| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/31/1987 | US4654645 Electric element breakdown detector |
| 03/31/1987 | US4654580 Electrical continuity tester for the connection of a terminal and an insulated lead |
| 03/31/1987 | CA1219912A1 Tracing electrical conductors by high-frequency constant-energy-content pulse loading |
| 03/31/1987 | CA1219911A1 Tracing electrical conductors by high-frequency loading and improved signal detection |
| 03/26/1987 | WO1987001813A1 An oven for the burn-in of integrated circuits |
| 03/26/1987 | DE3630026A1 Device for detecting partial discharges in high-voltage systems |
| 03/26/1987 | DE3533437A1 Protection electronics for accumulators |
| 03/25/1987 | EP0215620A2 DC ground fault detection |
| 03/25/1987 | EP0215146A1 Device for electronic testing of printed boards or similar devices |
| 03/25/1987 | CN85106989A Air insulation device |
| 03/25/1987 | CN85106698A Earth fault detacting system and device for the power equipment |
| 03/24/1987 | US4653003 Electronic control system for a motive unit |
| 03/24/1987 | US4652815 State logic testing device for a logic circuit |
| 03/24/1987 | US4652814 Circuit testing utilizing data compression and derivative mode vectors |
| 03/24/1987 | US4652813 Apparatus for identifying wires of multiple wire electrical system |
| 03/24/1987 | US4652812 One-sided ion migration velocity measurement and electromigration failure warning device |
| 03/24/1987 | US4652757 Method and apparatus for optically determining defects in a semiconductor material |
| 03/24/1987 | CA1219634A1 Detection of ground faults in ungrounded dc power supply systems |
| 03/24/1987 | CA1219625A1 Series-connected, skin-current heating pipe including current trouble detector |
| 03/18/1987 | EP0214483A1 Method for measuring distance in digital distance relays |
| 03/18/1987 | EP0214239A1 Method and circuit for detecting a fault condition. |
| 03/18/1987 | EP0214229A1 Logic circuit having improved testability for defective via contacts. |
| 03/18/1987 | CN86201209U Digital measuring instrument for coil turns |
| 03/17/1987 | US4651088 Device for testing semiconductor devices |
| 03/17/1987 | US4651086 Apparatus and method for determining the resistance of a coil connection of an electric motor winding |
| 03/17/1987 | US4651084 Fault test apparatus for conductors of multiconductor cable |
| 03/17/1987 | US4651038 Gate having temperature-stabilized delay |
| 03/17/1987 | US4650333 System for measuring and detecting printed circuit wiring defects |
| 03/17/1987 | US4649821 Electrical circuit continuity test apparatus for firing unit |
| 03/17/1987 | CA1219368A1 Cmos lsi and vlsi chips having internal delay testing capability |
| 03/12/1987 | DE3530925A1 Test device for coaxial RF connectors |
| 03/11/1987 | EP0214049A1 Semiconductor chip power supply monitor circuit arrangement |
| 03/11/1987 | EP0213871A1 Strobo electron beam apparatus |
| 03/11/1987 | EP0213774A1 Anisotropically electrically conductive article |
| 03/11/1987 | EP0213530A1 Process for the contact resistance measurement of electrical conductor connections in a network of conductors connected in parallel, and measuring arrangement therefor |
| 03/11/1987 | EP0213453A2 Noise reduction during testing of integrated circuit chips |
| 03/11/1987 | EP0213438A2 Method and arrangement for operating a scanning microscope |
| 03/11/1987 | EP0213409A1 Structure for the quality testing of a semiconductor substrate |
| 03/11/1987 | EP0119225B1 Photoluminescence method of testing double heterostructure wafers |
| 03/11/1987 | EP0096027B1 Branched labyrinth wafer scale integrated circuit |
| 03/10/1987 | US4649539 Apparatus providing improved diagnosability |
| 03/10/1987 | US4649515 Methods and apparatus for system fault diagnosis and control |
| 03/10/1987 | US4649374 Electrostatic system monitor and method therefor |
| 03/10/1987 | US4649344 Test circuit for detector used in well bore |
| 03/10/1987 | US4649335 Equipment for locating a signal reflection point in a transmission line |
| 03/04/1987 | EP0212997A2 Semiconductor integrated circuit adapted to carry out a test operation |
| 03/04/1987 | EP0212520A2 Data processing method |
| 03/04/1987 | EP0212268A2 Evaluation facilitating circuit device |
| 03/04/1987 | EP0212208A1 Circuit arrangement for testing integrated-circuit units |
| 03/04/1987 | EP0084247B1 Operation mode setting circuitry for microprocessor |
| 03/04/1987 | CN86104790A Generator stator winding diagnostic system |
| 03/03/1987 | US4648079 Method of troubleshooting an underwater acoustic transducer array |
| 03/03/1987 | US4648042 Method of and arrangement for generating pulses of an arbitrary time relation during immediately successive assumed pulse intervals with a very high accuracy and time resolution |
| 03/03/1987 | US4647860 Apparatus for automating standard voltage reference cell intercomparisons |
| 03/03/1987 | US4647852 Contact probe assembly |
| 03/03/1987 | US4647846 Method and means for testing multi-nodal circuits |
| 03/03/1987 | US4647844 Method and apparatus for testing shielded cable assemblies |
| 03/03/1987 | CA1218706A1 Monitor for scr system |
| 02/26/1987 | WO1987001207A1 Harmonic sampling logic analyzer |
| 02/26/1987 | DE3540031A1 Arrangement for monitoring a variable electrical resistance |
| 02/26/1987 | DE3540030A1 Arrangement for monitoring an electrical fuse element |
| 02/26/1987 | DE3530308A1 Method for adapting a test program for electrical circuits |
| 02/26/1987 | DE3530148A1 Compact battery tester |
| 02/25/1987 | EP0211711A1 Method and device for the rapid reflectometric testing of passive components in the VHF range |
| 02/25/1987 | EP0211590A2 Method and apparatus for optically determining defects in a semiconductor material |
| 02/25/1987 | EP0211087A1 Test pattern generator |
| 02/25/1987 | CN86103090A Method and apparatus for mornitoring a failure point of dc grounding |
| 02/24/1987 | US4646306 High-speed parity check circuit |
| 02/24/1987 | US4646299 Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
| 02/24/1987 | US4646298 Self testing data processing system with system test master arbitration |
| 02/24/1987 | US4646253 Method for imaging electrical barrier layers such as pn-junctions in semiconductors by means of processing particle-beam-induced signals in a scanning corpuscular microscope |
| 02/24/1987 | US4646248 Insulation analyzer apparatus and method of use |
| 02/24/1987 | US4646009 Contacts for conductivity-type sensors |
| 02/24/1987 | US4645958 Variable delay gate circuit |
| 02/24/1987 | CA1218444A1 Proving safe operation system for automatic train |
| 02/19/1987 | DE3528540A1 Device for monitoring the rotor current of a slipring-rotor motor of a converter cascade |
| 02/17/1987 | US4644269 Test fixture having full surface contact hinged lid |
| 02/17/1987 | US4644265 Noise reduction during testing of integrated circuit chips |
| 02/17/1987 | US4644264 Photon assisted tunneling testing of passivated integrated circuits |
| 02/17/1987 | US4644259 Nondestructive testing of multilayer ceramic capacitors |
| 02/17/1987 | US4644245 Nickel-cadmium battery state-of-charge measuring method |
| 02/17/1987 | US4644172 Electronic control of an automatic wafer inspection system |
| 02/17/1987 | US4643627 Vacuum transfer device |
| 02/17/1987 | CA1218159A1 Serial chip scan |
| 02/17/1987 | CA1218108A1 Surge arrester equipped for monitoring functions and method of use |
| 02/12/1987 | DE3625819A1 Method and device for contactlessly measuring the resistivity of semiconductor wafers |
| 02/12/1987 | DE3624781A1 Method for detecting the state of charge of a battery |
| 02/12/1987 | DE3528887A1 Method and device for approximately determining the field angle of a rotary field machine |
| 02/11/1987 | CN86105604A Circuit arrangment for testing integrated circuit components |
| 02/11/1987 | CN85106936A Instrument for measuring transistor dc parameters by square pulse current |
| 02/10/1987 | US4642616 Method and apparatus for detection of AC power failure conditions |
| 02/10/1987 | US4642600 Determining temperature of recombination catalyst |
| 02/10/1987 | US4642566 Method for the registration and representation of signals in the interior of integrated circuits by considering edge steepness and apparatus for implementing the method |
| 02/10/1987 | US4642565 Method to determine the crystalline properties of an interface of two materials by photovoltage phenomenon |
| 02/10/1987 | US4642561 Circuit tester having on-the-fly comparison of actual and expected signals on test pins and improved homing capability |
| 02/10/1987 | US4642560 Device for controlling continuity of printed circuits |
| 02/10/1987 | US4642556 Tracing electrical conductors by high-frequency constant-energy-content pulse loading |
| 02/10/1987 | US4642554 Fail-safe electrical-ground indicator |
| 02/10/1987 | US4641527 Inspection method and apparatus for joint junction states |
| 02/10/1987 | US4641525 Method and apparatus for checking the wall thickness of a layer |