Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2009
04/22/2009CN100480715C Automatic testing device of semiconductor construction element
04/22/2009CN100480714C Shielded probe apparatus for probing semiconductor water
04/22/2009CN100480713C Insulation degradation diagnosis apparatus
04/22/2009CN100480712C Method for measuring power-supply grounded resistance triple-bridged arm of electric system
04/22/2009CN100480711C Auto-IP traffic optimization in mobile telecommunications systems
04/22/2009CN100480710C Method and apparatus for source device synchronization in a communication system
04/22/2009CN100480709C Amperage control for valves
04/22/2009CN100480708C Converter transformer DC magnetic bias electrical current practical test method
04/22/2009CN100480707C Tester for maintainability of electron device
04/22/2009CN100480693C Employing infrared thermography for defect detection and analysis
04/21/2009US7523373 Minimum memory operating voltage technique
04/21/2009US7523372 Phase shifter with reduced linear dependency
04/21/2009US7523371 System and shadow bistable circuits coupled to output joining circuit
04/21/2009US7523370 Channel masking during integrated circuit testing
04/21/2009US7523369 Substrate and testing method thereof
04/21/2009US7523368 Diagnostics unit using boundary scan techniques for vehicles
04/21/2009US7523366 Storage efficient memory system with integrated BIST function
04/21/2009US7523365 Dynamic determination of signal quality in a digital system
04/21/2009US7523192 Automated module tracking system for communications networks
04/21/2009US7523010 Automated circuit board test actuator system
04/21/2009US7522762 Detection, resolution, and identification of arrayed elements
04/21/2009US7522660 Pulse pattern generating apparatus
04/21/2009US7522607 Congestion handling in a packet communication system
04/21/2009US7522602 Packet transfer apparatus with the function of flow detection and flow management method
04/21/2009US7522535 Method of adjustment for receiver of signals transmitted in bursts and corresponding receivers
04/21/2009US7522533 Optical transmission apparatus having path trace function
04/21/2009US7522527 Scalable crossbar matrix switch and arbitration method thereof
04/21/2009US7522525 L2 switch
04/21/2009US7522285 Method for determining the frequency response of an electrooptical component
04/21/2009US7521955 Method and system for device characterization with array and decoder
04/21/2009US7521954 Method for determining a minority carrier diffusion length using surface photo voltage measurements
04/21/2009US7521953 Test apparatus for testing operation of a printed circuit board
04/21/2009US7521952 Test structure for electromigration analysis and related method
04/21/2009US7521951 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions
04/21/2009US7521950 Wafer level I/O test and repair enabled by I/O layer
04/21/2009US7521949 Test pin, method of manufacturing same, and system containing same
04/21/2009US7521948 Integrated circuit load board and method having on-board test circuit
04/21/2009US7521947 Probe needle protection method for high current probe testing of power devices
04/21/2009US7521946 Electrical measurements on semiconductors using corona and microwave techniques
04/21/2009US7521937 Measurement circuit and test apparatus
04/21/2009US7521936 Diagnostic system for power converter
04/21/2009US7521918 Microcomputer chip with function capable of supporting emulation
04/21/2009US7521915 Wafer bevel particle detection
04/21/2009US7521894 Device combination system including plurality of devices and method of detecting a state of a battery mounted on a power supply device supplying power to said plurality of devices
04/21/2009US7521893 Battery apparatus and discharge controlling method of battery apparatus
04/21/2009US7521266 Production and packaging control for repaired integrated circuits
04/16/2009WO2009049117A1 Adjustable test pattern results latency
04/16/2009WO2009048972A1 Transformer through-fault current monitor
04/16/2009WO2009048619A1 Ground fault detection circuit for use in high voltage motor drive applications
04/16/2009WO2009048618A1 Probe card test apparatus and method
04/16/2009WO2009047844A1 Tester, test method, and program
04/16/2009WO2009047836A1 Probe card, inspecting apparatus and inspecting method
04/16/2009WO2009047160A2 Full raster cartridge for a parallel tester for testing an unpopulated printed circuit board, spring contact pin for such a full raster cartridge and adapter for testing an unpopulated printed circuit board
04/16/2009WO2009047089A1 Testing method
04/16/2009WO2009046946A1 Plunger for holding and moving electronic components in particular ic's with a heat conducting body
04/16/2009WO2009046945A2 Plunger for holding and moving electrical components in particular ic's
04/16/2009WO2009046885A1 Tempering chamber for tempering electronic components in particular ic's
04/16/2009WO2009046884A2 Handler for electronic components, in particular ic's, comprising a plurality of circulating carriages that are guided along a circulating track
04/16/2009WO2009046883A2 Handler for electronic components, in particular ic's, comprising circulating units, the temperature of which can be controlled
04/16/2009WO2009046882A2 Handler for electronic components, in particular ic's, comprising a pneumatic cylinder displacement unit for moving plungers
04/16/2009WO2009046747A1 Method for testing the free triggering behavior of an electromechanically activated power switch and device for performing said method
04/16/2009WO2008081419A3 Systems and methods for test time outlier detection and correction in integrated circuit testing
04/16/2009WO2008072226A3 Fault prediction in electric transmission networks
04/16/2009WO2008047383A3 System and method for network association inference, validation and pruning based on integrated constraints from diverse data
04/16/2009WO2008039881A3 Single support structure probe group with staggered mounting pattern
04/16/2009WO2007145727A3 Differential signal probing system
04/16/2009WO2007140164A3 Call quality monitoring
04/16/2009WO2007117821A3 Method and apparatus for generating a degree-constrained minimum spanning tree
04/16/2009WO2007086064A3 Diced wafer adaptor and a method for transferring a diced wafer
04/16/2009WO2007055713A3 Pin electronics implemented system and method for reduced index time
04/16/2009WO2007008961A3 Method and apparatus for parameter adjustment, testing, and configuration
04/16/2009WO2007008296A3 Method and apparatus for non-stop multi-node system synchronization
04/16/2009WO2006113012A3 Determining quality of lubricating oils in use
04/16/2009WO2006096543A3 Temperature sensing and prediction in ic sockets
04/16/2009WO2006083855A3 Method of estimating channel bandwidth from a time domain reflectometer (tdr) measurement
04/16/2009WO2004102803A3 A scalable scan-path test point insertion technique
04/16/2009US20090100306 Electronic unit
04/16/2009US20090100305 Reprogrammable built-in-self-test integrated circuit and test method for the same
04/16/2009US20090100304 Hardware and Software Co-test Method for FPGA
04/16/2009US20090099828 Device Threshold Calibration Through State Dependent Burnin
04/16/2009US20090099805 Measurement system
04/16/2009US20090099800 Apparatus and Method for Controlling Charging and Discharging Power Storage Device
04/16/2009US20090099799 Systems, Methods and Circuits for Determining Micro-Short
04/16/2009US20090097404 Oversubscribing Bandwidth In A Communications Network
04/16/2009US20090097397 Fault tolerance framework for networks of nodes
04/16/2009US20090096479 System and method for automated detection of singular faults in diode or'd power bus circuits
04/16/2009US20090096478 Reconfigurable connections for stacked semiconductor devices
04/16/2009US20090096477 Apparatus and methods for performing a test
04/16/2009US20090096476 Method of inspecting semiconductor circuit having logic circuit as inspection circuit
04/16/2009US20090096462 Wafer testing method
04/16/2009US20090096461 Test structure and method for resistive open detection using voltage contrast inspection
04/16/2009US20090096459 Method of measuring characteristics regarding safety of battery
04/16/2009DE202009000514U1 Grät zur Ermittlung der Restleistung einer Batterie in Zeiteinheiten (Stunden u./o. Minuten) Burrs to determine the remaining capacity of a battery in time units (u h. / O. Minutes)
04/16/2009DE10297415B4 Testvorrichtung für Halbleiterbauelemente Test apparatus for semiconductor devices
04/16/2009DE102008045726A1 Prüfvorrichtung Tester
04/16/2009DE102008038826A1 Batteriesteuerungsverfahren für Hybridfahrzeuge Battery control method for hybrid vehicles
04/16/2009DE102008031968A1 Wechselstrom-Masseschluss-Erfassungssystem eines Fahrzeugs AC ground fault detection system of a vehicle
04/16/2009DE102007050346A1 Capacity-related state variable validation method for electrical energy storage i.e. battery, of motor vehicle, involves concluding plausibility of capacity-related state variable of storage depending on evaluation parameter
04/16/2009DE102007048378B3 Vorrichtung zum Anschluss an eine Anhängersteckdose eines Kraftfahrzeugs Device for connection to a trailer socket of a motor vehicle
04/16/2009DE102007047740A1 Plunger zum Bewegen elektronischer Bauelemente, insbesondere IC's Plunger for moving electronic components, especially ICs