Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2009
12/15/2009US7632700 Photonic crystal-based filter for use in an image sensor
12/15/2009US7632699 Method for manufacturing CMOS image sensor
12/15/2009US7632698 Integrated circuit encapsulation and method therefor
12/15/2009US7632697 Nitride semiconductor thin film and method for growing the same
12/15/2009US7632696 Semiconductor chip with a porous single crystal layer and manufacturing method of the same
12/15/2009US7632695 Semiconductor device manufacturing method
12/15/2009US7632694 Manufacturing method for a TFT electrode for preventing metal layer diffusion
12/15/2009US7632692 Liquid crystal display, thin film transistor array panel therefor, and manufacturing method thereof
12/15/2009US7632691 Surface mountable chip
12/15/2009US7632690 Real-time gate etch critical dimension control by oxygen monitoring
12/15/2009US7632689 Methods for controlling the profile of a trench of a semiconductor structure
12/15/2009US7632630 A resin binder, photoacid generator and acrylic ester copolymer resin dye with a multicyclic chromophore on the side chain of one of the monomers; ultraviolet radiation absorption; reduced reflection, enhanced resolution; semiconductor wafers and flat panel displays
12/15/2009US7632627 Photomask apparatus, photomask manufacturing method, and mask pattern forming method
12/15/2009US7632626 Anti-reflective coating forming composition for lithography containing polymer having ethylenedicarbonyl structure
12/15/2009US7632614 Circuit pattern exposure method and mask
12/15/2009US7632613 comprising light shielding portions and openings formed on a transparent substrate; bias correction which expands the light shielding portions pattern to both sides; used for manufacturing a semiconductor; improve a pattern resolution quality
12/15/2009US7632419 Apparatus and method for monitoring processing of a substrate
12/15/2009US7632382 Plating apparatus
12/15/2009US7632379 Plasma source and plasma processing apparatus
12/15/2009US7632378 Polishing apparatus
12/15/2009US7632376 Method and apparatus for atomic layer deposition (ALD) in a proximity system
12/15/2009US7632375 Electrically enhancing the confinement of plasma
12/15/2009US7632374 Method and apparatus for picking up semiconductor chip and suction and exfoliation tool used therefor
12/15/2009US7632356 Gas providing member and processing device
12/15/2009US7632354 Thermal processing system with improved process gas flow and method for injecting a process gas into a thermal processing system
12/15/2009US7632331 first phase as a disperse metallic phase that is dispersed on a support of the second metal oxides phase; ultrasonic transducers underlying and ultrasonically energizing a reservoir of liquid feed which forms droplets of aerosol
12/15/2009US7632169 Polishing method and polishing apparatus
12/15/2009US7632164 Process for producing an organic EL display device using different processing units for each of the manufacturing stages
12/15/2009US7632087 Composite stamper for imprint lithography
12/15/2009US7631795 System and method for automated wire bonding
12/15/2009US7631680 Method of and mechanism for peeling adhesive tape bonded to segmented semiconductor wafer
12/15/2009US7631548 Scanning probe microscope
12/15/2009US7631518 Glass powders, methods for producing glass powders and devices fabricated from same
12/15/2009US7631418 Process to form an ABS through aggressive stitching
12/11/2009CA2673621A1 A method for evaluating umg silicon compensation
12/10/2009WO2009149325A2 Method and apparatus for producing a dislocation-free crystalline sheet
12/10/2009WO2009149275A2 Improved multilayer electrostatic chuck wafer platen
12/10/2009WO2009149167A2 Low temperature deposition of silicon-containing films
12/10/2009WO2009148992A1 Carrier mobility enhanced channel devices and method of manufacture
12/10/2009WO2009148930A1 Method of reducing memory effects in semiconductor epitaxy
12/10/2009WO2009148912A2 Methods of providing electrical isolation and semiconductor structures including same
12/10/2009WO2009148886A1 Ball grid array cleaning system
12/10/2009WO2009148876A1 Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm
12/10/2009WO2009148859A2 Method and apparatus for uv curing with water vapor
12/10/2009WO2009148855A1 Interconnect structure for integrated circuits having improved electromigration characteristics
12/10/2009WO2009148819A2 Techniques for changing temperature of a platen
12/10/2009WO2009148695A2 Edge termination for semiconductor devices
12/10/2009WO2009148678A2 Optical cavity furnace for semiconductor wafer processing
12/10/2009WO2009148674A1 A method for fabricating thin films
12/10/2009WO2009148671A2 Method for preparing ultraflat, atomically perfect areas on large regions of a crystal surface by heteroepitaxy deposition
12/10/2009WO2009148561A1 Methods of treating semiconducting materials and treated semiconducting materials
12/10/2009WO2009148533A1 Methods for fabricating gated lateral thyristor-based random access memory (gltram) cells
12/10/2009WO2009148450A1 Bonding tool with improved working face
12/10/2009WO2009148180A1 Semiconductor device
12/10/2009WO2009148155A1 Apparatus for manufacturing thin film solar cell
12/10/2009WO2009148154A1 Sputtering target for oxide thin film and process for producing the sputtering target
12/10/2009WO2009148138A1 Mold for nanoimprinting, process for producing the same, and processes for producing molded resin having fine rugged structure on surface and for producing wire-grid polarizer
12/10/2009WO2009148120A1 Apparatus for manufacturing thin film solar cell
12/10/2009WO2009148117A1 Apparatus for manufacturing thin film solar cell
12/10/2009WO2009148087A1 Apparatus for manufacturing thin film solar cell
12/10/2009WO2009148081A1 Thin film solar cell manufacturing equipment
12/10/2009WO2009148077A1 Apparatus for manufacturing thin film solar cell
12/10/2009WO2009148075A1 Method for manufacturing iii nitride semiconductor light emitting element, iii nitride semiconductor light emitting element and lamp
12/10/2009WO2009148070A1 Stage with alignment function, treatment device equipped with stage with the alignment function, and substrate alignment method
12/10/2009WO2009148001A1 Method for manufacturing semiconductor device
12/10/2009WO2009147993A1 Plasma processing apparatus, and film forming method and etching method using plasma processing apparatus
12/10/2009WO2009147976A1 ALxGa(1-x)As SUBSTRATE, EPITAXIAL WAFER FOR INFRARED LED, INFRARED LED, METHOD FOR PRODUCTION OF ALxGa(1-x)As SUBSTRATE, METHOD FOR PRODUCTION OF EPITAXIAL WAFER FOR INFRARED LED, AND METHOD FOR PRODUCTION OF INFRARED LED
12/10/2009WO2009147975A1 Alxga(1-x)as substrate, epitaxial wafer for infrared led, infrared led, method for production of alxga(1-x)as substrate, method for production of epitaxial wafer for infrared led, and method for production of infrared led
12/10/2009WO2009147974A1 Alxga(1-x)as substrate, epitaxial wafer for infrared led, infrared led, method for production of alxga(1-x)as substrate, method for production of epitaxial wafer for infrared led, and method for production of infrared led
12/10/2009WO2009147962A1 Liquid treatment apparatus and liquid treatment method
12/10/2009WO2009147954A1 Apparatus and method for attaching sheet
12/10/2009WO2009147948A1 Process for cleaning semiconductor element
12/10/2009WO2009147929A1 Probe, electronic component testing device, and probe manufacturing method
12/10/2009WO2009147871A1 Fluid heater, manufacturing method thereof, substrate processing device equipped with a fluid heater, and substrate processing method
12/10/2009WO2009147828A1 Manufacturing method for semiconductor device and semiconductor device
12/10/2009WO2009147823A1 Polymer for lithographic purposes and method for producing same
12/10/2009WO2009147810A1 Test system, electronic device, and testing apparatus
12/10/2009WO2009147804A1 Method for manufacturing probe device
12/10/2009WO2009147789A1 Circuit design system and circuit design method
12/10/2009WO2009147778A1 Bonded wafer manufacturing method
12/10/2009WO2009147774A1 Semiconductor device
12/10/2009WO2009147772A1 Semiconductor device and method for manufacturing the same
12/10/2009WO2009147768A1 Semiconductor device
12/10/2009WO2009147753A1 Semiconductor device
12/10/2009WO2009147747A1 Central core for cleaning sponge roller
12/10/2009WO2009147746A1 Organic transistor and manufacturing method thereof
12/10/2009WO2009147724A1 Test wafer unit and test system
12/10/2009WO2009147723A1 Test system and substrate unit to be used for testing
12/10/2009WO2009147722A1 Testing wafer, testing system and semiconductor wafer
12/10/2009WO2009147721A1 Test wafer unit and test system
12/10/2009WO2009147720A1 Semiconductor wafer, semiconductor circuit, testing board and testing system
12/10/2009WO2009147719A1 Test system
12/10/2009WO2009147718A1 Method of manufacturing probe wafer
12/10/2009WO2009147717A1 Probe wafer, probe apparatus, and test system
12/10/2009WO2009147559A1 Local buried layer forming method and semiconductor device having such a layer
12/10/2009WO2009147547A1 Electronic device and method of manufacturing an electronic device
12/10/2009WO2009147546A1 Method for manufacturing an electronic device
12/10/2009WO2009147347A1 Read-only memory with eeprom structure
12/10/2009WO2009147148A1 Stacked electronic device and process for fabricating such an electronic device
12/10/2009WO2009147065A1 Differential nitride pullback to create differential nfet to pfet divots for improved performance versus leakage