Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2009
04/08/2009EP2044450A2 Methods and systems for semiconductor testing using reference dice
04/08/2009EP2044449A1 Test probe for a test apparatus for testing plug-type connectors and method for testing plug-type connectors
04/08/2009EP1883829A4 Detection, localization and interpretation of partial discharge
04/08/2009EP1761968B1 System for monitoring a group of electrochemical cells and device therefor
04/08/2009EP1570664A4 Context aware transmission management method
04/08/2009EP1245070B1 Household electric user having an electronic control, and control and programming system thereof
04/08/2009CN201219293Y Linear array CCD optoelectronic experimental device
04/08/2009CN201219205Y Charger with illumination function
04/08/2009CN201218881Y High voltage test equipment for backlight tube group
04/08/2009CN201218837Y Battery detection electrode with indicator light seat
04/08/2009CN201218836Y High-speed, heavy-duty, medium and small sized generator tester
04/08/2009CN201218835Y Diesel locomotive control signal driven amplifying board detecting instrument
04/08/2009CN201218834Y Test circuit with automatic shut-off function
04/08/2009CN201218833Y Controlled silicon detection apparatus
04/08/2009CN201218832Y LED test device
04/08/2009CN201218831Y Automatic voltage testing system
04/08/2009CN201218830Y Indication circuit for open circuit fault of series batteries
04/08/2009CN201218829Y Multifunctional line measurement device
04/08/2009CN201218828Y Tester for microcomputer relay protector
04/08/2009CN201218827Y Arrester on-line monitor with communication ability
04/08/2009CN201218824Y Single slice voltage collection device for fuel cell
04/08/2009CN201218823Y Single slice voltage collection device for fuel cell
04/08/2009CN201218816Y Heat source apparatus similar to chip
04/08/2009CN201218769Y Fuel battery membrane electrode leak detector
04/08/2009CN101405989A Method and apparatus for limiting VPNv4 prefixes per VPN in an inter-autonomous system environment
04/08/2009CN101405669A Universal monitoring and diagnostic control system for a transformer or tap-changer
04/08/2009CN101405611A Method and device for indicating an electric discharge inside a bearing of an electric drive system
04/08/2009CN101405610A Semiconductor device, semiconductor testing apparatus and semiconductor device testing method
04/08/2009CN101405609A Multi-stage test response compactors
04/08/2009CN101405608A Test connector, kit and method for distinguishing a group of wires from other wires of a multi-wire cable
04/08/2009CN101404409A Cut-off ground fault recognition method for electrified railroad AT power supply contact system
04/08/2009CN101404408A Distribution network cable-wire mixed line failure route selection method by utilizing relative energy
04/08/2009CN101403917A Machine network dynamic parameter synthetic measuring apparatus
04/08/2009CN101403827A Circuit defect repairing method and device for liquid crystal display device
04/08/2009CN101403785A Probe apparatus and probing method
04/08/2009CN101403784A AC frequency conversion resonance vibration pressure-proof novel method for AC motor stator winding
04/08/2009CN101403783A Fault positioning DC injection method for low current grounding system
04/08/2009CN101403782A Cut-off terminal short trouble experiment loop used for ultra/extra-high voltage breaker
04/08/2009CN101403781A Tester for connecter
04/08/2009CN101403780A Laboratory test device and method for dynamic electric voltage recovery device
04/08/2009CN101403779A Parameter measuring apparatus and system for high tension power line
04/08/2009CN101403778A Self-adapting assembly line type AC parameter measuring method
04/08/2009CN101403777A Resistive current tester for great current zinc oxide lightning arrester
04/08/2009CN101403764A The connecting device for burn in testing equipment
04/08/2009CN101403721A Flexible penetration sensor used for military uniform
04/08/2009CN101403676A Insulator hydrophobicity rank amalgamation judging method based on D-S evidence theory
04/08/2009CN100477522C Integrated circuit and method for testing integrated circuit
04/08/2009CN100477391C Memory module testing socket and instrument
04/08/2009CN100477203C Offset dependent resistor for measuring misalignment of stitched masks
04/08/2009CN100477141C Semiconductor package device and method of formation and testing
04/08/2009CN100476790C Method and system for resource bunlding in communications network
04/08/2009CN100476733C System and method for semiconductor simulation on tool
04/08/2009CN100476451C Method and device for determining the charge being able to be drawn from an energy accumulator
04/08/2009CN100476450C Battery, machine and charger
04/08/2009CN100476449C Device and method for monitoring and/or analyzing electric machines in operation
04/08/2009CN100476448C Timing comparator, data sampling apparatus, and testing apparatus
04/08/2009CN100476447C Automatic test technology of ASIC device
04/08/2009CN100476446C Semiconductor test system
04/08/2009CN100476445C Inspection signal supply device and inspection signal application method
04/08/2009CN100476444C Method and apparatus for inspecting planar display device by visual model
04/08/2009CN100476442C Apparatus for testing a device with a high frequency signal
04/08/2009CN100476441C Test tray for handler for testing semiconductor devices
04/08/2009CN100476389C Luminous flux measurement device using standard light source in narrow beam for LED, and testing method
04/08/2009CN100476363C Multiple-degree-of-freedom motion attitude angle detection mechanism
04/07/2009US7516385 Test semiconductor device in full frequency with half frequency tester
04/07/2009US7516384 Semiconductor memory testing device and test method using the same
04/07/2009US7516383 Method and apparatus for analyzing delay in circuit, and computer product
04/07/2009US7516382 On-chip data transmission control apparatus and method
04/07/2009US7516381 Integrated circuit test system
04/07/2009US7516380 BIST to provide jitter data and associated methods of operation
04/07/2009US7516379 Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC)
04/07/2009US7516378 Internal core connected to bond pads by distributor and collector
04/07/2009US7516377 System and method for testing an on-chip initialization counter circuit
04/07/2009US7516376 Test pattern generator, test circuit tester, test pattern generating method, test circuit testing method, and computer product
04/07/2009US7516375 Methods and systems for repairing an integrated circuit device
04/07/2009US7516320 Distributed processing architecture with scalable processing layers
04/07/2009US7516032 Resolution in measuring the pulse width of digital signals
04/07/2009US7515962 Method for monitoring end of life for battery
04/07/2009US7515911 Radio transmission apparatus, routing method, and routing program of radio network
04/07/2009US7515609 Wireless communication system, wireless communication apparatus, wireless communication method, and computer program
04/07/2009US7515548 End-point based approach for determining network status in a wireless local area network
04/07/2009US7515544 Method and system for providing location-based addressing
04/07/2009US7515539 Router which facilitates simplified load balancing
04/07/2009US7515535 Technique for efficiently managing bandwidth for multipoint-to-multipoint services in a provider network
04/07/2009US7515531 Apparatus and methods for the communication and fault management of data in a multipath data network
04/07/2009US7515530 Detecting loops between network devices by monitoring MAC moves
04/07/2009US7515528 Host fail-over switch presence detection compatible with existing protocol and host controllers
04/07/2009US7515527 SDH transmission apparatus and signal transmission method
04/07/2009US7515074 Coding information in integrated circuits
04/07/2009US7514951 Negative voltage noise-free circuit for multi-functional pad
04/07/2009US7514950 Semiconductor device testing apparatus and device interface board
04/07/2009US7514949 Testing method detecting localized failure on a semiconductor wafer
04/07/2009US7514948 Vertical probe array arranged to provide space transformation
04/07/2009US7514947 Method of and system for functionally testing multiple devices in parallel in a burn-in-environment
04/07/2009US7514946 Semiconductor carrier tray, and burn-in board, burn-in test method, and semiconductor manufacturing method using the semiconductor carrier tray
04/07/2009US7514945 Systems configured for utilizing semiconductor components
04/07/2009US7514944 Probe head having a membrane suspended probe
04/07/2009US7514943 Coordinate transforming apparatus for electrical signal connection
04/07/2009US7514942 Probe based patterning of microelectronic and micromechanical devices
04/07/2009US7514941 Method and apparatus for predicting the reliability of electronic systems