| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/28/2009 | US7526695 BIST with generator, compactor, controller, adaptor, and separate scan paths |
| 04/28/2009 | US7526694 Integrated circuit internal test circuit and method of testing therewith |
| 04/28/2009 | US7526693 Initial decision-point circuit operation mode |
| 04/28/2009 | US7526692 Diagnostic interface architecture for memory device |
| 04/28/2009 | US7526691 System and method for using TAP controllers |
| 04/28/2009 | US7526690 Semiconductor device-testing apparatus |
| 04/28/2009 | US7526688 Parallel bit testing device and method |
| 04/28/2009 | US7526535 Network-based system for configuring a programmable hardware element in a modeling system using hardware configuration programs determined based on a user specification |
| 04/28/2009 | US7526496 Methods, systems, and computer program products for implementing data standardization activities |
| 04/28/2009 | US7526352 Semiconductor production system |
| 04/28/2009 | US7526304 Method of increasing the capacity of enhanced data channel on uplink in a wireless communications system |
| 04/28/2009 | US7525985 Apparatus for collision resolution among home networking stations using carrier sense signal |
| 04/28/2009 | US7525926 Wireless communication using beam forming and diversity |
| 04/28/2009 | US7525925 System and method for selecting an optimal transport format combination using progressive set reduction |
| 04/28/2009 | US7525921 Discard interface for diffusing network attacks |
| 04/28/2009 | US7525917 Flow control in a distributed scalable, shared memory switching fabric system |
| 04/28/2009 | US7525916 High-efficiency control of radio burst signal transmission system |
| 04/28/2009 | US7525911 Congestion controller for Ethernet switch |
| 04/28/2009 | US7525910 Method and system for non-disruptive data capture in networks |
| 04/28/2009 | US7525909 Method and apparatus for dynamic adjustment of rise-over-thermal (ROT) threshold for reverse link rate allocation |
| 04/28/2009 | US7525907 Method, device and software for establishing protection paths on demand and revertive protection switching in a communications network |
| 04/28/2009 | US7525903 Method for improved packet 1+1 protection |
| 04/28/2009 | US7525783 Monitoring method for an actuator and corresponding driver circuit |
| 04/28/2009 | US7525673 Optimizing selected variables of an optical metrology system |
| 04/28/2009 | US7525650 Substrate processing apparatus for performing photolithography |
| 04/28/2009 | US7525530 Display device and scanning circuit testing method |
| 04/28/2009 | US7525336 Method and apparatus for testing liquid crystal display device |
| 04/28/2009 | US7525335 Display element and inspecting method of the same |
| 04/28/2009 | US7525334 Liquid-crystal display device, defective pixel examination method, defective pixel examination program, and storage medium |
| 04/28/2009 | US7525333 Current sense circuit |
| 04/28/2009 | US7525332 On-chip substrate regulator test mode |
| 04/28/2009 | US7525331 On-chip critical path test circuit and method |
| 04/28/2009 | US7525330 Semiconductor device, card, system, and methods of initializing and checking the authenticity and the identity of the semiconductor device |
| 04/28/2009 | US7525329 Electrical connecting apparatus |
| 04/28/2009 | US7525328 Cap at resistors of electrical test probe |
| 04/28/2009 | US7525327 Apparatus for evaluating semiconductor wafer |
| 04/28/2009 | US7525326 Test apparatus capable of accurately connecting a test object to a substrate |
| 04/28/2009 | US7525325 System and method for floating-substrate passive voltage contrast |
| 04/28/2009 | US7525323 Method for measuring permeability of a ferromagnetic material in an integrated circuit |
| 04/28/2009 | US7525319 Method and apparatus to electrically qualify high speed PCB connectors |
| 04/28/2009 | US7525318 Load abnormality detecting system and method |
| 04/28/2009 | US7525317 Real-time multi-point ground resistance monitoring device |
| 04/28/2009 | US7525316 Electrostatic discharge event and transient signal detection and measurement device and method |
| 04/28/2009 | US7525305 Core wrappers with input and output linking circuitry |
| 04/28/2009 | US7525304 Measurement of effective capacitance |
| 04/28/2009 | US7525303 Automatic testing apparatus and method |
| 04/28/2009 | US7525299 Apparatus for accessing and probing the connections between a chip package and a printed circuit board |
| 04/28/2009 | US7525284 Charging rate estimating method, charging rate estimating unit and battery system |
| 04/28/2009 | US7525118 Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device |
| 04/28/2009 | US7524697 Method for manufactuing a semiconductor integrated circuit device |
| 04/28/2009 | CA2497118C Surface mount technology evaluation board |
| 04/23/2009 | WO2009051885A1 Detecting counterfeit electronic components using emi telemetric fingerprints |
| 04/23/2009 | WO2009051871A1 Enhancing speed of simulation of an ic design while testing scan circuitry |
| 04/23/2009 | WO2009051564A1 A heat transfer system and method |
| 04/23/2009 | WO2009051466A1 Perspective switching optical device for 3d semiconducter inspection |
| 04/23/2009 | WO2009051193A1 Logical value determination method and logical value determination program |
| 04/23/2009 | WO2009051191A1 Don't-care bit extraction method and don't-care bit extraction program |
| 04/23/2009 | WO2009050989A1 Secondary battery control system, electric vehicle mounting the control system, and secondary battery control method |
| 04/23/2009 | WO2009050821A1 Apparatus, method and program for determining operation frequency of semiconductor integrated circuit device |
| 04/23/2009 | WO2009050803A1 Tft array inspection apparatus and method for synchronization |
| 04/23/2009 | WO2009050349A2 Method for inspecting electronic boards using multispectral analysis |
| 04/23/2009 | WO2009050127A2 Probe holder |
| 04/23/2009 | WO2009050050A1 Energy storage unit |
| 04/23/2009 | WO2009050038A1 Method for testing a test substrate under defined thermal conditions and thermally conditionable prober |
| 04/23/2009 | WO2009049946A1 Determination of the internal resistance and connection resistance of a battery |
| 04/23/2009 | WO2009049803A1 Method for fault location on series compensated power transmission lines with two-end unsynchronized measurement |
| 04/23/2009 | WO2009049592A1 Method and device for measuring cell voltages in a plurality of series-connected accumulator cells |
| 04/23/2009 | WO2009025512A3 System and method for estimating long term characteristics of battery |
| 04/23/2009 | WO2009023727A3 Automated contact alignment tool |
| 04/23/2009 | WO2008007255A3 Method for scheduling of packets in tdma channels |
| 04/23/2009 | WO2007133176A3 Flat panel display substrate testing system |
| 04/23/2009 | WO2007050430A3 An apparatus and methods for controlling operation of a single-phase voltage regulator in a three-phase power system |
| 04/23/2009 | WO2007040882A3 Method for testing links in a wireless network |
| 04/23/2009 | WO2007022538A3 Test pads for measuring properties of a wafer |
| 04/23/2009 | WO2007022446A3 Electronic device having an interface supported testing mode |
| 04/23/2009 | WO2006135680A3 Electrical contact probe with compliant internal interconnect |
| 04/23/2009 | WO2006133232A3 Providing a data function in an access gateway node |
| 04/23/2009 | WO2006125193A3 System for testing smart cards and method for same |
| 04/23/2009 | WO2006101984A3 Internally generating patterns for testing in an integrated circuit device |
| 04/23/2009 | WO2006093944A3 Semiconductor device test system |
| 04/23/2009 | WO2005107372A3 Product functionality assurance and guided troubleshooting |
| 04/23/2009 | WO2005104401A3 Method and apparatus for optimizing multidimensional systems |
| 04/23/2009 | US20090106721 Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-out |
| 04/23/2009 | US20090106614 System and method for signature-based systematic condition detection and analysis |
| 04/23/2009 | US20090106611 Microelectronic device and pin arrangement method thereof |
| 04/23/2009 | US20090106610 Semiconductor integrated circuit |
| 04/23/2009 | US20090106609 Semiconductor integrated circuit and debug mode determination method |
| 04/23/2009 | US20090106608 Apparatus and method for selectively implementing launch off scan capability in at speed testing |
| 04/23/2009 | US20090105983 Test definer, a method of automatically determining and representing functional tests for a pcb having analog components and a test system |
| 04/23/2009 | US20090105977 Test apparatus, skew measuring apparatus, device and board |
| 04/23/2009 | US20090105971 System And Method For Time Domain Reflectometry Testing |
| 04/23/2009 | US20090105970 Semiconductor tester |
| 04/23/2009 | US20090104342 Photovoltaic fabrication process monitoring and control using diagnostic devices |
| 04/23/2009 | US20090103437 Method of transmitting/receiving data in sensor network for reducing overhearing of sensor nodes |
| 04/23/2009 | US20090103431 Method of Estimating Restoration Capacity in a Network |
| 04/23/2009 | US20090103430 System and method of managing failover network traffic |
| 04/23/2009 | US20090102667 Monitoring System |
| 04/23/2009 | US20090102504 Circuit Assemblage and Method for Functional Checking of a Power Transistor |
| 04/23/2009 | US20090102503 Semiconductor device, semiconductor chip, interchip interconnect test method, and interchip interconnect switching method |
| 04/23/2009 | US20090102502 Process testers and testing methodology for thin-film photovoltaic devices |