Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2010
05/26/2010CN101714559A Non-volatile memory semiconductor device
05/26/2010CN101714558A A semiconductor device
05/26/2010CN101714556A Semiconductor device and method for manufacturing the same
05/26/2010CN101714554A Photo alignment mark for a gate last process
05/26/2010CN101714552A High-low voltage device for plasma display driving chip and preparation method
05/26/2010CN101714550A Recessed channel array transistors, and semiconductor devices including a recessed channel array transistor
05/26/2010CN101714546A A display device and method for producing the same
05/26/2010CN101714545A 半导体装置 Semiconductor device
05/26/2010CN101714544A Integrated triode and manufacturing method thereof
05/26/2010CN101714543A Ceramic substrate for three-dimensional packaging of multi-chip system and packaging method thereof
05/26/2010CN101714541A Semiconductor device and method for manufacturing same
05/26/2010CN101714540A Data type encoding for media independent handover
05/26/2010CN101714539A Zigzag Pattern for TSV Copper Adhesion
05/26/2010CN101714538A Semiconductor device and method of manufacturing the same
05/26/2010CN101714536A Flip-chip package structure and the die attach method thereof
05/26/2010CN101714535A Ic encapsulation member with number of pin less than required
05/26/2010CN101714534A Resin sheet, circuit device and method of manufacturing the same
05/26/2010CN101714533A Circuit device and method of manufacturing the same
05/26/2010CN101714532A Package and fabricating method thereof
05/26/2010CN101714531A Semiconductor module and method for manufacturing the semiconductor module
05/26/2010CN101714530A Nitride semiconductor substrate
05/26/2010CN101714529A Semiconductor device and method for manufacturing the same
05/26/2010CN101714528A 半导体装置及其制造方法 Semiconductor device and manufacturing method
05/26/2010CN101714527A Method for manufacturing semiconductor element
05/26/2010CN101714526A Method for fabricating semiconductor device
05/26/2010CN101714525A Semiconductor integrated circuit device and a method for manufacturing a semiconductor integrated circuit device
05/26/2010CN101714524A Method for fabricating of cmos image sensor
05/26/2010CN101714523A Image sensor and method for manufacturing thereof
05/26/2010CN101714522A Advanced metal gate method and device
05/26/2010CN101714521A Semiconductor device and method of manufacturing the same
05/26/2010CN101714520A Method for manufacturing metal line of semiconductor device
05/26/2010CN101714519A A method for manufacturing a semiconductor device
05/26/2010CN101714518A Method for fabricating semiconductor device
05/26/2010CN101714517A Inspecting apparatus and method
05/26/2010CN101714516A Process for making contact with and housing integrated circuits
05/26/2010CN101714515A Microcavity structure and process
05/26/2010CN101714514A Apparatus and method for dispensing fusible material onto a surface
05/26/2010CN101714513A Adhesive sheet, semiconductor device, and method for producing the semiconductor device
05/26/2010CN101714512A Method of fabricating semiconductor device having three-dimensional stacked structure
05/26/2010CN101714511A Method and apparatus for joining adhesive tape
05/26/2010CN101714510A Image sensing device and packaging method thereof
05/26/2010CN101714509A Method for improving adhesive property between metal Ni base material and polymer adhesive
05/26/2010CN101714508A Method for fabricating semiconductor device
05/26/2010CN101714507A Semiconductor device having metal gate stacks and making method thereof
05/26/2010CN101714506A Capacitor with hafnium oxide and aluminum oxide alloyed dielectric layer and method for fabricating the same
05/26/2010CN101714505A Relaxation of a strained material layer with application of a stiffener
05/26/2010CN101714504A Thermal treatment apparatus, method for manufacturing semiconductor device, and method for manufacturing substrate
05/26/2010CN101714503A System and method for introducing a substrate into a process chamber
05/26/2010CN101714502A Taking and placing device of integrated circuit chip
05/26/2010CN101714501A Epitaxial reaction chamber cleaning method capable of improving epitaxial quality and reducing cost
05/26/2010CN101714500A COG chip inversion bonding device
05/26/2010CN101714499A A machining device
05/26/2010CN101714498A A machining device
05/26/2010CN101713932A Lithographic apparatus and device manufacturing method
05/26/2010CN101713920A 半导体器件 Semiconductor devices
05/26/2010CN101713919A A multilevel greyscale photo mask and method for producing the same
05/26/2010CN101713917A Gray mask blank, mask and manufacture methods thereof
05/26/2010CN101713916A Method of making an aperture mask
05/26/2010CN101713895A Liquid crystal display device and manufacturing method thereof
05/26/2010CN101713067A Film formation method and film formation apparatus
05/26/2010CN101713066A Method for depositing film and film deposition apparatus
05/26/2010CN101713057A Process used for spray forming Si-Al alloy solid-liquid two-phase region hot working molding encapsulating parts
05/26/2010CN101712852A Pressure-sensitive adhesive sheet for laser processing and method for laser processing
05/26/2010CN101712155A Substrate conveying arm
05/26/2010CN101712130A Positioning conversion device applied to chemical mechanical polishing equipment of silicon wafer
05/26/2010CN101712101A Laser processing machine
05/26/2010CN101459135B Implementing method for slot type dual layer grid power MOS device construction
05/26/2010CN101452966B Zener diode and manufacturing method thereof
05/26/2010CN101452847B Manufacturing method for ESD gate grounding NMOS transistor
05/26/2010CN101452846B Thick aluminum film forming process
05/26/2010CN101452845B Wet method corrosion process for silicon nitride film
05/26/2010CN101447447B Method of intrinsic gettering for trench isolation
05/26/2010CN101447433B Manufacturing method of double diffusion field effect transistor
05/26/2010CN101419937B Implementing method for groove type double layered gate power MOS construction
05/26/2010CN101414558B Method for reducing wet method etching particle pollution
05/26/2010CN101399218B Method for producing amorphous silicon isolated by deep groove
05/26/2010CN101346808B Bottom gate thin film transistors
05/26/2010CN101346804B Polishing composition, polishing method, and method for forming copper wiring for semiconductor integrated circuit
05/26/2010CN101336484B Semiconductor and its manufacture method
05/26/2010CN101336467B Plasma processing apparatus and plasma processing method
05/26/2010CN101331585B Method for manufacturing bonded substrate
05/26/2010CN101326633B Semiconductor device and manufacture method thereof
05/26/2010CN101315894B Method for raising puncture voltage between two polysilicons of groove type double-layer grid power MOS
05/26/2010CN101290885B Manufacturing method of separating wall
05/26/2010CN101275970B Testing device and probe structure thereof
05/26/2010CN101266913B Method for enhancing pattern uniformity
05/26/2010CN101263583B Polishing compound, polishing device, and semiconductor integrated circuit device
05/26/2010CN101253022B Polishing pad
05/26/2010CN101246878B LED chip packaging structure with ceramic as substrate and its production method
05/26/2010CN101202306B Thin film transistor substrate producing method
05/26/2010CN101201271B Internal modulation type ferro-electricity non-refrigeration infrared focal plane prober
05/26/2010CN101179057B Novel bond pad structure and its manufacture method
05/26/2010CN101164168B Electric element, memory device, and semiconductor integrated circuit
05/26/2010CN101162717B Stacked structures and methods of fabricating stacked structures
05/26/2010CN101162705B Multifunctional filmistor-electric capacity array
05/26/2010CN101160596B Method of producing electronic apparatus
05/26/2010CN101142487B Probe card and its manufacture method
05/26/2010CN101122752B Centering device and exposure device
05/26/2010CN101122627B Semi-conducting material thermoelectricity performance test system
05/26/2010CN101120438B Semiconductor device manufacturing method and semiconductor device