Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2009
04/14/2009US7519293 Optical communication system having ring-based restoration using shared protect links
04/14/2009US7519111 Apparatus and method for providing system and test clock signals to an integrated circuit on a single pin
04/14/2009US7519054 Replication of multicast data packets in a multi-stage switching system
04/14/2009US7519005 Single-wire communication bus for miniature low-power systems
04/14/2009US7519001 Information processing apparatus and method of controlling the information processing apparatus
04/14/2009US7519000 Systems and methods for managing a network
04/14/2009US7518999 Monitoring arrangements, having communication establishment information changed from initial communication establishment information
04/14/2009US7518997 Wireless mobile communication stations for operation in non-exclusive spectrum
04/14/2009US7518990 Route determination method and apparatus for virtually-concatenated data traffic
04/14/2009US7518987 Mechanisms for providing connectivity in NAT redundant/fail-over scenarios in unshared address-space
04/14/2009US7518984 IP-PBX, IP-PBX system, IP terminal control program
04/14/2009US7518982 System and method of communicating status and protection information between cards in a communications system
04/14/2009US7518963 Phase difference detection circuit and optical disk device
04/14/2009US7518690 Image display device
04/14/2009US7518601 Array substrate and display apparatus and method for manufacturing display apparatus
04/14/2009US7518393 Pixel circuit board, pixel circuit board test method, pixel circuit, pixel circuit test method, and test apparatus
04/14/2009US7518392 Systems and methods for continuity testing using a functional pattern
04/14/2009US7518391 Probe card and a method for detecting defects using a probe card and an additional inspection
04/14/2009US7518390 Semiconductor integrated circuit device with a test circuit that measures a period to select a test mode
04/14/2009US7518389 Interface assembly and dry gas enclosing apparatus using same
04/14/2009US7518388 Contactor for electronic components and test method using the same
04/14/2009US7518387 Shielded probe for testing a device under test
04/14/2009US7518386 Probe card having a leaf spring
04/14/2009US7518385 Probe using high pass ground signal path
04/14/2009US7518384 Method and apparatus for manufacturing and probing test probe access structures on vias
04/14/2009US7518383 Inspection apparatus and inspection method using electron beam
04/14/2009US7518379 Connection unit, a board for mounting a device under test, a probe card and a device interfacing part
04/14/2009US7518377 Measurement apparatus, test apparatus, and measurement method
04/14/2009US7518358 Chuck for holding a device under test
04/14/2009US7518357 Test circuits of an apparatus for testing micro SD devices
04/14/2009US7518356 Apparatus for testing system-in-package devices
04/14/2009US7518355 Package level voltage sensing of a power gated die
04/14/2009US7518339 State variable and parameter estimator comprising several partial models for an electrical energy storage device
04/14/2009US7518242 Semiconductor testing device
04/14/2009US7517707 Manufacturing method of semiconductor integrated circuit device and probe card
04/14/2009CA2409511C Method and device for detecting accidental arcs
04/09/2009WO2009046276A1 Emulating behavior of a legacy test system
04/09/2009WO2009045447A2 Gas measuring device and method of operating the same
04/09/2009WO2009044113A2 Semiconductor wafer metrology apparatus and method
04/09/2009WO2009044058A2 Method for characterising the sensitivity of an electronic component to energetic interactions
04/09/2009WO2009043772A1 Circuit arrangement for monitoring an electrical insulation
04/09/2009WO2009043752A1 Method and device for adjusting measuring probes
04/09/2009WO2009043654A1 Method for monitoring a measuring needle during test operation
04/09/2009WO2009043653A1 Method for adjusting measuring probes
04/09/2009WO2009043640A1 Method for informing a driver of an ability of an electric motor in a vehicle to supply a minimum amount of power which can be requested
04/09/2009WO2009022313A3 Integrated circuit with rf module, electronic device having such an ic and method for testing such a module
04/09/2009WO2009022276A3 Software-based verification of system-on-chip direct interconnect through additional registers
04/09/2009WO2009017465A3 Patterned wafer defect inspection system and method
04/09/2009WO2008153558A3 A semicoductor testing device with elastomer interposer
04/09/2009WO2008016767A3 Array testing method using electric bias stress for tft array
04/09/2009WO2007057884A3 Vpls remote failure indication
04/09/2009WO2007043051A3 Photoconductive based electrical testing of transistor arrays
04/09/2009WO2006129142A3 Apparatus and method creating virtual routing domains in an internet protocol network
04/09/2009WO2006113126A3 Method for monitoring a reticle
04/09/2009WO2006111959A3 A phase-modulated transmit diversity data communication system and method
04/09/2009WO2006102006A3 Voltage fault detection and protection
04/09/2009WO2006017142A3 Monitoring device for transport pods
04/09/2009WO2005119280A3 Bi-directional current sensing by monitoring vs voltage in a half or full bridge circuit
04/09/2009WO2005070171A3 Active thermal control system for testing
04/09/2009US20090094497 Data inversion register technique for integrated circuit memory testing
04/09/2009US20090094495 Modulation signature trigger
04/09/2009US20090093988 Virtual crimp validation system
04/09/2009US20090093161 Conductive-contact holder and conductive-contact unit
04/09/2009US20090092491 Apparatus and related method for sensing cracks in rotating engine blades
04/09/2009US20090092043 Providing an abstraction layer in a cluster switch that includes plural switches
04/09/2009US20090091868 Vehicle AC Ground Fault Detection System
04/09/2009US20090091867 Transformer Through-Fault Current Monitor
04/09/2009US20090091348 Circuit for testing internal voltage of semiconductor memory apparatus
04/09/2009US20090091347 Emulating Behavior of a Legacy Test System
04/09/2009US20090091346 Circuits and methods for characterizing device variation in electronic memory circuits
04/09/2009US20090091345 Structure for providing a duplicate test signal of an output signal under test in an integrated circuit
04/09/2009US20090091344 Magnetic sensor integrated circuit with test conductor
04/09/2009US20090091342 Node Extender for In-Circuit Test Systems
04/09/2009US20090091339 Method for detection and analysis of impurity content in refined metallurgical silicon
04/09/2009US20090091333 Stacked semiconductor apparatus with configurable vertical i/o
04/09/2009US20090091332 Vehicle power supply device
04/09/2009US20090091331 Circuit board and method for automatic testing
04/09/2009US20090091330 Device and method for actuator monitoring of a safety-related load circuit connected with two channels
04/09/2009US20090091299 Dynamically adaptive method for determining the state of charge of a battery
04/09/2009US20090091289 Stator inter-turn fault detection of synchronous machines
04/09/2009US20090090908 Providing A Duplicate Test Signal Of An Output Signal Under Test In An Integrated Circuit
04/09/2009US20090090622 System and method for particulate sensor diagnostic
04/09/2009DE112007001071T5 Verfahren und Vorrichtung zur Bewertung von Solarzellen und deren Verwendung Method and apparatus for evaluating the solar cell and the use thereof
04/09/2009DE102008048107A1 Diagnostic module for antenna device of vehicle, has switching transistor, where module is connected to arbitrary positions of antenna structure with pre-selected electrical potential except for ground connection at antenna structure
04/09/2009DE102008029878A1 Systeme und Verfahren zum Bewerten von Permanentmagnetmotoren Systems and methods for evaluating permanent magnet motors
04/09/2009DE102007047768A1 Prüfgerät für RFID-Systeme sowie RFID-Anordnungen und Verfahren zum Betreiben eines Prüfgeräts in einem RFID-System Tester for RFID systems and RFID devices and methods for operating a tester in an RFID system
04/09/2009DE102007047269A1 Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte Full grid cassette for a parallel tester for testing a bare board, spring pin for such a full grid cassette and adapter for a parallel tester for testing a bare board
04/09/2009DE102007046446A1 Verfahren zur Justierung von Messnadeln Procedures for calibration of measuring needles
04/09/2009DE102007046443A1 Verfahren zur Messnadelüberwachung im Prüfbetrieb A method for measuring needle monitoring in test
04/09/2009DE102007045756A1 Prüfschaltung für automatische Prüfeinrichtung Test circuit for automatic test equipment
04/09/2009DE102006058966B4 Verfahren und Vorrichtung zum Erfassen von elektrischen Potentialunterschieden Method and apparatus for detecting electric potential differences
04/09/2009DE102005028191B4 Verfahren und Vorrichtung zum Testen von unbestückten, großflächigen Leiterplatten mit einem Fingertester Method and apparatus for testing of non, large printed circuit with a finger tester
04/09/2009DE10131712B4 Elektronisches Bauelement, Testereinrichtung und Verfahren zur Kalibrierung einer Testereinrichtung An electronic component tester device and method for calibrating a device tester
04/09/2009DE10040246B4 Verfahren und Vorrichtung zur Ansteuerung wenigstens eines Verbrauchers Method and apparatus for controlling at least one consumer
04/09/2009CA2695919A1 Method for characterising the sensitivity of an electronic component to energetic interactions
04/08/2009EP2045688A1 Method of detecting an anomaly in a household installation and power management unit for implementing said method.
04/08/2009EP2045610A1 Location of a fault in a medium-voltage public distribution system
04/08/2009EP2044453A2 Device for measuring parameters of an electrical power supply
04/08/2009EP2044452A1 Digital waveform generation and measurement in automated test equipment
04/08/2009EP2044451A1 Photovoltaic arrangement