Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
07/2006
07/19/2006CN1805125A Circuitized substrates, method of making same, and electrical assemblies and information handling systems
07/19/2006CN1805124A Method of manufacture fin field effect transistor
07/19/2006CN1805123A Method for selective etching of oxides
07/19/2006CN1805122A Coated semiconductor wafer and method and apparatus to obtain it
07/19/2006CN1805121A Semiconductor wafer with an epitaxially deposited layer, and process for producing the semiconductor wafer
07/19/2006CN1805120A Method of forming separable interface and producing micro-electromechanical film with the method
07/19/2006CN1805119A Chuck plate assembly with cooling means
07/19/2006CN1805118A Substrate treating apparatus and method
07/19/2006CN1805117A High temperature wafer test oven
07/19/2006CN1805116A Formation method of diffused burial layer at a low surface gradient on semiconductor substrate
07/19/2006CN1805061A Method of producing photon scanning tunneling microscope probe with optical fiber and Indium-Tin-oxide
07/19/2006CN1805014A Method of manufacturing a magnetic head
07/19/2006CN1804746A Systems and methods for managing lot aggregation
07/19/2006CN1804727A Lithographic apparatus, illumination system and filter system
07/19/2006CN1804726A Method for measuring information about a substrate, and a substrate for use in a lithographic apparatus
07/19/2006CN1804725A Apparatus and method for supporting and thermally conditioning a substrate, a support table, a chuck and a lithographic apparatus comprising said support table
07/19/2006CN1804724A Oil-immersed exposure method for chip photolithography process
07/19/2006CN1804709A Liquid crystal display device and fabrication method thereof
07/19/2006CN1804694A Making method for liquid crystal LCOS and laminating apparatus therefor
07/19/2006CN1804567A Temperature/thickness measuring apparatus, temperature/thickness measuring method, temperature/thickness measuring system, control system and control method
07/19/2006CN1804396A Micro-electro-mechanical V-type micro valve and making method thereof
07/19/2006CN1804114A Thin film forming device and cleaning method thereof
07/19/2006CN1803964A Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using same
07/19/2006CN1803805A Insulating film material containing an organic silane compound, its production method and semiconductor device
07/19/2006CN1803584A Oxide material, method for preparing oxide thin film and element using said material
07/19/2006CN1803399A Surface polishing method and apparatus thereof
07/19/2006CN1803398A Cmp pad having a radially alternating groove segment configuration
07/19/2006CN1803374A Method of laser processing a wafer
07/19/2006CN1803322A Plasma cleansing apparatus that eliminates organic and oxidative contaminant and may effectively dissipate heat and eliminate exhaust gas and integrated system for the same
07/19/2006CN1265690C Printed circuit board and its mfg. method
07/19/2006CN1265561C Passive device and module of transceiver
07/19/2006CN1265505C Contact structure with silicone grease contact point and general laminated structure using same
07/19/2006CN1265471C Electrooptical device and method for driving same
07/19/2006CN1265469C Method for producing solar cell assembly
07/19/2006CN1265468C Optimized reachthrough implant for simultaneously forming an MOS capacitor
07/19/2006CN1265467C 半导体装置 Semiconductor device
07/19/2006CN1265466C Longitudinal transistor, memory device and longitudinal transistor making process
07/19/2006CN1265463C Semiconductor storage device
07/19/2006CN1265462C Semiconductor storage device
07/19/2006CN1265460C Memory device and method for driving the memory device
07/19/2006CN1265459C Low consumption power metal-insulator-semiconductor semiconductor device
07/19/2006CN1265458C Semiconductor device having formed capacitor in multi-layer wire distributing structure
07/19/2006CN1265456C Electronic devices
07/19/2006CN1265455C Semiconductor device and its making method
07/19/2006CN1265453C 半导体装置 Semiconductor device
07/19/2006CN1265452C Metal welding pad of integrated circuit and method for making the same
07/19/2006CN1265451C Semiconductor device and manufactoring method thereof
07/19/2006CN1265450C Thin film bearing belt for assembling electronic parts
07/19/2006CN1265449C Method for producing low resistance barrier layer of copper metallization production process
07/19/2006CN1265448C Substrate for element forming and its manufacturing method and semiconductor device
07/19/2006CN1265447C Electrically-connecting pad electroplated metal layer making method of semiconductor package base plate
07/19/2006CN1265446C Method for making film transistor
07/19/2006CN1265445C Method of forming light doped drain electrode using inverse taper grid structure
07/19/2006CN1265444C Method for preparing half insulated substrate by using non-adulterated indium phosphide through high temperature annealing
07/19/2006CN1265443C Method for removing etch residue resulting from a process for forming a via
07/19/2006CN1265442C Buffer of manometer inductor for dry etch reaction chamber
07/19/2006CN1265441C Sprayer of wafer processing equipment with gap controller
07/19/2006CN1265440C Polishing method
07/19/2006CN1265439C Semicondoctor wafer with improved partial planeness and making method thereof
07/19/2006CN1265438C Method for forming through-hole or depression on silicon chip
07/19/2006CN1265437C Drawing device with charged particle beam and its detecting method and control method for minification and rack phase position
07/19/2006CN1265436C T shape grid metal stripping method
07/19/2006CN1265435C Cleaning gas
07/19/2006CN1265434C Method for preparing p type ZnO crystal film
07/19/2006CN1265433C Preparation method of silicon material on thick membrane graphic insulator
07/19/2006CN1265432C Reactor with mobile Persian blind baffle
07/19/2006CN1265431C SiGe on relaxed, low-defect insulator and its making method
07/19/2006CN1265430C Low-temp. polycrystalline silicon film transistor and its polycrystalline silicon layer making method
07/19/2006CN1265429C 等离子处理装置 The plasma processing apparatus
07/19/2006CN1265428C Method of manufacturing film transistor
07/19/2006CN1265427C Manufacturing method of low-temp polycrystal silicon film transistor
07/19/2006CN1265426C Apparatus and method for mounting electronic parts
07/19/2006CN1265425C Substrate processing apparatus
07/19/2006CN1265424C Method for reprocessing power device
07/19/2006CN1265423C Semiconductor device and producing method thereof
07/19/2006CN1265422C Semiconductor device producing system and method
07/19/2006CN1265398C Method for forming pattern of transparent conductive membrane
07/19/2006CN1265396C Mixed packing semiconductor integrate circuit device of controller mass storage and measuring method
07/19/2006CN1265393C Integrated semiconductor memory with memory units of ferroelectric storage effect
07/19/2006CN1265247C Exposure method and exposure device
07/19/2006CN1265246C Photoresist coating device
07/19/2006CN1265245C Method for uniformly coating substrate
07/19/2006CN1265239C Wide viewing angle planar LCD
07/19/2006CN1265233C Liquid crystal display device and its producing method
07/19/2006CN1265215C Generation of library of periodic grating diffraction signals
07/19/2006CN1265155C Fan filter unit controlling system and dustless chamber therewith
07/19/2006CN1265030C Method and apparatus for growing single crystal
07/19/2006CN1265016C Film formation method and film forming device
07/19/2006CN1264949C Process for removing contaminant from a surface and composition useful therefor
07/19/2006CN1264941C Stripping film and adhesive film using stripping film
07/19/2006CN1264940C Dicing adhesive sheet and dicing method
07/19/2006CN1264897C Synthesis of siloxane resins
07/19/2006CN1264768C Device and method for scribing fragile material substrate
07/19/2006CN1264615C Solvent sweeped chemical transporting box
07/18/2006US7080340 Interconnect-aware integrated circuit design
07/18/2006US7080338 Method and apparatus for designing layout, and computer product
07/18/2006US7080336 Method and apparatus for computing placement costs
07/18/2006US7080302 Semiconductor device and test system therefor
07/18/2006US7080298 Circuit apparatus and method for testing integrated circuits using weighted pseudo-random test patterns
07/18/2006US7080270 Multi-threshold-voltage integrated circuit having a non-volatile data storage circuit