Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2008
03/12/2008CN100374365C Method and apparatus for the preparation of high purity phosphine or other gas
03/12/2008CN100374358C Front opening wafer carrier with path to ground effectuated by door
03/12/2008CN100374213C Applying method of liquid and its resin coating forming method
03/12/2008CN100374189C Method and apparatus for blending process materials
03/11/2008US7343571 Simulation model for a semiconductor device describing a quasi-static density of a carrier as a non-quasi-static model
03/11/2008US7343536 Scan based automatic test pattern generation (ATPG) test circuit, test method using the test circuit, and scan chain reordering method
03/11/2008US7343276 Recording media including code for estimating IC power consumption
03/11/2008US7343271 Incorporation of a phase map into fast model-based optical proximity correction simulation kernels to account for near and mid-range flare
03/11/2008US7343217 System for monitoring and controlling a semiconductor manufacturing apparatus using prediction model equation
03/11/2008US7342843 Semiconductor integrated circuit device
03/11/2008US7342825 Nonvolatile semiconductor memory having plural data storage portions for a bit line connected to memory cells
03/11/2008US7342824 Method of programming a 3D RRAM
03/11/2008US7342822 Magnetic memory device, write current driver circuit and write current driving method
03/11/2008US7342818 Hybrid circuit having nanotube electromechanical memory
03/11/2008US7342803 Printed circuit board and method of manufacturing printed circuit board
03/11/2008US7342720 Surface protective member for transmission screen
03/11/2008US7342715 Multilayer film reflector for soft X-rays and manufacturing method thereof
03/11/2008US7342710 Mems switch and method of fabricating the same
03/11/2008US7342646 Method of manufacturing reliability checking and verification for lithography process using a calibrated eigen decomposition model
03/11/2008US7342638 Electro-optical device, method of manufacturing the same, and method of manufacturing substrate device
03/11/2008US7342622 Liquid crystal display for enhancing reflection and method of manufacturing the same
03/11/2008US7342615 Image display and manufacturing method of the same
03/11/2008US7342408 Semiconductor test device using leakage current and compensation system of leakage current
03/11/2008US7342404 Device for measurement and analysis of electrical signals of an integrated circuit component
03/11/2008US7342354 Organic EL display device, electronic equipment, and method for manufacturing the same
03/11/2008US7342353 Display device with insulation film and conductive layers arranged in periphery of the substrate
03/11/2008US7342319 Semiconductor integrated circuit package having electrically disconnected solder balls for mounting
03/11/2008US7342318 Semiconductor package free of substrate and fabrication method thereof
03/11/2008US7342317 Low coefficient of thermal expansion build-up layer packaging and method thereof
03/11/2008US7342316 Cross-fill pattern for metal fill levels, power supply filtering, and analog circuit shielding
03/11/2008US7342315 Method to increase mechanical fracture robustness of porous low k dielectric materials
03/11/2008US7342314 Device having a useful structure and an auxiliary structure
03/11/2008US7342306 High performance reworkable heatsink and packaging structure with solder release layer
03/11/2008US7342302 Semiconductor device and a method of manufacturing the same
03/11/2008US7342301 Connection device with actuating element for changing a conductive state of a via
03/11/2008US7342300 Integrated circuit incorporating wire bond inductance
03/11/2008US7342296 Wafer street buffer layer
03/11/2008US7342295 Porogen material
03/11/2008US7342292 Capacitor assembly having a contact electrode encircling or enclosing in rectangular shape an effective capacitor area
03/11/2008US7342290 Semiconductor metal contamination reduction for ultra-thin gate dielectrics
03/11/2008US7342289 Strained silicon MOS devices
03/11/2008US7342288 Thin film transistor, liquid crystal display apparatus, manufacturing method of thin film transistor, and manufacturing method of liquid crystal display apparatus
03/11/2008US7342286 Electrical node of transistor and method of forming the same
03/11/2008US7342280 Non-volatile memory and method of fabricating the same
03/11/2008US7342279 Multi-state non-volatile integrated circuit memory systems that employ dielectric storage elements
03/11/2008US7342276 Method and apparatus utilizing monocrystalline insulator
03/11/2008US7342275 Semiconductor device and method of manufacturing the same
03/11/2008US7342273 Applying epitaxial silicon in disposable spacer flow
03/11/2008US7342269 Photoelectric conversion device, and process for its fabrication
03/11/2008US7342267 MOSFET package
03/11/2008US7342263 Circuit device
03/11/2008US7342262 Split-gate power module for suppressing oscillation therein
03/11/2008US7342261 Light emitting device
03/11/2008US7342259 Optical element
03/11/2008US7342252 Thin film transistor array substrate and fabricating method thereof
03/11/2008US7342251 Method of manufacturing an electro-optical device
03/11/2008US7342249 Organic electroluminescent device and fabricating method thereof
03/11/2008US7342245 Organic semiconductor device
03/11/2008US7342211 Image sensor and method of manufacturing the same
03/11/2008US7342204 Heater and heating device
03/11/2008US7342179 Electronic device and method for producing the same
03/11/2008US7342177 Wiring board, electro-optical device and electronic instrument
03/11/2008US7342053 Resin composition, adhesive film using the same and multilayer printed circuit board
03/11/2008US7341961 Method of manufacturing thin film transistor, thin film transistor manufactured using the method, and flat panel display device comprising the thin film transistor
03/11/2008US7341960 Method for making a metal oxide semiconductor device
03/11/2008US7341959 Introducing materials within chamber disposed with substrate; coupling electromagnetic power to chamber to generate a plasma that facilitates a reduction reaction between first and second materials; electromagnetic power is coupled to electrode to generate a substrate zone plasma to ionize contaminants
03/11/2008US7341958 Integrated process for thin film resistors with silicides
03/11/2008US7341957 Masking structure having multiple layers including amorphous carbon layer
03/11/2008US7341956 Disposable hard mask for forming bit lines
03/11/2008US7341955 Method for fabricating semiconductor device
03/11/2008US7341954 Method and apparatus for determining an operation status of a plasma processing apparatus, program and storage medium storing same
03/11/2008US7341953 Mask profile control for controlling feature profile
03/11/2008US7341952 Multi-layer hard mask structure for etching deep trench in substrate
03/11/2008US7341951 Methods of forming semiconductor constructions
03/11/2008US7341950 Method for controlling a thickness of a first layer and method for adjusting the thickness of different first layers
03/11/2008US7341949 Process for forming lead-free bump on electronic component
03/11/2008US7341948 Method of making a semiconductor structure with a plating enhancement layer
03/11/2008US7341947 Methods of forming metal-containing films over surfaces of semiconductor substrates
03/11/2008US7341946 Methods for the electrochemical deposition of copper onto a barrier layer of a work piece
03/11/2008US7341945 Method of fabricating semiconductor device
03/11/2008US7341944 Methods for synthesis of metal nanowires
03/11/2008US7341943 Post etch copper cleaning using dry plasma
03/11/2008US7341942 Method for forming metal line of semiconductor device
03/11/2008US7341941 Methods to facilitate etch uniformity and selectivity
03/11/2008US7341940 Method for forming metal wirings of semiconductor device
03/11/2008US7341939 Method for patterning micro features by using developable bottom anti-reflection coating
03/11/2008US7341938 Single mask via method and device
03/11/2008US7341937 Semiconductor device and method of manufacturing same
03/11/2008US7341936 Semiconductor device and method of manufacturing the same
03/11/2008US7341935 Alternative interconnect structure for semiconductor devices
03/11/2008US7341934 Method for fabricating conductive bump of circuit board
03/11/2008US7341933 Method for manufacturing a silicided gate electrode using a buffer layer
03/11/2008US7341932 Schottky barrier diode and method thereof
03/11/2008US7341931 Methods of forming low resistivity contact for an integrated circuit device
03/11/2008US7341930 Systems and methods for integration of heterogeneous circuit devices
03/11/2008US7341929 Method to fabricate patterned strain-relaxed SiGe epitaxial with threading dislocation density control
03/11/2008US7341928 System and process for processing a plurality of semiconductor thin films which are crystallized using sequential lateral solidification techniques
03/11/2008US7341927 Wafer bonded epitaxial templates for silicon heterostructures
03/11/2008US7341926 Wafer dividing method
03/11/2008US7341925 Method for transferring a semiconductor body from a growth substrate to a support material