| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 02/27/2008 | CN100372094C Wafer testing device automatic reversion function and wafer testing method |
| 02/27/2008 | CN100372093C Method for real-time measuring of milling eliminating rate |
| 02/27/2008 | CN100372092C Test method of metal layer structure with internal ligature |
| 02/27/2008 | CN100372091C Semiconductor device and method for evaluating characteristics of the same |
| 02/27/2008 | CN100372090C A method for identifying code coverage percentage analysis |
| 02/27/2008 | CN100372089C Pattern evaluating apparatus and pattern evaluating method |
| 02/27/2008 | CN100372088C Automatic bonding method of MEMS high temp pressure sensor |
| 02/27/2008 | CN100372087C Spacer take-up device and method in processing mechanism of film carrier tape for mounting electronic component |
| 02/27/2008 | CN100372086C Manufacturing method of photoelectric chip double-chip substrate packaging structure with control chip |
| 02/27/2008 | CN100372085C Automatic assembing machine |
| 02/27/2008 | CN100372084C Method for manufacturing. heat reinforced ball grid array IC packaging substrate and packaging substrate |
| 02/27/2008 | CN100372083C Method for forming film transistor |
| 02/27/2008 | CN100372082C Method of making transistors |
| 02/27/2008 | CN100372081C Picture-element electrode switch element and manufacturing method thereof |
| 02/27/2008 | CN100372080C Processing method for self-aligning metal silicide production capable of avoiding short-circuit |
| 02/27/2008 | CN100372079C Method of manufacturing semiconductor device having nitride film with improved insulating properties |
| 02/27/2008 | CN100372078C Semiconductor and method for fabricating the same |
| 02/27/2008 | CN100372077C Method for preparing porous thin film material with low dielectric constant |
| 02/27/2008 | CN100372076C Treatment method and apparatus of substrate |
| 02/27/2008 | CN100372075C Inductive coupling plasma device |
| 02/27/2008 | CN100372074C Method for monitoring plasma etching platform after prevention and maintenance process |
| 02/27/2008 | CN100372073C Polishing fluid and method of polishing |
| 02/27/2008 | CN100372072C Plate-like workpiece dividing apparatus |
| 02/27/2008 | CN100372071C Silicon sheet thinning method |
| 02/27/2008 | CN100372070C Technology for etching capable of controlling grid structural length |
| 02/27/2008 | CN100372069C Method for forming T type polycrystalline silicon gate through double inlaying process |
| 02/27/2008 | CN100372068C Conductive spacers extended floating gates |
| 02/27/2008 | CN100372067C Diffusion system |
| 02/27/2008 | CN100372066C Method of forming polysilicon layer in semiconductor device |
| 02/27/2008 | CN100372065C Method and device for preparing p-type zinc oxide crystal film by doping phosphorus |
| 02/27/2008 | CN100372064C Substrate transfer device for thin-film deposition apparatus |
| 02/27/2008 | CN100372063C Group III nitride semiconductor substrate and its manufacturing method |
| 02/27/2008 | CN100372062C Nanometer-size die manufacturing method and its application |
| 02/27/2008 | CN100372061C Group iii-v nitride series semiconductor substrate and assessment method therefor |
| 02/27/2008 | CN100372060C Film or layer of semiconducting material, and process for producing the film or layer |
| 02/27/2008 | CN100372059C Method for forming semiconductor material wafer and structure therefor |
| 02/27/2008 | CN100372058C Laser beam pattern mask and crystallization method using the same |
| 02/27/2008 | CN100372057C Method for fabricating capacitor |
| 02/27/2008 | CN100372056C Semiconductor device and producing method thereof |
| 02/27/2008 | CN100372055C Method for etching high dielectric constant materials and for cleaning deposition chambers for high dielectric constant materials |
| 02/27/2008 | CN100372054C Display device and method of manufacturing the same |
| 02/27/2008 | CN100372053C Manufacturing tool for wafer level package and method of placing dies |
| 02/27/2008 | CN100372052C Production equipment capable of regulating input gas temperature |
| 02/27/2008 | CN100372051C Method for making semiconductor device |
| 02/27/2008 | CN100372041C Method for manufacturing component figure, distributing structure, and image display device |
| 02/27/2008 | CN100372028C Semiconductor resistance element and producing method thereof |
| 02/27/2008 | CN100372027C Data write-in method for photoetching ROM |
| 02/27/2008 | CN100371962C Luminous device and its driving method, and electronic apparatus |
| 02/27/2008 | CN100371939C Method of defect management system |
| 02/27/2008 | CN100371839C Methods and apparatus for obtaining data for process operation, optimization, monitoring and control |
| 02/27/2008 | CN100371827C Immersion photolithography system and method using microchannel nozzles |
| 02/27/2008 | CN100371819C Liquid crystal display panel and fabricating method thereof |
| 02/27/2008 | CN100371817C Semi-penetration, semi-reflective pixel structure and its manufacturing method |
| 02/27/2008 | CN100371816C TFT array substrate of liquid crystal display, liquid crystal display panel and its manufacturing method |
| 02/27/2008 | CN100371815C Manufacture of thin-membrane transistor of liquid-crystal displaying device |
| 02/27/2008 | CN100371814C Manufacture of pixel electrode contacting point of thin-membrane transistor liquid crystal displaying device |
| 02/27/2008 | CN100371813C Liquid crystal display panel of horizontal electronic field applying type and fabricating method thereof |
| 02/27/2008 | CN100371810C A wire structure, a thin film transistor substrate of using the wire structure and a method of manufacturing the same |
| 02/27/2008 | CN100371809C An etchant for a wire, a method for manufacturing the wire and a method for manufacturing a thin film transistor array panel including the method |
| 02/27/2008 | CN100371808C Glass flip-chip arrangement |
| 02/27/2008 | CN100371780C Panel for liquid crystal display and manufacturing method thereof |
| 02/27/2008 | CN100371766C Electronic and optical devices and methods of forming these devices |
| 02/27/2008 | CN100371727C Electronic circuit and method for testing |
| 02/27/2008 | CN100371670C Resistance furnace |
| 02/27/2008 | CN100371502C Electrochemical electroplating electrolyte and method for electroplating surface of metal |
| 02/27/2008 | CN100371491C Pulsed plasma processing method and apparatus |
| 02/26/2008 | USRE40114 Tungsten silicide (WSIX) deposition process for semiconductor manufacture |
| 02/26/2008 | USRE40113 Method for fabricating gate oxide |
| 02/26/2008 | USRE40112 Semiconductor package and method for fabricating the same |
| 02/26/2008 | USRE40105 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits |
| 02/26/2008 | US7337426 Pattern correcting method, mask making method, method of manufacturing semiconductor device, pattern correction system, and computer-readable recording medium having pattern correction program recorded therein |
| 02/26/2008 | US7337425 Structured ASIC device with configurable die size and selectable embedded functions |
| 02/26/2008 | US7337423 Mask pattern generating method and mask pattern generating apparatus |
| 02/26/2008 | US7337379 Apparatus and method for diagnosing integrated circuit |
| 02/26/2008 | US7337091 Method and apparatus for coordinating fault detection settings and process control changes |
| 02/26/2008 | US7337088 Intelligent measurement modular semiconductor parametric test system |
| 02/26/2008 | US7337019 Integration of fault detection with run-to-run control |
| 02/26/2008 | US7336892 Reflection plate for semiconductor heat treatment and manufacturing method thereof |
| 02/26/2008 | US7336685 Laser irradiation apparatus, laser irradiation method, and method for manufacturing a semiconductor device |
| 02/26/2008 | US7336591 Data storage medium |
| 02/26/2008 | US7336556 Magnetic non-volatile memory device |
| 02/26/2008 | US7336535 Semiconductor integrated circuit device |
| 02/26/2008 | US7336530 CMOS pixel with dual gate PMOS |
| 02/26/2008 | US7336523 Memory device using nanotube cells |
| 02/26/2008 | US7336519 Stacked integrated circuit device/data processor device having a flash memory formed on top of a buffer memory |
| 02/26/2008 | US7336471 Charge eliminating mechanism for stage and testing apparatus |
| 02/26/2008 | US7336420 Diffractive optical element, illumination system comprising the same, and method of manufacturing semiconductor device using illumination system |
| 02/26/2008 | US7336391 Multi-exposure drawing method and apparatus therefor |
| 02/26/2008 | US7336352 Position detection apparatus |
| 02/26/2008 | US7336344 Positioning system, exposure apparatus using the same, and device manufacturing method |
| 02/26/2008 | US7336342 Projection method including pupillary filtering and a projection lens therefor |
| 02/26/2008 | US7336341 Simulator of lithography tool for correcting focus error and critical dimension, simulation method for correcting focus error and critical dimension, and computer medium for storing computer program for simulator |
| 02/26/2008 | US7336336 Thin film transistor array substrate, method of fabricating the same, liquid crystal display panel having the same and fabricating method thereof |
| 02/26/2008 | US7336310 Processing apparatus |
| 02/26/2008 | US7336136 High frequency semiconductor integrated circuit device, wireless electric unit and wireless communication system |
| 02/26/2008 | US7336119 Gate driver output stage with bias circuit for high and wide operating voltage range |
| 02/26/2008 | US7336105 Dual gate transistor keeper dynamic logic |
| 02/26/2008 | US7336086 Measurement of bias of a silicon area using bridging vertices on polysilicon shapes to create an electrical open/short contact structure |
| 02/26/2008 | US7336015 Method of manipulating wafers |
| 02/26/2008 | US7335996 Method of room temperature covalent bonding |