low stress fluorosilicate insulator with copper conductors
04/25/2006US7034399 Forming a porous dielectric layer
04/25/2006US7034398 Semiconductor device having contact plug and buried conductive film therein
04/25/2006US7034397 Oxygen bridge structures and methods to form oxygen bridge structures
04/25/2006US7034396 Structure of semiconductor element and its manufacturing process
04/25/2006US7034394 Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same
04/25/2006US7034391 Flip chip interconnection pad layout
04/25/2006US7034389 Flip chip package, circuit board thereof and packaging method thereof
04/25/2006US7034388 Stack type flip-chip package
04/25/2006US7034386 Thin planar semiconductor device having electrodes on both surfaces and method of fabricating same
04/25/2006US7034384 Integrated circuit adapted for ECO and FIB debug
04/25/2006US7034383 Electronic component and panel and method for producing the same
04/25/2006US7034381 Semiconductor device
04/25/2006US7034380 Low-dielectric constant structure with a multilayer stack of thin films with pores
04/25/2006US7034379 Carbide emitter mask etch stop