Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2008
02/28/2008US20080050659 Method of Patterning Self-Organizing Material, Patterned Substrate of Self-Organizing Material and Method of Producing the Same, and Photomask Using Patterned Substrate of Self-Organizing Material
02/28/2008US20080050599 Crystal film, crystal substrate, and semiconductor device
02/28/2008US20080050566 Semiconductor device and method of fabricating the same
02/28/2008US20080050564 Method of Forming a Nano-Structure and the Nano-Structure
02/28/2008US20080050538 Thin Film Forming Method and Thin Film Forming Apparatus
02/28/2008US20080050523 Unit-Layer Post-Processing Catalyst Chemical-Vapor-Deposition Apparatus and Its Film Forming Method
02/28/2008US20080050217 Kinematic pin with shear member and substrate carrier for use therewith
02/28/2008US20080050209 Conductive member supply apparatus and conductive member supply method
02/28/2008US20080050104 Filament lamp and light-irradiation-type heat treatment device
02/28/2008US20080050010 Apparatus for correcting defects in a reticle pattern and correcting method for the same
02/28/2008US20080049807 Method of manufacturing light source device and the light source device
02/28/2008US20080049802 Semiconductor laser diode having wafer-bonded structure and method of fabricating the same
02/28/2008US20080049537 1-transistor type dram cell, a dram device and manufacturing method therefore, driving circuit for dram, and driving method therefor
02/28/2008US20080049491 Electromechanical non-volatile memory device and method of manufacturing the same
02/28/2008US20080049486 Transistor, memory cell array and method for forming and operating a memory device
02/28/2008US20080049480 Semiconductor integrated circuit with voltage generation circuit, liquid crystal display controller and mobile electric equipment
02/28/2008US20080049437 Vehicle, display device and manufacturing method for a semiconductor device
02/28/2008US20080049379 Scalable lead zirconium titanate (pzt) thin film material and deposition method, and ferroelectric memory device structures comprising such thin film material
02/28/2008US20080049378 Metal-insulator-metal capacitor and method of fabricating same
02/28/2008US20080049374 Electrostatic chuck with heater and manufacturing method thereof
02/28/2008US20080049336 Projection optical system and method for photolithography and exposure apparatus and method using same
02/28/2008US20080049307 Multilayer mirror, method for manufacturing the same, and exposure equipment
02/28/2008US20080049306 Projection optical system and method for photolithography and exposure apparatus and method using same
02/28/2008US20080049225 Photomask evaluation method and manufacturing method of semiconductor device
02/28/2008US20080049203 Exposure apparatus
02/28/2008US20080049177 Semi-transmissive type liquid-crystal display device and method of fabricating the same
02/28/2008US20080049176 Thin film transistor-array substrate, transflective liquid crystal display device with the same, and method for manufacturing the same
02/28/2008US20080049158 Array substrate for organic thin film transistor liquid crystal display device and method of manufacturing the same
02/28/2008US20080049157 Liquid crystal display and method of manufacturing the same
02/28/2008US20080049155 Active Matrix Substrate, Method for Correcting a Pixel Deffect Therein and Manufacturing Method Thereof
02/28/2008US20080048835 Radio Frequency Identification Apparatuses
02/28/2008US20080048832 Systems Utilizing an Interrogator and One or More RFID Tags
02/28/2008US20080048707 Characteristic evaluation apparatus for insulated gate type transistors
02/28/2008US20080048706 Semiconductor device, semiconductor integrated circuit and bump resistance measurement method
02/28/2008US20080048703 Semiconductor integrated circuit and testing method of same
02/28/2008US20080048698 Probe Card
02/28/2008US20080048693 Probe station having multiple enclosures
02/28/2008US20080048689 Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same
02/28/2008US20080048686 Sheet-like Probe, Method of Producing the Probe, and Application of the Probe
02/28/2008US20080048648 Chuck for holding a device under test
02/28/2008US20080048647 Chuck for holding a device under test
02/28/2008US20080048345 Semiconductor device and fabricating method thereof
02/28/2008US20080048343 Thin flip-chip method
02/28/2008US20080048340 Semiconductor device having fine pattern wiring lines integrally formed with contact plug and method of manufacturing same
02/28/2008US20080048339 Metal line structures and methods of forming the same
02/28/2008US20080048338 Semiconductor Device and Fabrication Method Thereof
02/28/2008US20080048337 Semiconductor device including through electrode and method of manufacturing the same
02/28/2008US20080048336 Semiconductor Device and Method for Manufacturing the Same
02/28/2008US20080048335 Semiconductor device
02/28/2008US20080048334 Semiconductor devices and methods of fabricating the same
02/28/2008US20080048333 Semiconductor Device Having Buried Word Line Interconnects and Method of Fabricating the Same
02/28/2008US20080048332 Method for forming intermetal dielectric in semiconductor device
02/28/2008US20080048331 Power/ground network of integrated circuits and arrangement thereof
02/28/2008US20080048330 Implantable Microelectronic Device and Method of Manufacture
02/28/2008US20080048329 Top layers of metal for high performance IC's
02/28/2008US20080048326 Semiconductor device
02/28/2008US20080048325 Semiconductor device and fabricating method thereof
02/28/2008US20080048324 Fabricating Semiconductor Device
02/28/2008US20080048322 Semiconductor package including redistribution pattern and method of manufacturing the same
02/28/2008US20080048320 Low fabrication cost, fine pitch and high reliability solder bump
02/28/2008US20080048317 Electric Component With A Flip-Chip Construction
02/28/2008US20080048313 Wafer Bonding Method
02/28/2008US20080048311 Semiconductor Device, Substrate for Producing Semiconductor Device and Method of Producing Them
02/28/2008US20080048309 Metal core foldover package structures, systems including same and methods of fabrication
02/28/2008US20080048305 Negative Thermal Expansion System (NTES) Device for TCE Compensation in Elastomer Composites and Conductive Elastomer Interconnects in Microelectronic Packaging
02/28/2008US20080048302 Systems and methods for low profile die package
02/28/2008US20080048299 Electronic Component with Semiconductor Chips, Electronic Assembly Composed of Stacked Semiconductor Chips, and Methods for Producing an Electronic Component and an Electronic Assembly
02/28/2008US20080048296 Vertical bjt, manufacturing method thereof
02/28/2008US20080048293 Semiconductor device having heating structure and method of forming the same
02/28/2008US20080048292 Electronic device and manufacturing method thereof
02/28/2008US20080048291 Semiconductor interconnection structures and capacitors including poly-sige layers and metal contact plugs, and methods of fabricating the same
02/28/2008US20080048290 Semiconductor device and fabricating method
02/28/2008US20080048289 RF Inductor of Semiconductor Device and Fabrication Method Thereof
02/28/2008US20080048288 Semiconductor device
02/28/2008US20080048287 Isolation structures for integrated circuits and modular methods of forming the same
02/28/2008US20080048284 Image sensor and fabrication method thereof
02/28/2008US20080048282 Semiconductor Device and Fabricating Method Thereof
02/28/2008US20080048281 Image sensor and fabricating method thereof
02/28/2008US20080048279 Process for Producing Semiconductor Substrate, Semiconductor Substrate for Solar Application and Etching Solution
02/28/2008US20080048278 Method of forming pattern of inorganic material film and structure containing the pattern
02/28/2008US20080048277 Gate of a transistor and method of forming the same
02/28/2008US20080048276 Semiconductor Device and Method for Manufacturing the Same
02/28/2008US20080048275 Mos transistor, semiconductor device, and method of manufacturing the same
02/28/2008US20080048274 Semiconductor device including a gate electrode of lower electrical resistance and method of manufacturing the same
02/28/2008US20080048273 Method for doping a fin-based semiconductor device
02/28/2008US20080048272 Silicidation monitoring pattern for use in semiconductor manufacturing process
02/28/2008US20080048271 STRUCTURE AND METHOD TO USE LOW k STRESS LINER TO REDUCE PARASITIC CAPACITANCE
02/28/2008US20080048267 Circuits and Methods for Improved FET Matching
02/28/2008US20080048266 ESD protection device and method
02/28/2008US20080048264 Method for forming pattern of stacked film and thin film transistor
02/28/2008US20080048262 Fin field effect transistor and method of forming the same
02/28/2008US20080048261 Semiconductor device and method of manufacturing the same
02/28/2008US20080048260 Thin film transistor array panel and method of manufacturing the same
02/28/2008US20080048256 Semiconductor Device
02/28/2008US20080048254 Semiconductor device and manufacturing method of the semiconductor device
02/28/2008US20080048253 Semiconductor device having a recess channel structure and method for manufacturing the same
02/28/2008US20080048252 Mosfet device suppressing electrical coupling between adjoining recess gates and mthod for manufacturing the same
02/28/2008US20080048251 Lateral trench MOSFET with direct trench polysilicon contact and method of forming the same
02/28/2008US20080048250 Mosfet with a thin gate insulating film
02/28/2008US20080048249 Semiconductor device and method of manufacturing the same