| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/01/2009 | CN201215580Y Integrated circuit test system |
| 04/01/2009 | CN201215579Y Weft detecting electric cable detection device of Picanol OMNI-800 weaving machine |
| 04/01/2009 | CN201215578Y Novel electricity test device |
| 04/01/2009 | CN201215577Y Portable arrow type human short circuit earthing transmission device |
| 04/01/2009 | CN201215576Y Automobile and motorcycle main cable automatic detection platform |
| 04/01/2009 | CN201215572Y Voltage tester with clip |
| 04/01/2009 | CN201215570Y Voltage detecting circuit for battery |
| 04/01/2009 | CN201215565Y Switching control tool shared by multiple dimensions for precise high-frequency crystal oscillator test |
| 04/01/2009 | CN201215492Y Synthetic check instrument for combined instrument of car and motocycle |
| 04/01/2009 | CN201215216Y Leakage-proof intelligent valve |
| 04/01/2009 | CN101401275A Charge controller |
| 04/01/2009 | CN101399447A Solar bi-purpose charging clip device for automobile with voltage meter |
| 04/01/2009 | CN101399253A Method for cutting fuse-wires by laser, test structure and method thereof and test wafer |
| 04/01/2009 | CN101399134A Relay status detection method |
| 04/01/2009 | CN101398999A Display equipment test device and method |
| 04/01/2009 | CN101398967A Theftproof system and method for electric power facilities of base station |
| 04/01/2009 | CN101398539A Display module |
| 04/01/2009 | CN101398469A Method for assessing service life and security of lithium secondary battery |
| 04/01/2009 | CN101398468A Latch effect test method and system for CMOS chip |
| 04/01/2009 | CN101398467A Internal integrate circuit bus interface test system and method |
| 04/01/2009 | CN101398466A Multimeter for conveniently and rapidly testing cut in voltage of diode with different types |
| 04/01/2009 | CN101398465A Electron component detection system and method thereof |
| 04/01/2009 | CN101398464A Circuit pattern inspection device |
| 04/01/2009 | CN101398463A Connection testing apparatus and method and chip using the same |
| 04/01/2009 | CN101398462A Paster bonding wire automatic detection system |
| 04/01/2009 | CN101398461A Chip electro-static discharge test device |
| 04/01/2009 | CN101398460A Debugging method for chip electro-static discharge test after failure and device |
| 04/01/2009 | CN101398459A Method and device for identifying charger type |
| 04/01/2009 | CN101398458A Needle testing system |
| 04/01/2009 | CN101398457A Wafer, test system thereof, test method thereof, and test fixture thereof |
| 04/01/2009 | CN101398456A Test card and automatic test method thereof |
| 04/01/2009 | CN101398455A Measuring system and method |
| 04/01/2009 | CN101398454A Solar assembly test method and device thereof |
| 04/01/2009 | CN101398453A Single light path quantum efficiency test system |
| 04/01/2009 | CN101398452A Computation method of dynamic electric energy index of quality based on 100kHz frequency |
| 04/01/2009 | CN101398451A Rapid detection method for testing backing board |
| 04/01/2009 | CN101398450A Electric network peak transmission test device |
| 04/01/2009 | CN101398449A Low-voltage electric network earth fault positioning device |
| 04/01/2009 | CN101398446A Temperature compensated current measuring device and battery pack using the same |
| 04/01/2009 | CN101398442A Tool plate and test method using the same |
| 04/01/2009 | CN101398441A Probe plate and inspection device of semiconductor wafer using the same |
| 04/01/2009 | CN101396692A Device capable of automatically detecting the electronic component appearance |
| 04/01/2009 | CN101396276A Channel connectivity diagnostic equipment of probe-head control module of ultrasonic diagnostic device |
| 04/01/2009 | CN100474998C Quasi continuous light generating power supply of single flash light sun analogue device |
| 04/01/2009 | CN100474577C Base board and electric test method therefor |
| 04/01/2009 | CN100474548C Device for detecting metal etching defect |
| 04/01/2009 | CN100474545C Test board for high-frequency system level test |
| 04/01/2009 | CN100474457C Test method for a semiconductor memory |
| 04/01/2009 | CN100474434C Integrated circuit memory devices and operating methods configured to output data bits at a lower rate |
| 04/01/2009 | CN100474083C Liquid crystal display and testing method thereof |
| 04/01/2009 | CN100473999C Battery remaining capacity indicating apparatus and battery remaining capacity indicating method |
| 04/01/2009 | CN100473998C Apparatus and method of auto-regulating testing clock frequency |
| 04/01/2009 | CN100473997C False pin soldering test device and method |
| 04/01/2009 | CN100473996C Apparatus for detecting linear index of power amplifier |
| 04/01/2009 | CN100473995C Testing regulating device and method of quartz crystal osciuator |
| 04/01/2009 | CA2640175A1 Insulation resistance decrease detector for industrial vehicle |
| 03/31/2009 | US7512925 System and method for reducing test time for loading and executing an architecture verification program for a SoC |
| 03/31/2009 | US7512912 Method and apparatus for solving constraints for word-level networks |
| 03/31/2009 | US7512872 Test apparatus and test method |
| 03/31/2009 | US7512871 Techniques for mitigating, detecting, and correcting single event upset effects in systems using SRAM-based field programmable gate arrays |
| 03/31/2009 | US7512858 Method and system for per-pin clock synthesis of an electronic device under test |
| 03/31/2009 | US7512856 Register circuit, scanning register circuit utilizing register circuits and scanning method thereof |
| 03/31/2009 | US7512855 Shift register circuit |
| 03/31/2009 | US7512854 Method and apparatus for testing, characterizing and monitoring a chip interface using a second data path |
| 03/31/2009 | US7512852 Protecting an integrated circuit test mode |
| 03/31/2009 | US7512851 Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit |
| 03/31/2009 | US7512850 Checkpointing user design states in a configurable IC |
| 03/31/2009 | US7512849 Reconfigurable programmable logic system with configuration recovery mode |
| 03/31/2009 | US7512848 Clock and data recovery circuit having operating parameter compensation circuitry |
| 03/31/2009 | US7512510 Device for the preparation execution and evaluation of a non-destructive analysis |
| 03/31/2009 | US7512508 Determining and analyzing integrated circuit yield and quality |
| 03/31/2009 | US7512506 IC chip stress testing |
| 03/31/2009 | US7512503 Wire fault detection |
| 03/31/2009 | US7512260 Substrate inspection method and apparatus |
| 03/31/2009 | US7512216 Joint fault detection |
| 03/31/2009 | US7512196 System and method of obtaining random jitter estimates from measured signal data |
| 03/31/2009 | US7512069 IP packet identification method and system for TCP connection and UDP stream |
| 03/31/2009 | US7512065 Reducing overhead when setting up multiple virtual circuits using signaling protocols |
| 03/31/2009 | US7512064 Avoiding micro-loop upon failure of fast reroute protected links |
| 03/31/2009 | US7512062 Method to maintain the integrity of remote data by making it disposable |
| 03/31/2009 | US7511547 Delay circuit, and testing apparatus |
| 03/31/2009 | US7511527 Methods and apparatus to test power transistors |
| 03/31/2009 | US7511526 Circuit module testing apparatus and method |
| 03/31/2009 | US7511525 Boundary-scan system architecture for remote environmental testing |
| 03/31/2009 | US7511524 Contact tip structure of a connecting element |
| 03/31/2009 | US7511523 Cantilever microprobes for contacting electronic components and methods for making such probes |
| 03/31/2009 | US7511522 Electronic device test apparatus |
| 03/31/2009 | US7511521 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 03/31/2009 | US7511520 Universal wafer carrier for wafer level die burn-in |
| 03/31/2009 | US7511519 Electric signal connecting device and probe assembly and probing device using the same |
| 03/31/2009 | US7511518 Method of making an interposer |
| 03/31/2009 | US7511517 Semi-automatic multiplexing system for automated semiconductor wafer testing |
| 03/31/2009 | US7511510 Nanoscale fault isolation and measurement system |
| 03/31/2009 | US7511509 Semiconductor device and test system which output fuse cut information sequentially |
| 03/31/2009 | US7511508 Fixture characteristic measuring device, method, program, recording medium, network analyzer, and semiconductor test device |
| 03/31/2009 | US7511507 Integrated circuit and circuit board |
| 03/31/2009 | US7511506 Semiconductor testing system and testing method |
| 03/31/2009 | US7511505 Centralized connector module having component diagnostic capability, refrigeration unit incorporating the same and methods of assembling and troubleshooting a refrigeration unit |
| 03/31/2009 | US7511501 Systems and apparatus for monitoring internal temperature of a gradient coil |
| 03/31/2009 | US7511485 Magnetic field measurement method and system |