| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/30/2009 | US20090108847 Fully Insulated Fuse Test and Ground Device |
| 04/30/2009 | US20090108393 Semiconductor Device With a Plurality of Ground Planes |
| 04/30/2009 | US20090107682 Monitoring A Solenoid of A Directional Control Valve |
| 04/30/2009 | US20090107256 Wind Turbine Testing System |
| 04/30/2009 | US20090107255 Test Bench And A Method For Testing Wind Turbine Equipment |
| 04/30/2009 | DE19638816B4 Tester für Halbleiteranordnungen mit einer mehrere voneinander isolierte Teile aufweisenden Spannvorrichtung Tester for semiconductor devices with a plurality of mutually isolated portions having clamping device |
| 04/30/2009 | DE102008052360A1 Kontakt und elektrische Verbindungsvorrichtung, die ihn verwendet Contact and electrical connection apparatus using it |
| 04/30/2009 | DE102008050642A1 Elektronische Einheit und Testverfahren Electronic unit and test methods |
| 04/30/2009 | DE102008042559A1 Verfahren, Einrichtung und System zum Ausführen einer Funktion zu einem vorgegebenen Zeitpunkt A method, device and system for performing a function at a predetermined time |
| 04/30/2009 | DE102008023855A1 Prüfsystem und Verfahren zur Verringerung von einem Prüfsignalverlust für integrierte Schaltungen Test system and method for reducing an integrated circuit Prüfsignalverlust |
| 04/30/2009 | DE102007046921A1 Measuring arrangement for use with three-phase or four-conductor network, has resistance network which forms neutral point and sum of measuring voltages is compared with testing voltage adjacent to neutral point |
| 04/30/2009 | DE102007046447A1 Verfahren zur automatischen Ausrichtung einer Vielzahl von Messnadelspitzen A method for automatically aligning a plurality of measuring needle points |
| 04/30/2009 | DE102006056646B4 Sondenhalter für eine Sonde zur Prüfung von Halbleiterbauelementen Probe holder for a probe for the testing of semiconductor devices |
| 04/30/2009 | DE102006022330B4 Kontaktierungsanordnung mit einer Leiterplatte und einem aufsetzbaren Modul zur elektrischen Kontaktierung der Leiterplatte Contacting arrangement with a circuit board and an attachable module for electrically contacting the circuit board |
| 04/30/2009 | DE102004026114B4 Diagnosesysteme und Verfahren für eine Vorrichtung zur Erfassung eines Leckstroms Diagnostic systems and methods for a device for detecting a leakage current |
| 04/30/2009 | DE10080443B4 Vorrichtung zum Messen eines Jitters An apparatus for measuring a jitter |
| 04/30/2009 | CA2616192A1 Combined state of charge meter and fuel gauge |
| 04/29/2009 | EP2053717A2 Discharge controller |
| 04/29/2009 | EP2053515A1 A boundary scan method, system and device |
| 04/29/2009 | EP2053414A2 Method and apparatus for detecting internal information of secondary battery |
| 04/29/2009 | EP2052948A2 Electric power steering apparatus |
| 04/29/2009 | EP2052271A1 Method for determining the battery capacity using capacity-dependent parameters |
| 04/29/2009 | EP2052270A1 Real time clock monitoring method and system |
| 04/29/2009 | EP2052268A1 Method and apparatus for detecting a fault in a supply line |
| 04/29/2009 | EP2052265A1 Circuit for continuously measuring discontinuous metal insulator transition of mit element and mit sensor using the same |
| 04/29/2009 | EP2005203A4 Power supply testing architecture |
| 04/29/2009 | EP1932007B1 Process and device for the fail-safe evaluation of a position indicator, in particular a potentiometer |
| 04/29/2009 | EP1859528B1 Power supply apparatus with function of detecting abnormality of current sensor |
| 04/29/2009 | EP1847003A4 Current sensing analog to digital converter and method of use |
| 04/29/2009 | EP1812804B1 Adaptive memory calibration using bins |
| 04/29/2009 | EP1810044B1 Circuit interconnect testing arrangement and approach therefor |
| 04/29/2009 | EP1695104B1 Method and assembly for testing a power output stage |
| 04/29/2009 | EP1260084B1 Extrapolation of location and amplitude of noise source on telecommunication wireline from single ended access point |
| 04/29/2009 | CN201230204Y Logic test device for microcomputer type protection monitoring module in power supply and distribution system |
| 04/29/2009 | CN201230196Y Apparatus for monitoring working state of fuse |
| 04/29/2009 | CN201229395Y Lithium ion battery set residual electric energy computation device |
| 04/29/2009 | CN201229394Y Self-loading intelligent accumulator voltameter |
| 04/29/2009 | CN201229393Y Digital wired intercommunication keyboard detection device |
| 04/29/2009 | CN201229392Y Type H5 PCM intelligent maintaining detector |
| 04/29/2009 | CN201229391Y Circuit board comprising removable gagging point part and test system |
| 04/29/2009 | CN201229390Y AC cable voltage test device |
| 04/29/2009 | CN201229389Y Cable sheath insulation on-line monitoring device |
| 04/29/2009 | CN201229388Y Short circuit and earth fault indicating equipment for power distribution network |
| 04/29/2009 | CN201229387Y Multifunctional electric appliance test bench |
| 04/29/2009 | CN201229386Y Cable tester |
| 04/29/2009 | CN201229385Y Thermal resistor simulating and calibrating equipment for burn-in screen vehicle for component |
| 04/29/2009 | CN201229384Y Electric energy metering cabinet debugging system |
| 04/29/2009 | CN201229383Y Electroconductivity test device for carbon powder box |
| 04/29/2009 | CN201229379Y Induction electroscope |
| 04/29/2009 | CN201229241Y Sub-joint for detecting and diagnosing electric-controlled automobile |
| 04/29/2009 | CN101421634A Device and method for determining replacement of storage battery |
| 04/29/2009 | CN101421633A Test access port switch |
| 04/29/2009 | CN101421632A Electronic circuit |
| 04/29/2009 | CN101421433A Method and apparatus for combinatorially varying materials, unit process and process sequence |
| 04/29/2009 | CN101420247A Time-domain wave beam synthesizing and scanning method for open loop system ultra-wideband pulse source array |
| 04/29/2009 | CN101420095A Switching board |
| 04/29/2009 | CN101420054A 电池充电方法及其装置 Battery charging method and device |
| 04/29/2009 | CN101419373A Array detecting device |
| 04/29/2009 | CN101419345A Display driver and built-in test circuit thereof |
| 04/29/2009 | CN101419272A Motor comprehensive test instrument |
| 04/29/2009 | CN101419271A Turn-off time detection circuit for semiconductor pulse power switch |
| 04/29/2009 | CN101419270A Method for testing BVceo soft breakdown of semiconductor triode |
| 04/29/2009 | CN101419269A Inspecting apparatus for photovoltaic devices |
| 04/29/2009 | CN101419268A Amplifier tube screening instrument |
| 04/29/2009 | CN101419267A Electric network fault on-line rapid diagnosis and analysis method |
| 04/29/2009 | CN101419266A Dynamic analog method for extra-high voltage transformer |
| 04/29/2009 | CN101419265A Signal generating circuit for detecting protective earthing connecting status |
| 04/29/2009 | CN101419264A Method for manufacturing flexible printed circuit board and detection method thereof |
| 04/29/2009 | CN101419263A Insulation property on-line monitoring instrument for composite insulator of powerline |
| 04/29/2009 | CN101419262A On-line detecting system for quartz crystal oscillator |
| 04/29/2009 | CN101419261A High resolution multimedia interface test system |
| 04/29/2009 | CN101419260A Inspection plate for vacuum fluorescent display with built-in chip |
| 04/29/2009 | CN101419254A Uhv transmission line parameter measuring systems and method |
| 04/29/2009 | CN101419253A Uhv transmission line positive sequence and zero sequence parameter measurement method and system |
| 04/29/2009 | CN101419245A Digital audio signal standard test source |
| 04/29/2009 | CN101419131A Braking system debugging technological process for motor train unit |
| 04/29/2009 | CN100484138C Method for adjusting transmission rate to obtain optimum transmission rate in a mobile special network |
| 04/29/2009 | CN100483713C 半导体器件和显示器件 Semiconductor devices and display devices |
| 04/29/2009 | CN100483664C Tcp handler, and method of detecting defective punching hole therefor |
| 04/29/2009 | CN100483660C Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device |
| 04/29/2009 | CN100483559C Semiconductor integrated circuit and its check method |
| 04/29/2009 | CN100483558C Memory independent on testing group function and system for replacing fault stored word |
| 04/29/2009 | CN100483557C Circuit and method for test and repair |
| 04/29/2009 | CN100483486C Display device and used display panel, pixel circuit and compensating mechanism |
| 04/29/2009 | CN100483146C Apparatus, methods and computer program products for estimation of battery reserve life using adaptively modified state of health indicator-based reserve life models |
| 04/29/2009 | CN100483145C Method and appts. of adaptor for face bond of tester and tested device |
| 04/29/2009 | CN100483144C Corona detecting method and system for insulator remote surface on optical amplifier |
| 04/29/2009 | CN100483143C Magnet coil break detection circuit |
| 04/29/2009 | CN100483142C Apparatus and method for electromechanical testing and validation of probe cards |
| 04/29/2009 | CN100483141C On-line needle-bed detection device of detecting instrument |
| 04/29/2009 | CN100483066C Detection device capable of automatic aligning detected material |
| 04/28/2009 | US7526747 Inspection method and inspection system using charged particle beam |
| 04/28/2009 | US7526706 Method and apparatus for preventing network outages |
| 04/28/2009 | US7526703 Method of test pattern generation in IC design simulation system |
| 04/28/2009 | US7526701 Method and apparatus for measuring group delay of a device under test |
| 04/28/2009 | US7526700 Semiconductor integrated circuit device |
| 04/28/2009 | US7526699 Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system |
| 04/28/2009 | US7526698 Error detection and correction in semiconductor structures |
| 04/28/2009 | US7526697 Memory test circuit and method |
| 04/28/2009 | US7526696 Scan-based self-test structure and method using weighted scan-enable signals |