Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2007
04/11/2007CN1944716A Non-cyanogen type electrolytic gold plating bath for bump forming
04/11/2007CN1944613A Cleaning agent for integrated circuit substrate silicon chip and its cleaning method
04/11/2007CN1944496A Polishing slurry, method of producing same, and method of polishing substrate
04/11/2007CN1944236A Semiconductor device, method for manufacturing the same and method for inspecting the same
04/11/2007CN1944070A Laser induced thermal imaging apparatus and laser induced thermal imaging method
04/11/2007CN1944069A Laser induced thermal imaging apparatus and fabricating method of organic light emitting diode
04/11/2007CN1944066A Method for forming a pattern and liquid ejection apparatus
04/11/2007CN1943993A Polishing pad and polishing apparatus
04/11/2007CN1943991A Flexible materials processing rotation tool
04/11/2007CN1943990A In-situ substrate imaging
04/11/2007CN1943989A Carrier head with multiple chambers
04/11/2007CN1943988A Retainer ring, polishing head, and chemical mechanical polishing apparatus
04/11/2007CN1943981A Apparatus for exchanging cutting blade
04/11/2007CN1310343C Method for producing avalanche slot optical detector and detector
04/11/2007CN1310341C Etching process for making electrodes
04/11/2007CN1310339C Thin-film transistor and producing method thereof
04/11/2007CN1310338C Polysilicon film for film transistor and display device with the polysilicon film
04/11/2007CN1310337C Tunneling biasing metal oxide semiconductor transistor
04/11/2007CN1310336C Semiconductor device and mfg. method thereof
04/11/2007CN1310335C Thin membrane transistor and producing method thereof
04/11/2007CN1310333C Non-volatile semiconductor memory device and manufacturing method thereof
04/11/2007CN1310332C Nonvolatile semiconductor memory
04/11/2007CN1310331C Ferroelectric random access memory capacitor and method for manufacturing the same
04/11/2007CN1310330C Semiconductor memory device with recording area and periphery area and manufacturing method thereof
04/11/2007CN1310329C Semiconductor integrated circuit device and its manufacturing method
04/11/2007CN1310328C Semiconductor devices having at least one storage node and methods of fabricating the same
04/11/2007CN1310326C Self-reparable semiconductor and method thereof
04/11/2007CN1310325C MOS device and electrostatic discharge protection circuit
04/11/2007CN1310323C Semiconductor device
04/11/2007CN1310322C Layer insulated film and its forming method and polymer composition
04/11/2007CN1310321C Distribution-containing structure and forming method thereof
04/11/2007CN1310320C Flexible interconnection device, fingerprint transducing device and manufacturing method thereof
04/11/2007CN1310316C Mixed integrated circuit apparatus
04/11/2007CN1310315C Longitudinal static random access storage unit device and its forming method
04/11/2007CN1310314C Method of making transistors with gate insulation layers of differing thickness
04/11/2007CN1310313C Method for design of semconductor device, and semiconductor device
04/11/2007CN1310312C Semiconductor integrated circuit, method and apparatus for mfg. same
04/11/2007CN1310311C Improved 3D mask programme ROM
04/11/2007CN1310310C Semiconductor device containing liner structure
04/11/2007CN1310309C Method of plugging through-holes in silicon substrate
04/11/2007CN1310308C Fill pattern generation for spin-on glass and related self-planarization deposition
04/11/2007CN1310307C Groove etching process for low k insulation layer
04/11/2007CN1310306C Semiconductor device formed over a multiple thickness buried oxide layer, and methods of making same
04/11/2007CN1310305C Method of preventing shift of alignment marks during rapid thermal processing
04/11/2007CN1310304C Semiconductor device and its manufacturing method
04/11/2007CN1310303C Electrostatic sucker
04/11/2007CN1310302C Method for carrying object to be processed
04/11/2007CN1310301C Port structure in semiconductor processing system
04/11/2007CN1310300C Method for testing chips of wideband data communicatioin chip
04/11/2007CN1310299C Hazard detection and elimination method based on circuit static time-delay property
04/11/2007CN1310298C Method and apparatus for cascade control using integrated metrology
04/11/2007CN1310297C Packaging base plate with no plating bar and making method for same
04/11/2007CN1310296C Method for forming MOS device on silicon substrate
04/11/2007CN1310295C Material for forming fine pattern and method for manufacturing semiconductor device using the same
04/11/2007CN1310294C Method for filling gap and producing method for shallow kennel separated structure
04/11/2007CN1310293C Dry etching method
04/11/2007CN1310292C Vacuum processing device
04/11/2007CN1310291C Chip washing equipment preventing blocking of pipe wall
04/11/2007CN1310290C Upper electrode and plasma processing device
04/11/2007CN1310289C Plating method and apparatus that creates a differential between additive disposed on a top surface and a cavity surface of a workpiece using an external influence
04/11/2007CN1310288C Manufacturing method of semiconductor device
04/11/2007CN1310287C Doped silicon deposition process in resistively heated single wafer chamber
04/11/2007CN1310286C Method of manufacturing III-V family compound semiconductor
04/11/2007CN1310285C Processing device
04/11/2007CN1310284C Crystallization method of amorphous silicon for thin film transistor
04/11/2007CN1310283C Correcting method for scanning tool of semiconductor and standard correcting piece thereof
04/11/2007CN1310282C Multi-crystalline silicon layer crystallization method
04/11/2007CN1310281C Pedestal with integral shield
04/11/2007CN1310259C Method for producing electronic parts, and material for production thereof
04/11/2007CN1310212C Magnetic device and magnetic memory
04/11/2007CN1310093C Exposure device
04/11/2007CN1310092C Positive slushing agent composition and resist pattern forming method
04/11/2007CN1310091C Positive photoresist composition and method of forming photoresist pattern
04/11/2007CN1310090C Polymers and photoresist compositions
04/11/2007CN1310089C Photoetching adhesive composition
04/11/2007CN1310081C Liquid-crystal display panel cutting method
04/11/2007CN1310073C Translucent liquid crystal display device and its manufacturing method
04/11/2007CN1310067C Base board and its producing method, base board for photoelectric device, photoelectric device and electronic device
04/11/2007CN1310066C Method for producing transparent current-conducing plate with low-contact surface resistance
04/11/2007CN1310025C Manufacturing method for test apparatus and parts
04/11/2007CN1310011C Model and parameter selection for optical metrology
04/11/2007CN1309876C Apparatus and method for anodic sxidation
04/11/2007CN1309861C Device for supplying gas for epitaxial growth
04/11/2007CN1309859C Cylinder-based plasma processing system
04/11/2007CN1309761C Adhesive resin and film adhesives made by using the same
04/11/2007CN1309638C Thin wafer carrier
04/11/2007CN1309634C Wafer container cushion system
04/11/2007CN1309629C 300mm single stackable film frame carrier
04/11/2007CN1309567C Base board ,device and manufacturing method, active matrix base board manufacturing method and electro-optical device
04/11/2007CN1309526C Method and device for measuring capillary free oscillation amplitude of lead line connector
04/11/2007CN1309524C Apparatus and method for controlling temperature uniformity of substrates
04/11/2007CN1309523C Solder ball bonding method and bonding device
04/11/2007CN1309486C Method of and apparatus for substrate pre-treatment
04/10/2007US7203565 Temperature abnormality detection method and semiconductor manufacturing apparatus
04/10/2007US7203564 Treatment condition decision method, treatment condition decision system, treatment system, treatment condition decision calculator program, program recording medium, and semiconductor device manufacturing method
04/10/2007US7203563 Automatic N2 purge system for 300 mm full automation fab
04/10/2007US7203562 Process monitoring system for lithography lasers
04/10/2007US7203559 Method for manufacturing semiconductor wafer, method for receiving order for manufacture of semiconductor wafer, and system for receiving order for manufacture of semiconductor wafer
04/10/2007US7203387 VLSI-photonic heterogeneous integration by wafer bonding
04/10/2007US7203275 Multilayer film reflector and X-ray exposure system
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