Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2008
03/12/2008CN101139713A Etching liquid and method for manufacturing patterned conductive layer using the same
03/12/2008CN101139712A Stripping method
03/12/2008CN101139365A Organometallic compounds and their use as precursors for forming films and powders of metal or metal derivatives
03/12/2008CN101139079A Plastic packaging method of microcomputer sensing and measuring element and structure thereof
03/12/2008CN101139045A Substrates transmission apparatus
03/12/2008CN101138838A Grinding pad with hollow fiber and manufacturing method thereof
03/12/2008CN101138834A Negative pressure vacuum adsorption device and edge-grinding device using said device
03/12/2008CN101138833A Group iii nitride substrate and manufacturing method of group iii nitride substrate
03/12/2008CN100375391C Double-usage of integrated circuit tube pin and signal switch over on the pin
03/12/2008CN100375353C Method of forming quantum dots for extended wavelength operation
03/12/2008CN100375310C Inkjet-fabricated integrated circuits
03/12/2008CN100375309C Tmr material having ultra-thin magnetic layer
03/12/2008CN100375298C Externally connecting method and connector for dye sensitized nanometer thin-film solar cell
03/12/2008CN100375296C Dynamic threshold voltage MOSFET on SOI
03/12/2008CN100375293C Trench MOSFET device with polycrystalline silicon source contact structure
03/12/2008CN100375292C Doped group III-V nitride materials, and microelectronic devices and device precursor structures comprising same
03/12/2008CN100375291C Electron chip and manufacturing method
03/12/2008CN100375290C Luminous device
03/12/2008CN100375286C Solid photogvapic taking cameva and mfg method thereof
03/12/2008CN100375285C Integrated storage circuit
03/12/2008CN100375283C Semiconductor device
03/12/2008CN100375282C Electrical fuses structure
03/12/2008CN100375281C Ball grid array x-ray oreintation mark
03/12/2008CN100375280C Conducting material and mfg. method thereof
03/12/2008CN100375279C Decouping network in integrated circuit
03/12/2008CN100375278C Semiconductor device and its mfg. method
03/12/2008CN100375277C Temperature compensating device of module type integrated circuit test processor
03/12/2008CN100375274C Circuit device and its manufacturing method
03/12/2008CN100375273C Semiconductor device and method of manufacturing the same
03/12/2008CN100375271C Novel dram access transistor
03/12/2008CN100375270C Self-aligned drain/channel junction in vertical pass transistor DRAM cell design for device scaling
03/12/2008CN100375269C Semiconductor device and method for manufacturing thereof
03/12/2008CN100375268C Semiconductor device and method for manufacturing thereof
03/12/2008CN100375267C Method for manufacturing semiconductor devices
03/12/2008CN100375266C Sacrificial inorganic polymer intermetal dielectric damascene wire and via liner
03/12/2008CN100375265C Tri-layer masking architecture for patterning dual damascene interconnects
03/12/2008CN100375264C Method for forming shallow trench isolation structure
03/12/2008CN100375263C Electrostatic chuck and treating device
03/12/2008CN100375262C Substrate supporting plate and stripping method for supporting plate
03/12/2008CN100375261C Plasma treatment appts. focusing ring and base
03/12/2008CN100375260C System and method for determining line widths of free-standing structures resulting from a semiconductor manufacturing process
03/12/2008CN100375259C Surface inspection apparatus
03/12/2008CN100375258C Method for detecting again fault
03/12/2008CN100375257C Semiconductor testing structure for clearing leakage current generating reason
03/12/2008CN100375256C Bonding method and bonding device
03/12/2008CN100375255C Semiconductor device and its mfg. method
03/12/2008CN100375254C Temperature control sequence of electroless plating baths
03/12/2008CN100375253C Metallorganics chemical vapour deposition (CVD) preparing method for p-type ZnO thin film
03/12/2008CN100375252C Backgated finfet having diferent oxide thicknesses
03/12/2008CN100375251C Manufacture of FinFET and ic including at least one FinFET
03/12/2008CN100375250C Composition for removing sidewall residues
03/12/2008CN100375249C Method of filling opening, dielectric layer opening and trench
03/12/2008CN100375248C Heterogeneous low K dielectric and forming method thereof
03/12/2008CN100375247C Plasma processing method and plasma processing device
03/12/2008CN100375246C Plasma processing apparatus
03/12/2008CN100375245C On-wafer monitoring system
03/12/2008CN100375244C Plasma treatment device and plasma treatment method
03/12/2008CN100375243C Method of manufacturing a thin film semiconductor device
03/12/2008CN100375242C Method of fabricating trench cut light emitting diodes and substrate assembly parts
03/12/2008CN100375241C Gate structure of semiconductor memory device
03/12/2008CN100375240C Method for forming metal silication grid and transistor with metal silication grid
03/12/2008CN100375239C Method for forming corrosion-resisting pattern and distribution pattern, and method for making semiconductor device
03/12/2008CN100375238C Exposure apparatus and device fabrication method using the same
03/12/2008CN100375237C Slushing compound filling method and manufacturing method of semiconductor device
03/12/2008CN100375236C Method of forming separable interface and producing micro-electromechanical film with the method
03/12/2008CN100375235C Growth controlling method for preparation of silicon dioxide or silicon nanowire in large area
03/12/2008CN100375234C Micro-machined device structures having on and off-axis orientations
03/12/2008CN100375233C Fabrication method for polycrystalline silicon thin film and display device fabricated using the same
03/12/2008CN100375232C Semiconductor device and method of fabricating the same
03/12/2008CN100375231C Display device and method for manufacturing the same
03/12/2008CN100375230C Transfer chamber for cluster system
03/12/2008CN100375229C Active matrix backplane for controlling controlled elements and method of manufacture thereof
03/12/2008CN100375228C Device for liquid treatment of disk-shaped objects
03/12/2008CN100375227C Fluoration thermal active for semiconductor working chamber
03/12/2008CN100375226C Angular spin, rinse, and dry module and methods for making and implementing the same
03/12/2008CN100375218C System and method for removing contaminant particles relative to ion beam
03/12/2008CN100375199C Semiconductor integrated circuit device
03/12/2008CN100375194C Semiconductor integrated circuit device
03/12/2008CN100375193C Semiconductor memory
03/12/2008CN100375097C Personalized hardware
03/12/2008CN100375086C Method and device for dynamic sensor configuration and runtime execution
03/12/2008CN100374956C A composition containing a photoacid generator monomer and carrier coated with the same and application thereof
03/12/2008CN100374950C Variable mask device for crystallizing silicon layer and method for crystallizing using the same
03/12/2008CN100374949C Liquid crystal display device and manufacturing method thereof
03/12/2008CN100374948C Copper conducting wire structure and mfg. method thereof
03/12/2008CN100374947C Liquid crystal display device and fabricating method thereof
03/12/2008CN100374945C Method of manufacturing array substrate for liquid crystal display device
03/12/2008CN100374944C Liquid crystal display device and method of fabricating the same
03/12/2008CN100374917C Method for forming pattern of liquid crystal display device and method for fabricating thin film transistor array substrate
03/12/2008CN100374912C Manufacture of electronic device installing bodies
03/12/2008CN100374911C 基板传送系统 Substrate transfer system
03/12/2008CN100374872C Semiconductor PN node diode device temperature rise measuring method and apparatus
03/12/2008CN100374765C Gas valve assembly and apparatus using the same
03/12/2008CN100374761C Cover body device and vacuum vessel device
03/12/2008CN100374622C Lithographic apparatus and method to determine beam size and divergence
03/12/2008CN100374616C Plasma treating device with protective tube
03/12/2008CN100374527C Metal CMP slurry compositions that favor mechanical removal of metal oxides with reduced susceptibility to micro-scratching
03/12/2008CN100374506C 辐射敏感树脂组合物 The radiation-sensitive resin composition of the
03/12/2008CN100374475C Acrylic polymers and radiation-sensitive resin compositions
03/12/2008CN100374433C Conductive organic compound and its electronic device
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