Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2014
06/04/2014CN103839859A Lifting device and semiconductor device having the same
06/04/2014CN103839858A Process capability monitoring method and ion implantation method for of ion implanter
06/04/2014CN103839857A Substrate processing apparatus, substrate processing method, substrate holding mechanism, and substrate holding method
06/04/2014CN103839856A Interposer apparatus and methods
06/04/2014CN103839855A Multistage substrate drying apparatus
06/04/2014CN103839854A Semiconductor processing device and degas chamber and heating assembly thereof
06/04/2014CN103839853A Substrate processing system
06/04/2014CN103839852A Wafer detection device and method used for ashing machine
06/04/2014CN103839851A Endpoint judgment method
06/04/2014CN103839850A Programming column crosstalk on-line detecting method
06/04/2014CN103839849A Method for judging failed machine in ion implantation section
06/04/2014CN103839848A Substrate static electricity inspection device and substrate manufacturing method
06/04/2014CN103839847A Graphics detection method
06/04/2014CN103839846A Trench DMOS polysilicon back etching online monitoring method
06/04/2014CN103839845A Method for manufacturing high-temperature service low-resistance connector through induced reaction of silicon/metal energy-contained modulation film
06/04/2014CN103839844A Encapsulating method
06/04/2014CN103839843A Mask for arrangement
06/04/2014CN103839842A Method for fabricating an electronic component
06/04/2014CN103839841A Nesting tool and reaction chamber
06/04/2014CN103839840A Manufacturing method of inductor unit
06/04/2014CN103839839A Method for assembling chip by coating back surface of chip with solder paste
06/04/2014CN103839838A Ball grid array and land grid array having modified footprint
06/04/2014CN103839837A Method for manufacturing ultra-thin uniform temperature plate and ultra-thin uniform temperature plate manufactured by same
06/04/2014CN103839836A Method for manufacturing cooling substrate
06/04/2014CN103839835A Method and structure for heating microcell based on graphene field-effect transistor
06/04/2014CN103839834A Semiconductor device and manufacturing method thereof
06/04/2014CN103839833A Method for manufacturing trench type MOS transistor
06/04/2014CN103839832A Fin type field effect transistor with GeSn source drain and forming method thereof
06/04/2014CN103839831A MOSFET with GeSn channel and forming method thereof
06/04/2014CN103839830A MOSFET with SiGeSn channel and forming method thereof
06/04/2014CN103839829A Fin type field effect transistor with SiGeSn channel and forming method thereof
06/04/2014CN103839828A MOSFET with SiGeSn channel and forming method thereof
06/04/2014CN103839827A MOSFET with SiGeSn source drain and forming method thereof
06/04/2014CN103839826A Low-temperature polycrystalline silicon thin film transistor, array substrate and manufacturing method of array substrate
06/04/2014CN103839825A Low-temperature polycrystalline silicon thin film transistor, array substrate and manufacturing method of array substrate
06/04/2014CN103839824A Method for manufacturing a semiconductor device
06/04/2014CN103839823A Forming method of transistor
06/04/2014CN103839822A Fin type field effect transistor and forming method thereof
06/04/2014CN103839821A Transistor and manufacturing method thereof
06/04/2014CN103839820A Method for manufacturing semiconductor device
06/04/2014CN103839819A Semiconductor device and manufacture method thereof
06/04/2014CN103839818A Semiconductor device manufacturing method
06/04/2014CN103839817A Semiconductor device and manufacturing method thereof
06/04/2014CN103839816A Semiconductor device and manufacturing method thereof
06/04/2014CN103839815A Method for forming NMOS transistor
06/04/2014CN103839814A Method for forming fin field effect transistor
06/04/2014CN103839813A MOS transistor and method for forming same
06/04/2014CN103839812A Semiconductor device and method for preparing same
06/04/2014CN103839811A Method for manufacturing semiconductor device
06/04/2014CN103839810A Fin field effect transistor chip and manufacturing method thereof
06/04/2014CN103839809A Method for manufacturing semiconductor device
06/04/2014CN103839808A Semiconductor device manufacturing method
06/04/2014CN103839807A Trench DMOS transistor manufacturing method and trench DMOS transistor
06/04/2014CN103839806A Semiconductor device and manufacturing method thereof
06/04/2014CN103839805A Preparation method of power device
06/04/2014CN103839804A Method for manufacturing electric field blocking type IGBT structure
06/04/2014CN103839803A Method for preparing planar IGBT structure
06/04/2014CN103839802A Method for manufacturing groove-shaped IGBT structure
06/04/2014CN103839801A Schottky barrier diode and manufacturing method thereof
06/04/2014CN103839800A Silicon nitride manufacturing method
06/04/2014CN103839799A Wet etching device of single semiconductor substrate
06/04/2014CN103839798A Process for polishing a semiconductor wafer, comprising the simultaneous polishing of a front side and of a reverse side of a substrate wafer
06/04/2014CN103839797A Method for preparing IGBT short-circuit collector electrode structure
06/04/2014CN103839796A Method for forming source electrode polycrystalline silicon
06/04/2014CN103839795A Method for manufacturing floating gate and method for manufacturing floating gate transistor
06/04/2014CN103839794A Method for manufacturing transparent conductive electrode and array substrate
06/04/2014CN103839793A Semiconductor device manufacturing method
06/04/2014CN103839792A Semiconductor device manufacturing method
06/04/2014CN103839791A Preparation method for trench gate of trench type MOS device
06/04/2014CN103839790A Laser annealing device and annealing method
06/04/2014CN103839789A SiGeSn layer of selected area and method for forming SiGeSn layer of selected area
06/04/2014CN103839788A SiGeSn layer and forming method thereof
06/04/2014CN103839787A Composition for forming n-type diffusion layer, method for producing n-type diffusion layer, and method for producing solar cell element
06/04/2014CN103839786A SiGeSn layer of selected area and method for forming SiGeSn layer of selected area
06/04/2014CN103839785A Method for forming photo composition
06/04/2014CN103839784A Ion implantation mask method and silicon carbide Schottky diode manufacturing method
06/04/2014CN103839783A Self-aligned double patterning formation method
06/04/2014CN103839782A Mask and method for manufacturing the same, and semicondutor device
06/04/2014CN103839781A Method for forming fine patterns on semiconductor
06/04/2014CN103839780A Trenched power device and manufacturing method thereof
06/04/2014CN103839779A Method for forming high-density capacitor structure and capacitor structure
06/04/2014CN103839778A Method for manufacturing polyresistor structure and polyresistor structure
06/04/2014CN103839777A Large area continuous lossless laser stripping method for gallium nitride film
06/04/2014CN103839776A Semiconductor structure and forming method thereof
06/04/2014CN103839775A GeSn layer of selected area and method for forming GeSn layer of selected area
06/04/2014CN103839774A SiGeSn layer and forming method thereof
06/04/2014CN103839773A Acid tank for wet etching process
06/04/2014CN103839772A Method for detaching a semiconductor chip from a foil
06/04/2014CN103839771A Semiconductor device failure analysis sample production method and analysis method
06/04/2014CN103839770A Technological method for simultaneously forming graphs at bottom and top of deep trench
06/04/2014CN103839769A Method for forming patterns
06/04/2014CN103839768A Method for reducing particle impurities in ethyl-orthosilicate furnace body
06/04/2014CN103839767A Method for building defect program through collection of optimal light ray polarization signals on chip in region partitioning mode
06/04/2014CN103838923A Wafer image formula generation method of wafer acceptance test
06/04/2014CN103838048A Array substrate, manufacturing method thereof, and display device
06/04/2014CN103838047A Array substrate, manufacturing method thereof and display device
06/04/2014CN103838045A Array substrate for liquid crystal display and manufacturing method of the same
06/04/2014CN103838044A Substrate, manufacturing method of substrate and display device
06/04/2014CN103838043A Array substrate, manufacturing method thereof and liquid crystal display panel
06/04/2014CN103837185A Test instrument mounting support
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